Abstract: A scanning device is provided. The scanning device includes a frame having a first portion and a second portion pivotably coupled to the first frame portion. The scanning device also includes a couplant source disposed in the first frame portion along with a couplant assembly. The couplant assembly includes a first couplant line disposed completely within the first frame portion and the second frame portion. The couplant assembly also includes a second couplant line extending from the first couplant line and out of the second frame portion at a first end of the second couplant line. The couplant assembly has a couplant line branch extending from the second couplant line where a sensor assembly of the ultrasound scanning device couples with the couplant line branch at an end opposite the second end of the second couplant line.

Abstract: An eddy current (EC) detection system comprises an EC probe including a plurality of sensors to provide corresponding EC response signals; and processing circuitry to evaluate speed of the EC probe based on a measurement of similarity of the EC response signals; determine whether the speed of the EC probe is too fast or two slow based on quality of the measurement; and generate a command to adjust speed of the EC probe during further EC inspection.

Abstract: Systems and methods are disclosed for conducting an ultrasonic-based inspection. The systems and methods perform operations comprising: receiving a plurality of scan plan parameters associated with generating an image of at least one flaw within a specimen based on acoustic echo data obtained using full matrix capture (FMC); applying the plurality of scan plan parameters to an acoustic model, the acoustic model configured to determine a two-way pressure response of a plurality of inspection modes based on specular reflection and diffraction phenomena; generating, by the acoustic model based on the plurality of scan plan parameters, an acoustic region of influence (AROI) comprising an acoustic amplitude sensitivity map for a first inspection mode amongst the plurality of inspection modes; and generating, for display, a first image comprising the AROI associated with the first inspection mode for capturing or inspecting the image of the at least one flaw.

Abstract: An acoustic technique can be used for performing non-destructive testing. For example, a method for acoustic evaluation of a target can include generating respective acoustic transmission events via selected transmitting ones of a plurality of electroacoustic transducers, and in response to the respective acoustic transmission events, receiving respective acoustic echo signals using other receiving ones of the plurality of electroacoustic transducers, and coherently summing representations of the respective received acoustic echo signals to generate a pixel or voxel value corresponding to a specified spatial location of the target. Such summation can include weighting contributions from the respective representations to suppress contributions from acoustic propagation paths outside a specified angular range with respect to a surface on or within the target, such as to provide an acoustic path-filtered total focusing method (PF-TFM).

Abstract: Systems and methods are disclosed for conducting an ultrasonic-based inspection. The systems and methods perform operations comprising: receiving, by one or more processors, data indicative of a detected tag on a specimen, the tag associated with one or more ultrasonic-based inspections that were previously performed on the specimen; retrieving, by the one or more processors, based on the detected tag, configuration data for a non-destructive testing (NDT) instrument, the configuration data being associated with the one or more ultrasonic-based inspections that were previously performed on the specimen; generating, by the one or more processors, new configuration data for the NDT instrument to perform a new inspection of the specimen at least in part using the received configuration data; and performing the new inspection of the specimen based on spatially positioning the NDT instrument relative to a position of the tag on the specimen.

Abstract: An ultrasound probe can detect flaws in an object in a non-destructive manner. The probe includes a row-column addressed (RCA) array with a plurality of row and column electrodes. The row and column electrodes are configurable to have at least four states: 1) a transmission state, 2) a reception state, 3) a ground state, and 4) a high impedance state. The probe also includes a control circuit to operate the RCA array in different transmission and reception configurations.

Abstract: An ultrasound probe can detect flaws in an object in a non-destructive manner. The probe includes a row-column addressed (RCA) array with a plurality of row and column electrodes. The row and column electrodes are configurable to have at least four states: 1) a transmission state, 2) a reception state, 3) a ground state, and 4) a high impedance state. The probe also includes a control circuit to operate the RCA array in different transmission and reception configurations.

Abstract: An X-ray fluorescence (XRF) instrument comprises a hand-held device housing which holds a radiation emitter configured to emit radiation directed at a test object and a radiation detector housed inside a chamber closed by a sealing window and configured to detect radiation of the test object, caused by the test object being exposed to the emitted radiation. A protective cover mechanism is affixed to the testing device and is configured to have a closed position which covers or blocks access to the sealing window to protect it from being broken or damaged by debris or other obstructions, and an open position which exposes the sealing window to allow the un-obstructed passage of radiation therethrough. The cover mechanism can be implemented variously, including by a pivotally mounted cover plate, an iris mechanism, a fan-like cover and the like. Debris can be detected variously, including by strain sensors, optical detectors and proximity sensors.

Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.

Abstract: A non-destructive inspection and testing instrument includes a housing and a first panel with a first type input to be assembled onto the housing and a second panel with a different, second type input to be assembled onto the housing. A first GUI module for the first panel implements a function upon an actuation of the first type input. A second GUI module for the second panel implements the same function upon an actuation of the second type input. A controller is configured to select the first GUI module when the first panel is associated with the instrument and to select the second GUI module when the second panel is associated with the instrument.

Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.

Abstract: The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The 3D orthogonal sensor is conventionally wound onto a 3D core, with at least some of the surfaces being un-parallel to the surface be inspected. Using the herein disclosed 2D configuration allows the use of printed circuit board technologies for the manufacturing of these EC sensors. The herein disclosed method and the associated 2D EC sensors are particularly useful for reproducing the EC effect of conventional orthogonal probe arrays.

Abstract: A pulse generation circuit and method includes using digital signals to trigger a first and second varying analog signals and detecting when they reach one or more reference levels. In response to the first and second varying analog signals reaching one or more reference levels, a first and a second digital control signals are produced and provided as input to a pulser producing a voltage excitation pulse having a width and timing defined by the first and second digital control signals.

Abstract: The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The resulting thin-film eddy current array of coils configured to be placed parallel and against the test surface, and a corresponding eddy current circuitry operable to excite and receive eddy current from the array of coils. The array of coils forming at least a first inspection channel and a second inspection channel. The eddy current circuitry is configured and operable in a way that the one of the first pair of driver coils is usable as one of the second pair of driver coils; and one of the first pair of receiver coils is useable as one the second pair of receiver coils.

Abstract: A device is disclosed for performing non-destructive inspection and testing (NDT/NDI) of an elongated test object, wherein the inspection system includes: a test object conveyor for conveying the test object along a longitudinal conveyance path; a probe assembly including phased-array probes, the probe assembly being configured to induce signals in the test object and sense echoes reflected from the test object; a probe assembly conveyor configured to movably support the probe assembly, to move the probe assembly on a circumferential path about the test object; and a control system coupled to the test object conveyor and to the probe assembly conveyor and configured to allow data acquisition by and from the phased-array probes while, simultaneously, the test object moves along the longitudinal path and the phased-array probes move on the circumferential path.

Abstract: An XRF analysis apparatus includes a housing with a source of penetrating radiation to be directed at a sample and a detector for detecting fluoresced radiation from the sample. A shield is attachable to the housing to protect the user from radiation and a safety interlock is configured to detect whether or not the shield is attached to the housing. A controller is responsive to the safety interlock, and configured to monitor usage of the source of radiation at or above a predetermined power level when the shield is not attached to the housing and provide an output signal when the monitored usage of the source of penetrating radiation at or above the predetermined power level without the shield attached to the housing exceeds one or more predetermined thresholds.

Abstract: Disclosed are a method and an NDT/NDI inspection device deploying digital circuitry to conduct detection and compensation of phase and amplitude shift in responding signals. A digital waveform generator, such as a direct digital synthesizer (DDS) is used to generate a digital sine-wave of a specific frequency and amplitude, mimicking the pulser frequency and amplitude. The sine-wave is converted to analog signal through a DAC and transmitted to the transducer. The received analog sine-wave from the transducer is converted back to a digital signal through an ADC. The transmitted and received digital signals are then compared for phase and amplitude differences. A null circuit involving another waveform generating component is employed to compensate the detected phase and amplitude differences. As a result the phase and amplitude differences are effectively eliminated before being further processed and analyzed for defects information.

Abstract: A shielded eddy current coil probe is formed on a printed circuit board and comprises a first coil component forming a test coil and a second coil component forming an active shielding coil. The test coil and the active shielding coil are concentrically arranged and the number of coil windings in the active shielding coil and the field direction thereof are configured to limit the induced field or the sensed field in the test object to the footprint area of the test coil on the test object. Multiple sets of test coils with active shielding coils can be provided on the same or different layers of the printed circuit board to realize different driver, receiver and combined driver/receiver coil configurations.

Abstract: A multi-frequency bond-testing system using acoustic probes in conjunction with NDT/NDI inspection instruments. Bond-testing of test objects is carried out at multiple discrete frequencies to produce a single, combined amplitude C-scan. Alternatively, or in combination, the system provides a single, combined phase C-scan to enable proper interpretation of the C-scans. Amplitude and/or phase readings on test objects are normalized at the selected frequencies relative to tests performed on a defect-free object at those frequencies. In this manner, the non-linear behavior of a bond-testing probe over a frequency range chosen for a given inspection is compensated for. The invention enables providing more easily interpretable and sharper images which enable a more reliable and faster reading and identification of defects in the test objects.

Abstract: A touch screen is disclosed which responds to a user's touch for re-drawing, re-scaling, re-translating and re-positioning an impedance plane signal received from non-destructive testing equipment, such as an eddy current sensor. The impedance plane is manipulated by slidingne, two or more fingers simultaneously to an end position to effectuate a complete re-drawing operation of the image.