Patents Assigned to Olympus NDT
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Publication number: 20140088921Abstract: Disclosed is a non-destructive testing instrument configured, when the digital signal is saturated during one data acquisition session, to display an indicator flag to warn the operator in order to help the operator to clearly see that a measurement is invalid. It's also configured to abandon and not to display the measurement results to stop any further analysis on them.Type: ApplicationFiled: September 24, 2013Publication date: March 27, 2014Applicant: OLYMPUS NDT, INC.Inventors: Hanan Hayot, Marc Dulac
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Patent number: 8670952Abstract: A non-destructive inspection (NDI) instrument includes a sensor connection system configured to receive test signals from at least two different types of NDI sensors which are configured to obtain test signals from an object being tested. The sensor connection system has sensor-specific connection circuits and at least one common sensor connection circuit. A data acquisition circuitry is coupled to the sensor connection and has sensor-specific data acquisition circuits and at least one common data acquisition circuit. It is further coupled to a common digital data processor which executes sensor-specific processing modules and at least one common processing module. A common display screen and user interface is coupled to the data processor and enables programs including sensor-specific user interface modules and at least one common user interface module. The sensor types preferably include all of or any combination of an ultrasound sensor, an eddy current sensor and acoustic sensor.Type: GrantFiled: April 18, 2011Date of Patent: March 11, 2014Assignee: Olympus NDT Inc.Inventor: Michael Drummy
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Publication number: 20140035568Abstract: Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off.Type: ApplicationFiled: July 31, 2013Publication date: February 6, 2014Applicant: OLYMPUS NDT INC.Inventor: Benoit Lepage
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Publication number: 20140002072Abstract: The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The resulting thin-film eddy current array of coils configured to be placed parallel and against the test surface, and a corresponding eddy current circuitry operable to excite and receive eddy current from the array of coils. The array of coils forming at least a first inspection channel and a second inspection channel. The eddy current circuitry is configured and operable in a way that the one of the first pair of driver coils is usable as one of the second pair of driver coils; and one of the first pair of receiver coils is useable as one the second pair of receiver coils.Type: ApplicationFiled: August 23, 2013Publication date: January 2, 2014Applicant: Olympus NDT Inc.Inventor: Benoit LEPAGE
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Patent number: 8577629Abstract: A method and system related to phased array ultrasonic systems identifies faults in individual element on a regular basis. The method and system are based on a simple approach of calculating energy levels in response signals from each individual element and then identifying any discontinuities or unexpected drops in energy levels sensed during a typical phased array operation, by comparing responses for individual transducer elements to the group response.Type: GrantFiled: March 25, 2009Date of Patent: November 5, 2013Assignee: Olympus NDTInventors: Christian Simard, Michael Drummy
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Publication number: 20130255386Abstract: A pulse generation circuit and method includes using digital signals to trigger a first and second varying analog signals and detecting when they reach one or more reference levels. In response to the first and second varying analog signals reaching one or more reference levels, a first and a second digital control signals are produced and provided as input to a pulser producing a voltage excitation pulse having a width and timing defined by the first and second digital control signals.Type: ApplicationFiled: March 29, 2012Publication date: October 3, 2013Applicant: OLYMPUS NDTInventor: Andrew THOMAS
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Publication number: 20130249540Abstract: The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.Type: ApplicationFiled: March 22, 2012Publication date: September 26, 2013Applicant: OLYMPUS NDT INC.Inventor: Benoit Lepage
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Patent number: 8521457Abstract: A user configured measurement display system and method for a non-destructive testing device and instrument (NDT/NDI) with high input data rate is disclosed. The system and the method provide the means for NDT/NDI instruments display measurement values that satisfies user designated measurement criterion occurring during any measurement time intervals (MTIs). The present disclosure overcomes the shortcomings of conventional ways of picking and displaying measurement values at fixed MTIs, by which the values truly satisfying the measurement criterion that occurs at random MTIs (other than scheduled MTIs) are often skipped.Type: GrantFiled: October 20, 2008Date of Patent: August 27, 2013Assignee: Olympus NDTInventors: Jayesh Patel, Michael Drummy
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Patent number: 8521446Abstract: Disclosed is an ultrasonic phased array non-destructive inspection system that includes a PA probe, a conventional PA inspection unit and a refraction angle verification unit. The PA inspection unit is employed to emit ultrasonic angle beams into an AWS IIW Block and to receive a set of corresponding echo signals reflected from the calibration block and to provide time-of-flight (TOF) values corresponding to each angle beam. The refraction angle verification unit then provides a true angle for each of the angle beams based on the ultrasonic and geometric characteristics of the block and the measured TOF values. Other calibration blocks such as the DSC and Nayships blocks can also be used for this purpose.Type: GrantFiled: November 23, 2010Date of Patent: August 27, 2013Assignee: Olympus NDT Inc.Inventors: Jinchi Zhang, Jason Habermehl
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Patent number: 8519702Abstract: An orthogonal eddy current probe with at least three coils, each of the coils is wound across the two facing sides of an at least six-sided right polygonal [b1] prism. At each time interval, two of the three coils are used as driver coils, being charged simultaneously with electric current driven in coherent directions to induce a combined eddy current and one of the coils is used as a receiver coil to sense the eddy current, with the combined eddy current to be orthogonal to the receiver coil. Each coil alternates to be one of the driver coils or the receiver coil at a predetermined switching sequence and a predetermined switching frequency during consecutive time intervals. The eddy current probe provides advantages of inspecting a test surface for flaws of any flaw orientation with one pass of scan, providing sufficient sensitivity and desirable noise cancellation in all directions.Type: GrantFiled: July 30, 2010Date of Patent: August 27, 2013Assignee: Olympus NDT Inc.Inventor: Benoit Lepage
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Publication number: 20130197841Abstract: Disclosed is a method and a phased array inspection device enabling calibration of the device with an optimized pulse rate, the pulse rate is derived based on the true adaptive value of the impedance of the specific phased array probe circuit or the pulser circuit and the circuit energy consumption limitations. The energy consumption limitations include the total energy made available by the power supply to the pulser and probe circuit and the pulser energy consumption with limitation due to pulser circuit's physical limit such as thermal limitation.Type: ApplicationFiled: January 27, 2012Publication date: August 1, 2013Applicant: Olympus NDT, Inc.Inventors: Christian SIMARD, Denys Laquerre
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Patent number: 8490491Abstract: A method and apparatus for effecting ultrasonic flaw detection of an object processes an echo signal received from the object being tested in at least three signal channels, wherein the echo signal is scaled to different degrees along each channel to increase and extend the dynamic range of an associated A/D converter system, in a manner which dispenses with the need for using numerous analog high pass and low pass filters and a variable gain amplifier. This reduces complexity and avoids performance limitations. The digital to analog converters sample the differently scaled input signal and a selection circuit selects the output of the digital output obtained from that analog to digital converter which has the highest gain, but which has not overflowed. The digital outputs are seamlessly merged to produce an output that can be displayed as a scan display which shows the location of faults.Type: GrantFiled: February 25, 2010Date of Patent: July 23, 2013Assignee: Olympus NDTInventor: Andrew Thomas
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Patent number: 8448518Abstract: Disclosed is a wear plate assembly for NDT/NDI probes which provides sufficient protection for the probe being wrung against test objects, desirable acoustic performance meeting the requirements for versatile ultrasonic inspections while providing a mechanism that allows the transducer to be put into or taken out conveniently. The wear plate protects probes from being pieced, worn or structurally deformed albeit being thinner than a wavelength of the acoustic echoes.Type: GrantFiled: June 11, 2010Date of Patent: May 28, 2013Assignee: Olympus NDTInventors: Daniel Stephen Kass, Matthew Edward Stanton, Thomas J. Nelligan
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Patent number: 8421802Abstract: A peak visualization enhancement system for use with a non-destructive inspection (NDI) instrument using a digital display which replicates the haloing effect of analog cathode ray tube (CRT) displays. A peak detection algorithm is provided which intelligently selects the peak values from within the uncompressed digitized waveform while taking measures to prevent noise spikes and the like from being identified as valid waveform peaks. The digital display then highlights the identified peaks, or a subset of the identified peaks, on the compressed waveform display. In this way the effect of bright spots (halos) about the zero slope points on a waveform displayed on an analog CRT is replicated in a digitally compressed waveform display.Type: GrantFiled: March 6, 2009Date of Patent: April 16, 2013Assignee: Olympus NDTInventors: Andrew R. Thomas, Steven Besser, Daniel Kass, Erich Henjes, Ehab Ghabour, Marc Dulac, Paul J. DeAngelo
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Patent number: 8408061Abstract: An apparatus for performing ultrasonic inspection of an object, during one measurement on the object, triggers a sequence of excitations of the probe system and receives a sequence of substantially identical echo signals reflected from the object, and further scales each echo signal to different degrees to increase and extend the dynamic range of the echo signals. An A/D converter is then used to digitize the scaled signal sequentially in a manner which dispenses the need for using numerous A/D converters and the associated filters. The digitized signal samples are then combined to produce a single digital output in a manner that is not over-flowed and with desirable resolution.Type: GrantFiled: December 2, 2009Date of Patent: April 2, 2013Assignee: Olympus NDTInventor: Andrew Thomas
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Publication number: 20130060488Abstract: A system and method suitable for producing user designated views of non-destructive inspection target with adjustable color, opacity and/or fill-patterns in coordination of the display of inspection scan images. The geometric definition of the inspection target and the inspection scan area are both prepared by independent processes under which vertices and respective primitives are established. The inspection target primitives are given an alpha texture that includes color, opacity and/or fill-pattern designated by the user. The scan area primitives are mapped by a color and/or opacity texture representing inspection signal information such as amplitude. An efficient commercially available graphics accelerator is used to render both of the images of inspection target's chosen view and that of scanned area. The method allows implementation in real-time and on hand-held devices.Type: ApplicationFiled: September 2, 2011Publication date: March 7, 2013Applicant: OLYMPUS NDT INC.Inventors: Ehab Ghabour, Daniel Stephen Kass
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Patent number: 8371151Abstract: The present invention relates to a method of detecting non-linear operation of a measuring device comprising an array of transducers and at least one receiver channel portion. The method comprises receiving measured signals through transducers of the array, processing the measured signals from the transducers through the receiver channel portion, combining the processed measured signals to produce a combined measurement signal, and detecting non-linearity of the combined measurement signal and non-linear operation of the measuring device by detecting saturation of the receiver channel portion. In one embodiment, the receiver channel portion comprises an analog-to-digital converter, a threshold is assigned to a digital output of the analog-to-digital converter, and saturation of the receiver channel portion is detected when the digital output of the analog-to-digital converter oversteps the assigned threshold. In one application of the invention, the measuring device is a non-destructive testing device.Type: GrantFiled: December 29, 2010Date of Patent: February 12, 2013Assignee: Olympus NDTInventors: Pierre Langlois, Michael Drummy
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Patent number: 8365602Abstract: A weld seam tracking device for tracking weld seams on pipes or the like uses NDT/NDI sensor(s) in conjunction with an NDT/NDI operation, such as an ultrasonic phased array (PA) inspection. Processing of the weld seam tracking data is integrated or combined with the existing data processing element of the existing NDT/NDI inspection devices. Wide scanning areas of phased array probes allow weld seam tracking and inspection to be performed using a single set of probe and data processing elements to achieve both fault scanning and seam tracking with a single run of the PA scan.Type: GrantFiled: October 9, 2009Date of Patent: February 5, 2013Assignee: Olympus NDT, Inc.Inventors: Christophe Claude Imbert, Jinchi Zhang
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Publication number: 20130030726Abstract: Disclosed are a method and an NDT/NDI inspection device deploying digital circuitry to conduct detection and compensation of phase and amplitude shift in responding signals. A digital waveform generator, such as a direct digital synthesizer (DDS) is used to generate a digital sine-wave of a specific frequency and amplitude, mimicking the pulser frequency and amplitude. The sine-wave is converted to analog signal through a DAC and transmitted to the transducer. The received analog sine-wave from the transducer is converted back to a digital signal through an ADC. The transmitted and received digital signals are then compared for phase and amplitude differences. A null circuit involving another waveform generating component is employed to compensate the detected phase and amplitude differences. As a result the phase and amplitude differences are effectively eliminated before being further processed and analyzed for defects information.Type: ApplicationFiled: July 29, 2011Publication date: January 31, 2013Applicant: OLYMPUS NDT INC.Inventors: Andrew THOMAS, Marc DULAC
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Patent number: 8336365Abstract: Disclosed is a method and an NDT/NDI calibration process that automatically detects erroneous TOF readings by providing a predetermined time acceptance window. During the calibration process, TOF readings acquired by a UT device are validated to determine whether the TOF reading for the thin test block falls within the range of the predetermined time acceptance window. If the TOF reading for the thin block (T2) falls out of the predetermined time acceptance window, the operator is alerted of an error and to repeat the TOF test for the thin block.Type: GrantFiled: March 22, 2011Date of Patent: December 25, 2012Assignee: Olympus NDT Inc.Inventors: Paul Joseph Deangelo, Steven Abe Labreck