Abstract: Disclosed is a phased array ultrasound total focusing method in which the ultrasound energy is transmitted as plane waves and the response signals are processed as plane waves. The processing is adaptively corrected to account for geometric variations in the probes and the part being inspected. Methods are disclosed for measuring the geometric variations of the probes and the part.

Abstract: Disclosed is an electronic system for resetting the voltage of a charge-sensitive pre-amplifier having input from an X-ray detector and output to an ADC. The pre-amplifier gain is increased so that the RMS ADC noise is less than 1% of a representative digitized X-ray signal. The reset logic is configured to avoid loss of X-ray counts and to prevent the pre-amplifier output being outside the allowable input range of the ADC. Reset is initiated when the pre-amplifier output rises above an upper level, which is below the maximum allowable ADC input. Reset is also initiated when a pile-up event is detected, provided that such reset will not cause the pre-amplifier output to fall below the minimum allowable ADC input. At each reset a known amount of charge is removed from the pre-amplifier, and the reset time is continuously adjusted to ensure that the charge amount does not drift.

Abstract: A phased array ultrasonic inspection system configured for weld inspection includes a data analysis process with automated and optimized gating to take into account the actual distance between a phased array probe and a weld line. The system embodies a weld tracking module and a dynamic gating module. The tracking module produces dynamically corrected overlays of the weld line based on the echo signals, the dynamically corrected overlays having a series of offsets from the corresponding initial overlays. The dynamic gating module purposefully positions a plurality of data analysis gates to filter out noise signals caused by sources unrelated to the weld, and to provide dynamic target gating adjusted by at least part of the offset.

Abstract: Disclosed is a flexible ultrasonic transducer in which a single layer serves dual function as both a matching layer and a flexible circuit for making electrical connections, and there is no separate matching layer. Also disclosed is a method of assembling the flexible transducer.

Abstract: Disclosed is an attachable spacer applied to the front base plate of a hand-held and self-contained XRF testing device that holds the face plate at a forwards tilt towards a test sample, and ensures that only the top rim of the face plate ever touches a test sample. The resulting triangular gap minimizes contact between the front plate window and the test surface, prevents the transfer of heat to the XRF testing device's circuitry, and locks in a fixed distance between the face plate of the XRF testing device and the sample being tested.

Abstract: Disclosed is a probe holder for in-line inspection of the surface of bars of high value alloys. To attain full coverage of the inspected surface, the bar is rotated while either the bar or the probe holder is translated. The probe holder of the invention ensures constant probe lift-off by allowing the probe to move freely under its own weight, while constraining the motion to be only in the radial direction of the bar. The lift-off distance is defined by a spacer which is made of soft material to avoid damaging the inspected surface. Although the spacer is soft, its wear due to friction with the rotating bar is minimized by minimizing the pressure between the spacer and the bar. This is achieved by resting most of the mechanism weight on two rollers, with only the much smaller weight of the probe resting on the spacer.

Abstract: Disclosed are circuits for automatic calibration of the gain of electronic amplification and digitization systems for use with X-ray detectors. The calibration is based on injecting predetermined pulses into the electronic system and deriving a calibration ratio based the digital value of their amplitude with the digital value of the same pulses, unamplified and digitized with a high accuracy reference ADC. All ADCs, as well as the DACs used to control the pulser amplitude are referenced to a single common reference voltage. Calibration for non-linearity of the gain is disclosed with an alternative embodiment for the same circuits.

Abstract: A rotary bolt hole eddy current inspection scanner using a differential eddy current probe, the circuitry of the scanner is embodied with a filtering circuit with three filters: FIR (Finite Impulse Response), a low pass filter, and a phase control filter (by means of a Hilbert transform). The result from a scan of a bolt hole is an output signal on an impedance plane exhibiting a “backwards 6” shape of stable size when the scanner changes its rotating rate significantly.

Abstract: Disclosed is an ultrasonic IRIS inspection system and a method of providing automatically compensated concentric B-scans by means of curve-fitting the unadjusted tube boundaries from inspection data, and from the curve fitted theoretical circle, using non-linear regression analysis to determine an adjusted center. The off-center distance between the adjust center and the misaligned center is then used to produce concentric inspection result by compensating the unadjusted inspection result with the off-center distance.

Abstract: Disclosed is a touchscreen display assembly for use in harsh environments. The touchscreen cable emerges from the touchscreen through a hole in a glass panel. The hole is inside the perimeter of a sealing strip which forms the seal for the touchscreen airgap. The touchscreen may be assembled and tested independently, and subsequently integrated with a display screen and protective front cover. The seal to the front cover is made without the need for a bezel overlapping the touchscreen top film, thereby avoiding possible damage to the touchscreen. Elimination of the bezel allows the touchscreen display assembly to have an attractive planar front surface, and also avoids accumulation of dirt between a bezel and the touchscreen top film.

Abstract: Disclosed is a test stand that supports and stabilizes a handheld XRF analyzer, and holds a body of sample to be tested. The test stand allows both horizontal and vertical analysis positions of the analyzer. The preferred embodiment of the test stand comprises a shielded X-ray chamber in which samples are tested and which affixes to the XRF analyzer's window via a spring loaded handle, a stabilizing base to which the analyzer's handle is situated, and a stanchion for horizontal mounting of the XRF analyzer. In the horizontal orientation, the chamber contains an adjustable platform and soil sample retainer to facilitate the positioning of the sample to be tested. The stanchion can be stored under the base.

Abstract: Disclosed is a sample handling assembly facilitating a sample holding cell used for XRD analysis. The assembly holds the sample cell upright during sample loading and analysis phases. The sample handling assembly is vibrated, partly by a tuning fork, to allow the powder to flow into the sample cell. After the XRD analysis, a rotating arm holding the sample cell is rotated 180° to orient the sample cell completely upside down so that the sample can be emptied. Also disclosed are jets of air that are pulsed onto the sample cell, and/or into the sample cell funnel-tube assembly, to shake and clean the components.

Abstract: A non-destructive testing and inspection (NDT/NDI) system and method operable to conduct an ultrasonic scanning test on a test object that synchronizes and merges the apertures of two or more NDT sub-instruments in frequency and phase. Disclosed are a method of using a Phased Lock Loop (PLL) as a synchronizing clock/trigger generator, and also a method of using a General Positioning Clock (GPS) and a pulse per second (PPS) output. Both methods combine ultrasonic scanning data acquisition from two or more NDT sub-instruments, and transform the sub-instruments into one bigger NDT instrument.

Abstract: Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.

Abstract: Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes.

Abstract: Disclosed is phased array inspection system with automatically generated PAUT scan plan based on a set of configurable probe operation parameters and a combination of preferred code requirement and rules given by PAUT expertise. The complex code requirements and PAUT expertise are pre-assembled into a plurality of templates applicable to categories of inspection tasks by PAUT experts. Requirements and optimization scoring schemes are then used to automatically score each of specifically proposed scan plan setup, including the selection of probe operation parameters against the corresponding template for a specific task. This allows less skilled field inspector to operate with the correct interpretation of the complex code and accurate evaluation of the scan plan.

Abstract: An adjustable probe holder assembly is disclosed for an inspection or measurement sensor, such as an ultrasound transducer, eddy current sensor, magnetic thickness sensor or optical image sensor, in order to position the sensor in a confined space using an extended arm with an adjustable curvature. The probe holder has at least two elongated holding arms, among which a first arm and a second arm, each having a probe end and a holding end, wherein the probe end of each of the holding arms are attached to the probe and the at least two arms remain substantially parallel and very close to each other when the probe holder is at a non-operational status. The two arms bulge open away from each other due to either a tension force or a compression force being exerted along the longitudinal direction of either one of the arms, holding the probe to be against the test surface of the test object.

Abstract: Disclosed is a portable non-destructive testing (NDT) instrument system that transmits spectrum data measured from a test material sample to a remotely located computer for computation of the sample's atomic element composition. The atomic element composition is subsequently transmitted back to the portable instrument for display to the operator in real time. The precision and accuracy of the compositional computation is improved by the greater processing power of the high performance remote computer. The operator of the NDT instrument may choose to use the remote computer to perform part or all of the compositional computation.