Patents Assigned to OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS, INC
  • Publication number: 20170074831
    Abstract: Disclosed is a composite focusing wedge for ultrasonic non-destructive testing/inspection. The composite wedge comprises a base made of machined or cast material, and a lens made of a material which is cast in liquid form and subsequently solidifies. The acoustic velocity in the base material is less than that in the lens material. The castable lens material conforms exactly to a convex machined or cast surface of the base, thereby forming a concave lower surface of the lens. A flat ultrasonic probe is coupled to a planar upper surface of the lens. The minimum distance between the lower concave and upper planar surfaces of the lens is less than one acoustic wavelength in the lens material. The ringdown time of reverberations between the two surfaces is then sufficiently short that there is no interference between the reverberations and signals from sub-surface flaws in the object being tested.
    Type: Application
    Filed: September 11, 2015
    Publication date: March 16, 2017
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Jinchi Zhang, C. Tricia Liu, Jason Habermehl
  • Publication number: 20170030867
    Abstract: Disclosed is a probe holder for in-line inspection of the surface of bars of high value alloys. To attain full coverage of the inspected surface, the bar is rotated while either the bar or the probe holder is translated. The probe holder of the invention ensures constant probe lift-off by allowing the probe to move freely under its own weight, while constraining the motion to be only in the radial direction of the bar. The lift-off distance is defined by a spacer which is made of soft material to avoid damaging the inspected surface. Although the spacer is soft, its wear due to friction with the rotating bar is minimized by minimizing the pressure between the spacer and the bar. This is achieved by resting most of the mechanism weight on two rollers, with only the much smaller weight of the probe resting on the spacer.
    Type: Application
    Filed: July 31, 2015
    Publication date: February 2, 2017
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventor: Denis Faucher
  • Patent number: 9523660
    Abstract: The method for calibrating an inspection instrument coupled with acoustic transducers disposed at circumferential positions distributed around a surface of an elongated object to inspect generally has the steps of: for each one of the circumferential positions, measuring a first and a second received signal using two acoustic transducers disposed at two axial positions along the object, the received signals resulting from the propagation of an acoustic guided wave signal along the object; identifying an acoustic mode according to the first received and the second received signals using a known period of time associated with the propagation of the acoustic guided wave signal between the two axial positions along the object; and determining a coupling coefficient associated with the acoustic mode, the coupling coefficient being indicative of the coupling of the acoustic transducers on the object; and calibrating the inspection instrument coupled to the object based on the coupling coefficients.
    Type: Grant
    Filed: March 31, 2015
    Date of Patent: December 20, 2016
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Benoit Lepage, Guillaume Painchaud-April
  • Publication number: 20160290973
    Abstract: The phased-array probe to be received on a probe receiving area of a wedge generally has a probe housing, a plurality of acoustic transducer elements disposed in the probe housing and distributed along a length of a working surface of the probe housing, and a matching layer covering the plurality of acoustic transducer elements and extending to cover an extended region of the working surface of the probe housing such that the matching layer forms a closed contact with an upper end of an acoustic damping junction of the wedge when the working surface of the probe housing of the phased-array probe is received on the probe receiving area of the wedge, wherein the closed contact prevents acoustic energy from being reflected from the extended region of the working surface of the probe housing.
    Type: Application
    Filed: March 31, 2016
    Publication date: October 6, 2016
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventor: Jinchi Zhang
  • Publication number: 20160290972
    Abstract: The method for calibrating an inspection instrument coupled with acoustic transducers disposed at circumferential positions distributed around a surface of an elongated object to inspect generally has the steps of: for each one of the circumferential positions, measuring a first and a second received signal using two acoustic transducers disposed at two axial positions along the object, the received signals resulting from the propagation of an acoustic guided wave signal along the object; identifying an acoustic mode according to the first received and the second received signals using a known period of time associated with the propagation of the acoustic guided wave signal between the two axial positions along the object; and determining a coupling coefficient associated with the acoustic mode, the coupling coefficient being indicative of the coupling of the acoustic transducers on the object; and calibrating the inspection instrument coupled to the object based on the coupling coefficients.
    Type: Application
    Filed: March 31, 2015
    Publication date: October 6, 2016
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Benoit Lepage, Guillaume Painchaud-April
  • Publication number: 20160258888
    Abstract: Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test target's responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and a window protecting film assembly allowing X-rays to pass through and providing protection to the window, the film assembly being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film assembly presently in use. An embodiment of the film assembly comprises a thin film fixed with an adhesive layer to a supporting frame having a closely spaced array of apertures.
    Type: Application
    Filed: May 17, 2016
    Publication date: September 8, 2016
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Peter Hardman, Fabrice Cancre
  • Publication number: 20160238566
    Abstract: Disclosed is phased array inspection system with automatically generated PAUT scan plan based on a set of configurable probe operation parameters and a combination of preferred code requirement and rules given by PAUT expertise. The complex code requirements and PAUT expertise are pre-assembled into a plurality of templates applicable to categories of inspection tasks by PAUT experts. Requirements and optimization scoring schemes are then used to automatically score each of specifically proposed scan plan setup, including the selection of probe operation parameters against the corresponding template for a specific task. This allows less skilled field inspector to operate with the correct interpretation of the complex code and accurate evaluation of the scan plan.
    Type: Application
    Filed: February 13, 2015
    Publication date: August 18, 2016
    Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Benoit LePage, Martin St-Laurent
  • Publication number: 20160231289
    Abstract: Disclosed is an NDT/NDI probe array and manufacturing method. The probe array includes a sheet of flexible circuit 10 with a plurality of lower pins 102 and corresponding, electrically connected, upper pins 104. The probe further comprises a backing block 12, a layer of piezoelectric ceramic 16 having a plurality of conductive elements 162, a matching layer 18 and a frame 14. An adhesive material such as epoxy is applied to the circuit, the backing, the ceramic and the matching layer, and all are aligned and stack pressed at least partially into the frame and permanently bonded in such a fashion that each of the lower pins of the flexible circuit is firmly and permanently in contact with a corresponding one of the conductive elements of the ceramic.
    Type: Application
    Filed: January 29, 2016
    Publication date: August 11, 2016
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: James Laudermilch, Terry Wray
  • Publication number: 20160202093
    Abstract: An adjustable probe holder assembly is disclosed for an inspection or measurement sensor, such as an ultrasound transducer, eddy current sensor, magnetic thickness sensor or optical image sensor, in order to position the sensor in a confined space using an extended arm with an adjustable curvature. The probe holder has at least two elongated holding arms, among which a first arm and a second arm, each having a probe end and a holding end, wherein the probe end of each of the holding arms are attached to the probe and the at least two arms remain substantially parallel and very close to each other when the probe holder is at a non-operational status. The two arms bulge open away from each other due to either a tension force or a compression force being exerted along the longitudinal direction of either one of the arms, holding the probe to be against the test surface of the test object.
    Type: Application
    Filed: January 9, 2015
    Publication date: July 14, 2016
    Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Matthew Edward Stanton, Ernest Bill
  • Patent number: 9390520
    Abstract: Disclosed is a method and system to provide an improved signal representation of non-destructive test/inspection instruments by proper color display, in order to emulate as closely as possible, the visual rendering effect of those seen in the traditional non-electronic testing, including penetrant testing and magnetic particle testing. The foregoing object of the invention is preferably realized by providing an eddy current or phased array instrument with a color palette module that allows the deployment of an array of color representation system typically used in traditional non-electronic testing methods.
    Type: Grant
    Filed: August 15, 2013
    Date of Patent: July 12, 2016
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventor: Tommy Bourgelas
  • Patent number: 9372164
    Abstract: Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test target's responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and at least one window protecting film allowing X-rays to pass through and providing protections to the window, the film being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film presently in use.
    Type: Grant
    Filed: April 10, 2014
    Date of Patent: June 21, 2016
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Fabrice Cancre, Ted Michael Shields, Jiawei Tan
  • Publication number: 20160146759
    Abstract: A rotary bolt hole eddy current inspection scanner using a differential eddy current probe, the circuitry of the scanner is embodied with a filtering circuit with three filters: FIR (Finite Impulse Response), a low pass filter, and a phase control filter (by means of a Hilbert transform). The result from a scan of a bolt hole is an output signal on an impedance plane exhibiting a “backwards 6” shape of stable size when the scanner changes its rotating rate significantly.
    Type: Application
    Filed: November 21, 2014
    Publication date: May 26, 2016
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventor: Andrew Thomas
  • Publication number: 20160123908
    Abstract: Disclosed is a sample handling assembly facilitating a sample holding cell used for XRD analysis. The assembly holds the sample cell upright during sample loading and analysis phases. The sample handling assembly is vibrated, partly by a tuning fork, to allow the powder to flow into the sample cell. After the XRD analysis, a rotating arm holding the sample cell is rotated 180° to orient the sample cell completely upside down so that the sample can be emptied. Also disclosed are jets of air that are pulsed onto the sample cell, and/or into the sample cell funnel-tube assembly, to shake and clean the components.
    Type: Application
    Filed: October 8, 2015
    Publication date: May 5, 2016
    Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Philippe Christian Sarrazin, Aaron Troy Baensch, Will M. Brunner
  • Patent number: 9297865
    Abstract: Disclosed is a Hall Effect instrument with the capability of compensating for temperature drift consistently, accurately and in real time of operation. The instrument embodies a four-point ohmmeter circuit measuring Hall Effect sensor resistance and tracking the effect of temperature on the Hall Effect sensor. The instrument takes into account a relationship between the temperature and a temperature compensation index on a per probe basis, which has exhibited a deterministic difference observed by the present inventor.
    Type: Grant
    Filed: January 21, 2015
    Date of Patent: March 29, 2016
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventors: Andrew Thomas, Steven Besser
  • Publication number: 20160084777
    Abstract: Disclosed is an attachable spacer applied to the front base plate of a hand-held and self-contained XRF testing device that holds the face plate at a forwards tilt towards a test sample, and ensures that only the top rim of the face plate ever touches a test sample. The resulting triangular gap minimizes contact between the front plate window and the test surface, prevents the transfer of heat to the XRF testing device's circuitry, and locks in a fixed distance between the face plate of the XRF testing device and the sample being tested.
    Type: Application
    Filed: September 23, 2014
    Publication date: March 24, 2016
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Kenneth Lee Smith, JR., Ted Michael Shields
  • Patent number: 9292035
    Abstract: Disclosed are a method of and an apparatus devising a packet based DDS circuitry for performing packet based a direct digital synthesizing (DDS) function within an electronic testing instrument. The circuitry comprising a DDS logic circuit configured to execute direct digital syntheses on a plurality of consecutive packets of sine-like waves, each packet having a length of a period precisely chosen such that the sine wave at the end of one packet matches up with the sine wave at the start of the immediate subsequent packet. Also disclosed is an eddy current testing circuitry using multiple outputs of the single packet based DDS, one of the output is used in a circuit producing reference signals approximating the response signals. With the usage of the packet based DDS, the reference signal can be highly effective in nulling the unchanging portion of the response signals.
    Type: Grant
    Filed: January 24, 2014
    Date of Patent: March 22, 2016
    Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.
    Inventor: Andrew Thomas
  • Publication number: 20160069995
    Abstract: Disclosed is an ultrasonic IRIS inspection system and a method of providing automatically compensated concentric B-scans by means of curve-fitting the unadjusted tube boundaries from inspection data, and from the curve fitted theoretical circle, using non-linear regression analysis to determine an adjusted center. The off-center distance between the adjust center and the misaligned center is then used to produce concentric inspection result by compensating the unadjusted inspection result with the off-center distance.
    Type: Application
    Filed: September 5, 2014
    Publication date: March 10, 2016
    Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS, INC.
    Inventors: Tommy Bourgelas, Martin St-Laurent, Guillaume Painchaud-April
  • Publication number: 20160025686
    Abstract: A non-destructive testing and inspection (NDT/NDI) system and method operable to conduct an ultrasonic scanning test on a test object that synchronizes and merges the apertures of two or more NDT sub-instruments in frequency and phase. Disclosed are a method of using a Phased Lock Loop (PLL) as a synchronizing clock/trigger generator, and also a method of using a General Positioning Clock (GPS) and a pulse per second (PPS) output. Both methods combine ultrasonic scanning data acquisition from two or more NDT sub-instruments, and transform the sub-instruments into one bigger NDT instrument.
    Type: Application
    Filed: July 16, 2015
    Publication date: January 28, 2016
    Applicant: Olympus Scientific Solutions Americas Inc.
    Inventors: Christian Simard, Benjamin Couillard
  • Patent number: D769447
    Type: Grant
    Filed: October 15, 2015
    Date of Patent: October 18, 2016
    Assignee: Olympus Scientific Solutions Americas Inc.
    Inventors: Azeddine Choumach, Cole Derby, Daniel Harden
  • Patent number: D769746
    Type: Grant
    Filed: June 20, 2014
    Date of Patent: October 25, 2016
    Assignee: Olympus Scientific Solutions Americas Inc.
    Inventor: Jean-Francois Houde