Abstract: An x-ray reflecting system comprising a Kirkpatrick-Baez side-by-side optic in a single corner configuration having multi-layer Bragg x-ray reflective surfaces.
Type:
Grant
Filed:
February 19, 1998
Date of Patent:
March 21, 2000
Assignee:
Osmic, Inc.
Inventors:
George Gutman, Licai Jiang, Boris Verman
Abstract: An x-ray reflecting system comprising a plurality of x-ray reflectors, wherein the x-ray reflectors are coupled together to form a Kirkpatrick-Baez side-by-side system of multiple corners and may include multi-layer or graded-d multi-layer Bragg x-ray reflective surfaces.
Type:
Grant
Filed:
February 19, 1998
Date of Patent:
January 11, 2000
Assignee:
OSMIC, Inc.
Inventors:
George Gutman, Licai Jiang, Boris Verman
Abstract: An optical system for providing a steerable monochromatized source of x-ray or neutron radiation. The system incorporates a radiation source and a Bragg structure reflective optical element. A stage causes the optical element to move relative to the radiation source. Such movement is coordinated with lateral d-layer grading such that Bragg's law of reflection is satisfied for radiation of a given wavelength bandwidth to be reflected at various instances and departure angles.
Abstract: This invention relates to novel methods of producing flat and curved optical elements with laterally and depth graded multilayer thin films, in particular multilayers of extremely high precision, for use with soft and hard x-rays and neutrons and the optical elements achieved by these methods. In order to improve the performance of an optical element, errors in d spacing and curvature are isolated and subsequently compensated.
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