Patents Assigned to Otsuka Electronic Co., Ltd.
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Patent number: 10480997Abstract: An optical measurement apparatus includes: a probe including a transmissive optical member having a reference surface, the probe being configured to irradiate a sample with light through the reference surface, and receive a first reflected light from the reference surface, a second reflected light from a front side of the sample, and a third reflected light from a back side of the sample; and a calculator configured to calculate a first distance from the reference surface to the front side of the sample with use of a first reflection interference light to be generated by the first reflected light and the second reflected light, and to calculate a thickness of the sample with use of a second reflection interference light to be generated by the second reflected light and the third reflected light.Type: GrantFiled: May 17, 2019Date of Patent: November 19, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Toshiki Shinke, Shiro Kawaguchi, Nobuyuki Inoue
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Patent number: 10481001Abstract: An optical spectrum measuring apparatus includes: a CCD (Charge Coupled Device) detector including a plurality of light-receiving devices that are two-dimensionally arranged; an optical system configured to split incident light into rays and irradiate the CCD detector with the rays; and a restriction unit configured to restrict one or more rows and/or one or more columns out of the rows and columns of the plurality of light-receiving devices from being irradiated with light from the optical system.Type: GrantFiled: January 9, 2018Date of Patent: November 19, 2019Assignee: Otsuka Electronics Co., Ltd.Inventor: Goro Maeda
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Publication number: 20190331842Abstract: A confocal optical system-based measurement apparatus includes: a light source; a light projecting optical fiber group; a light receiving optical fiber group; a spectroscope; and a confocal optical system configured to condense each of a plurality of beams from a plurality of light projecting optical fibers to irradiate a sample therewith, and cause a plurality of beams from a plurality of condensing points on the sample to form images on the plurality of light receiving optical fibers, respectively, wherein the light projecting optical fiber group includes the plurality of light projecting optical fibers configured to receive light from the light source, the light receiving optical fiber group includes the plurality of light receiving optical fibers configured to guide received light to the spectroscope, the shape of an end face of the light projecting optical fiber group and the shape of an end face of the light receiving optical fiber group are in a mirror image relationship, and in the light projecting opType: ApplicationFiled: March 29, 2019Publication date: October 31, 2019Applicant: Otsuka Electronics Co., Ltd.Inventors: Haruka OTSUKA, Hisashi SHIRAIWA, Tsutomu MIZUGUCHI
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Patent number: 10429238Abstract: There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.Type: GrantFiled: August 15, 2017Date of Patent: October 1, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Nobuyuki Inoue, Taku Nagashima
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Patent number: 10422694Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: GrantFiled: February 8, 2019Date of Patent: September 24, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
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Patent number: 10422695Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: GrantFiled: February 8, 2019Date of Patent: September 24, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
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Patent number: 10330530Abstract: A reference light source device for calibration of a spectral radiance meter includes an integrating sphere having a radiance reference plane, which is an opening; and a plurality of first optical ports, which are formed apart from each other in an outer wall of the integrating sphere to allow light rays with equivalent wavelength characteristics to enter an interior of the integrating sphere.Type: GrantFiled: March 24, 2015Date of Patent: June 25, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Hisashi Shiraiwa, Hiroyuki Sano
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Publication number: 20190176157Abstract: A measurement apparatus includes: a sample holder on which a plurality of samples can be placed; a measurement unit configured to measure the plurality of samples placed on the sample holder; and a control unit configured to control a position of the measurement unit relative to a sample to be measured. The sample holder includes a substrate, and a holding unit configured to hold the sample. The substrate is provided with a plurality of holding units. The holding unit is configured to hold each of a plurality of samples having different shapes at a center position of the holding unit.Type: ApplicationFiled: November 23, 2018Publication date: June 13, 2019Applicant: Otsuka Electronics Co., Ltd.Inventor: Hisashi SHIRAIWA
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Publication number: 20190170577Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: ApplicationFiled: February 8, 2019Publication date: June 6, 2019Applicant: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
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Publication number: 20190170578Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: ApplicationFiled: February 8, 2019Publication date: June 6, 2019Applicant: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
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Patent number: 10309767Abstract: An optical measurement method with an optical measurement apparatus including an irradiation optical system and a measurement optical system is provided. The optical measurement method includes obtaining a distribution of actually measured values when angles of incidence are different for the same sample, calculating a modification factor depending on an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light, and calculating optical characteristics including a refractive index of the sample based on a group of pixel values in one row or a plurality of rows along any one direction in the distribution of the actually measured values and a corresponding modification factor.Type: GrantFiled: June 4, 2018Date of Patent: June 4, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Nobuyuki Inoue, Kunikazu Taguchi
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Patent number: 10288412Abstract: An optical measurement apparatus includes an irradiation optical system which linearly irradiates a measurement target with measurement light having a certain wavelength range, a measurement optical system which receives linear measurement interference light which is transmitted light or reflected light originating from the measurement target as a result of irradiation with the measurement light, and a processing device. The processing device includes a first calculation module that calculates a modification factor depending on with an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light and a second calculation module that calculates optical characteristics of the measurement target by applying the corresponding modification factor to a value for each pixel included in the two-dimensional image.Type: GrantFiled: June 4, 2018Date of Patent: May 14, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Nobuyuki Inoue, Kunikazu Taguchi
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Publication number: 20190139249Abstract: An optical characteristics measuring method for measuring optical characteristics of a subject, the optical characteristics measuring method including: a step of acquiring one or more captured images including the subject, using an image capturing apparatus that is located at a predetermined distance from the subject, and is configured to be displaceable relative to the subject, while maintaining the predetermined distance; and a step of creating, based on the one or more captured images thus acquired, a virtual image including the subject and acquired from one or more analysis points each located at a position other than a position on a plane that includes the trajectory of the image capturing apparatus.Type: ApplicationFiled: October 26, 2018Publication date: May 9, 2019Applicant: Otsuka Electronics Co., Ltd.Inventors: Yoshihiko NISHIDA, Yoshi ENAMI, Nobuyuki INOUE
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Patent number: 10222261Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: GrantFiled: July 1, 2016Date of Patent: March 5, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
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Patent number: 10168142Abstract: An optical characteristic measuring apparatus includes an optical system, a detector, and an analysis unit. The optical system collects detection light incident from a sample. The detector spectrally disperses the detection light in plural times to generate plural pieces of detection data, the plural pieces of detection data indicating their respective spectra of detection light incident from the sample to the optical system with an optical distance between the sample and the optical system being different from each other. The analysis unit analyzes the spectrum indicated by the detection data to measure a predetermined optical characteristic of the sample. The analysis unit specifies a piece of the detection data to be used for measuring the optical characteristic based on intensity of the detection light in the plural pieces of detection data, and measures the optical characteristic based on the specified piece of the detection data.Type: GrantFiled: December 18, 2017Date of Patent: January 1, 2019Assignee: OTSUKA ELECTRONICS CO., LTD.Inventors: Sota Okamoto, Yuki Sasaki, Seon Heum Na
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Publication number: 20180347965Abstract: An optical measurement method with an optical measurement apparatus including an irradiation optical system and a measurement optical system is provided. The optical measurement method includes obtaining a distribution of actually measured values when angles of incidence are different for the same sample, calculating a modification factor depending on an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light, and calculating optical characteristics including a refractive index of the sample based on a group of pixel values in one row or a plurality of rows along any one direction in the distribution of the actually measured values and a corresponding modification factor.Type: ApplicationFiled: June 4, 2018Publication date: December 6, 2018Applicant: Otsuka Electronics Co., Ltd.Inventors: Nobuyuki INOUE, Kunikazu TAGUCHI
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Publication number: 20180347964Abstract: An optical measurement apparatus includes an irradiation optical system which linearly irradiates a measurement target with measurement light having a certain wavelength range, a measurement optical system which receives linear measurement interference light which is transmitted light or reflected light originating from the measurement target as a result of irradiation with the measurement light, and a processing device. The processing device includes a first calculation module that calculates a modification factor depending on with an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light and a second calculation module that calculates optical characteristics of the measurement target by applying the corresponding modification factor to a value for each pixel included in the two-dimensional image.Type: ApplicationFiled: June 4, 2018Publication date: December 6, 2018Applicant: Otsuka Electronics Co., Ltd.Inventors: Nobuyuki INOUE, Kunikazu TAGUCHI
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Patent number: 10127472Abstract: A light distribution characteristic measurement apparatus includes an imaging unit disposed at a predetermined distance from a light source, a movement mechanism that successively changes a positional relation of the imaging unit with respect to the light source, while keeping the distance between the light source and the imaging unit, and a processing module that calculates the light distribution characteristic of the light source. The processing module obtains a plurality of image data taken under a first imaging condition and a plurality of image data taken under a second imaging condition different from the first condition, and determines corrected image information corresponding to a relative position of interest, from first image information corresponding to the relative position of interest included in the image data taken under the first condition and second image information corresponding to the relative position of interest included in the image data taken under the second condition.Type: GrantFiled: February 11, 2016Date of Patent: November 13, 2018Assignee: Otsuka Electronics Co., Ltd.Inventors: Yoshi Enami, Yoshihiko Nishida
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Patent number: 10120177Abstract: An optical characteristic measurement apparatus which can be reduced in size and can achieve enhanced versatility is provided. The optical characteristic measurement apparatus includes a first optical element which converts measurement light from a measurement target object to parallel light, a reflective lens which reflects the parallel light from the first optical element to convert the parallel light to convergent light, a light reception portion which receives the convergent light from the reflective lens, and a drive mechanism which varies a position of the first optical element relative to the measurement target object.Type: GrantFiled: November 29, 2016Date of Patent: November 6, 2018Assignee: Otsuka Electronics Co., Ltd.Inventors: Sota Okamoto, Hiroyuki Sano
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Patent number: D869310Type: GrantFiled: March 21, 2018Date of Patent: December 10, 2019Assignee: Otsuka Electronics Co., Ltd.Inventors: Hiroya Nagasawa, Ikuo Wakayama, Kazuyoshi Kamekawa