Patents Assigned to Otsuka Electronic Co., Ltd.
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Publication number: 20180224331Abstract: An optical spectrum measuring apparatus includes: a CCD (Charge Coupled Device) detector including a plurality of light-receiving devices that are two-dimensionally arranged; an optical system configured to split incident light into rays and irradiate the CCD detector with the rays; and a restriction unit configured to restrict one or more rows and/or one or more columns out of the rows and columns of the plurality of light-receiving devices from being irradiated with light from the optical system.Type: ApplicationFiled: January 9, 2018Publication date: August 9, 2018Applicant: Otsuka Electronics Co., Ltd.Inventor: Goro MAEDA
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Patent number: 9921149Abstract: A controller of an optical measurement apparatus causes, in a condition that a rotational speed of a rotary body is controlled so that the speed is a specified value, a light source to generate light having a constant intensity and apply the light to an irradiation region, and acquires first timing information based on a change with time of an intensity of reflected light or transmitted light that is output from a second detection unit receiving the reflected light or transmitted light of the applied light. The controller causes the light source to periodically generate pulsed light in accordance with the first timing information and apply the pulsed light to the irradiation region, and acquires second timing information based on a result which is output from the first detection unit whose measurement is periodically enabled in accordance with the first timing information.Type: GrantFiled: April 24, 2015Date of Patent: March 20, 2018Assignee: Otsuka Electronics Co., Ltd.Inventor: Tsutomu Mizuguchi
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Publication number: 20180073923Abstract: There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.Type: ApplicationFiled: August 15, 2017Publication date: March 15, 2018Applicant: Otsuka Electronics Co., Ltd.Inventors: Nobuyuki INOUE, Taku NAGASHIMA
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Patent number: 9891105Abstract: A microspectroscope includes: a light source; a plurality of light projecting optical fibers that receive light from the light source; a spectroscope; a plurality of light receiving optical fibers for guiding received light to the spectroscope; and a confocal optical system for causing each of a plurality of beams from the plurality of light projecting optical fibers to be condensed and irradiated onto a sample, and forming images of a plurality of beams from a plurality of condensing points on the sample, respectively on the plurality of light receiving optical fibers.Type: GrantFiled: July 14, 2016Date of Patent: February 13, 2018Assignee: Otsuka Electronics Co., Ltd.Inventor: Hisashi Shiraiwa
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Patent number: 9746374Abstract: A spectrophotometer includes a photodetection unit configured to convert received light into an electric signal to output the electric signal; a circuit unit including a plurality of gain amplifiers and a plurality of AD converters configured to amplify an output signal from the photodetection unit by a plurality of gains using the plurality of gain amplifiers and configured to convert the amplified output signals into digital signals using the plurality of AD converters to output the digital signals as a plurality of pieces of light amount data; a saturation determination unit configured to determine whether or not each of the plurality of pieces of light amount data from the circuit unit has been saturated; and a measurement result calculation unit configured to calculate, in accordance with a result of the determination by the saturation determination unit, a measurement result of the received light using a part or all of the plurality of pieces of light amount data.Type: GrantFiled: February 26, 2014Date of Patent: August 29, 2017Assignee: OTSUKA ELECTRONICS CO., LTD.Inventor: Hisashi Shiraiwa
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Publication number: 20170184833Abstract: An optical characteristic measurement apparatus which can be reduced in size and can achieve enhanced versatility is provided. The optical characteristic measurement apparatus includes a first optical element which converts measurement light from a measurement target object to parallel light, a reflective lens which reflects the parallel light from the first optical element to convert the parallel light to convergent light, a light reception portion which receives the convergent light from the reflective lens, and a drive mechanism which varies a position of the first optical element relative to the measurement target object.Type: ApplicationFiled: November 29, 2016Publication date: June 29, 2017Applicant: Otsuka Electronics Co., Ltd.Inventors: Sota OKAMOTO, Hiroyuki SANO
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Publication number: 20170102321Abstract: A controller of an optical measurement apparatus causes, in a condition that a rotational speed of a rotary body is controlled so that the speed is a specified value, a light source to generate light having a constant intensity and apply the light to an irradiation region, and acquires first timing information based on a change with time of an intensity of reflected light or transmitted light that is output from a second detection unit receiving the reflected light or transmitted light of the applied light. The controller causes the light source to periodically generate pulsed light in accordance with the first timing information and apply the pulsed light to the irradiation region, and acquires second timing information based on a result which is output from the first detection unit whose measurement is periodically enabled in accordance with the first timing information.Type: ApplicationFiled: April 24, 2015Publication date: April 13, 2017Applicant: Otsuka Electronics Co., Ltd.Inventor: Tsutomu MIZUGUCHI
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Publication number: 20170059407Abstract: A microspectroscope includes: a light source; a plurality of light projecting optical fibers that receive light from the light source; a spectroscope; a plurality of light receiving optical fibers for guiding received light to the spectroscope; and a confocal optical system for causing each of a plurality of beams from the plurality of light projecting optical fibers to be condensed and irradiated onto a sample, and forming images of a plurality of beams from a plurality of condensing points on the sample, respectively on the plurality of light receiving optical fibers.Type: ApplicationFiled: July 14, 2016Publication date: March 2, 2017Applicant: Otsuka Electronics Co., Ltd.Inventor: Hisashi SHIRAIWA
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Publication number: 20170010214Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.Type: ApplicationFiled: July 1, 2016Publication date: January 12, 2017Applicant: Otsuka Electronics Co., Ltd.Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
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Patent number: 9500520Abstract: An optical measurement apparatus includes: a hollow cylindrical member having one plane with a first opening and the other plane with a second opening; a rotation mechanism for rotating the cylindrical member about a first axis; a support unit for arranging a light source at a measurement position which is on the first axis and from which the emitted light enters the cylindrical member through the first opening; a first reflection unit arranged inside the cylindrical member for reflecting the light emitted from the light source and entering through the first opening; a second reflection unit for reflecting the light inside the cylindrical member and propagating the light through the second opening along the first axis to the outside of the cylindrical member; and at least one third reflection unit for causing the light reflected by the first reflection unit to be incident on the second reflection unit.Type: GrantFiled: July 30, 2012Date of Patent: November 22, 2016Assignee: OTSUKA ELECTRONICS CO., LTD.Inventors: Kazuaki Ohkubo, Hisashi Shiraiwa
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Patent number: 9488568Abstract: Provided is a polarization analysis apparatus that can quickly measure the polarization properties of a sample. The polarization analysis apparatus includes a light source configured to emit light in a predetermined wavelength region, a polarizer configured to transmit the light emitted from the light source, a spatial phase modulator configured to transmit the light from the sample, an analyzer configured to transmit the light that has passed through the spatial phase modulator, and an imaging spectrometer configured to receive the light that has passed through the analyzer. The spatial phase modulator is formed of a birefringent material, and is configured to have different phase differences at respective positions in a first direction in a plane orthogonal to an optical axis. The imaging spectrometer disperses the received light in a second direction that is different from the first direction in the plane orthogonal to the optical axis.Type: GrantFiled: December 12, 2014Date of Patent: November 8, 2016Assignee: Otsuka Electronics Co., Ltd.Inventors: Kazuhiro Sugita, Yusuke Yamazaki, Haruka Otsuka
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Publication number: 20160239720Abstract: A light distribution characteristic measurement apparatus includes an imaging unit disposed at a predetermined distance from a light source, a movement mechanism that successively changes a positional relation of the imaging unit with respect to the light source, while keeping the distance between the light source and the imaging unit, and a processing module that calculates the light distribution characteristic of the light source. The processing module obtains a plurality of image data taken under a first imaging condition and a plurality of image data taken under a second imaging condition different from the first condition, and determines corrected image information corresponding to a relative position of interest, from first image information corresponding to the relative position of interest included in the image data taken under the first condition and second image information corresponding to the relative position of interest included in the image data taken under the second condition.Type: ApplicationFiled: February 11, 2016Publication date: August 18, 2016Applicant: Otsuka Electronics Co., Ltd.Inventors: Yoshi ENAMI, Yoshihiko NISHIDA
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Patent number: 9377352Abstract: A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.Type: GrantFiled: January 23, 2014Date of Patent: June 28, 2016Assignee: OTSUKA ELECTRONICS CO., LTD.Inventor: Kazuaki Ohkubo
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Patent number: 9239259Abstract: An optical measurement system includes an integrating sphere having a reflecting surface on its inner wall and having a first window. The optical measurement system further includes a support member for supporting a light source at a substantially central position of the integrating sphere, and a first baffle arranged on a line connecting the first window and the light source supported by the support member. The support member is connected, in a region opposite to the first window with respect to the light source, to the inner wall of the integrating sphere.Type: GrantFiled: October 13, 2011Date of Patent: January 19, 2016Assignees: OTSUKA ELECTRONICS CO., LTD., LABSPHERE, INC.Inventors: Kazuaki Ohkubo, Greg McKee
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Patent number: 9163985Abstract: A spectral characteristic measurement apparatus includes a spectrometer for spatially dispersing incident light depending on wavelengths and a detection portion for receiving light dispersed by the spectrometer. The detection portion includes a first detection area on which a component in a first wavelength range is incident and a second detection area on which a component in a second wavelength range is incident. The apparatus includes a correction portion for correcting stray light detected by the detection portion derived from light to be measured. The correction portion corrects a stray light pattern based on a first amount of change with respect to wavelengths in the first wavelength range of the stray light pattern and a second amount of change with respect to wavelengths included in a result of detection in the first detection area of the detection portion, to calculate a stray light component derived from the light to be measured.Type: GrantFiled: August 26, 2013Date of Patent: October 20, 2015Assignee: Otsuka Electronics Co., Ltd.Inventors: Hiroyuki Sano, Suguru Irie, Tsutomu Mizuguchi
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Publication number: 20150260569Abstract: An optical measurement apparatus includes: a hollow cylindrical member having one plane with a first opening and the other plane with a second opening; a rotation mechanism for rotating the cylindrical member about a first axis; a support unit for arranging a light source at a measurement position which is on the first axis and from which the emitted light enters the cylindrical member through the first opening; a first reflection unit arranged inside the cylindrical member for reflecting the light emitted from the light source and entering through the first opening; a second reflection unit for reflecting the light inside the cylindrical member and propagating the light through the second opening along the first axis to the outside of the cylindrical member; and at least one third reflection unit for causing the light reflected by the first reflection unit to be incident on the second reflection unit.Type: ApplicationFiled: July 30, 2012Publication date: September 17, 2015Applicant: OTSUKA ELECTRONICS CO., LTD.Inventors: Kazuaki Ohkubo, Hisashi Shirawa
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Patent number: 9127832Abstract: A light source support apparatus includes: a base member; a first support member supporting the base member rotatably about a first axis; first and second arm members connected respectively to opposite ends of the base member and extending in a direction parallel to the first axis; and a pair of second support members disposed at respective positions, which are opposite to each other, of the first and second arm members for supporting a sample light source. The pair of second support members is configured to be able to rotate the supported sample light source about a second axis orthogonal to the first axis. At least one of the first and second arm members is configured to be attachable to and detachable from the base member.Type: GrantFiled: January 30, 2013Date of Patent: September 8, 2015Assignee: OTSUKA ELECTRONICS CO., LTD.Inventors: Hisashi Shiraiwa, Takeshi Kamada
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Patent number: 8999131Abstract: An electrophoretic mobility measurement cell includes a container having a rectangular parallelepiped internal space for introducing a sample solution, two electrodes for applying an electric field to the internal space, tubular sample injection and extraction portions in communication with the internal space, first and second caps for covering the sample injection and extraction portions and sealing the internal space, the first cap has a first side surface contacting an inner side surface of the tubular sample injection portion, the inner side surface formed so that the cross-sectional area of the tube increases with distance from the internal space, and the area of the cross section of the first side surface decreases in the direction of insertion of the first cap. The cell and electrode portions are formed integrally, the electrode portions are made disposable together with the cell, and bubbles are unlikely to remain during injection of the sample solution.Type: GrantFiled: October 3, 2013Date of Patent: April 7, 2015Assignee: Otsuka Electronics Co., Ltd.Inventors: Mayumi Ikegami, Katsuhiro Morisawa, Tamotsu Hamao, Hidehiro Atagi
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Patent number: 8982341Abstract: A light distribution characteristic measurement apparatus includes: a detecting unit for detecting light from a light source; a mirror for reflecting the light from the light source to direct the light to the detecting unit; a movement mechanism for moving the detecting unit and the mirror relatively to the light source; a rotation mechanism for rotating the mirror while maintaining an optical path length from the light source to the detecting unit; and a processor adapted to calculate the light distribution characteristic of the light source, based on a plurality of measurement results that are detected by the detecting unit under a condition that the detecting unit and the mirror are arranged at a plurality of measurement positions relative to the light source and the mirror is oriented at different rotational angles for each measurement position.Type: GrantFiled: August 20, 2013Date of Patent: March 17, 2015Assignee: Otsuka Electronics Co., Ltd.Inventor: Yoshi Enami
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Patent number: 8970835Abstract: An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.Type: GrantFiled: November 6, 2012Date of Patent: March 3, 2015Assignee: Otsuka Electronics Co., Ltd.Inventors: Kazuaki Ohkubo, Hisashi Shiraiwa