Patents Assigned to Otsuka Electronics Co., Ltd.
  • Patent number: 10480997
    Abstract: An optical measurement apparatus includes: a probe including a transmissive optical member having a reference surface, the probe being configured to irradiate a sample with light through the reference surface, and receive a first reflected light from the reference surface, a second reflected light from a front side of the sample, and a third reflected light from a back side of the sample; and a calculator configured to calculate a first distance from the reference surface to the front side of the sample with use of a first reflection interference light to be generated by the first reflected light and the second reflected light, and to calculate a thickness of the sample with use of a second reflection interference light to be generated by the second reflected light and the third reflected light.
    Type: Grant
    Filed: May 17, 2019
    Date of Patent: November 19, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Toshiki Shinke, Shiro Kawaguchi, Nobuyuki Inoue
  • Patent number: 10481001
    Abstract: An optical spectrum measuring apparatus includes: a CCD (Charge Coupled Device) detector including a plurality of light-receiving devices that are two-dimensionally arranged; an optical system configured to split incident light into rays and irradiate the CCD detector with the rays; and a restriction unit configured to restrict one or more rows and/or one or more columns out of the rows and columns of the plurality of light-receiving devices from being irradiated with light from the optical system.
    Type: Grant
    Filed: January 9, 2018
    Date of Patent: November 19, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Goro Maeda
  • Publication number: 20190331842
    Abstract: A confocal optical system-based measurement apparatus includes: a light source; a light projecting optical fiber group; a light receiving optical fiber group; a spectroscope; and a confocal optical system configured to condense each of a plurality of beams from a plurality of light projecting optical fibers to irradiate a sample therewith, and cause a plurality of beams from a plurality of condensing points on the sample to form images on the plurality of light receiving optical fibers, respectively, wherein the light projecting optical fiber group includes the plurality of light projecting optical fibers configured to receive light from the light source, the light receiving optical fiber group includes the plurality of light receiving optical fibers configured to guide received light to the spectroscope, the shape of an end face of the light projecting optical fiber group and the shape of an end face of the light receiving optical fiber group are in a mirror image relationship, and in the light projecting op
    Type: Application
    Filed: March 29, 2019
    Publication date: October 31, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Haruka OTSUKA, Hisashi SHIRAIWA, Tsutomu MIZUGUCHI
  • Patent number: 10429238
    Abstract: There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.
    Type: Grant
    Filed: August 15, 2017
    Date of Patent: October 1, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Nobuyuki Inoue, Taku Nagashima
  • Patent number: 10422694
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Grant
    Filed: February 8, 2019
    Date of Patent: September 24, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
  • Patent number: 10422695
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Grant
    Filed: February 8, 2019
    Date of Patent: September 24, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
  • Patent number: 10330530
    Abstract: A reference light source device for calibration of a spectral radiance meter includes an integrating sphere having a radiance reference plane, which is an opening; and a plurality of first optical ports, which are formed apart from each other in an outer wall of the integrating sphere to allow light rays with equivalent wavelength characteristics to enter an interior of the integrating sphere.
    Type: Grant
    Filed: March 24, 2015
    Date of Patent: June 25, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hisashi Shiraiwa, Hiroyuki Sano
  • Publication number: 20190176157
    Abstract: A measurement apparatus includes: a sample holder on which a plurality of samples can be placed; a measurement unit configured to measure the plurality of samples placed on the sample holder; and a control unit configured to control a position of the measurement unit relative to a sample to be measured. The sample holder includes a substrate, and a holding unit configured to hold the sample. The substrate is provided with a plurality of holding units. The holding unit is configured to hold each of a plurality of samples having different shapes at a center position of the holding unit.
    Type: Application
    Filed: November 23, 2018
    Publication date: June 13, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventor: Hisashi SHIRAIWA
  • Publication number: 20190170578
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Application
    Filed: February 8, 2019
    Publication date: June 6, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
  • Publication number: 20190170577
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Application
    Filed: February 8, 2019
    Publication date: June 6, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro OSAWA, Tsutomu MIZUGUCHI, Munehiro NOGUCHI
  • Patent number: 10309767
    Abstract: An optical measurement method with an optical measurement apparatus including an irradiation optical system and a measurement optical system is provided. The optical measurement method includes obtaining a distribution of actually measured values when angles of incidence are different for the same sample, calculating a modification factor depending on an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light, and calculating optical characteristics including a refractive index of the sample based on a group of pixel values in one row or a plurality of rows along any one direction in the distribution of the actually measured values and a corresponding modification factor.
    Type: Grant
    Filed: June 4, 2018
    Date of Patent: June 4, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Nobuyuki Inoue, Kunikazu Taguchi
  • Patent number: 10288412
    Abstract: An optical measurement apparatus includes an irradiation optical system which linearly irradiates a measurement target with measurement light having a certain wavelength range, a measurement optical system which receives linear measurement interference light which is transmitted light or reflected light originating from the measurement target as a result of irradiation with the measurement light, and a processing device. The processing device includes a first calculation module that calculates a modification factor depending on with an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light and a second calculation module that calculates optical characteristics of the measurement target by applying the corresponding modification factor to a value for each pixel included in the two-dimensional image.
    Type: Grant
    Filed: June 4, 2018
    Date of Patent: May 14, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Nobuyuki Inoue, Kunikazu Taguchi
  • Publication number: 20190139249
    Abstract: An optical characteristics measuring method for measuring optical characteristics of a subject, the optical characteristics measuring method including: a step of acquiring one or more captured images including the subject, using an image capturing apparatus that is located at a predetermined distance from the subject, and is configured to be displaceable relative to the subject, while maintaining the predetermined distance; and a step of creating, based on the one or more captured images thus acquired, a virtual image including the subject and acquired from one or more analysis points each located at a position other than a position on a plane that includes the trajectory of the image capturing apparatus.
    Type: Application
    Filed: October 26, 2018
    Publication date: May 9, 2019
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiko NISHIDA, Yoshi ENAMI, Nobuyuki INOUE
  • Patent number: 10222261
    Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
    Type: Grant
    Filed: July 1, 2016
    Date of Patent: March 5, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro Osawa, Tsutomu Mizuguchi, Munehiro Noguchi
  • Patent number: 10168142
    Abstract: An optical characteristic measuring apparatus includes an optical system, a detector, and an analysis unit. The optical system collects detection light incident from a sample. The detector spectrally disperses the detection light in plural times to generate plural pieces of detection data, the plural pieces of detection data indicating their respective spectra of detection light incident from the sample to the optical system with an optical distance between the sample and the optical system being different from each other. The analysis unit analyzes the spectrum indicated by the detection data to measure a predetermined optical characteristic of the sample. The analysis unit specifies a piece of the detection data to be used for measuring the optical characteristic based on intensity of the detection light in the plural pieces of detection data, and measures the optical characteristic based on the specified piece of the detection data.
    Type: Grant
    Filed: December 18, 2017
    Date of Patent: January 1, 2019
    Assignee: OTSUKA ELECTRONICS CO., LTD.
    Inventors: Sota Okamoto, Yuki Sasaki, Seon Heum Na
  • Publication number: 20180347965
    Abstract: An optical measurement method with an optical measurement apparatus including an irradiation optical system and a measurement optical system is provided. The optical measurement method includes obtaining a distribution of actually measured values when angles of incidence are different for the same sample, calculating a modification factor depending on an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light, and calculating optical characteristics including a refractive index of the sample based on a group of pixel values in one row or a plurality of rows along any one direction in the distribution of the actually measured values and a corresponding modification factor.
    Type: Application
    Filed: June 4, 2018
    Publication date: December 6, 2018
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Nobuyuki INOUE, Kunikazu TAGUCHI
  • Publication number: 20180347964
    Abstract: An optical measurement apparatus includes an irradiation optical system which linearly irradiates a measurement target with measurement light having a certain wavelength range, a measurement optical system which receives linear measurement interference light which is transmitted light or reflected light originating from the measurement target as a result of irradiation with the measurement light, and a processing device. The processing device includes a first calculation module that calculates a modification factor depending on with an angle of incidence on the measurement optical system from each measurement point in association with a region in the two-dimensional image corresponding to each measurement point in the measurement target irradiated with the measurement light and a second calculation module that calculates optical characteristics of the measurement target by applying the corresponding modification factor to a value for each pixel included in the two-dimensional image.
    Type: Application
    Filed: June 4, 2018
    Publication date: December 6, 2018
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Nobuyuki INOUE, Kunikazu TAGUCHI
  • Patent number: 10127472
    Abstract: A light distribution characteristic measurement apparatus includes an imaging unit disposed at a predetermined distance from a light source, a movement mechanism that successively changes a positional relation of the imaging unit with respect to the light source, while keeping the distance between the light source and the imaging unit, and a processing module that calculates the light distribution characteristic of the light source. The processing module obtains a plurality of image data taken under a first imaging condition and a plurality of image data taken under a second imaging condition different from the first condition, and determines corrected image information corresponding to a relative position of interest, from first image information corresponding to the relative position of interest included in the image data taken under the first condition and second image information corresponding to the relative position of interest included in the image data taken under the second condition.
    Type: Grant
    Filed: February 11, 2016
    Date of Patent: November 13, 2018
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshi Enami, Yoshihiko Nishida
  • Patent number: 10120177
    Abstract: An optical characteristic measurement apparatus which can be reduced in size and can achieve enhanced versatility is provided. The optical characteristic measurement apparatus includes a first optical element which converts measurement light from a measurement target object to parallel light, a reflective lens which reflects the parallel light from the first optical element to convert the parallel light to convergent light, a light reception portion which receives the convergent light from the reflective lens, and a drive mechanism which varies a position of the first optical element relative to the measurement target object.
    Type: Grant
    Filed: November 29, 2016
    Date of Patent: November 6, 2018
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Sota Okamoto, Hiroyuki Sano
  • Patent number: D869310
    Type: Grant
    Filed: March 21, 2018
    Date of Patent: December 10, 2019
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hiroya Nagasawa, Ikuo Wakayama, Kazuyoshi Kamekawa