Patents Assigned to Otsuka Electronics Co., Ltd.
  • Publication number: 20120229803
    Abstract: A spectral characteristic measurement method for measuring spectral characteristics of measured light with higher accuracy is provided. The spectral characteristic measurement method includes causing an optical measurement instrument having detection sensitivity in a first wavelength range to receive light in a second wavelength range which is a part of the first wavelength range, obtaining characteristic information indicating a stray light component from a portion of a first spectrum detected by the optical measurement instrument, that corresponds to a range other than the second wavelength range, and obtaining a pattern indicating a stray light component generated in the optical measurement instrument by subjecting the characteristic information to extrapolation processing as far as the second wavelength range in the first wavelength range.
    Type: Application
    Filed: February 16, 2012
    Publication date: September 13, 2012
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki SANO, Kunikazu TAGUCHI
  • Patent number: 8169608
    Abstract: An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum.
    Type: Grant
    Filed: November 29, 2011
    Date of Patent: May 1, 2012
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki Sano, Makoto Okawauchi, Kosei Oshima, Kazuaki Ohkubo, Tsutomu Mizuguchi, Shiro Shima
  • Patent number: 8169607
    Abstract: A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.
    Type: Grant
    Filed: October 4, 2009
    Date of Patent: May 1, 2012
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki Sano, Makoto Okawauchi, Kosei Oshima, Kazuaki Ohkubo, Tsutomu Mizuguchi, Shiro Shima
  • Patent number: 8164632
    Abstract: A picture is scrolled on a display 5 to be measured, and the scrolling moving picture is pursuit-captured by a color camera 3 so as to obtain a pursuit-captured moving picture image. A moving picture response curve using received light intensity data obtained based upon the pursuit-captured moving picture image is converted into a color moving picture response curve using emission intensity of display elements of the display 5 to be measured. The coloration of an edge part of the pursuit-captured moving picture image is decomposed into the respective color components, by which objective quantitative evaluations of color shifting can be made.
    Type: Grant
    Filed: February 27, 2007
    Date of Patent: April 24, 2012
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Yoshi Enami, Yoshihisa Furukawa, Hiroyuki Nakamoto, Tsutomu Mizuguchi
  • Publication number: 20120075628
    Abstract: An optical characteristic measurement device includes a photodetector and a processor. The photodetector has a detection surface greater than a light incident surface receiving light from a spectrometer. The processor is configured to obtain a measurement spectrum detected in a first detection area corresponding to the light incident surface and a signal intensity detected in a second detection area different from the light incident surface, correct a pattern prepared in advance and exhibiting a noise characteristic of the photodetector based on the signal intensity to calculate a first correction spectrum, subtract a correction value calculated based on the signal intensity from each component value of the measurement spectrum to calculate a second correction spectrum, and subtract each component value of the first correction spectrum from a corresponding component value of the second correction spectrum to calculate an output spectrum.
    Type: Application
    Filed: November 29, 2011
    Publication date: March 29, 2012
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki SANO, Makoto OKAWAUCHI, Kosei OSHIMA, Kazuaki OHKUBO, Tsutomu MIZUGUCHI, Shiro SHIMA
  • Patent number: 8119996
    Abstract: A sample that is an object whose quantum efficiency is to be measured, and a standard object having a known reflectance characteristic are each attached to a sample window provided in a plane mirror. Based on respective spectrums measured by a spectrometer in respective cases where the sample is attached and the standard object is attached, the quantum efficiency of the sample is measured. The plane of an opening of an observation window is made substantially coincident with the exposed surface of the sample or standard object, so that direct incidence, on the observation window, of the fluorescence generated from the sample receiving an excitation light and the excitation light reflected from sample is prevented.
    Type: Grant
    Filed: January 20, 2009
    Date of Patent: February 21, 2012
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Kazuaki Ohkubo
  • Publication number: 20120019831
    Abstract: An optical measurement apparatus using an optical fiber to measure the characteristic of an object to be measured arranged along the circumference of a circle includes a first pulley, a second pulley which is turnable on its own axis at a second angular velocity while revolving about the first pulley at a first angular velocity, and the optical fiber which is held by the second pulley and projects detection light on the object to be measured and receives reflected light from the object to be measured. The first angular velocity and the second angular velocity are the same in magnitude and opposite in the direction. Occurrence of a twist in the optical fiber is suppressed, and therefore, the optical measurement apparatus is capable of measuring the characteristics of the object to be measured with high accuracy.
    Type: Application
    Filed: July 21, 2011
    Publication date: January 26, 2012
    Applicants: TOPPAN PRINTING CO., LTD., Otsuka Electronics Co., Ltd.
    Inventors: Hidehiro ATAGI, Shuichi Yamada, Masanori Nakano, Eiji Kawata, Shuichi Akashi, Hiroyuki Kuroki
  • Publication number: 20120018280
    Abstract: A transferred object rotating device includes a mounting plate having an opening corresponding to a shape of a transferred object and being capable of moving from a mounting position to a rotating position, a boost unit capable of moving up to pass through the opening of the mounting plate in the rotating position, and a rotation plate capable of rotating about a power transmission shaft. The mounting plate moves to the rotating position after the transferred object is mounted on the mounting plate to close the opening. The transferred object is lifted by upward movement of the boost unit. The transferred object rotates while being sandwiched between the boost unit and the rotation plate. The transferred object mounted on the mounting plate in the mounting position can be transferred to the rotating position by the mounting plate, and rotate in the rotating position.
    Type: Application
    Filed: July 21, 2011
    Publication date: January 26, 2012
    Applicants: TOPPAN PRINTING CO., LTD., Otsuka Electronics Co., Ltd.
    Inventors: Tamotsu Hamao, Akira Tanaka, Eiji Kawata, Shuichi Akashi, Hiroyuki Kuroki
  • Publication number: 20110235036
    Abstract: An optical measurement apparatus includes a spectroscopic measurement device, a first optical fiber for propagating light to be measured, a hemispherical portion having a light diffuse reflection layer on an inner wall of the hemispherical portion, and a plane portion disposed to close an opening of the hemispherical portion and having a mirror reflection layer located to face the inner wall of the hemispherical portion. The plane portion includes a first window for directing the light emitted thorough the first optical fiber into an integrating space. The integrating space is formed by the hemispherical portion and the plane portion. The optical measurement apparatus further includes a second optical fiber for propagating the light in the integrating space to the spectroscopic measurement device through a second window of the plane portion.
    Type: Application
    Filed: February 25, 2011
    Publication date: September 29, 2011
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Kazuaki OHKUBO, Kunikazu Taguchi
  • Publication number: 20110226961
    Abstract: A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.
    Type: Application
    Filed: February 24, 2011
    Publication date: September 22, 2011
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro OSAWA, Kazuaki Ohkubo
  • Publication number: 20110205541
    Abstract: An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.
    Type: Application
    Filed: February 16, 2011
    Publication date: August 25, 2011
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Yoshihiro OSAWA, Kazuaki Ohkubo
  • Publication number: 20110155926
    Abstract: A sample that is an object whose quantum efficiency is to be measured, and a standard object having a known reflectance characteristic are each attached to a sample window provided in a plane mirror. Based on respective spectrums measured by a spectrometer in respective cases where the sample is attached and the standard object is attached, the quantum efficiency of the sample is measured. The plane of an opening of an observation window is made substantially coincident with the exposed surface of the sample or standard object, so that direct incidence, on the observation window, of the fluorescence generated from the sample receiving an excitation light and the excitation light reflected from sample is prevented.
    Type: Application
    Filed: January 20, 2009
    Publication date: June 30, 2011
    Applicant: Otsuka Electronics Co.,Ltd.
    Inventor: Kazuaki Ohkubo
  • Patent number: 7847819
    Abstract: A system is disclosed, which comprises a rotatable mirror 2, a camera 3 for taking an image of a screen 5 through the mirror 2, a photodetector 4 having a detection range covering a part of the screen 5, and a control section 6. At a time when a measuring pattern included in a moving image displayed on the screen 5 is detected by the photodetector 4, a detection signal is outputted from the photodetector 4. Based on the detection signal, the control section triggers the mirror 2 to rotate, and after the mirror 2 starts rotating, the control section 6 controls so that the mirror 2 rotates to follow the motion of the measuring pattern. It is possible to obtain images that trace the motion of the moving image on a detector plane of the camera 3 without resorting to electrical synchronization of the rotation of the mirror and moving image signals, and to measure the moving image quality of displays with a simple structure.
    Type: Grant
    Filed: June 6, 2003
    Date of Patent: December 7, 2010
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Koichi Oka
  • Patent number: 7847935
    Abstract: An FTIR measurement is conducted on a background gas to obtain a single beam spectrum SB(BG) [C] and a synthetic single beam spectrum SSB(BG)[D], and an FTIR measurement is conducted on a sample gas to obtain a single beam spectrum SB(Samp)[E] and a synthetic single beam spectrum SSB(Samp)[F].
    Type: Grant
    Filed: March 18, 2008
    Date of Patent: December 7, 2010
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Satoshi Nitta, Yoshihiro Osawa
  • Publication number: 20100296082
    Abstract: In a total luminous flux measurement apparatus according to an embodiment, a total luminous flux emitted by an object is calculated based on a result of measuring illuminances using a measuring unit when providing relative movement between the object and an integrating unit to expose a substantially entire light emitting surface of the object to an inner space of the integrating unit. Specifically, under conditions that the object is disposed to penetrate the integrating unit from one sample hole to the other sample hole, a luminous flux of a portion of the object within the inner space of the integrating unit is measured, then the integrating unit is moved relative to the object, and a luminous flux of a portion accordingly contained in the inner space of the integrating unit is measured.
    Type: Application
    Filed: May 13, 2010
    Publication date: November 25, 2010
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Kazuaki OHKUBO, Shunsuke Mishima
  • Patent number: 7808625
    Abstract: Disclosed is an aperture variable inspection optical system including a variable aperture unit 13 having a polygonal light transparent section and light collecting systems 12a, 12b for forming an irradiation spot U of light passing through the variable aperture unit 13 at the position of a sample S. The variable aperture unit 13 is capable of changing the shape/size of the polygon. The size of the irradiation spot U can be changed without rearranging the aperture unit.
    Type: Grant
    Filed: August 29, 2007
    Date of Patent: October 5, 2010
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Kenji Nakamura, Hisashi Shiraiwa
  • Publication number: 20100091280
    Abstract: A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.
    Type: Application
    Filed: October 4, 2009
    Publication date: April 15, 2010
    Applicant: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki SANO, Makoto Okawauchi, Kosei Oshima, Kazuaki Ohkubo, Tsutomu Mizuguchi, Shiro Shima
  • Patent number: 7663744
    Abstract: A mirror is provided with a light source window and an illumination window each establishing communicative connection between an inner face side and an outer side of a hemispherical unit. The light source window is an opening to which a light source OBJ to be measured is attached mainly. The illumination window is an opening for guiding a flux of light from a correcting light source used for measurement of self-absorption toward the inner face of the hemispherical unit. A self-absorption correcting coefficient of the light source OBJ is calculated based on an illuminance by a correcting flux of light in a case where the light source to be measured OBJ in a non-light emitting state is attached to the light source window and an illuminance by a correcting flux of light in a case where a calibration mirror is attached to the light source window.
    Type: Grant
    Filed: October 16, 2008
    Date of Patent: February 16, 2010
    Assignee: Otsuka Electronics Co., Ltd.
    Inventor: Kazuaki Ohkubo
  • Patent number: 7528967
    Abstract: A measurement-purpose light source generates a measurement light used for measuring an optical characteristic of an object to be measured, and the measurement light includes a component in a wavelength range for measurement of the optical characteristic of the object. An observation-purpose light source generates an observation light used for focusing on the object to be measured and checking a position of measurement. The observation light is selected such that the observation light includes a component that can be reflected from the object to be measured. The measurement light and the observation light are thus applied independently to the object to be measured, through a common objective lens, and accordingly improvement of the precision in measurement of the optical characteristic and facilitation of focusing on the object to be measured are achieved simultaneously.
    Type: Grant
    Filed: May 15, 2008
    Date of Patent: May 5, 2009
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Makoto Okawauchi, Tsutomu Mizuguchi, Shiro Kawaguchi
  • Publication number: 20090109428
    Abstract: A mirror is provided with a light source window and an illumination window each establishing communicative connection between an inner face side and an outer side of a hemispherical unit. The light source window is an opening to which a light source OBJ to be measured is attached mainly. The illumination window is an opening for guiding a flux of light from a correcting light source used for measurement of self-absorption toward the inner face of the hemispherical unit. A self-absorption correcting coefficient of the light source OBJ is calculated based on an illuminance by a correcting flux of light in a case where the light source to be measured OBJ in a non-light emitting state is attached to the light source window and an illuminance by a correcting flux of light in a case where a calibration mirror is attached to the light source window.
    Type: Application
    Filed: October 16, 2008
    Publication date: April 30, 2009
    Applicant: Otsuka Electronics Co., Ltd.
    Inventor: Kazuaki OHKUBO