Patents Assigned to Oxford Instruments Analytical Oy
  • Patent number: 9548402
    Abstract: A semiconductor radiation detector comprises a detector chip having a front side and a back side, and a support plate on the back side of the detector chip, having electric connections with said detector chip. A base plate has a thermoelectric cooler attached to it and contact pins protruding from the base plate towards said detector chip. A bonding plate is on an opposite side of said thermoelectric cooler than said base plate, and first wire bonded connections go between said contact pins and said bonding plate. A joint plate is between said bonding plate and said support plate, and electric connections between said support plate and said bonding plate go through said joint plate.
    Type: Grant
    Filed: December 8, 2014
    Date of Patent: January 17, 2017
    Assignee: Oxford Instruments Analytical Oy
    Inventor: Veikko Kämäräinen
  • Patent number: 9530902
    Abstract: A semiconductor device comprises a piece of semiconductor material. On a surface of said piece of semiconductor material, a number of electrodes exist and are configured to assume different electric potentials. A guard structure comprises a two-dimensional array of conductive patches, at least some of which are left to assume an electric potential under the influence of electric potentials existing at said electrodes.
    Type: Grant
    Filed: June 20, 2012
    Date of Patent: December 27, 2016
    Assignee: Oxford Instruments Analytical Oy
    Inventor: Pasi Kostamo
  • Patent number: 9310324
    Abstract: A portable X-ray fluorescence analyzer comprises a detector of ionizing radiation that is configured to detect radiation from spontaneous radioactive decay within an environment of the portable X-ray fluorescence analyzer and or ionizing radiation that propagates past a front end of the portable X-ray fluorescence analyzer towards its user.
    Type: Grant
    Filed: September 24, 2013
    Date of Patent: April 12, 2016
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Mikko Järvikivi, Jarmo Leino
  • Patent number: 9159849
    Abstract: A semiconductor detector head comprises a detector chip having a front side and a back side, and a substrate on the back side of said detector chip. Contact points are located on at least one of said substrate and said detector chip. A first set of contact pins protrude on an opposite side of said substrate than said detector chip. At least one of the contact pins of said first set is conductively coupled to at least one of said contact points. A base plate holds a second set of contact pins that protrude from said base plate towards the contact pins of said first set. Electric connections are made between matching pairs of contact pins of said first and second sets.
    Type: Grant
    Filed: May 24, 2013
    Date of Patent: October 13, 2015
    Assignee: Oxford Instruments Analytical Oy
    Inventor: Veikko Kämäräinen
  • Patent number: 9123837
    Abstract: A semiconductor radiation detector includes a bulk layer of semiconductor material. On a first side of said bulk layer is an arrangement of field electrodes and a collection electrode for collecting radiation-induced signal charges from said bulk layer. A radiation shield exists on a second side of said bulk layer, opposite to said first side, which radiation shield selectively overlaps the location of said collection electrode.
    Type: Grant
    Filed: May 31, 2013
    Date of Patent: September 1, 2015
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Hans Andersson, Pasi Kostamo, Veikko Kämäräinen, Seppo Nenonen
  • Publication number: 20150085976
    Abstract: A portable X-ray fluorescence analyzer comprises a detector of ionizing radiation that is configured to detect radiation from spontaneous radioactive decay within an environment of the portable X-ray fluorescence analyzer and or ionizing radiation that propagates past a front end of the portable X-ray fluorescence analyzer towards its user.
    Type: Application
    Filed: September 24, 2013
    Publication date: March 26, 2015
    Applicant: Oxford Instruments Analytical Oy
    Inventors: Mikko JÄRVIKIVI, Jarmo LEINO
  • Patent number: 8921797
    Abstract: A radiation detector comprises a piece of semiconducting material. On its surface, a number of consecutive electrode strips are configured to assume electric potentials of sequentially increasing absolute value. A field plate covers the most of a separation between a pair of adjacent electrode strips and is isolated from the most of said separation by an electric insulation layer. A bias potential is coupled to said field plate so that attracts surface-generated charge carriers.
    Type: Grant
    Filed: June 20, 2012
    Date of Patent: December 30, 2014
    Assignee: Oxford Instruments Analytical Oy
    Inventor: Pasi Kostamo
  • Publication number: 20140346630
    Abstract: A semiconductor detector head comprises a detector chip having a front side and a back side, and a substrate on the back side of said detector chip. Contact points are located on at least one of said substrate and said detector chip. A first set of contact pins protrude on an opposite side of said substrate than said detector chip. At least one of the contact pins of said first set is conductively coupled to at least one of said contact points. A base plate holds a second set of contact pins that protrude from said base plate towards the contact pins of said first set. Electric connections are made between matching pairs of contact pins of said first and second sets.
    Type: Application
    Filed: May 24, 2013
    Publication date: November 27, 2014
    Applicant: Oxford Instruments Analytical Oy
    Inventor: Veikko Kämäräinen
  • Patent number: 8494119
    Abstract: A radiation window membrane and for covering an opening in an X-ray device is presented, as well a method for its manufacturing. Said openings are such through which X-rays are to pass. The membrane comprises a window base layer and a pinhole-blocking layer on a surface of said window base layer. Said pinhole-blocking layer comprises graphene.
    Type: Grant
    Filed: June 18, 2010
    Date of Patent: July 23, 2013
    Assignee: Oxford Instruments Analytical Oy
    Inventor: Hans Andersson
  • Patent number: 7727796
    Abstract: A semiconductor radiation detector crystal is patterned by using a Q-switched laser to selectively remove material from a surface of said semiconductor radiation detector crystal, thus producing a groove in said surface that penetrates deeper than the thickness of a diffused layer on said surface.
    Type: Grant
    Filed: April 26, 2007
    Date of Patent: June 1, 2010
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Heikki Johannes Sipilä, Hans Andersson, Seppo Nenonen, Juha Jouni Kalliopuska
  • Patent number: 7660393
    Abstract: A gas tight radiation window membrane comprises a layered diffusion barrier with a reactive metal layer (201) covered on both sides by cover layers (202, 203). An originally continuous carrier layer (101) can be made a mesh that has openings coincident with openings of a reinforcement grid (105), while the gas tight diffusion barrier (107, 507) spans as a continuous film over said openings in said mesh.
    Type: Grant
    Filed: June 19, 2007
    Date of Patent: February 9, 2010
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Heikki Johannes Sipilä, Seppo Nenonen
  • Patent number: 7618906
    Abstract: A window membrane is permeable to electromagnetic radiation, especially soft X-rays. It comprises a film (201) and a metallic reinforcement mesh (202) attached to the film (201). A preferable way of attaching the metallic reinforcement mesh (202) to the film is to use a positive-working photosensitive glue (204) and allow the reinforcement mesh (202) to act as the exposure mask.
    Type: Grant
    Filed: November 17, 2005
    Date of Patent: November 17, 2009
    Assignee: Oxford Instruments Analytical Oy
    Inventor: Tomi Meilahti
  • Patent number: 7508906
    Abstract: An X-ray fluorescence measurement device comprises an X-ray source and a sample window for allowing X-rays from the X-ray source reach a sample. A filter arrangement between the X-ray source and the sample window includes a first filter layer comprising a first filtering element and a second filter layer including a second filtering element. The atomic number of the second filtering element is greater than the atomic number of the first filtering element. The first filter layer is between the X-ray source and the second filter layer.
    Type: Grant
    Filed: April 26, 2007
    Date of Patent: March 24, 2009
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Erikki Puusaari, Andy Ellis
  • Patent number: 7474730
    Abstract: An X-ray source (101) is configured to controllably irradiate a sample (105) with incident X-rays through a sample window (104) that has a two-dimensional area. A detector (102) is configured to detect fluorescent radiation coming from the irradiated sample. A carrier (301, 401, 402, 501, 601) is essentially transparent to X-rays and disposed to spatially coincide with a substantial part of the two-dimensional area of the sample window (104). Marker material (303, 403, 602), which is responsive to X-rays by emitting fluorescent radiation, is mechanically supported by said carrier and essentially evenly distributed across at least that part of the carrier that spatially coincides with said two-dimensional area of the sample window.
    Type: Grant
    Filed: October 17, 2006
    Date of Patent: January 6, 2009
    Assignee: Oxford Instruments Analytical OY
    Inventors: Erkki Tapani Puusaari, Oleg Shirokobrod
  • Patent number: 7443959
    Abstract: An X-ray fluorescence analyzer device comprises an X-ray source and a sample window. Between the X-ray source and the sample window there are a collimator plate with a plurality of microscopic pores and an annular plate comprising material essentially opaque to X-rays. The annular plate defines an area transparent to X-rays. The pores in said collimator plate let through collimated X-rays radiated by said X-ray source towards said sample window. The area transparent to X-rays in said annular plate spatially limits in a transverse direction a beam of X-rays radiated by said X-ray source towards said sample window.
    Type: Grant
    Filed: October 10, 2006
    Date of Patent: October 28, 2008
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Esko Juhani Kantonen, Heikki Johannes Sipilä
  • Patent number: 7426019
    Abstract: An arrangement and a method are provided for non-destructively analyzing the composition of a delicate sample. The value of the sample depends at least partly on absence of visual defects. A laser source (301) produces a pulsed laser beam, and focusing optics (302) focus said pulsed laser beam into a focal spot on the sample. A sensor (312) receives and detects optical emissions from particles of the sample excited by said pulsed laser beam. A processing subsystem (111) produces information of the composition of the sample based on the optical emissions detected by said sensor (312).
    Type: Grant
    Filed: May 4, 2006
    Date of Patent: September 16, 2008
    Assignee: Oxford Instruments Analytical Oy
    Inventor: Tero Eklin
  • Patent number: 7409037
    Abstract: An X-ray fluorescence analyzer has a structure that defines a chamber (102). There is a window (103) to the chamber in a surface that is to come next to a sample (101) outside the chamber. The window (103) comprises a foil that is permeable to X-rays. A detector (104) receives fluorescent X-rays through said window (103). A low pressure source (508) is coupled to the chamber (102) and configured to controllably lower the pressure of a gaseous medium in the chamber (102) to a pressure value between 760 torr and 10 torr. The X-ray fluorescence analyzer maintains a lowered pressure of a value between 760 torr and 10 torr in the chamber (102) for the duration of an X-ray fluorescence measurement.
    Type: Grant
    Filed: May 5, 2006
    Date of Patent: August 5, 2008
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Erkki Tapani Puusaari, Hannu Rintamäki
  • Patent number: 7394537
    Abstract: An apparatus for performing laser-induced breakdown spectroscopy comprises a handheld unit with a pump laser and a controller. A combination of a solid laser medium and a Q-switch receive a laser beam from said pump laser. Focusing optics focus laser pulses from said combination to a focal spot at a sample. Light collection optics collect light from plasma induced of sample material by focused laser pulses. A spectrometer receives collected light and produces information describing its spectral distribution. A power source delivers electric power to other parts of the apparatus. The pump laser, combination, focusing optics, light collection optics, spectrometer and power source are parts of said handheld unit.
    Type: Grant
    Filed: December 22, 2006
    Date of Patent: July 1, 2008
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Pamela Lindfors, Mikko Krapu
  • Patent number: 7233643
    Abstract: A measurement apparatus and method are provided for determining the material composition of a sample. An X-ray fluorescence detector (412) detects fluorescent X-rays coming from said sample under irradiation with incident X-rays. A laser source (301) is adapted to produce a laser beam. Focusing optics (302) focus said laser beam into a focal spot on a surface of said sample. An optical sensor (312) detects optical emissions coming from particles of said sample upon being exposed to said laser beam at said focal spot. A gas administration subsystem (104, 105, 106, 107, 108) is adapted to controllably deliver gas to a space (101) around said focal spot.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: June 19, 2007
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Heikki Johannes Sipilä, Tero Eklin, Kai Kuparinen
  • Patent number: 7203283
    Abstract: In an x-ray tube comprising a housing, which define an enclosure, a cathode arrangement, which emits electrons within the enclosure, and a window, which seals an end of the enclosure, the window comprises a carrier layer and, on a side of the carrier layer that faces the enclosure, a layered anode arrangement having certain characteristics.
    Type: Grant
    Filed: February 21, 2006
    Date of Patent: April 10, 2007
    Assignee: Oxford Instruments Analytical Oy
    Inventor: Erkki Tapani Puusaari