Patents Assigned to Oxford Instruments Analytical Oy
  • Patent number: 7193216
    Abstract: For compensating for the rate dependent change of charge-to-voltage conversion factor in a drift-type radiation detector there is detected a change in a momentary photon hit rate affecting said drift-type radiation detector. A drain current flowing through an integrated amplifier of said drift-type radiation detector is changed by an amount proportional to the detected change in said momentary photon hit rate.
    Type: Grant
    Filed: October 22, 2004
    Date of Patent: March 20, 2007
    Assignee: Oxford Instruments Analytical Oy
    Inventor: Erkki Sakari Kiuru
  • Patent number: 7078695
    Abstract: An antenna-coupled microbolometer structure comprises a substrate (301), an antenna (102, 103) supported by the substrate, and a thermally sensitive element (101, 305) connected to the antenna and arranged to dissipate electric currents induced into the antenna. Both the antenna (102, 103) and the thermally sensitive element (101, 305) comprise material that is susceptible to achieving a superconductive state below a certain critical temperature. The thermally sensitive element (101, 305) is supported at a distance from the substrate (301) leaving an empty gap (306) between the thermally sensitive element (101, 305) and a surface of the substrate (301).
    Type: Grant
    Filed: May 23, 2003
    Date of Patent: July 18, 2006
    Assignee: Oxford Instruments Analytical Oy
    Inventor: Arttu Luukanen
  • Patent number: 7065174
    Abstract: A portable measurement apparatus is presented for inducing and measuring fluorescent X-ray radiation. It comprises an X-ray source (303, 902, 1005, 1105) adapted to controllably irradiate a sample (301, 803) with X-rays, and a detector (305, 406, 1006, 1106) adapted to detect fluorescent radiation emitted by said sample (301, 803). The X-ray source (303, 902, 1005, 1105) is an X-ray tube, an anode of which comprises at least one of silver, rhodium and molybdenium. Consequently said X-ray tube is adapted to controllably emit L-line radiation of at least one of silver, rhodium and molybdenium.
    Type: Grant
    Filed: November 12, 2004
    Date of Patent: June 20, 2006
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Heikki Johannes Sipilä, Riitta Kaijansaari
  • Patent number: 7020238
    Abstract: The measurement head (101) of an X-ray fluorescence analyzer device is protected against heat from a hot target by using an adapter (201). It comprises a sheet of material having low thermal conductivity and has a three-dimensional shape that follows the form of a front part of the measurement head (101). Said sheet of material is attached to said measurement head (101) and has a central part (401) which defines an opening (202) coincident with a radiation window (109) in said measurement head (101). Said attachment means (204, 205, 301, 302, 311, 312) are located at a part of said sheet of material that is distant from said central part (401).
    Type: Grant
    Filed: January 31, 2005
    Date of Patent: March 28, 2006
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Esko Juhani Kantonen, Janne Adolf Petteri Kesälä, Erkki Tapani Puusaari, Heikki Johannes Sipilä
  • Patent number: 6967329
    Abstract: The invention relates to a radiation detector, an arrangement and a method for an energy-dispersive detection of X-ray photons. X-ray photons are allowed to collide (701) in the radiation detector (201, 601), whereby there are produced (702, 703, 704, 705, 706, 707, 708) observations of the X-ray photons that collided in the detector. According to the invention, there are separately produced observations of X-ray photons (702, 703, 704) that collided in the first detector space (205, 501) of the radiation detector and X-ray photons (705, 706, 707, 708) that collided in the second detector space (206, 502) of the radiation detector. The (712) observations of X-ray photons that collided in the first detector space (205, 501) are ignored, when there is received a simultaneous observation of an X-ray photon that collided in the second detector space.
    Type: Grant
    Filed: December 3, 2002
    Date of Patent: November 22, 2005
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Heikki Johannes Sipilä, Erkki Sakari Kiuru
  • Patent number: 6933503
    Abstract: An X-ray detector (401, 501, 601) has a detecting element that comprises a semiconductor heterostructure where an undoped Germanium layer (402, 502) is enclosed between two oppositely doped Gallium Arsenide layers (403, 404, 503, 505).
    Type: Grant
    Filed: June 11, 2003
    Date of Patent: August 23, 2005
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Heikki Johannes Sipilä, Jacques Bourgoin
  • Patent number: 6934021
    Abstract: A measurement device and method are provided for OES measurements in air. An arc electrode (201, 501) has a certain thickness and a pointed end having a certain grinding angle. Holding means (202, 502) hold the arc electrode (201, 501) at a certain distance from the material to be measured. A voltage and current supply (203) generates and maintains a voltage between the arc electrode and the material to be measured and supplies current through the arc. Focusing and detection optics (205, 206, 402, 403, 404, 405, 406, 407, 408, 505, 506, 509, 604) collect and detect optical radiation. The thickness of the arc electrode (201, 501) is between 3 and 10 mm and the grinding angle is between 50 and 130 degrees. The arc distance is between 0.5 and 3 mm. An ignition spark voltage is between 5 and 20 kV, an arc voltage between 20 and 160 V and an arc current between 1 and 10 A.
    Type: Grant
    Filed: August 27, 2003
    Date of Patent: August 23, 2005
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Tero Eklin, Mikko Krapu