Patents Assigned to Panalytical B.V.
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Patent number: 9658352Abstract: A measurement standard suitable for measuring amounts of certain elements in pharmaceutical excipients is described. A reference standard is dissolved in a solvent, for example acetone, and mixed with a pharmaceutical excipient such as cellulose, lactose or calcium carbonate. The solvent is then evaporated to provide a dry standard.Type: GrantFiled: January 9, 2015Date of Patent: May 23, 2017Assignee: PANALYTICAL B.V.Inventors: Mark Ingham, Leian Grimsley
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Patent number: 9640292Abstract: X-ray diffraction apparatus includes a flat graded multilayer 8 which may be used in a SAXS configuration for a sample 6. The apparatus may be adapted for Bragg-Brentano measurements by a collimator 16 without the need for alternate beam paths or complex arrangements.Type: GrantFiled: November 19, 2014Date of Patent: May 2, 2017Assignee: PANALYTICAL B.V.Inventors: Detlef Beckers, Stjepan Prugovecki
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Patent number: 9547094Abstract: X-ray analysis of a primary sample such as a flexible sheet 60 uses apparatus having a primary sample holder such as a material feed-through system 20 for moving the flexible sheet through the apparatus. An X-ray analysis head 6 containing an X-ray source and an X-ray detector is mounted on a robot arm 4. The robot arm moves in three dimensions so that the analysis head can be brought into position to measure the flexible sheet as it is being brought through the apparatus by the material feed-through system.Type: GrantFiled: February 17, 2015Date of Patent: January 17, 2017Assignee: PANALYTICAL B.V.Inventors: Jeroen Rinsema, Mark Alexander Pals
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Patent number: 9506880Abstract: A method of imaging phases in an inhomogeneous polycrystalline sample having a plurality of crystallites of at least a first crystalline component includes illuminating an illuminated area extending across a surface of a sample with substantially monochromatic X-rays incident at a Bragg-Brentano parafocussing geometry at first angle ?1 to the surface of the sample. X-rays diffracted by the sample at a second angle ?2 pass through a pinhole. The diffraction angle ?1+?2 fulfils a Bragg condition for the first crystalline component which is imaged by a detector to provide a two-dimensional image of the first crystalline component at the surface of the sample.Type: GrantFiled: June 23, 2014Date of Patent: November 29, 2016Assignee: PANALYTICAL B.V.Inventors: Detlef Beckers, Milen Gateshki
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Patent number: 9239305Abstract: A two or three part sample holder for X-ray apparatus has a sample ring 2 and a counter ring 20. The sample ring 2 has two opposed surfaces and foils 8, 10 one on each surface holding a powder sample 6 within the central hole 4. The sample ring 2 is relatively thin, of thickness 0.2 to 4 mm. A counter ring 20 is provided to engage with the sample ring 2 to provide increased strength and/or stiffness.Type: GrantFiled: April 24, 2013Date of Patent: January 19, 2016Assignee: PANALYTICAL B.V.Inventors: Charalampos Zarkadas, Ian Torquels Campbell, Youhong Xiao
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Patent number: 9110003Abstract: A method of X-ray diffraction illuminates a beam (4) of X-rays along an illuminated strip (16) on a surface (14) of a sample (10). The X-rays are diffracted by the sample (10) and pass through a mask (20) having a slit extending essentially perpendicularly to the strip (16). The X-rays are detected by a two-dimensional X-ray detector to measure the diffracted X-rays at different positions along the strip (16).Type: GrantFiled: February 28, 2013Date of Patent: August 18, 2015Assignee: PANALYTICAL B.V.Inventors: Detlef Beckers, Milen Gateshki
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Publication number: 20140146940Abstract: A two or three part sample holder for X-ray apparatus has a sample ring 2 and a counter ring. The sample ring 2 has two opposed surfaces and foils 8, 10 one on each surface holding a powder sample 6 within the central hole 4. The sample ring is relatively thin, of thickness 0.2 to 4 mm. A counter ring is provided to engage with the sample ring to provide increased strength and/or stiffness.Type: ApplicationFiled: April 24, 2013Publication date: May 29, 2014Applicant: PANalytical B.VInventor: PANalytical B.V.
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Publication number: 20130243159Abstract: A method of X-ray diffraction illuminates a beam (4) of X-rays along an illuminated strip (16) on a surface (14) of a sample (10). The X-rays are diffracted by the sample (10) and pass through a mask (20) having a slit extending essentially perpendicularly to the strip (16). The X-rays are detected by a two-dimensional X-ray detector to measure the diffracted X-rays at different positions along the strip (16).Type: ApplicationFiled: February 28, 2013Publication date: September 19, 2013Applicant: PANalytical B.V.Inventors: Detlef Beckers, Milen Gateshki
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Publication number: 20130220971Abstract: Method for manufacturing a multilayer structure with a lateral pattern, in particular of an optical grating for application in an optical device for electromagnetic radiation with a wavelength in the wavelength range between 0.1 nm and 100 nm, comprising the steps of (i) providing a multilayer structure, and (ii) arranging a lateral three-dimensional pattern in the multilayer structure, wherein step (ii) of arranging the lateral pattern is performed by means of a method for nano-imprint lithography (NIL), and BF and LMAG structures manufactured according to this method.Type: ApplicationFiled: December 8, 2010Publication date: August 29, 2013Applicant: PANALYTICAL B.V.Inventors: Frederik Bijkerk, Wilfred Gerard Van Der Wiel, Robert Van Der Meer, Petronella Emerentiana Hegeman
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Patent number: 8488740Abstract: A compact powder diffractometer has one or more detectors arranged no more than 300 mm, in an example 55 mm, from a sample stage for mounting a powder sample. High resolution is nevertheless obtained in spite of the small dimensions using a geometry that achieves a suitable divergence of X-rays incident on the sample and a small spot size using a grazing exit condition on a monochromator crystal.Type: GrantFiled: November 18, 2010Date of Patent: July 16, 2013Assignee: PANalytical B.V.Inventor: Paul Fewster
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Patent number: 8477904Abstract: An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be used. Embodiments use relatively soft X-rays in the 5-25 keV range. An integrated mounting unit to mount the sample 8 close to detector 10 is also described.Type: GrantFiled: December 14, 2010Date of Patent: July 2, 2013Assignee: PANalytical B.V.Inventor: Gabriel Blaj
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Patent number: 8437451Abstract: A shutter arrangement for an X-ray housing includes a shutter 10 for example of solid tantalum. In embodiments, the shutter has a through hole 22 and slides between a closed and an open position on the inner face of the X-ray housing, in the open position the through hole 22 aligns with an opening 8 in the housing.Type: GrantFiled: January 12, 2011Date of Patent: May 7, 2013Assignee: PANalytical B.V.Inventors: Wilbert Alexander Van Lemel, Jaap Boksem
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Publication number: 20120177180Abstract: A shutter arrangement for an X-ray housing includes a shutter 10 for example of solid tantalum. In embodiments, the shutter has a through hole 22 and slides between a closed and an open position on the inner face of the X-ray housing, in the open position the through hole 22 aligns with an opening 8 in the housing.Type: ApplicationFiled: January 12, 2011Publication date: July 12, 2012Applicant: PANalytical B.V.Inventors: Wilbert Alexander VAN LEMEL, Jaap BOKSEM
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Patent number: 8210000Abstract: A bead furnace has a furnace with a furnace chamber 4 and opening 6. A closure assembly 20 is provided on closure assembly 22. The closure assembly has a blank closure element 26 and an active closure element 32 on different sides of the closure assembly, each matching the opening 6. A crucible holder 44 with a detent for holding a crucible and a mold holder 60 for holding a mold are provided on the active face. The closure assembly moves between two states, a load state with the blank closure element 26 in the furnace opening and an operation state with the active closure element 32 in the furnace opening with the crucible and mold in the furnace. The closure assembly can agitate the crucible contents and then tip the crucible to pour fused contents into the mold.Type: GrantFiled: June 29, 2010Date of Patent: July 3, 2012Assignees: Panalytical B.V., XRF Scientific LimitedInventor: Stephen Prossor
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Publication number: 20120128128Abstract: A compact powder diffractometer has one or more detectors arranged no more than 300 mm, in an example 55 mm, from a sample stage for mounting a powder sample. High resolution is nevertheless obtained in spite of the small dimensions using a geometry that achieves a suitable divergence of X-rays incident on the sample and a small spot size using a grazing exit condition on a monochromator crystal.Type: ApplicationFiled: November 18, 2010Publication date: May 24, 2012Applicant: PANalytical B.V.Inventor: Paul Fewster
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Publication number: 20110200164Abstract: An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be used. Embodiments use relatively soft X-rays in the 5-25 keV range. An integrated mounting unit to mount the sample 8 close to detector 10 is also described.Type: ApplicationFiled: December 14, 2010Publication date: August 18, 2011Applicant: PANalytical B.V.Inventor: Gabriel Blaj
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Patent number: 7978820Abstract: An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray source 10 creating an incident X-ray beam directed to a sample on a sample stage. An X-ray detection system is mounted at a fixed angle 2? for high energy energy dispersive XRD For XRF, an X-ray detection system is used.Type: GrantFiled: October 22, 2009Date of Patent: July 12, 2011Assignee: Panalytical B.V.Inventors: Alexander Kharchenko, Roger Meier, Walter van den Hoogenhof
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Patent number: 7949092Abstract: The invention relates to a device for performing X-ray analysis. Device 1 comprises an X-ray tube 2 and at least one capillary lens 4 for focusing the X-rays in a micro-region at a location 5 for a sample for analysis. Device 1 further comprises a detector 6 for detecting X-ray fluorescence from the sample. Device 1 further comprises at least one energy-dependent filter 3 placed between the X-ray tube 2 and the capillary lens 4. The filter 3 is adapted to substantially block X-rays with an energy which is lower than a predetermined threshold value.Type: GrantFiled: April 25, 2008Date of Patent: May 24, 2011Assignee: Panalytical B.V.Inventors: Gustaaf Christian Simon Brons, Petronella Emerentiana Hegeman
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Publication number: 20110058648Abstract: The invention relates to a device for performing X-ray analysis. Device 1 comprises an X-ray tube 2 and at least one capillary lens 4 for focusing the X-rays in a micro-region at a location 5 for a sample for analysis. Device 1 further comprises a detector 6 for detecting X-ray fluorescence from the sample. Device 1 further comprises at least one energy-dependent filter 3 placed between the X-ray tube 2 and the capillary lens 4. The filter 3 is adapted to substantially block X-rays with an energy which is lower than a predetermined threshold value.Type: ApplicationFiled: April 25, 2008Publication date: March 10, 2011Applicant: PANalytical B.V.Inventors: Gustaaf Christian Simon Brons, Petronella Emerentiana Hegeman
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Patent number: 7858945Abstract: A hybrid imaging detector is for detecting ionizing radiation such as X-rays or electron radiation, or other ionizing radiation. The detector has a sensor (10) on a read-out chip (20). The sensor (10) includes a plurality of sensor material layers (12,14) of different materials stacked on top of one another, having differing radiation absorbing properties. The materials may be Si and SiGe, Si and Ge, or Si and amorphous Se, for example. The read-out chip is a photon-counting read-out chip that records a single count when it detects a pulse above a threshold.Type: GrantFiled: February 4, 2009Date of Patent: December 28, 2010Assignee: PANalytical B.V.Inventor: Klaus Bethke