Patents Assigned to Panalytical B.V.
  • Patent number: 9658352
    Abstract: A measurement standard suitable for measuring amounts of certain elements in pharmaceutical excipients is described. A reference standard is dissolved in a solvent, for example acetone, and mixed with a pharmaceutical excipient such as cellulose, lactose or calcium carbonate. The solvent is then evaporated to provide a dry standard.
    Type: Grant
    Filed: January 9, 2015
    Date of Patent: May 23, 2017
    Assignee: PANALYTICAL B.V.
    Inventors: Mark Ingham, Leian Grimsley
  • Patent number: 9640292
    Abstract: X-ray diffraction apparatus includes a flat graded multilayer 8 which may be used in a SAXS configuration for a sample 6. The apparatus may be adapted for Bragg-Brentano measurements by a collimator 16 without the need for alternate beam paths or complex arrangements.
    Type: Grant
    Filed: November 19, 2014
    Date of Patent: May 2, 2017
    Assignee: PANALYTICAL B.V.
    Inventors: Detlef Beckers, Stjepan Prugovecki
  • Patent number: 9547094
    Abstract: X-ray analysis of a primary sample such as a flexible sheet 60 uses apparatus having a primary sample holder such as a material feed-through system 20 for moving the flexible sheet through the apparatus. An X-ray analysis head 6 containing an X-ray source and an X-ray detector is mounted on a robot arm 4. The robot arm moves in three dimensions so that the analysis head can be brought into position to measure the flexible sheet as it is being brought through the apparatus by the material feed-through system.
    Type: Grant
    Filed: February 17, 2015
    Date of Patent: January 17, 2017
    Assignee: PANALYTICAL B.V.
    Inventors: Jeroen Rinsema, Mark Alexander Pals
  • Patent number: 9506880
    Abstract: A method of imaging phases in an inhomogeneous polycrystalline sample having a plurality of crystallites of at least a first crystalline component includes illuminating an illuminated area extending across a surface of a sample with substantially monochromatic X-rays incident at a Bragg-Brentano parafocussing geometry at first angle ?1 to the surface of the sample. X-rays diffracted by the sample at a second angle ?2 pass through a pinhole. The diffraction angle ?1+?2 fulfils a Bragg condition for the first crystalline component which is imaged by a detector to provide a two-dimensional image of the first crystalline component at the surface of the sample.
    Type: Grant
    Filed: June 23, 2014
    Date of Patent: November 29, 2016
    Assignee: PANALYTICAL B.V.
    Inventors: Detlef Beckers, Milen Gateshki
  • Patent number: 9239305
    Abstract: A two or three part sample holder for X-ray apparatus has a sample ring 2 and a counter ring 20. The sample ring 2 has two opposed surfaces and foils 8, 10 one on each surface holding a powder sample 6 within the central hole 4. The sample ring 2 is relatively thin, of thickness 0.2 to 4 mm. A counter ring 20 is provided to engage with the sample ring 2 to provide increased strength and/or stiffness.
    Type: Grant
    Filed: April 24, 2013
    Date of Patent: January 19, 2016
    Assignee: PANALYTICAL B.V.
    Inventors: Charalampos Zarkadas, Ian Torquels Campbell, Youhong Xiao
  • Patent number: 9110003
    Abstract: A method of X-ray diffraction illuminates a beam (4) of X-rays along an illuminated strip (16) on a surface (14) of a sample (10). The X-rays are diffracted by the sample (10) and pass through a mask (20) having a slit extending essentially perpendicularly to the strip (16). The X-rays are detected by a two-dimensional X-ray detector to measure the diffracted X-rays at different positions along the strip (16).
    Type: Grant
    Filed: February 28, 2013
    Date of Patent: August 18, 2015
    Assignee: PANALYTICAL B.V.
    Inventors: Detlef Beckers, Milen Gateshki
  • Publication number: 20140146940
    Abstract: A two or three part sample holder for X-ray apparatus has a sample ring 2 and a counter ring. The sample ring 2 has two opposed surfaces and foils 8, 10 one on each surface holding a powder sample 6 within the central hole 4. The sample ring is relatively thin, of thickness 0.2 to 4 mm. A counter ring is provided to engage with the sample ring to provide increased strength and/or stiffness.
    Type: Application
    Filed: April 24, 2013
    Publication date: May 29, 2014
    Applicant: PANalytical B.V
    Inventor: PANalytical B.V.
  • Publication number: 20130243159
    Abstract: A method of X-ray diffraction illuminates a beam (4) of X-rays along an illuminated strip (16) on a surface (14) of a sample (10). The X-rays are diffracted by the sample (10) and pass through a mask (20) having a slit extending essentially perpendicularly to the strip (16). The X-rays are detected by a two-dimensional X-ray detector to measure the diffracted X-rays at different positions along the strip (16).
    Type: Application
    Filed: February 28, 2013
    Publication date: September 19, 2013
    Applicant: PANalytical B.V.
    Inventors: Detlef Beckers, Milen Gateshki
  • Publication number: 20130220971
    Abstract: Method for manufacturing a multilayer structure with a lateral pattern, in particular of an optical grating for application in an optical device for electromagnetic radiation with a wavelength in the wavelength range between 0.1 nm and 100 nm, comprising the steps of (i) providing a multilayer structure, and (ii) arranging a lateral three-dimensional pattern in the multilayer structure, wherein step (ii) of arranging the lateral pattern is performed by means of a method for nano-imprint lithography (NIL), and BF and LMAG structures manufactured according to this method.
    Type: Application
    Filed: December 8, 2010
    Publication date: August 29, 2013
    Applicant: PANALYTICAL B.V.
    Inventors: Frederik Bijkerk, Wilfred Gerard Van Der Wiel, Robert Van Der Meer, Petronella Emerentiana Hegeman
  • Patent number: 8488740
    Abstract: A compact powder diffractometer has one or more detectors arranged no more than 300 mm, in an example 55 mm, from a sample stage for mounting a powder sample. High resolution is nevertheless obtained in spite of the small dimensions using a geometry that achieves a suitable divergence of X-rays incident on the sample and a small spot size using a grazing exit condition on a monochromator crystal.
    Type: Grant
    Filed: November 18, 2010
    Date of Patent: July 16, 2013
    Assignee: PANalytical B.V.
    Inventor: Paul Fewster
  • Patent number: 8477904
    Abstract: An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be used. Embodiments use relatively soft X-rays in the 5-25 keV range. An integrated mounting unit to mount the sample 8 close to detector 10 is also described.
    Type: Grant
    Filed: December 14, 2010
    Date of Patent: July 2, 2013
    Assignee: PANalytical B.V.
    Inventor: Gabriel Blaj
  • Patent number: 8437451
    Abstract: A shutter arrangement for an X-ray housing includes a shutter 10 for example of solid tantalum. In embodiments, the shutter has a through hole 22 and slides between a closed and an open position on the inner face of the X-ray housing, in the open position the through hole 22 aligns with an opening 8 in the housing.
    Type: Grant
    Filed: January 12, 2011
    Date of Patent: May 7, 2013
    Assignee: PANalytical B.V.
    Inventors: Wilbert Alexander Van Lemel, Jaap Boksem
  • Publication number: 20120177180
    Abstract: A shutter arrangement for an X-ray housing includes a shutter 10 for example of solid tantalum. In embodiments, the shutter has a through hole 22 and slides between a closed and an open position on the inner face of the X-ray housing, in the open position the through hole 22 aligns with an opening 8 in the housing.
    Type: Application
    Filed: January 12, 2011
    Publication date: July 12, 2012
    Applicant: PANalytical B.V.
    Inventors: Wilbert Alexander VAN LEMEL, Jaap BOKSEM
  • Patent number: 8210000
    Abstract: A bead furnace has a furnace with a furnace chamber 4 and opening 6. A closure assembly 20 is provided on closure assembly 22. The closure assembly has a blank closure element 26 and an active closure element 32 on different sides of the closure assembly, each matching the opening 6. A crucible holder 44 with a detent for holding a crucible and a mold holder 60 for holding a mold are provided on the active face. The closure assembly moves between two states, a load state with the blank closure element 26 in the furnace opening and an operation state with the active closure element 32 in the furnace opening with the crucible and mold in the furnace. The closure assembly can agitate the crucible contents and then tip the crucible to pour fused contents into the mold.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: July 3, 2012
    Assignees: Panalytical B.V., XRF Scientific Limited
    Inventor: Stephen Prossor
  • Publication number: 20120128128
    Abstract: A compact powder diffractometer has one or more detectors arranged no more than 300 mm, in an example 55 mm, from a sample stage for mounting a powder sample. High resolution is nevertheless obtained in spite of the small dimensions using a geometry that achieves a suitable divergence of X-rays incident on the sample and a small spot size using a grazing exit condition on a monochromator crystal.
    Type: Application
    Filed: November 18, 2010
    Publication date: May 24, 2012
    Applicant: PANalytical B.V.
    Inventor: Paul Fewster
  • Publication number: 20110200164
    Abstract: An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be used. Embodiments use relatively soft X-rays in the 5-25 keV range. An integrated mounting unit to mount the sample 8 close to detector 10 is also described.
    Type: Application
    Filed: December 14, 2010
    Publication date: August 18, 2011
    Applicant: PANalytical B.V.
    Inventor: Gabriel Blaj
  • Patent number: 7978820
    Abstract: An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray source 10 creating an incident X-ray beam directed to a sample on a sample stage. An X-ray detection system is mounted at a fixed angle 2? for high energy energy dispersive XRD For XRF, an X-ray detection system is used.
    Type: Grant
    Filed: October 22, 2009
    Date of Patent: July 12, 2011
    Assignee: Panalytical B.V.
    Inventors: Alexander Kharchenko, Roger Meier, Walter van den Hoogenhof
  • Patent number: 7949092
    Abstract: The invention relates to a device for performing X-ray analysis. Device 1 comprises an X-ray tube 2 and at least one capillary lens 4 for focusing the X-rays in a micro-region at a location 5 for a sample for analysis. Device 1 further comprises a detector 6 for detecting X-ray fluorescence from the sample. Device 1 further comprises at least one energy-dependent filter 3 placed between the X-ray tube 2 and the capillary lens 4. The filter 3 is adapted to substantially block X-rays with an energy which is lower than a predetermined threshold value.
    Type: Grant
    Filed: April 25, 2008
    Date of Patent: May 24, 2011
    Assignee: Panalytical B.V.
    Inventors: Gustaaf Christian Simon Brons, Petronella Emerentiana Hegeman
  • Publication number: 20110058648
    Abstract: The invention relates to a device for performing X-ray analysis. Device 1 comprises an X-ray tube 2 and at least one capillary lens 4 for focusing the X-rays in a micro-region at a location 5 for a sample for analysis. Device 1 further comprises a detector 6 for detecting X-ray fluorescence from the sample. Device 1 further comprises at least one energy-dependent filter 3 placed between the X-ray tube 2 and the capillary lens 4. The filter 3 is adapted to substantially block X-rays with an energy which is lower than a predetermined threshold value.
    Type: Application
    Filed: April 25, 2008
    Publication date: March 10, 2011
    Applicant: PANalytical B.V.
    Inventors: Gustaaf Christian Simon Brons, Petronella Emerentiana Hegeman
  • Patent number: 7858945
    Abstract: A hybrid imaging detector is for detecting ionizing radiation such as X-rays or electron radiation, or other ionizing radiation. The detector has a sensor (10) on a read-out chip (20). The sensor (10) includes a plurality of sensor material layers (12,14) of different materials stacked on top of one another, having differing radiation absorbing properties. The materials may be Si and SiGe, Si and Ge, or Si and amorphous Se, for example. The read-out chip is a photon-counting read-out chip that records a single count when it detects a pulse above a threshold.
    Type: Grant
    Filed: February 4, 2009
    Date of Patent: December 28, 2010
    Assignee: PANalytical B.V.
    Inventor: Klaus Bethke