Patents Assigned to Polytec GmbH
  • Patent number: 12345563
    Abstract: A method for interferometric vibration measurement at a plurality of measurement points using a measuring laser beam, including A. generating the measuring laser beam having a wavelength in the infrared wavelength range and a pilot laser beam having a wavelength in the visible wavelength range; B. deflecting the measuring laser beam and the pilot, laser beam by a common optical deflection unit, and controlling the deflection unit such that the pilot laser beam is incident on the measurement point; and C. carrying out a vibration measurement using the measuring laser beam. An angular deviation between the pilot laser beam and the measuring laser beam is determined and, in a correction step B1, between method step B and C, the deflection unit is actuated in order to compensate for the angular deviation between the pilot laser beam and the measuring laser beam.
    Type: Grant
    Filed: March 9, 2020
    Date of Patent: July 1, 2025
    Assignee: Polytec GmbH
    Inventor: Matthias Schüssler
  • Patent number: 12104896
    Abstract: The invention relates to an interferometric measurement device and to an interferometric method for determining the surface topography of a measurement object (1). The essence of the invention is that the light intensities Iq(zi) of at least one other detector element q of the multi-element detector (6) are also used besides the light intensities Ip(zi) of this detector element to determine the value zp associated with a detector element p (6b) of the measurement device.
    Type: Grant
    Filed: May 26, 2020
    Date of Patent: October 1, 2024
    Assignee: Polytec GmbH
    Inventors: Henrik Schmid, Volker Seyfried
  • Patent number: 12066321
    Abstract: A method for determining the path of a measurement beam of an interferometric measuring device, includes A. recording a plurality of spatially resolved images of the object under measurement; B. creating a three-dimensional model of the object under measurement; C. providing a beam-position image-recording unit and recording at least one spatially resolved beam-position-determining image; D. determining the spatial position and orientation of the beam-position image-recording unit relative to the object under measurement; E. providing a spatial relation between the spatial path of the measurement beam of the interferometric measuring device and the position and orientation of the beam-position image-recording unit; F. determining the spatial path of the measurement beam of the interferometric measuring device relative to the object under measurement. A measuring device for interferometric measurement of an object under measurement is also provided.
    Type: Grant
    Filed: June 5, 2019
    Date of Patent: August 20, 2024
    Assignee: Polytec GmbH
    Inventors: Bernd Armbruster, Matthias Schussler, Bernd Heinen
  • Publication number: 20220221272
    Abstract: The invention relates to an interferometric measurement device and to an interferometric method for determining the surface topography of a measurement object (1). The essence of the invention is that the light intensities Iq(zi) of at least one other detector element q of the multi-element detector (6) are also used besides the light intensities Ip(zi) of this detector element to determine the value zp associated with a detector element p (6b) of the measurement device.
    Type: Application
    Filed: May 26, 2020
    Publication date: July 14, 2022
    Applicant: Polytec GmbH
    Inventors: Henrik SCHMID, Volker SEYFRIED
  • Publication number: 20220187120
    Abstract: A method for interferometric vibration measurement at a plurality of measurement points using a measuring laser beam, including A. generating the measuring laser beam having a wavelength in the infrared wavelength range and a pilot laser beam having a wavelength in the visible wavelength range; B. deflecting the measuring laser beam and the pilot, laser beam by a common optical deflection unit, and controlling the deflection unit such that the pilot laser beam is incident on the measurement point; and C. carrying out a vibration measurement using the measuring laser beam. An angular deviation between the pilot laser beam and the measuring laser beam is determined and, in a correction step B 1, between method step B and C, the deflection unit is actuated in order to compensate for the angular deviation between the pilot laser beam and the measuring laser beam.
    Type: Application
    Filed: March 9, 2020
    Publication date: June 16, 2022
    Applicant: Polytec GmbH
    Inventor: Matthias SCHÜSSLER
  • Patent number: 11333485
    Abstract: An alignment method for a beam-directing unit of an interferometric measuring device for directing a laser beam of a laser beam source towards a plurality of measurement points of an object under measurement, wherein a three-dimensional model of a measurement surface of an object under measurement is created by a plurality of spatially resolved images. A measuring device for carrying out an interferometric measurement by laser radiation is also provided, having a controller which is designed to align a beam-directing unit of the measurement device.
    Type: Grant
    Filed: June 5, 2019
    Date of Patent: May 17, 2022
    Assignee: Polytec GmbH
    Inventors: Bernd Armbruster, Matthias Schussler, Bernd Heinen
  • Publication number: 20210278197
    Abstract: The invention relates to an alignment method for a beam-directing unit of an interferometric measuring device for directing a laser beam of a laser beam source towards a plurality of measurement points of an object under measurement, wherein a three-dimensional model of a measurement surface of an object under measurement is created by a plurality of spatially resolved images. The invention also relates to a measuring device for carrying out an interferometric measurement by laser radiation, having a controller which is designed to align a beam-directing unit of the measurement device.
    Type: Application
    Filed: June 5, 2019
    Publication date: September 9, 2021
    Applicant: Polytec GmbH
    Inventors: Bernd ARMBRUSTER, Matthias SCHUSSLER, Bernd HEINEN
  • Publication number: 20210278271
    Abstract: A method for determining the path of a measurement beam of an interferometric measuring device including the method steps: A. recording a plurality of spatially resolved images of the object under measurement; B. creating a three-dimensional model of the object under measurement; C. providing a measurement-head model; D. creating an association between coordinates in the three-dimensional model of the object under measurement and coordinates in the measurement-head model; E. determining the measurement beam path. A measuring device for interferometric measurement of an object under measurement is also provided.
    Type: Application
    Filed: June 5, 2019
    Publication date: September 9, 2021
    Applicant: Polytec GmbH
    Inventors: Bernd ARMBRUSTER, Matthias SCHUSSLER, Bernd HEINEN
  • Publication number: 20210255030
    Abstract: A method for determining the path of a measurement beam of an interferometric measuring device, includes A. recording a plurality of spatially resolved images of the object under measurement; B. creating a three-dimensional model of the object under measurement; C. providing a beam-position image-recording unit and recording at least one spatially resolved beam-position-determining image; D. determining the spatial position and orientation of the beam-position image-recording unit relative to the object under measurement; E. providing a spatial relation between the spatial path of the measurement beam of the interferometric measuring device and the position and orientation of the beam-position image-recording unit; F. determining the spatial path of the measurement beam of the interferometric measuring device relative to the object under measurement. A measuring device for interferometric measurement of an object under measurement is also provided.
    Type: Application
    Filed: June 5, 2019
    Publication date: August 19, 2021
    Applicant: Polytec GmbH
    Inventors: Bernd ARMBRUSTER, Matthias SCHUSSLER, Bernd HEINEN
  • Patent number: 10018460
    Abstract: A device for the interferometric measuring of an object, including a light source to generate an emitted beam, a beam splitting device for splitting the emitted beam into a measuring beam and at least first and second reference beams, an optic interference device, and first and second detectors, with the interference device and the first detector being embodied cooperating such that the measuring beam, at least partially reflected by the object, and the first reference beam are interfered on at least one detector area of the first detector. The interference device and the second detector are embodied cooperating such that the measuring beam, at least partially scattered by the object, and the second reference beam are interfered on at least one detector area of the second detector. A method is also provided for the interferometric measuring of an object.
    Type: Grant
    Filed: November 2, 2012
    Date of Patent: July 10, 2018
    Assignee: Polytec GmbH
    Inventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Robert Kowarsch, Wanja Ochs
  • Patent number: 9910056
    Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.
    Type: Grant
    Filed: January 23, 2017
    Date of Patent: March 6, 2018
    Assignee: Polytec GmbH
    Inventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
  • Patent number: 9851243
    Abstract: A device for the optical non-contact vibration measurement of an vibrating object, including a laser Doppler vibrometer that has a laser as the light source for a laser beam, a first beam splitter assembly for splitting the laser beam into a measuring beam and a reference beam, a means for shifting the frequency of the reference beam or of the measuring beam in a defined manner, a second beam splitter assembly by which the measuring beam back-scattered by the oscillating object is merged with the reference beam and superimposed on the same, and a detector for receiving the superimposed measuring and reference beam and for generating a measurement signal. The laser is provided with a polarization filter arranged inside the optical resonator of the laser and the laser is frequency stabilized by regulating to a beat signal of the laser.
    Type: Grant
    Filed: March 16, 2012
    Date of Patent: December 26, 2017
    Assignee: POLYTEC GMBH
    Inventors: Christian Rembe, Alexander Drabenstedt, Matthias Schussler, Christian Ehrmann, Volkmar Roth
  • Publication number: 20170199214
    Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.
    Type: Application
    Filed: January 23, 2017
    Publication date: July 13, 2017
    Applicant: Polytec GmbH
    Inventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
  • Patent number: 9638513
    Abstract: A device for the interferometric measuring of an object, including a radiation source for generating an output beam, at least one beam splitter, as well as at least one detector, with the beam splitter being arranged in the radiation path of the output beam such that the output beam is split into at least one measuring beam and one reference beam, and the device is embodied to interfere the reference beam on the detector with an interference beam to form an optic interference. The device has an open optic resonator, which is arranged in the radiation path of the device such that the measuring beam enters the open optic resonator and the interference beam emitted from the open optic resonator is interfered with a reference beam on the detector to form an optic interference. The invention further relates to a method for the interferometric measuring of an object.
    Type: Grant
    Filed: January 26, 2015
    Date of Patent: May 2, 2017
    Assignee: Polytec GmbH
    Inventor: Christian Rembe
  • Patent number: 9551726
    Abstract: A device for the interferometric measuring of an object, including a source to generate a source beam, a beam splitting device to split the source beam into a measuring beam and a reference beam, an optic interference device and a first detector, which cooperate such that the measuring beam reflected by the object at least partially is at least partially interfered as the receiver beam and the reference beam on a detector area of the first detector. The beam splitting device splits the source beam into a measuring beam, a first partial reference beam, and at least one second partial reference beam. There is at least one second detector embodied such that the first receiver beam is interfered with the first partial reference beam on a detection area of the first detector and the second partial receiver beam with a second partial reference beam on a detection area of the second detector, each with the formation of an optic interference.
    Type: Grant
    Filed: July 1, 2013
    Date of Patent: January 24, 2017
    Assignee: Polytec GmbH
    Inventors: Matthias Schussler, Christian Rembe, Alexander Drabenstedt, Sebastian Boedecker, Thian-Hua Xu
  • Patent number: 9212896
    Abstract: An optical interferometer including an output-beam beam input for coupling-in an output beam, and a beam splitter device for splitting the output beam into at least one first sub-beam and one second sub-beam, the interferometer being embodied as a heterodyne interferometer by virtue of at least one optical frequency shifter being arranged in the beam path of the interferometer and the interferometer including one or more optical waveguide elements, by which optical waveguides are formed, at least between the output-beam beam input, beam splitter device and frequency shifter. The frequency shifter is arranged in the beam path of the first or second sub-beam.
    Type: Grant
    Filed: May 27, 2014
    Date of Patent: December 15, 2015
    Assignee: POLYTEC GMBH
    Inventors: Michael Wortge, Christian Rembe, Alexander Drabenstedt, Tobias Braun
  • Publication number: 20150211841
    Abstract: A device for the interferometric measuring of an object, including a radiation source for generating an output beam, at least one beam splitter, as well as at least one detector, with the beam splitter being arranged in the radiation path of the output beam such that the output beam is split into at least one measuring beam and one reference beam, and the device is embodied to interfere the reference beam on the detector with an interference beam to form an optic interference. The device has an open optic resonator, which is arranged in the radiation path of the device such that the measuring beam enters the open optic resonator and the interference beam emitted from the open optic resonator is interfered with a reference beam on the detector to form an optic interference. The invention further relates to a method for the interferometric measuring of an object.
    Type: Application
    Filed: January 26, 2015
    Publication date: July 30, 2015
    Applicant: Polytec GmbH
    Inventor: Christian Rembe
  • Patent number: 8913247
    Abstract: A device for interferometric vibration measurement, having a radiation source for generating an original beam, a first beam splitter for dividing it into measuring and reference beams, a detector and a focusing device. The measuring beam at least partly reflected by the object and the reference beam are superimposed on a detection area of the detector, and the focusing device in the beam path of the measuring beam between the image unit and object focuses it onto a measuring point. Here, a measuring beam having a wavelength greater than 1100 nm is generated and the device has an image unit for two-dimensional imaging of the object surrounding the measuring point. The measuring beam focus lies in the focal plane of the image unit and, by use of the focusing device, the focal point of the measuring beam and the focal plane of the imaging unit are displaceable simultaneously.
    Type: Grant
    Filed: October 19, 2010
    Date of Patent: December 16, 2014
    Assignee: Polytec GmbH
    Inventors: Christian Rembe, Alexander Dräbenstedt, Michael Gartner, Mike Herberich, Andreas Leonhardt
  • Publication number: 20140347670
    Abstract: An optical interferometer including an output-beam beam input for coupling-in an output beam, and a beam splitter device for splitting the output beam into at least one first sub-beam and one second sub-beam, the interferometer being embodied as a heterodyne interferometer by virtue of at least one optical frequency shifter being arranged in the beam path of the interferometer and the interferometer including one or more optical waveguide elements, by which optical waveguides are formed, at least between the output-beam beam input, beam splitter device and frequency shifter. The frequency shifter is arranged in the beam path of the first or second sub-beam.
    Type: Application
    Filed: May 27, 2014
    Publication date: November 27, 2014
    Applicant: POLYTEC GMBH
    Inventors: Michael Wortge, Christian Rembe, Alexander Drabenstedt, Tobias Braun
  • Publication number: 20140041456
    Abstract: A device for the optical non-contact vibration measurement of an vibrating object, including a laser Doppler vibrometer that has a laser (1) as the light source for a laser beam, a first beam splitter assembly (S1) for splitting the laser beam into a measuring beam (2) and a reference beam (3), a means (4) for shifting the frequency of the reference beam (3) or of the measuring beam (2) in a defined manner, a second beam splitter assembly (S2, S3) by which the measuring beam (2) back-scattered by the oscillating object (6) is merged with the reference beam (3) and superimposed on the same, and a detector (5) for receiving the superimposed measuring and reference beam (7) and for generating a measurement signal. The laser (1) is provided with a polarization filter arranged inside the optical resonator of the laser and the laser (1) is frequency stabilized by regulating to a beat signal of the laser.
    Type: Application
    Filed: March 16, 2012
    Publication date: February 13, 2014
    Applicant: POLYTEC GMBH
    Inventors: Christian Rembe, Alexander Dräbenstedt, Matthias Schüssler, Christian Ehrmann, Volkmar Roth