Abstract: A device for the optic measuring of an object (1), including a signal processing unit (2) as well as an interferometer with a light source (3) and with at least one detector (4a, 4d). The interferometer is embodied such that a light beam (12) created by the light source (3) is split at least into a working beam (12a) and a reference beam (12b), with the working beam (12a) impinging the object (1) and the working beam (12a) is at least partially reflected by the object and interfered with the reference beam (12b) on the detector (4a, 4b). The signal processing unit (2) is connected to the detector (4a, 4b) and includes a vibrometer processing unit (2f), which detects the motion of the object (1) from the measuring signals of the detector (4a, 4d).

Abstract: An apparatus for optical measurement of an object, especially for measuring movement, is provided, which includes an interferometer for measuring movements along the measurement beam of the interferometer, as well as a confocal auto-focus microscope. The interferometer is coupled in the beam path of the confocal auto-focus microscope, such that the measurement beam of the interferometer is simultaneously the focusing beam of the microscope. Here, it is guaranteed that the interferometric movement measurement is always performed at the focal point of the microscope that is used. This enables automatic correction of the Guoy effect for objectives with high numerical aperture. In addition, for the use of a scanning confocal auto-focus microscope, data sets of test objects can also be measured, which comprise their vibrational behavior, height profile, and optionally also their in-plane movement behavior.

Abstract: A scanning microscope for the optical measuring of an object, including a lens, a light source, a displacement unit, and a scanner control unit, with the scanning microscope being embodied such that a measurement beam emitted by the light source impinges the object to be measured and that the measuring beam reflected by the object reentering as a reflection beam through the lens into the radiation path of the microscope and the scanner control unit is embodied cooperating with the displacement unit such that the scanner control unit controls the displacement unit via control signals such that the relative position of the object to be measured and the measuring beam can be changed so that the measuring beam can be directed to at least two predetermined, locally different measuring points on the object.

Abstract: A measuring device for the optic measuring of an object 13a is provided, in particular for measuring a motion of the object. The device includes an interferometer 20 with a measuring beam exit 12, a reflection beam entry 14, an interfering beam exit 15, and a light source 1 for creating a light beam 8, an optic detector 16, which is arranged at the interfering beam exit 15 of the interferometer 20 such that a light beam exiting the interfering beam exit 15 impinges the detector and a signal processing unit 17 connected to the detector 16 being embodied such that they can measure measuring signals of the detector 16.

Abstract: An optical assembly to be mounted on a microscope for measuring micro-structures is provided, which images a first object image (7) onto a second object image (8) lying above the optical assembly and in this way shifts the object image at a standardized interface for a camera (12), as well as the interface for the camera itself, upwards. The optical assembly permits a stroboscope lamp (6) to be coupled into the incident beam path of the microscope over a beam splitter (5) without requiring any structural modifications to the microscope. Instead, the optical assembly according to the invention is simply mounted on the C-mount of the microscope. The invention enables the use of stroboscope lamps in commercially available microscopes, which otherwise are not suitable for stroboscopic examinations.

Abstract: A measurement device for oscillation measurement, as well as a corresponding method, is proposed, wherein the oscillation measurement is performed by at least one laser interferometer (2, 3), whose measurement beam is directed onto various measurement points (5) of the object (1) for generating a scanning movement, and the obtained oscillation data is correlated with the position data of the respective measurement point (5) and evaluated or displayed. In particular, for three-dimensional measurements, the invention reduces the measurement complexity because the scanning device is a robot arm, which moves a measurement head of the laser interferometer to the desired measurement points on the object.

Abstract: An apparatus for optical measurement of an object, especially for measuring movement, is provided, which includes an interferometer for measuring movements along the measurement beam of the interferometer, as well as a confocal auto-focus microscope. The interferometer is coupled in the beam path of the confocal auto-focus microscope, such that the measurement beam of the interferometer is simultaneously the focusing beam of the microscope. Here, it is guaranteed that the interferometric movement measurement is always performed at the focal point of the microscope that is used. This enables automatic correction of the Guoy effect for objectives with high numerical aperture. In addition, for the use of a scanning confocal auto-focus microscope, data sets of test objects can also be measured, which comprise their vibrational behavior, height profile, and optionally also their in-plane movement behavior.

Abstract: An optical assembly to be mounted on a microscope for measuring micro-structures is provided, which images a first object image (7) onto a second object image (8) lying above the optical assembly and in this way shifts the object image at a standardized interface for a camera (12), as well as the interface for the camera itself, upwards. The optical assembly permits a stroboscope lamp (6) to be coupled into the incident beam path of the microscope over a beam splitter (5) without requiring any structural modifications to the microscope. Instead, the optical assembly according to the invention is simply mounted on the C-mount of the microscope. The invention enables the use of stroboscope lamps in commercially available microscopes, which otherwise are not suitable for stroboscopic examinations.

Abstract: For non-contact and non-destructive measurement of surfaces of cast models of a tooth in restorative dentistry, a coherent-radar device, whose measurement direction is brought generally into alignment with the insertion or placement direction for the dental restoration is used, with the help of a real-time video image, which is recorded either in the insertion or placement direction. The sample holder is a commercially available magnetic tilting table. A light source can be used, which has a narrow bandwidth of about 3-40 nanometers.

Abstract: A measurement device for oscillation measurement, as well as a corresponding method, is proposed, wherein the oscillation measurement is performed by at least one laser interferometer (2, 3), whose measurement beam is directed onto various measurement points (5) of the object (1) for generating a scanning movement, and the obtained oscillation data is correlated with the position data of the respective measurement point (5) and evaluated or displayed. In particular, for three-dimensional measurements, the invention reduces the measurement complexity because the scanning device is a robot arm, which moves a measurement head of the laser interferometer to the desired measurement points on the object.

Abstract: A method and an apparatus are provided for contact-free optical displacement and/or vibration measurement of an object, in which the actual positions of the plurality of measurement points are selected and recorded. The display positions of the plurality of measurement points are displayed in the output unit based on a stored or video image of the object. Errors in congruency between the actual positions of the plurality of measurement points and the display positions of the plurality of measurement points are corrected.

Abstract: A method and an apparatus are provided for contact-free optical displacement and/or vibration measurement of an object, in which the object to be measured is scanned in the form of a grid. The position of the measurement points and the contour of the grid are freely selectable. Individual measurement point subquantities, to be analyzed respectively in correlation with one another, can be classified in different categories and analyzed as a function of the category to which they are assigned.

Abstract: A method and an apparatus are provided for contact-free optical displacement and/or vibration measurement of an object, in which the object to be measured is scanned in the form of a grid. The position of the measurement points and the contour of the grid are freely selectable. Individual measurement point subquantities, to be analyzed respectively in correlation with one another, can be classified in different categories and analyzed as a function of the category to which they are assigned.

Abstract: A device is provided for optical measurement of an object, in particular for path and/or vibration measurements, using a laser interferometer, wherein a measuring beam is input into the beam path of a microscope. The device has a mechanism for shifting the measuring beam in an approximately parallel manner. The input of the measuring beam is accomplished via a camera connection of the microscope. The shifting device causes a shift of the impact point of the measuring beam on the measurement object, and the measuring beam reflected back or scattered from the measurement object is decoupled via the camera connection from the beam path of the microscope.

Abstract: A semiconductor laser HL has an external resonator including a reflector R which reflects the emitted laser beam back into the front facet of the laser. The light emitted from the rear facet of the laser falls on a photodiode PD which generates a signal s which is evaluated by an evaluation unit AE. By differentiation or other processing of the shapes of pulses in the signal s, it is possible to determine the direction of change of any of several operating parameters of the laser system, such as the length L between laser HL and reflector R, the tilt angle of reflector R with respect to the optical axis of the laser or the refractive index n of the medium in the space N defined between the laser and the reflector. For example, one can detect when gas G is fed into space N to change the medium from ordinary air to carbon dioxide, or the reverse.