Abstract: An image acquisition system and method employing multi-axis integration (MAI) may incorporate both optical axis integration (OAI) and time-delay integration (TDI) techniques. Disclosed MAI systems and methods may integrate image data in the z direction as the data are acquired, projecting the image data prior to deconvolution. Lateral translation of the image plane during the scan in the z direction may allow large areas to be imaged in a single scan sequence.

Abstract: A system and method of cooling a CCD camera may employ a composite material housing design that allows the cold side of a TEC to be mounted relatively close to the CCD and the hot side of the TEC to be isolated from the housing cavity in which the CCD resides. An efficient heat transfer path may facilitate cooling the CCD to a predetermined or selected operating temperature and isolate the CCD from the heat loads generated by operation the TEC.

Abstract: A plurality of panels are assembled into a single image. Each of the panels may have different intensities throughout the panel, as well as non-uniformities between panels. The panels are modified using flat-field calibration, panel flattening, and panel connecting techniques. These techniques correct for non-uniformities and provide a cleaner, single image.

Abstract: Systems and methods according to aspects of the present invention are described. The systems and methods enable charging, soaking, and measuring of capacitors to be conducted quickly. Charging and soaking typically occurs in parallel and certain embodiments facilitate the measuring of capacitor leakage by sequentially disconnecting each capacitor and measuring the time for voltage on the capacitor to reach a predetermined threshold. Further, all capacitors can be disconnected from a charging source simultaneously and voltages can be measured for each capacitor simultaneously. Monitoring can be periodic in nature. Substantial time savings in the calculation device of leakage values and parameters can be attained.

Abstract: A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from two or more perspectives through a substantially transparent fiducial plate bearing a fiducial marking; camera viewing angles and apparent relative distances between a feature on a test article and one or more fiducials may enable accurate calculation of feature position.

Abstract: A plurality of panels are assembled into a single image. Each of the panels may have different intensities throughout the panel, as well as non-uniformities between panels. The panels are modified using flat-field calibration, panel flattening, and panel connecting techniques. These techniques correct for non-uniformities and provide a cleaner, single image.

Abstract: A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.

Abstract: A system and method of generating and acquiring phase contrast microscope images while minimizing interference with the intensity and optical quality of other microscopy modalities employing polarization and attenuation strategies for phase microscopy applications. A plane polarizing objective phase ring may be used in conjunction with a phase microscopy apparatus. Attenuated light may be controlled such that transparency may be selectively provided with respect to light in a predetermined plane. Illumination outside of the predetermined plane may be selected for phase microscopy applications. Accordingly, a polarizing objective phase ring effective for enabling polarized phase microscopy may reduce interfere with normal usage of the microscope for other applications such as, for example, fluorescence microscopy.

Abstract: A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.

Abstract: A system and method of providing illumination for a cell imaging system delivering modulated light for illumination of a sample. Modulation of illumination intensity may be effectuated by pulsing the output of a light source, for example, or by selectively interrupting light provided by the source. Such modulated illumination may have particular utility in applications where reducing the number of electrons in a super-excited state may minimize the rate of photobleaching and photodamage in the molecules being studied.

Abstract: A wire chopper module for processing spent electrode emerging from an EDM system employs replaceable inserts that are also movable relative to the feed path of the electrode. Shifting the position of the inserts relative to the feed path of the electrode allows more than one portion of each cutting edge on the insert to be used. Each insert has more than one cutting edge and can be rotated and re-inserted to present a completely new cutting edge. Removable multi-edge inserts that are repositionable relative to the feed path of the spent electrode permit renewal of the cutting edges of the wire chopper module with increased frequency and reduced cost. The wire chopper module also incorporates a flywheel to increase the movement of inertia of the rotating cutting inserts as an aid in overcoming jams. Sharp cutting edges and increased rotational momentum improve the reliability of the inventive wire chopper module.

Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.

Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.

Abstract: A scanning system is calibrated to correct for possible panel misalignments errors. A reference slide or data point is used to obtain a series of measurements with the scanning system. These measurements are compared with the expected results to determine systematic alignment errors in the scanning system. A model is created to correct the alignment errors during the scanning process, thus providing a plurality of more accurate scans. The plurality of scans may then be assembled to create a complete image of the scan area.

Abstract: A system and method of controlling the relationship between two surfaces (such as a primary surface and a reference surface) and correcting any deviation from the desired or ideal relationship generally employ a plurality of actuators and flexural assemblies. The actuators may be driven in unison to translate the primary surface in one-dimension; the actuators may also be driven independently, accommodating fine adjustment in pitch, roll, or both, of the primary surface. Flexural assemblies may be implemented to minimize lateral cross-coupling between the linear actuators.

Abstract: A wire chopper module for processing spent electrode emerging from an EDM system employs replaceable inserts that are also movable relative to the feed path of the electrode. Shifting the position of the inserts relative to the feed path of the electrode allows more than one portion of each cutting edge on the insert to be used. Each insert has more than one cutting edge and can be rotated and re-inserted to present a completely new cutting edge. Removable multi-edge inserts that are repositionable relative to the feed path of the spent electrode permit renewal of the cutting edges of the wire chopper module with increased frequency and reduced cost. The wire chopper module also incorporates a flywheel to increase the moment of inertia of the rotating cutting inserts as an aid in overcoming jams. Sharp cutting edges and increased rotational momentum improve the reliability of the inventive wire chopper module.

Abstract: Expression profiling using DNA microarrays is an important new method for analyzing cellular physiology. In “spotted” microarrays, fluorescently labeled cDNA from experimental and control cells is hybridized to arrayed target DNA and the arrays imaged at two or more wavelengths. Statistical analysis is performed on microarray images and show that non-additive background, high intensity fluctuations across spots, and fabrication artifacts interfere with the accurate determination of intensity information. The probability density distributions generated by pixel-by-pixel analysis of images can be used to measure the precision with which spot intensities are determined. Simple weighting schemes based on these probability distributions are effective in improving significantly the quality of microarray data as it accumulates in a multi-experiment database. Error estimates from image-based metrics should be one component in an explicitly probabilistic scheme for the analysis of DNA microarray data.

Abstract: A system and method employing photokinetic techniques in cell biology imaging applications are disclosed. Systems and methods of acquiring image data of an object may comprise: selectively inducing photoactivation of material at a site on the object; performing an optical axis integration scan; simultaneously executing a time delay integration scan sequence; and processing acquired image data in accordance with one or more desired analyses. Various methodologies and applications may include, inter alia, selective photobleaching of a site on the object, diffusion rate, velocity, and wave-front propagation analyses, multi-dimensional analyses of dispersion characteristics, biomolecular binding in cellular organelles, and photoactivation assisted systematic image segmentation for the study of cellular components.

Abstract: A plurality of panels are assembled into a single image. Each of the panels may have different intensities throughout the panel, as well as non-uniformities between panels. The panels are modified using flat-field calibration, panel flattening, and panel connecting techniques. These techniques correct for non-uniformities and provide a cleaner, single image.

Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.