Patents Assigned to SV Probe Technology Taiwan Co., Ltd.
  • Patent number: 10962569
    Abstract: Provided are a probe that enables control of a bending direction and can be simply manufactured, an inspection jig using the probe, an inspection device, and a method of manufacturing the probe. A probe has a substantially bar-like shape extending linearly and includes: a tip end portion, a body portion continuous with the tip end portion Pa; and a base end portion continuous with the body portion. The body portion includes a first connection region having a thickness in a thickness direction perpendicular to an axial direction of the bar-like shape that gradually decreases away from the tip end portion, and a second connection region having a thickness that gradually decreases away from the base end portion. A dimension of the body portion in a width direction perpendicular to the thickness direction is larger than dimensions of the tip end portion and the base end portion.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: March 30, 2021
    Assignees: Nidec-Read Corporation, SV Probe Technology Taiwan Co., Ltd.
    Inventors: Michio Kaida, Huei Che Yu
  • Publication number: 20190353684
    Abstract: Provided are a probe that enables control of a bending direction and can be simply manufactured, an inspection jig using the probe, an inspection device, and a method of manufacturing the probe. A probe has a substantially bar-like shape extending linearly and includes: a tip end portion, a body portion continuous with the tip end portion Pa; and a base end portion continuous with the body portion. The body portion includes a first connection region having a thickness in a thickness direction perpendicular to an axial direction of the bar-like shape that gradually decreases away from the tip end portion, and a second connection region having a thickness that gradually decreases away from the base end portion. A dimension of the body portion in a width direction perpendicular to the thickness direction is larger than dimensions of the tip end portion and the base end portion.
    Type: Application
    Filed: May 16, 2019
    Publication date: November 21, 2019
    Applicants: Nidec-Read Corporation, SV Probe Technology Taiwan Co., Ltd.
    Inventors: Michio KAIDA, Huei Che Yu
  • Patent number: D894025
    Type: Grant
    Filed: November 16, 2018
    Date of Patent: August 25, 2020
    Assignees: NIDEC-READ CORPORATION, SV PROBE TECHNOLOGY TAIWAN CO., LTD.
    Inventors: Michio Kaida, Huei Che Yu