Electric characteristic measuring probe
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The broken line portions of the design are included to show unclaimed portions and form no part of the claimed design. Annotated drawings showing one non-limiting example of the article in use is provided in the accompanying Appendix, which may be deleted prior to printing of any patent that grants from the present application.
Claims
The ornamental design for an electric characteristic measuring probe, as shown and described.
Type: Grant
Filed: Nov 16, 2018
Date of Patent: Aug 25, 2020
Assignees: NIDEC-READ CORPORATION (Kyoto-shi), SV PROBE TECHNOLOGY TAIWAN CO., LTD. (Zhubei)
Inventors: Michio Kaida (Kyoto), Huei Che Yu (Zhubei)
Primary Examiner: Antoine Duval Davis
Application Number: 29/670,517