Electric characteristic measuring probe

- NIDEC-READ CORPORATION
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Description

FIG. 1 is a perspective view of an electric characteristic measuring probe, showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is an enlarged top plan view thereof;

FIG. 9 is an enlarged bottom plan view thereof;

FIG. 10 is an enlarged partial perspective view thereof, taken along line 10-10 of FIG. 1;

FIG. 11 is a an enlarged cross-sectional view thereof, taken along line 11-11 of FIG. 2;

FIG. 12 is an enlarged partial front elevational view thereof, taken along line 12-12 of FIG. 2; and,

FIG. 13 is an enlarged partial right side elevational view thereof, taken along line 13-13 of FIG. 4.

The broken line portions of the design are included to show unclaimed portions and form no part of the claimed design. Annotated drawings showing one non-limiting example of the article in use is provided in the accompanying Appendix, which may be deleted prior to printing of any patent that grants from the present application.

Claims

The ornamental design for an electric characteristic measuring probe, as shown and described.

Referenced Cited
U.S. Patent Documents
D507198 July 12, 2005 Kister
D510043 September 27, 2005 Kister
7671610 March 2, 2010 Kister
D769748 October 25, 2016 Teranishi
D769749 October 25, 2016 Teranishi
D776551 January 17, 2017 Teranishi
D776552 January 17, 2017 Teranishi
10132833 November 20, 2018 Eldridge
Patent History
Patent number: D894025
Type: Grant
Filed: Nov 16, 2018
Date of Patent: Aug 25, 2020
Assignees: NIDEC-READ CORPORATION (Kyoto-shi), SV PROBE TECHNOLOGY TAIWAN CO., LTD. (Zhubei)
Inventors: Michio Kaida (Kyoto), Huei Che Yu (Zhubei)
Primary Examiner: Antoine Duval Davis
Application Number: 29/670,517
Classifications