Abstract: Semiconductor designs are large and complex, typically consisting of numerous circuits called cells. To handle complexity, hierarchical structures are imposed on the semiconductor design to help accomplish analysis, simulation, verification, and so on. The hierarchical structures define architecture, behavior, function, structure, etc. of the semiconductor design. Virtual cells are constructed to compress cell geometries and ease the various design tasks. A cell and multiple instances of the cell are identified within the semiconductor design and the virtual hierarchical levels describing the design. Virtual hierarchical layer (VHL) data based on the cell is loaded. A virtual cell model representative of the cell is obtained. Interactions between cell data and VHL data are determined, and relevant portions of shapes are selected. Data within the virtual cell model is reduced based on the determined interactions.

Abstract: An embodiment of a method and apparatus for ciphering data. Data is provided for ciphering. The data is ciphered in a plurality of steps. For each step, determining an encoding for error detection of the data being processed within the step. Determining an output error detection encoding for the step. Processing data of the round to provide output error detection encoding. Then, verifying the encoding against a determined output error detection encoding. If the output error detection encoding is not the same as the determined error detection encoding, providing a signal indicating the presence of an error within the cipher process.

Abstract: Devices and methods are described relating to capacitor energy storage devices that are small in size and have a high energy stored to volume ratio. The capacitor devices include 2D material electrodes. The capacitor devices offer very fine granularity with high stacking possibilities which may be used in super capacitors and capacitor arrays. The devices include interleaved laminations 2D material electrode layers, for example graphene, and dielectric layers, for example Hafnium Oxide. In an embodiment a capacitor device includes 10,000 layers of interleaved graphene separated by 9,999 layers of HfO. Odd layers of the graphene are electrically connected to a first terminal and even layers of graphene are electrically connected to a second terminal of the capacitor device.

Abstract: A method and apparatus of a novel modeling scheme for performing optical lithography simulation for a multi-color layer fabrication process is described. The method interpolates for simulation use between test or experimental data or descriptions to more accurately apply color differentiated parameters to the model creation and lithography simulation.

Abstract: Electronic design automation to simulate the behavior of structures and materials at multiple simulation scales with different simulators.

Abstract: The present invention provides a graphical view of this connected network that allows the user to navigate throughout a network. The graph view consists of a series of nodes that correspond to a set of test, testbench, design or coverage items in the simulation. Various nodes in the network are colored or shaped differently to represent either test, class, stimulus, testbench, design or coverage points. The graph may be drawn so that all items that occur at the same time are lined up in the same horizontal or vertical region, to give the user an intuitive view of time going left to right or top to bottom.

Abstract: A multi-bit flip-flop (MBFF) includes a plurality of 1-bit flip-flops, each having an input data selection circuit that receives a data signal and a scan data signal. The MBFF also includes a local signal generation circuit that receives a global clock signal and a global scan enable signal, and in response, provides local control signals, wherein each of the local control signals is generated in response to both the global clock signal and the global scan enable signal. The local control signals are provided to the input data selection circuits, and exclusively control the input data selection circuits to route either the input data signal or the scan input data signal as a master data bit, reducing transistor requirements. Local clock signals may be generated by the local signal generation circuit in response to the global clock signal, and may exclusively control data transfer within the flip-flops, improving setup time.

Abstract: In one well bias arrangement, no well bias voltage is applied to the n-well, and no well bias voltage is applied to the p-well. Because no external well bias voltage is applied, the n-well and the p-well are floating, even during operation of the devices in the n-well and the p-well. In another well bias arrangement, the lowest available voltage is not applied to the p-well, such as a ground voltage, or the voltage applied to the n+-doped source region of the n-type transistor in the p-well. This occurs even during operation of the n-type transistor in the p-well. In yet another well bias arrangement, the highest available voltage is not applied to the n-well, such as a supply voltage, or the voltage applied to the p+-doped source region of the p-type transistor in the n-well. This occurs even during operation of the p-type transistor in the n-well.

Abstract: Systems and techniques for three-dimension (3D) resist profile aware resolution enhancement techniques are described. 3D resist profile aware resolution enhancement models can be calibrated based on empirical data. Next, the 3D resist profile aware resolution enhancement models can be used in one or more applications, including, but not limited to, lithography verification, etch correction, optical proximity correction, and assist feature placement.

Abstract: A system and method use reactive initialization to facilitate formal verification of an electronic logic design. The system verifies that a part of the logic design correctly transitions through a sequence of states by automatically assigning an initial state value. The system interacts with a correction-unit to provide meaningful feedback of verification failures, making it possible for the correction-unit to correct the failures or add new constraints that allow the verification to complete. Assigning an initial state simplifies the verification of the validity of the remaining states in the sequence, thus making it more likely to reach a conclusive result and consuming less computing resources.

Abstract: A method for designing an integrated circuit (IC) includes, in part, dividing the wires disposed in the IC into a multitude of segments each having a length extending from a first end point to a second end point. Each segment is then widened without overlapping any adjacent object. As an example, an intermediate, or expanded, segment is formed that includes the first and the second end points and has a size to overlap with an adjacent object. The method includes identifying regions in the adjacent objects that overlap with the expanded segment. For each of the identified regions, an expanded region is formed, which has a shape and size to enclose the identified object with additional spacing around the perimeter. Next, the size of the expanded segment is reduced to form the wide segment such that the wide segment does not overlap any of the adjacent expanded objects.

Abstract: A system and method for netlist clock domain crossing verification leverages RTL clock domain crossing (CDC) verification data and results. The netlist clock domain crossing verification system (NCDC) migrates RTL-level constraints and waivers to the netlist design so that the user does not have to re-enter them. The NCDC checks the netlist and generates a report that compares RTL-level CDC checking results to the netlist-level CDC checking results to make it easy to see new issues. The NCDC receives and stores netlist corrections from user input or automatically corrects certain CDC violations, in the netlist.

Abstract: Computer-implemented techniques are disclosed for verifying circuit designs using dynamic problem generation. A device under test (DUT) is modeled as part of a test bench where the test bench is a random process. A set of constraints is solved to generate stimuli for the DUT. Problem generation is repeated numerous times throughout a verification process with problems and sub-problems being generated and solved. When a problem is solved, the problem structure can be stored in a cache. The storage can be based on entropy of variables used in the problem. The problem storage cache can be searched for previously stored problems which match a current problem. By retrieving a problem structure from cache, the computational burden is reduced during verification. Problems can be multi-phase problems with storage and retrieval of problem structures based on the phase level. Caching can be accomplished using an information theoretic approach.

Abstract: A code protection scheme for controlling access to a memory region in an integrated circuit includes a processor with an instruction pipeline that includes multiple processing stages. A first processing stage receives one or more instructions. A second processing stage receives address information identifying a protected memory region of the memory from the first processing stage and protection information for an identified protected memory region. The protection information indicates a protection state assigned to each protected memory region. Based on the instruction type of the received instruction and the protection information associated with a particular protected memory region, the second processing stage determines whether to enable or disable access to the particular protected memory region by the processor or other external host.

Abstract: Systems and techniques for identifying failure mechanisms based on a population of scan diagnostic reports is described. Given a population of scan diagnostic reports, a mixed membership model can be used for computing a topic distribution for each portion of each scan diagnostic report and a feature distribution for each topic. The failure mechanisms can be identified based on the topic distributions for the portions of the scan diagnostic reports and the feature distributions for the topics.

Abstract: Techniques for creating and using a hierarchical data structure, in accordance with embodiments of the present invention include storing received data as records in a first level of the hierarchical data structure. One or more parameters for each block of records in the first level are summarized and stored in a second level of the hierarchical data structure. The techniques may also include querying a given level of a hierarchical data structure. One or more blocks of records one level below the given level are accessed. Each of the accessed blocks correspond to records that are summarized by records in the given level that satisfies the query.

Abstract: Systems and techniques are described for designing an integrated circuit (IC). Some embodiments identify and preserve slices by using new objects in an IC design data model. One or more IC design representations that are used in an IC design flow may natively support such slice objects. These new objects can enable rapid access and preservation of slices, thereby improving the runtime and/or quality of results (QoR) of an IC design system.

Abstract: In Integrated Circuit (IC) Physical Design, the shapes and other geometric objects that are used to represent the mask data have physical coordinates expressed in a Cartesian plane. When the designs are hierarchical, each level of physical hierarchy has its own coordinate system. When viewed from the top level of a hierarchical design, lower-level shapes must be transformed in order to understand their location from the point of view of the top block. Users and algorithms that manipulate physical data across these hierarchy boundaries must go through the tedious task of transforming data, sometimes multiple times, as it is being changed.

Abstract: Roughly described, a field effect transistor has a first piezoelectric layer supporting a channel, a second piezoelectric layer over the first piezoelectric layer, a dielectric layer having a plurality of dielectric segments separated by a plurality of gaps, the dielectric layer over the second piezoelectric layer, and a gate having a main body and a plurality of tines. The main body of the gate covers at least one dielectric segment of the plurality of dielectric segments and at least two gaps of the plurality of gaps. The plurality of tines have proximal ends connected to the main body of the gate, middle portions projecting through the plurality of gaps, and distal ends separated from the first piezoelectric layer by at least the second piezoelectric layer. The dielectric layer exerts stress, creating a piezoelectric charge in the first piezoelectric layer, changing the threshold voltage of the transistor.

Abstract: A finFET block architecture suitable for use of a standard cell library, is based on an arrangement including a first set of semiconductor fins in a first region of the substrate having a first conductivity type, and a second set of semiconductor fins in a second region of the substrate, the second region having a second conductivity type. A patterned gate conductor layer including gate traces in the first and second regions, arranged over channel regions of the first and second sets of semiconductor fins is used for transistor gates. Patterned conductor layers over the gate conductor layer are arranged in orthogonal layout patterns, and can include a plurality of floating power buses over the fins in the first and second regions.