Abstract: A device includes at least two digital-to-analog converters, each digital-to-analog converter having a digital-to-analog converter clock modulator, a system reference clock modulator, and a phase detector to track the phases of the clock and the system reference clock. A method of calibrating a phase detector includes providing a pulse waveform, aligning a phase of a digital-to-analog clock to a phase of an internal system reference clock, aligning a phase of a modulated system reference clock with a phase of a modulated, divided, digital-to-analog clock, storing the aligned phase of the modulated system reference clock as a calibration value, synchronizing the digital-to-analog converters and adjusting the phase of the digital-to-analog converters to a center of a desired phase, and storing the aligned phase of the digital-to-analog converters as a calibration value.

Abstract: Embodiments of the invention include methods and devices for determining a phase angle offset between a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT). Some embodiments include a laser source and an optical phase adjustor, which may be embodied by a loop stretcher structured to controllably stretch a length of fiber optic cable, driven by a phase adjust driver. In other embodiments the phase angle offset information is conveyed to an oscilloscope for internal compensation.

Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end.

Abstract: An electro-optic modulator of a test and measurement system. The electro-optic modulator includes a first electrode, a second electrode with identical electrical characteristics as the first electrode and an optical waveguide between the first electrode and the second electrode. The first electrode and the second electrode present a balanced load to a device under test.

Abstract: A differential pin to RF adaptor includes a center conductor contact with an RF connector on one end and a signal contact on the other end. An insulating sleeve surrounds the central contact. A reference contact surrounds the insulating sleeve. The signal pin of the differential pair interfaces with the center conductor contact of the RF connector. The adaptor is structured to slide down over a pair of pins/leads so that the reference contact abuts a circuit board attached to the pins. The pins/leads are shielded all the way to the circuit board, which shields/isolates the pins from common mode and other types of interference. The adaptor maintains the shape of the signal pin and the reference pin during testing. The adaptor maintains a fixed impedance of the pins, which reduces or eliminates uncontrolled impedance and hence preserves system frequency response and reduces/eliminates erroneous ripple currents.

Abstract: A system and method are provided for graphically actuating a trigger in a test and measurement device. The method includes displaying a visual representation of signal properties for one or more time-varying signals. A graphical user input is received, in which a portion of the visual representation is designated. The method further includes configuring a trigger of the test and measurement device in response to the graphical user input, by setting a value for a trigger parameter of the trigger. The set value for the trigger parameters varies with and is dependent upon the particular portion of the visual representation that is designated by the graphical user input. The trigger is then employed in connection with subsequent monitoring of signals within the test and measurement device.

Abstract: A frequency mask trigger capable of triggering based on a logical combination of two or more areas of a frequency mask transforms a frame of digital data representing an input signal into a frequency spectrum having a plurality of frequency bins, with each frequency bin having a power amplitude value. A frequency mask is defined having a plurality of reference power levels, one reference power level being associated with each frequency bin. Two or more areas of the frequency mask are defined, with each mask area corresponding to one or more of the frequency bins. A violation status is determined for each mask area by comparing all of the power amplitude values within each mask area to the associated reference power level. If any of the power amplitude values within the mask area violates the associated reference power level, then the entire mask area is deemed to be violated. A trigger signal is generated when a logical combination of the violation statuses of the mask areas is satisfied.

Abstract: A method for determining a waveform expected to be received by a device under test, the method including outputting a waveform generated by a waveform generation section of an arbitrary waveform and function generator at an output of the arbitrary waveform and function generator; sending the waveform generated by the waveform generation section to the device under test through a cable; monitoring a waveform at the output by a waveform monitoring section of the arbitrary waveform and function generator; and determining by the waveform monitoring section a transformed waveform expected to be received at the device under test based on the generated waveform being modified by the cable.

Abstract: Aspects of the invention include an equivalent-time sampling oscilloscope that receives a carrier signal, the carrier signal after it has been modulated with a repeating data pattern, and a pattern trigger signal that is synchronous with the data pattern. The carrier signal and the modulation are asynchronous, that is, they are not phase-locked in any way. The oscilloscope simultaneously samples the modulated carrier signal and quadrature phases of the unmodulated carrier signal at a plurality of timebase delays relative to the pattern trigger signal, and a plurality of times at each timebase delay. After collecting this information, the oscilloscope uses the quadrature samples to calculate phases of the unmodulated carrier signal that correspond to the samples of the modulated carrier signal.

Abstract: A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.

Abstract: A connector for terminating a cable including a compressible fitting and a crimp nut. The compressible fitting has an inner passage to receive a portion of the cable and a threaded outer wall coaxial with and surrounding the inner passage. The outer wall includes a first slot extending radially through the outer wall and axially away from a first end of the outer wall. The crimp nut is configured to thread onto the outer wall of the compressible fitting. The crimp nut is further configured, in a first position, not to constrict the inner passage and, in a second position, to radially compress the outer wall of the compressible fitting to reduce a bore diameter of the inner passage and to electrically connect the outer wall with the portion of the cable received in the inner passage of the compressible fitting. Methods are also disclosed.

Abstract: Embodiments of the invention include a phase adjustor for adjusting a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT). Some embodiments include a laser source for a lightwave component analyzer and an optical phase adjustor. The lightwave component analyzer drives a first test input to the DUT. An output of the DUT drives an output of the optical phase adjustor adapted to couple to an oscillator input to the DUT. A monitor selector is also included that accepts at least two outputs of the DUT and is structured to transmit a selected output of the DUT to the phase adjust driver. The phase adjust driver is structured to drive the optical phase adjustor with a control signal based on the output of the DUT that is selected by the monitor selector.

Abstract: A method can include receiving an input signal having multiple signal edges, performing an initial scan of the input signal to identify peaks corresponding to the signal edges, and determining whether each peak is a Uniformly Synchronous (US) edge or a Quasi-Synchronous (QS) edge. The method can also include generating a final waveform and displaying the final waveform on a display device.

Abstract: Embodiments of the invention are directed to a system for generating video test pattern signals from definitions contained in a text-based definition file. The definition file allows the user to create generic definitions for test signals that can be interpreted to create test signals in a variety of formats, raster sizes, color spaces, sample structures, frame modes, and bit depths. A parametric generator uses one or more engines to then generate the desired test pattern from the definition file.

Abstract: A waveform monitor includes a brightness measuring system to generate brightness values that are then converted to stop equivalents. The conversion may be performed using a Look Up Table. The output is generated as a stop vs. time waveform. Methods of generating the stop vs. time waveform are also described.

Abstract: An apparatus, system, and method are described for providing an intuitive user interface on a test and measurement instrument. The test and measurement instrument can include container logic, which provides a work mode in which interactions with objects within a container on a display are allowed, and a move mode in which interactions with the objects within the container on the display are temporarily prevented. When in the move mode, the container logic can detect a dragging gesture associated with the container. In response to the dragging gesture, a preview container arrangement is provided overlaying the container arrangement. The container logic can detect a dropping indication, thereby causing the arrangement to snap to the preview container arrangement. Various other user interface controls are provided while in the move mode. In multi-user environments, customized container arrangements may be saved and then later recalled. Containers may be moved among multiple different displays.

Abstract: A system and method for monitoring a communication network is provided. The method includes capturing network data from network traffic of the communication network by a plurality of probes monitoring the communication network. The method further includes detecting by lightweight analysis a data packet of the captured network data that includes information related to a transactional procedure failure transacted by an end-user device and determining an identity of the end-user device. The method further includes sharing the identity of the end-user device with other probes of the plurality of probes, adding the end-user device's identity to respective whitelists associated with the probes of the plurality of probes, and performing, for end-user device identities included in the respective whitelists, detailed analysis of network data during a predetermined time period.

Abstract: A test and measurement instrument configured to receive at least one input signal is disclosed. The test and measurement instrument includes a processor configured to sample the input signal and generate a plurality of measurements. The processor is configured to generate a measurement ticker having a plurality of ticker elements configured for presentation on a display in a serial, scrolling fashion. Each ticker element has a measurement value associated with the input signal. The processor may be configured to sample a plurality of input signals and each ticker element may include a measurement value associated with at least one of the plurality of input signals. Each ticker element may further comprise a source ID and a measurement type.

Abstract: Disclosed is a test and measurement instrument having a multiple variable bandwidth frequency mask. The instrument includes an input processor for receiving an input signal and producing a digital signal, as well as a trigger signal generator for generating a trigger signal on the occurrence of a trigger event. A time to frequency converter converts a frame of digital data from the digital signal into a frequency spectrum having at least two frequency bins of dissimilar frequency widths. Each frequency bin has a power amplitude value. The trigger signal is generated when the power amplitude value of any of the at least two frequency bins violates an associated reference power level. In some cases the output may be shown as a density trace, and the trigger signal generated when any point of the density trace violates an associated density threshold.

Abstract: Embodiments of the invention include a test and measurement device, system, and method for synchronizing measurement views and configuration parameters across multiple input channels or devices. A method includes receiving signals under test associated with multiple input channels of the test and measurement instrument or with multiple devices, selecting a measurement view of one input signal or device, receiving a synchronized view enable preference from a user control interface, and synchronizing the measurement view or configuration parameters of the other signals or devices with what was chosen on the first signal or device. A test and measurement instrument includes input terminals to receive the input signals, a user control interface to receive input from an operator, a display to provide measurement information about the input signals, and a synchronization control unit to synchronize measurement views and/or configuration parameters between the inputs or devices.