Abstract: The present disclosure provides a method of testing a single device under test (DUT) through multiple cores in parallel, which includes steps as follows. The test quantity of the DUT is calculated; the test quantity of the DUT is evenly allocated to to a plurality of test cores, so as to control a period of testing the DUT through the test cores in parallel.

Abstract: A test system includes a plurality of test core devices and a plurality of first buses. The plurality of test core devices are electrically connected to a device under test (DUT). The plurality of first buses are electrically connected to the test core devices, where at least one set of test core devices selected from the plurality of test core devices are merged to be a merged test core device through one or more of the plurality of first buses.

Abstract: An apparatus for three-dimensional inspection includes a carrier, an image sensing component, and a processor. The carrier is configured to hold an object. The image sensing component is configured to capture a first image, a second image and a third image of the object along a first axis, a second axis, and a third axis respectively, and the first axis, the second axis, and the third axis are not parallel with each other. The processor is configured to analyze the first image and the second image to obtain a first directional stereo information, and analyze the third image and a determined image of the object to obtain a second directional stereo information.

Abstract: An optical inspection apparatus includes a dichroic mirror, a first light source, and a first image capturing device. The dichroic mirror has a first side and a second side opposite to the first side. The dichroic mirror transmits a first light beam and reflects a second light beam. The wavelength of the second light beam is different from the wavelength of the first light beam. The first light source is disposed at the first side of the dichroic mirror and is configured to provide the first light beam to pass through the dichroic mirror. The first image capturing device is disposed at the second side of the dichroic mirror and is configured to detect the second light beam reflected from the dichroic mirror.

Abstract: An automatic optical inspection system includes a first AOI machine and a second AOI machine, and the second AOI machine is electrically connected to the first AOI machine. The first AOI machine is configured to use a first resolution to inspect an object, so as to detect a possible defective region(s) of the object. The second AOI machine is configured to use a second resolution higher than the first resolution of the first AOI machine to inspect within the possible defective region(s) only, so as to detect whether there is/are any defect(s) within the possible defective region(s) of the object.

Abstract: A test signal transmission apparatus used in a multi-chassis test device is provided. The test signal transmission apparatus includes global buses and test signal transmission modules each including an I/O port coupled to a test controller, a test bus coupled to an in-circuit-tester system and a bridge matrix including an output unit and an input unit. The output unit either routes a first output signal from the I/O port to the test bus, or routes the first output signal to one of the global buses and routes a second output signal from another one of the global buses to the test bus. The input unit either routes a first input signal from the test bus to the I/O port, or routes the first input signal to one of the global buses and routes a second input signal from another one of the global buses to the I/O port.

Abstract: A test device is provided. The test device includes test components, power supplies, an alternating current (AC) power detection circuit and an alert module. The power supplies convert an AC power through a first wire, a second wire and an earth wire to a direct current (DC) power and supply the DC power to the test components. The AC power detection circuit receives the AC power through the first wire, the second wire and the earth wire to determine whether both of voltage differences between the first wire and the earth wire and between the second wire and the earth wire is outside of respective predetermined ranges. When both of the voltage differences are outside of the corresponding predetermined range, the AC power detection circuit controls the alert module to generate an alerting signal.

Abstract: An optical inspection system includes a first optical module and a second optical module. The first optical module includes a first light source having a first optical axis and a first image capturing unit having a first image capturing axis. The first optical axis and the first image capturing axis are symmetric relative a normal line of an inspection plane. A first angle is formed between the first optical axis and the first image capturing axis. The second optical module includes a second light source having a second optical axis and a second image capturing unit having a second image capturing axis. The second optical axis and the second image capturing axis are symmetric relative to the normal line. A second angle is formed between the second optical axis and the second image capturing axis and is different from the first angle.

Abstract: An inspection method is provided herein. The inspection method is adapted for an inspection device. The inspection method includes: optically scanning an examining target for generating a scanned image; reconstructing the scanned image for a reconstructed volume; adjusting a slicing direction associated with the examining target for slicing the reconstructed volume into a sliced image; inspecting the sliced image for analyzing one or more features of the examining target; and outputting an inspection result of the examining target.

Abstract: An inspecting device for inspecting an inspection target is provided. The inspecting device includes a mono-color image-retrieving module, illuminating modules and a control module. The mono-color image-retrieving module is disposed above the inspection target with an optical axis orienting toward the inspection target. Each of the illuminating modules includes light-emitting elements of different colors. The control module controls the illuminating modules to sequentially generate illuminating lights both in an order of different colors and different incident angles to further control the mono-color image-retrieving module to sequentially retrieve mono-color images each in response to one illumination of the illuminating lights. The control module performs an inspection of the inspection target based on the mono-color images.

Abstract: An inspection system includes an irradiation source, an image detector, and a placement device. The placement device comprises a carrier and a rotation mechanism. With respect to connections, the placement device is configured to be disposed between the irradiation source and the image detector, and the rotation mechanism is configured to be connected to the carrier. With respect to operations, the irradiation source and the image detector are driven to be moved along a predetermined path, the carrier is configured to carry at least one object, and the rotation mechanism is configured to rotate the carrier.

Abstract: An optical system includes an optical apparatus. The optical apparatus is for projecting a first projection image to a plane or detecting a first detected image of the plane. The optical apparatus includes a first image device, and a lens group. The first image device has an image surface having an image center. The lens group is disposed between the first image device and the plane and has a lens axis surface and an optic center. The optic center and the image center form a connection line. The plane has a tangent surface to an intersecting point of the connection line. The lens axis surface, the tangent surface, and an extension surface of the image surface substantially intersect at a straight line.

Abstract: A testing apparatus for providing per pin level setting is disclosed, and the testing apparatus includes a control unit and a filter circuit, where the control unit is electrically connected to the filter circuit. The control unit includes a field programmable gate array (FPGA) for providing a PWM signal. The filter circuit receives the PWM signal and outputs at least one DC voltage.

Abstract: An optical system includes at least one optical apparatus. The optical apparatus includes a first light source, a second light source, and a dynamic switch. The first light source is configured for providing a first light beam. The second light source is configured for providing a second light beam. The dynamic switch includes a plurality of mirrors arranged in an array manner. Each of the mirrors has a first tilt angle and a second tilt angle. The first light beam and the second light beam impinge on the dynamic switch from different directions. The dynamic switch reflects the first light beam to a desired position when the mirrors are at the first tilt angles, and reflects the second light beam to the desired position when the mirrors are at the second tilt angles.

Abstract: A board-warping measuring method is configured to measure a device under test. The device under test is disposed on a measuring carrier. The board-warping measuring method includes: projecting a pattern onto the device under test, wherein the pattern includes plural reference points; capturing a measurement image by an image-capturing module when the pattern is projected onto the device under test, wherein the measurement image includes plural measurement points respectively corresponding to the reference points; calculating a position of each of the measurement points in the measurement image by utilizing a transfer function corresponding to each of the reference points to obtain position heights of the device under test corresponding to the measurement points; and compensating for board warping of the device under test based on the position heights of the device under test corresponding to the measurement points.

Abstract: A three-dimensional measurement system includes a measurement platform, a projection module, an image-capturing module, and a control unit. The measurement platform carries a test object. The projection module includes a light-emitting unit, a light-shielding rotary disc, a grating unit, and an optical-reflective ring structure. The light-emitting unit generates a light beam. An aperture formed in the light-shielding rotary disc is located at different rotational positions time-sequentially while the light-shielding rotary disc rotates, and the light beam passes through the aperture to form light beam segments. The grating unit transforms the light beam segments into stripe-patterned structure-light beams. The optical-reflective ring structure reflects the stripe-patterned structure-light beams onto the test object. The image-capturing module captures stripe-patterned images formed after reflection of the stripe-patterned structure-light beams from the test object.

Abstract: A measuring system for a 3D object includes a base, a horizontal scanning device disposed on the base, a first light emitting device, a second light emitting device, an image capture device, and a control device. The first light emitting device, the second light emitting device, and the image capture device are connected to the horizontal scanning device. The control device controls the horizontal scanning device to cause planar motion relative to the base. With the control of the control device, the first light emitting device and the second light emitting device alternate in projecting a light source onto a 3D object. The image capture device includes a double-sided telecentric lens to capture a plurality of images of the 3D object when the light source is projected onto the 3D object.

Abstract: A testing apparatus with a back-drive protection function is disclosed, where the testing apparatus includes a driver and a field programmable gate array (FPGA), where the driver is electrically connected to the FPGA. The FPGA can monitor output current from the driver and perform the back-drive protection function on the driver to protect device-under-test (DUT).

Abstract: A three-dimensional image measuring apparatus includes a measurement platform, a movable optical head, a three-dimensional calculator module, a moving module and a calibration controlling module. The movable optical head includes a beam splitter unit, a projecting module, an image-capturing module and an indicator module. The measurement platform supports an object under measurement. The projecting module generates a structure light of parallel sinusoid strips pattern to the object under measurement. The image-capturing module includes image-capturing units facing the object under measurement from different directions or angles. Each image-capturing unit is configured to capture a reflection image which is formed from the structure light of parallel sinusoid strips pattern reflected by the object under measurement. The indicator module projects an alignment beam onto the object under measurement for forming an alignment mark.

Abstract: A device for performing timing analysis used in a programmable logic array system is provided. The device comprises first and second basic I/O terminals, a channel multiplexer, high-speed I/O terminals, a sampling module and a timing analysis module. The first basic I/O terminals receive under-test signals from an under-test unit. The channel multiplexer receives the under-test signals from the first basic I/O terminals to select at least a group of the under-test signals to be outputted to the second basic I/O terminals. The high-speed I/O terminals has a logic level analyzing speed higher than that of the first and second basic I/O terminals. The sampling module receives the group of under-test signals from the high-speed I/O terminals and samples the group of under-test signals to generate a sample result. The timing analysis module performs timing analysis and measurement according to the sample result.