Abstract: The invention concerns a method of optical, inspection of an electronic circuit (Card) including the acquisition of images of the electronic circuit by image sensors (C), the use of the images to determine the offset between the position of the electronic circuit (Card) and an inspection position, and the use of said images in at least another step of the method.

Abstract: The invention concerns a calibration target (30) of an optical system, formed of a plate (32) comprising through holes (38).

Abstract: A method of assisting the optical inspection of an object includes the steps of: determining a first three-dimensional image of the object; determining a first color or grey level two-dimensional image of the object; determining at least one first window (F1) on the first two-dimensional image surrounding a possible defect of the object from the first three-dimensional image and/or from the first two-dimensional image; determining a second two-dimensional image corresponding to the first two-dimensional image outside of the first window and corresponding to a first depth map of the object in the first window; and determining a second three-dimensional image (I3D?) corresponding to the first three-dimensional image having the second two-dimensional image applied thereon.

Abstract: A method of assisting the optical inspection of an object includes the steps of: determining a first three-dimensional image of the object; determining a first color or grey level two-dimensional image of the object; determining at least one first window (F1) on the first two-dimensional image surrounding a possible defect of the object from the first three-dimensional image and/or from the first two-dimensional image; determining a second two-dimensional image corresponding to the first two-dimensional image outside of the first window and corresponding to a first depth map of the object in the first window; and determining a second three-dimensional image (I3D?) corresponding to the first three-dimensional image having the second two-dimensional image applied thereon.

Abstract: Correction of an initial three-dimensional image of a deformed object comprises the provision of a model of the undeformed object comprising first zones, the determination in the initial three-dimensional image of second zones corresponding to the first zones, the determination of a first geometric transformation which maps the second zones to the first zones and the determination of a three-dimensional image corrected on the basis of the first geometric transformation and of the initial three-dimensional image.

Abstract: A three-dimensional image acquisition system including: at least two projectors aligned in a direction and suitable for illuminating a scene, the projection axes of the projectors defining a plane for each projector, and being turned toward the scene. A first and second camera are placed on one side of said plane, and a third and fourth camera placed on the other side of said plane. The optical axis of the first and second cameras form, with said plane, a different first and second angle, respectively, and the optical axis of the third and fourth cameras form, with said plane, a different third and fourth angle, respectively.

Abstract: An optical inspection system for an electronic circuit comprises sensors of images of the electronic circuit, at least two supports on which are intended to rest two parts of the electronic circuit and a device for modifying the position of each support, independently of one another.

Abstract: An installation of optical inspection of integrated circuits or the like includes a photographic system placed above a scene in a plane defined by a first and a second direction, the photographic system having several digital cameras each having an orthogonal array of pixels, all cameras having their respective optical axes inclined by a first angle with respect to a third direction perpendicular to the two others; and two projectors of determined patterns, these patterns being such that two straight lines projected by each of the projectors are aligned in the plane defined by the first two directions and are coplanar with a straight line interconnecting the optical centers of the two projectors.

Abstract: An installation of optical inspection of integrated circuits or the like, comprising: a planar conveyor along a first direction of the objects to be analyzed and a photographic system placed above an area of the conveyor and in a fixed position with respect thereto, the photographic system comprising at least one first set of digital cameras each comprising an orthogonal array of pixels, said cameras being aligned in a second direction different from the first one, the cameras being all oriented so that one of the orthogonal directions of their pixel array forms a first angle with the first direction.

Abstract: An installation of optical inspection of integrated circuits or the like, comprising: a photographic system placed above a scene in a plane defined by a first and a second direction, the photographic system comprising several digital cameras each comprising an orthogonal array of pixels, all cameras having their respective optical axes inclined by a first angle with respect to a third direction perpendicular to the two others; and two projectors of determined patterns, these patterns being such that two straight lines projected by each of the projectors are aligned in the plane defined by the first two directions and are coplanar with a straight line interconnecting the optical centers of the two projectors.

Abstract: An installation of optical inspection of integrated circuits or the like, comprising: a planar conveyor along a first direction of the objects to be analyzed and a photographic system placed above an area of the conveyor and in a fixed position with respect thereto, the photographic system comprising at least one first set of digital cameras each comprising an orthogonal array of pixels, said cameras being aligned in a second direction different from the first one, the cameras being all oriented so that one of the orthogonal directions of their pixel array forms a first angle with the first direction.

Abstract: The invention relates to a method of focusing, by an imaging device, of images of a substantially planar surface of an object including the step of determining the attitude of the surface of the object with respect to a reference plane by scanning this surface by means of at least one triangulation sensor along exactly two parallel lines in the reference plane. The invention further includes the steps of splitting the surface of the object into areas of a size corresponding to the size of a taken image, inferring from the attitude respective elevations of the image areas, and adjusting, for each area, the focus with respect to the elevation thereof.