Abstract: A method of inspecting a material includes examining a surface of a test material with an eddy current sensor and applying an X-ray fluorescence analysis to the surface of the test material at the same location at which the eddy current examination was performed.
Type:
Grant
Filed:
December 23, 2021
Date of Patent:
July 25, 2023
Assignee:
BWXT Nuclear Operations Group, Inc.
Inventors:
Paul D. Sheldon, Wayne M. Latham, Thomas C. Mohr, Aaron C. Havener, Richard Manzini, Timothy A. Policke
Abstract: The present application belongs to the technical field of monitoring of durability of concrete, and particularly relates to a method for optimizing a structure of an electrical capacitance tomography sensor and analyzing an electromagnetic field. A specific process of the method includes eight steps: parameter setting, geometric setting, material setting, mesh generation, physical field setting, solution, sensor structure optimization and calculation of electromagnetic field distribution. The method proposes a new concept for solving a forward problem of an ECT system based on COMSOL software. After modeling is completed, uniformity of a sensitive field of the ECT sensor is analyzed according to calculation results, and structural parameter values of components of the ECT sensor are adjusted to seek an optimal design scheme.
Abstract: A plasma probe device includes: an antenna installed in an opening portion formed in a wall of a processing container via a seal member that seals between a vacuum space and an atmospheric space; and a light transmission portion installed inside the antenna or forming at least a portion of the antenna, and configured to transmit emission of plasma generated in the vacuum space to the atmospheric space.
Abstract: A switch assembly configured to determine when input received from a switch is caused by proper actuation of the switch and should be accepted, or is caused instead by a fault in the switch or in the intervening circuitry and should be ignored and/or reported. The switch assembly optionally includes a logic circuit that is electrically connected to the switch. The logic circuit may provide power to the switch, for example, as a time varying signal, which may then be presented to the logic circuit as input when the switch is properly actuated. The logic circuit may then compare the input from the switch with the signal sent to the switch to determine if a fault is present, or if the switch is operating properly.
Abstract: A system and method that can automatically select a frequency of a magnetic field in a magnetic tracking system. A magnetic tracking system emits an alternating magnetic field using a set of three frequencies. In the present approach, a transmitter is capable of generating multiple sets of three frequencies. A processor selects a first set of frequencies to use and causes the receiver to measure the amplitude of the magnetic field at those frequencies. In one embodiment, the frequency set having the lowest energy is selected. The processor then compares an estimated jitter at those frequencies to the actual jitter experienced using the frequencies. If the actual jitter exceeds the estimated jitter by a predetermined amount, the processor switches to a different set of frequencies and causes the receiver to measure the magnetic field at the new set of frequencies. The process may repeat using the additional sets of frequencies.
Type:
Grant
Filed:
June 7, 2022
Date of Patent:
July 4, 2023
Assignee:
PENUMBRA, INC.
Inventors:
Cameron J. Mahon, Oded Y. Zur, Alejandro S. Diaz
Abstract: A battery management system (BMS) for a vehicle includes a module for estimating the state of a rechargeable battery, such as its state of charge, in real time. The module includes a learning model for predicting the state of a battery based on the vehicle's usage and related factors unique to the vehicle, in addition to a sensed voltage, current and temperature of a battery.
Abstract: A display device including: a display panel; a first substrate attached to a side of the display panel; and a second substrate attached to a side of the first substrate, wherein the display panel includes a first panel test pad and a second panel test pad, the first substrate includes a 1-1 circuit test lead overlapping and connected to the first panel test pad, a 1-2 circuit test lead overlapping and connected to the second panel test pad, a 2-1 circuit test lead overlapping and connected to the second substrate, a 1-1 test lead line connected to the 1-1 circuit test lead, a 1-2 test lead line connected to the 1-2 circuit test lead, and a first test lead line connected to the 2-1 circuit test lead, and the 1-1 test lead line and the 1-2 test lead line are connected to the first test lead line.
Type:
Grant
Filed:
November 18, 2020
Date of Patent:
June 27, 2023
Assignee:
SAMSUNG DISPLAY CO., LTD.
Inventors:
Yong Jin Shin, Kyun Ho Kim, Uk Jae Jang, Bong Im Park
Abstract: Described is an invention that adds capacitive sensing ability with a single magnetic field sensor location or distributed within an array of surfaces of the sensor. The capacitive sensing can be achieved by modifying a classic Hall effect sensor or putting separate capacitive sensor plates in close proximity to the hall effect sensor.
Type:
Grant
Filed:
September 2, 2021
Date of Patent:
June 27, 2023
Assignee:
Lexmark International, Inc.
Inventors:
James Howard Ellis, Jr., Keith Bryan Hardin
Abstract: In accordance with at least one aspect of this disclosure, a controller for an aircraft electrical system includes, a software safe module. In embodiments, the software safe module can be configured to determine whether there was a sudden power failure upon controller initialization, and cause operation of the controller in a software safe mode if there was a sudden power failure such that manual intervention is required to leave the software safe mode to prevent repetitive power failure of the controller.
Type:
Grant
Filed:
September 14, 2021
Date of Patent:
June 27, 2023
Assignee:
Hamilton Sundstrand Corporation
Inventors:
Kamaraj Thangavelu, Matthew Ryan Hasseman, Jeffrey D. Myroth, Ryan Thomas Carter
Abstract: An integrated circuit method processes parametric data for each integrated circuit die in a plurality of integrated circuit die to determine an expected data pattern, screens integrated circuit die by comparing a data pattern corresponding to a plurality of parametric data for the integrated circuit die to an expected data pattern and, responsive to the comparing, determining whether a difference between the data pattern corresponding to a plurality of parametric data for the predetermined integrated circuit die and the expected data pattern is beyond a tolerance.
Abstract: Methods and apparatus that can include a rotatable target to generate a sinusoidal signal in a magnetic field sensor, wherein the target includes a plurality of sinusoidal teeth to reduce angular error. A magnetic field sensor can be configured to determine a position of the target. In embodiments, a rotatable target to generate a sinusoidal signal in a magnetic field sensor can include a plurality of sinusoidal teeth and a number of harmonics to reduce angular error.
Type:
Grant
Filed:
January 7, 2022
Date of Patent:
June 27, 2023
Assignee:
Allegro MicroSystems, LLC
Inventors:
Rémy Lassalle-Balier, Jeffrey Eagen, Damien Dehu, Paul A. David, Andrea Foletto, Maxime Rioult
Abstract: A magnetic sensor device includes at least one magnetic sensor and a support. A center of gravity of an element layout area of the at least one magnetic sensor is deviated from a center of gravity of a reference plane of the support. The at least one magnetic sensor includes four resistor sections constituted by a plurality of magnetoresistive elements. Magnetization of a free layer in each of two of the resistor sections includes a component in a third magnetization direction. The magnetization of a free layer in each of the other two resistor sections includes a component in a fourth magnetization direction opposite to the third magnetization direction.
Abstract: Disclosed is a system for interacting with polyisoprene based products to enhance sensing features. The system includes a hub unit and one or more electronic circuitries operably configured with the polyisoprene based product. The hub unit includes a controller for contactless powering and communicating data with the polyisoprene based product, a generator for generating a frequency, a resonator for increasing voltage level of the frequency, a first electrode for emitting the alternating electric field, a second electrode for receiving the alternating electric field from the polyisoprene based product, an analog digital converter connected to the second electrode to digitize information received from the polyisoprene based product under the influence of the alternating electric field. The one or more electronic circuitries senses the condition of the polyisoprene based product and communicates further to the hub unit for processing and communicating processed information over a communication network.
Abstract: According to various implementations, an apparatus for electromagnetic impedance spectrographic characterization of a material under test (MUT) includes: a planar array of at least two electrodes configured to be placed in electromagnetic communication with the MUT, wherein during operation of the planar array, at least one of the electrodes comprises a transmitting electrode for transmitting an electromagnetic signal over a range of frequencies through the MUT to at least one receiving electrode in the planar array; and a backer ground plate at least partially surrounding the at least two electrodes, the backer ground plate being electrically grounded and insulated from the at least two electrodes, wherein the backer ground plate extends from a plane formed by the at least two electrodes and separates the at least two electrodes to create an electrically isolated volume proximate to the at least two electrodes.
Type:
Grant
Filed:
February 11, 2022
Date of Patent:
June 20, 2023
Assignee:
TRANSTECH SYSTEMS, INC.
Inventors:
Manfred Geier, Adam D. Blot, Andrew J. Westcott
Abstract: An electrical field mapping system with an improved measurement and recording method which enables students to produce an electric field map of equipotential lines and electric field vectors. Measurements of an electric potential point and an electric field vector may be made by a three-probe sensor with pointer and displayed on voltmeters. An angular scale below the pointer may assist to measure the direction of the electric field. An X-Y transfer mechanism transfers the location of the three-probe sensor, from the space around electrodes, to a marker at a corresponding location in the recording area. Recordings of the field data are made by markers with different impressions and may include an electric field vector, equipotential line segment, and electric potential point.
Abstract: A rotary encoder (1) is provided, including a shaft (W) connected to and drivable by an external shaft, a first gear unit (G1) and a second gear unit (G2), each following rotations of the shaft (W). Both gear units (G1, G2) (G1 and G2) are drivable independently of one another by the shaft (W), a first gear stage (G1S1) of the first gear unit (G1) has a first detection unit (E1), and a gear stage (G2S2) downstream of a first gear stage (G2S1) of the second gear unit (G2) has a second detection unit (E2). An evaluation unit derives the angular position from signals of the detection units (E1, E2) and compares the rotations of the first gear stage (G1S1) and the downstream gear stage (G2S2) for plausibility, taking into account a known ratio of the rotation of the first gear stage (G1S1) to the rotation of the downstream gear stage (G2S2).
Abstract: Embodiments of the present disclosure relate to solutions for introducing personalization data in nonvolatile memories of a plurality of integrated circuits, comprising writing in the nonvolatile memory of a given integrated circuit a static data image, corresponding to an invariant part of nonvolatile memory common to the plurality of integrated circuits, and a personalization data image representing data specific to the given integrated circuit.
Abstract: A magnetic sensor comprises a magnetoresistive effect element including a first side surface and a second side surface facing in opposite directions along a first axis and a first end surface and a second end surface facing in opposite directions along a second axis substantially orthogonal to the first axis. The sensor has a sensitivity axis extending in a direction of the first axis, a first yoke unit provided adjacent to the first side surface of the magnetoresistive effect element, and a first bias magnetic field generation unit provided adjacent to the first end surface of the magnetoresistive effect element. The first bias magnetic field generation unit is provided to be capable of applying a bias magnetic field on the magnetoresistive effect element and the first yoke unit.
Type:
Grant
Filed:
October 24, 2022
Date of Patent:
June 13, 2023
Assignee:
TDK Corporation
Inventors:
Kenichi Takano, Tsuyoshi Umehara, Yuta Saito, Hiraku Hirabayashi
Abstract: Systems, assemblies, and methods can involve a retainer assembly adapted to interface with a sensor rod of an in-cylinder position sensor assembly of a fluid cylinder. The retainer assembly can comprise an annular body that defines a bore extending from a first end of the annular body to a second end of the annular body opposite the first end; a sleeve disposed in the bore at an inner wall of the annular body; and one or more magnets fixedly provided between the annular body and the sleeve in a radial direction of the annular body. Each of the one or more magnets may be fixedly molded in place between the annular body and the sleeve in the radial direction of the annular body.
Type:
Grant
Filed:
December 15, 2020
Date of Patent:
June 13, 2023
Assignee:
Caterpillar Inc.
Inventors:
Ananda S. Ponnusamy, Kurt S. Goslovich, Satish B. Nutakki
Abstract: Planar error between a probe card and a semiconductor wafer may be reduced with a low-profile gimbal platform. The low-profile gimbal platform may be coupled between a probe card and a tester head. The low-profiled gimbal platform includes a number of linear actuators and pistons that are used to perform high-precision in situ planarity adjustments to the probe card to achieve co-planarity between the probe card and the semiconductor wafer. The in situ planarity adjustments may reduce the likelihood of malfunctions due to misalignment of the probe card.