Patents Examined by Amy He
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Patent number: 11221358Abstract: Provided is an electronic device inspection apparatus that suppresses cost increase. A prober is provided with a stage on which a carrier or a wafer is placed. The stage is provided with a stage cover on which the carrier is placed, a cooling unit in contact with the stage cover, and an LED irradiation unit facing the carrier across the stage cover and the cooling unit. Each of the stage cover and the cooling unit is formed of light-transmitting material. A light-transmitting coolant flows in a coolant flow path in the cooling unit. The LED irradiation unit has a plurality of LEDs oriented to the carrier. The carrier is formed of a glass substrate having a substantially disk-like shape. A plurality of electronic devices is arranged on a surface of the carrier at predetermined intervals.Type: GrantFiled: September 29, 2017Date of Patent: January 11, 2022Assignee: TOKYO ELECTRON LIMITEDInventors: Shigeru Kasai, Yoshinori Fujisawa
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Patent number: 11181550Abstract: Probe systems and methods including electric contact detection. The probe systems include a probe assembly and a chuck. The probe systems also include a translation structure configured to operatively translate the probe assembly and/or the chuck and an instrumentation package configured to detect contact between the probe system and a device under test (DUT) and to test operation of the DUT. The instrumentation package includes a continuity detection circuit, a test circuit, and a translation structure control circuit. The continuity detection circuit is configured to detect electrical continuity between a first probe electrical conductor and a second probe electrical conductor. The test circuit is configured to electrically test the DUT. The translation structure control circuit is configured to control the operation of the translation structure. The methods include monitoring continuity between a first probe and a second probe and controlling the operation of a probe system based upon the monitoring.Type: GrantFiled: May 23, 2019Date of Patent: November 23, 2021Assignee: FormFactor, lnc.Inventors: Sia Choon Beng, Kazuki Negishi
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Patent number: 11181495Abstract: A rainwater detection device for detecting rainwater is provided. The rainwater detection device includes: a panel having a surface; rainwater sensing wires on the surface; and a rainwater sensor (i) physically connected with the rainwater sensing wires without an electrical connection if a condition is unsatisfied and (ii) physically and electrically connected with the rainwater sensing wires if the condition is satisfied; wherein a first wire, one of the rainwater sensing wires, is separated from a second wire, another of the rainwater sensing wires, by an interval, without contacting each other and wherein the rainwater sensing wires are connected to opposite polarity of an electrode connected with the rainwater sensor, and wherein the condition is that a first state where no current flows between the first and the second wires is changed to a second state where current flows between the first and the second wires due to the rainwater.Type: GrantFiled: February 25, 2021Date of Patent: November 23, 2021Assignee: NATIONAL INSTITUTE OF METEOROLOGICAL SCIENCESInventors: Geon Tae Kim, Seon Jeong Kim, Yoo Jun Kim, Baek Jo Kim
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Patent number: 11169196Abstract: The present application discloses a method and device suitable to perform the method for operating Voltage Indication system (VIS) and partial discharge module (PD) for medium-voltage or high voltage apparatuses, comprising: monitoring, with the partial discharge-module (PD), provided in low-voltage section, whether partial discharge occurs within a dielectric of the high-voltage or medium-voltage apparatus or system, the partial discharge-module or VIS being electrically connected to a coupler provided in the medium-voltage or high-voltage apparatus; indicating with the Voltage Indication System (VIS), provided in a low-voltage portion, the presence of operating voltages in high-voltage or medium-voltage apparatus or system, Voltage Indication System (VIS) being electrically connected with partial discharge-module (PD) and deactivating by deactivation module connected to Voltage Indication System and partial discharge-module (PD) an optical display in the Voltage Indication System (VIS) during partial dischaType: GrantFiled: July 1, 2019Date of Patent: November 9, 2021Assignee: ABB Schweiz AGInventors: Yannick Maret, Kai Hencken, Stefano Marano
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Patent number: 11169220Abstract: A deterioration degree diagnosis device includes a measurement unit and a diagnosis unit. The measurement unit measures an impedance related to a contact resistance of an electrical connection portion by measuring an AC voltage between metal members and an AC current flowing between the metal members in a state where an AC signal of a predetermined frequency is applied to an electric circuit that connects two metal members in contact via the electrical connection portion. The diagnosis unit diagnoses a deterioration degree of the electrical connection portion based on a reactance component value in the impedance measured by the measurement unit.Type: GrantFiled: June 7, 2019Date of Patent: November 9, 2021Assignees: YAZAKI CORPORATION, NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGYInventors: Jun Toyoizumi, Yoshitaka Ito, Takaya Kondo, Yasuhiro Fukuyama, Nobuhisa Kaneko
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Patent number: 11156447Abstract: A gap measurement device. The device has a circuit having a variable inductor and a capacitor. The variable inductor has an indicator. The device has a gap that includes a gap measurement and a gap length. The gap measurement is related to the inductance. The gap is configured to receive at least a portion of the variable inductor while the variable inductor moves along the gap length. The movement of the variable inductor along the gap length causes the inductance to change in response to the gap measurement.Type: GrantFiled: July 23, 2018Date of Patent: October 26, 2021Assignee: U.S. Department of EnergyInventors: Joel A. Johnson, Ronald J. Heaps
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Patent number: 11156652Abstract: A reflectometry system for the analysis of faults in a transmission line into which a complex signal, generated then modulated, has been injected, includes a means for measuring the modulated complex signal propagating in the transmission line, a demodulator of the measured signal designed to produce a demodulated complex signal, a complex correlator configured for correlating the demodulated complex signal with a copy of the generated complex signal, in order to produce a first time-domain reflectogram corresponding to the real part of the complex correlation and a second time-domain reflectogram corresponding to the imaginary part of the complex correlation, a module for joint analysis of the first time-domain reflectogram and of the second time-domain reflectogram for identifying the presence of faults in the transmission line.Type: GrantFiled: November 29, 2017Date of Patent: October 26, 2021Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESInventors: Esteban Cabanillas, Christophe Layer
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Patent number: 11143718Abstract: Thermal-mechanical fatigue assessment systems and methods include a controller operable to estimate a temperature of the conductor having a non-linear resistance based on an ambient temperature input and a current input for current flow through the conductor when connected to an energized electrical power system. A state of fatigue of the conductor may be assessed in view of an estimated first temperature differential between the conductor and an arc extinguishing medium surrounding the conductor, an estimated temperature differential between the temperature of the arc quenching medium and the ambient temperature, and the estimated temperature of the conductor.Type: GrantFiled: May 31, 2018Date of Patent: October 12, 2021Assignee: EATON INTELLIGENT POWER LIMITEDInventors: Gopinadh Sirigineedi, Pandarinath R, Ravishankar S, Robert Stephen Douglass, Harold Handcock
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Patent number: 11143496Abstract: The present disclosure provides an electrostatic self-powered strain grid sensor configured to measure strain of a component to be measured. The sensor includes a slide groove and a slide sheet. The slide groove is fixed to a fixing end and a sensor array is arranged at an inside bottom of the slide groove. The slide sheet is fixedly connected with the component to be measured and a lower end part of the slide sheet is in contact with the inside bottom of the slide groove. An electric signal is output when the slide sheet sweeps over the sensor array. Based on the output current of a sensor unit of the sensor array indicated by the signal, the number of segments swept over by the slide sheet and a distance swept over the sensor units in a single sensor array by the slide sheet is obtained, thereby acquiring a structural strain.Type: GrantFiled: July 25, 2019Date of Patent: October 12, 2021Assignee: ZHEJIANG UNIVERSITYInventors: He Zhang, Liwei Quan, Jiwei Zhang, Zhicheng Zhang
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Patent number: 11143674Abstract: A probe head includes a linear probe which is flattened at least one of tail, body and head portions thereof and thereby defined with first and second width axes, along which each of the tail, body and head portions is defined with first and second widths, and upper and lower die units having upper and lower installation holes respectively, wherein the tail and head portions are inserted respectively, which are offset from each other along the second width axis so that the body portion is curved. The first and second widths of the body portion are respectively larger and smaller than the first and second widths of at least one of the tail and head portions. As a result, the probes of the same probe head are consistent in bending direction and moving behavior and prevented from rotation, drop and escape.Type: GrantFiled: July 1, 2019Date of Patent: October 12, 2021Assignee: MPI CORPORATIONInventors: Tzu Yang Chen, Chia Ju Wei
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Patent number: 11131642Abstract: The present disclosure relates to a measuring circuit for a conductivity sensor, wherein the measuring circuit includes a built-in reference circuit and multiple built-in measuring ranges.Type: GrantFiled: September 17, 2018Date of Patent: September 28, 2021Assignee: Endress+Hauser Conducta GmbH+Co. KGInventors: Stefan Paul, Erik Münz
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Patent number: 11073576Abstract: An object of the present invention is to selectively detect a detection magnetic field without separately providing a sensor for detecting an environmental magnetic field. A magnetic field detection device includes a magnetic field detection unit 10 that generates an output signal S1 according to a magnetic field, a first signal generation unit 20 that extracts a predetermined frequency component from the output signal S1 and generates a cancel signal S2 based on the predetermined frequency component, a first magnetic field generation unit 40 that applies a first cancel magnetic field to the magnetic field detection unit 10 based on the cancel signal S2, and a second signal generation unit 30 that generates a detection signal S3 based on the output signal S1 of the magnetic field detection unit 10 to which the first cancel magnetic field is applied.Type: GrantFiled: October 20, 2016Date of Patent: July 27, 2021Assignee: TDK CORPORATIONInventor: Kei Tanabe
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Patent number: 11061075Abstract: A system configured to avoid a power shortage while a vehicle is traveling is provided. A voltage measurement device includes a relay, a first voltage measurement unit measures a first voltage applied to the power supply circuit, a second voltage measurement unit, a power supply circuit, and a control circuit. The power supply circuit is indirectly connected to a direct current bus. A first end of the relay is connected to the direct current bus, whereas a second end is connected to the power storage device. The control circuit, controls opening and closing of the relay, and closes a path between the first end and the second end when the first voltage is lower than or equal to a first threshold value. The second voltage measurement unit measures a second voltage applied to the second end at least when the relay is in an open state.Type: GrantFiled: November 25, 2016Date of Patent: July 13, 2021Assignees: AutoNetworks Technologies, Ltd., Sumitomo Wiring Systems, Ltd., Sumitomo Electric Industries, Ltd.Inventor: Hiromichi Yasunori
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Patent number: 11054466Abstract: A semiconductor device test system and a semiconductor device test method are provided. The system includes a device under test (DUT) which provides an output voltage to a load connected to an output terminal, automatic test equipment (ATE) which supplies power to the DUT and measures the output voltage of the DUT, and a current mirror which is connected between the ATE and the DUT. The ATE outputs a reference current to the current mirror, and the DUT provides an output current to the current mirror. The output current is obtained by mirroring the reference current from the ATE.Type: GrantFiled: May 31, 2018Date of Patent: July 6, 2021Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventor: Sung-Gu Lee
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Patent number: 11041930Abstract: According to one embodiment, the MRI apparatus includes an RF coil apparatus having a coil element, a coil port to which the RF coil apparatus is connectible, receive circuitry receiving a signal detected by the RF coil apparatus via the coil port when neither an RF pulse nor a gradient magnetic field is being applied, and performing A/D conversion with an A/D converter, and processing circuitry detecting an abnormality based on the signal. With the RF coil apparatus being connected to the coil port, the receive circuitry switches at least one switch provided in a section between the coil element and the A/D converter between on and off, and receives the signal. The processing circuitry compares a signal of a path where the coil element and A/D converter are connected with a signal of a path where the coil element and A/D converter are not connected, and detects the abnormality.Type: GrantFiled: May 3, 2018Date of Patent: June 22, 2021Assignee: CANON MEDICAL SYSTEMS CORPORATIONInventors: Shinji Mitsui, Keiji Tahira
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Patent number: 11016137Abstract: A semiconductor inspection jig includes: a jig body having a recessed part provided on a top surface of the jig body; a printed circuit board provided on the top surface of the jig body; a GND block provided in the recessed part and having first and second side faces opposite to each other; first and second blocks provided in the recessed part and sandwiching the GND block; a push-up part pushing up the GND block from a bottom surface of the recessed part; a first press part pressing the first block against the first side face of the GND block; and a second press part pressing the second block against the second side face of the GND block.Type: GrantFiled: May 3, 2018Date of Patent: May 25, 2021Assignee: Mitsubishi Electric CorporationInventor: Tomohito Taniuchi
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Patent number: 10969249Abstract: A method, apparatus, and system use logic circuitry arranged within an integrated circuit to: convert a self capacitance of a first sensor element arranged within the integrated circuit to a digital value, and apply a signal to an output pin of the integrated circuit based on the self capacitance.Type: GrantFiled: February 15, 2017Date of Patent: April 6, 2021Assignee: Cypress Semiconductor CoprorationInventors: Rajagopal Narayanasamy, Mahadevan Krishnamurthy Narayana Swamy, David G. Wright, Steve Kolokowsky
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Patent number: 10961841Abstract: Systems and methods for corrosion detection of downhole tubulars.Type: GrantFiled: June 2, 2017Date of Patent: March 30, 2021Assignee: Halliburton Energy Services, Inc.Inventors: Reza Khalaj Amineh, Burkay Donderici, Luis Emilio San Martin
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Patent number: 10958101Abstract: An electric power system includes an energy management system configured to control a generated power output level of one or more electric generator resources, and a configuration of two or more high-voltage transmission lines, for efficient operation based, at least in part, on a topology error estimation using binary values corresponding to switch statuses. Increased accuracy of network topology estimates facilitates improved state estimation, which in turn enables production of more highly optimized control of electric generator resources and configuration of high-voltage transmission lines.Type: GrantFiled: June 1, 2018Date of Patent: March 23, 2021Assignee: SIEMENS INDUSTRY, INC.Inventors: James G. Frame, Lei Fan
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Patent number: 10955488Abstract: A modular power supply including a voltage regulator configured to output a voltage, a first output configured to connect to a device under test and output the voltage from the regulator, a microcontroller connected to the voltage regulator, and an interface configured to connect to a test and measurement instrument. The interface includes an input configured to receive power from the test and measurement instrument and a second output configured to output a signal characteristic of the first output.Type: GrantFiled: April 20, 2018Date of Patent: March 23, 2021Assignee: Tektronix, Inc.Inventors: Haiping Lv, Hai Wen Yu