Patents Examined by Brian P. Werner
  • Patent number: 9454700
    Abstract: In a feature extraction and pattern matching system, image sharpening can enable vascular point detection (VPD) for detecting points of interest from visible vasculature of the eye. Pattern Histograms of Extended Multi-Radii Local Binary Patterns and/or Pattern Histograms of Extended Multi-Radii Center Symmetric Local Binary Patterns can provide description of portions of images surrounding a point of interest, and enrollment and verification templates can be generated using points detected via VPD and the corresponding descriptors. Inlier point pairs can be selected from the enrollment and verification templates, and a first match score indicating similarity of the two templates can be computed based on the number of inlier point pairs and one or more parameters of a transform selected by the inlier detection. A second match score can be computed by applying the selected transform, and either or both scores can be used to authenticate the user.
    Type: Grant
    Filed: November 5, 2015
    Date of Patent: September 27, 2016
    Assignee: EyeVerify Inc.
    Inventors: Vikas Gottemukkula, Reza R. Derakhshani, Sashi K. Saripalle
  • Patent number: 9454827
    Abstract: Systems, devices and methods for improved tracking with an electronic device are disclosed. The disclosures employ advanced exposure compensation and/or stabilization techniques. The tracking features may therefore be used in an electronic device to improve tracking performance under dramatically changing lighting conditions and/or when exposed to destabilizing influences, such as jitter. Historical data related to the lighting conditions and/or to the movement of a region of interest containing the tracked object are advantageously employed to improve the tracking system under such conditions.
    Type: Grant
    Filed: February 20, 2014
    Date of Patent: September 27, 2016
    Assignee: QUALCOMM Incorporated
    Inventors: Fan Deng, Ming Yan, Lei Ma, Dashan Gao, Xin Zhong, Shizhong Liu
  • Patent number: 9442077
    Abstract: Methods and systems for filtering scratches from wafer inspection results are provided. One method includes generating a defect candidate map that includes image data for potential defect candidates as a function of position on the wafer and removing noise from the defect candidate map to generate a filtered defect candidate map. The method also includes determining one or more characteristics of the potential defect candidates based on portions of the filtered defect candidate map corresponding to the potential defect candidates. In addition, the method includes determining if each of the potential defect candidates are scratches based on the one or more characteristics determined for each of the potential defect candidates and separating the potential defect candidates determined to be the scratches from other defects in inspection results for the wafer.
    Type: Grant
    Filed: August 25, 2014
    Date of Patent: September 13, 2016
    Assignee: KLA-Tencor Corp.
    Inventors: Junqing Huang, Huan Jin, Grace Hsiu-Ling Chen, Lisheng Gao
  • Patent number: 9436867
    Abstract: The method produces, from a first image, a second image with sparse coding. The method produces, from the first image, a processing intermediate image having a pixel value distribution that a difference among pixel values in a region of the intermediate image is equal to a DC component in a corresponding region of the first image, performs a first process of acquiring, using an AC component in a first region of the intermediate image and a basis produced by dictionary learning, an AC component in a second region, performs a second process of acquiring a difference among pixel values in the second region as a DC component in a corresponding region of the second image, and repeats the first and second processes with changing a position of the first region in the intermediate image to acquire DC components in regions of the second image.
    Type: Grant
    Filed: December 17, 2014
    Date of Patent: September 6, 2016
    Assignee: CANON KABUSHIKI KAISHA
    Inventor: Yoshinori Kimura
  • Patent number: 9436990
    Abstract: The present invention is detection of a defect signal which is small enough to be buried in a background noise, by a method that includes detecting a defect on a specimen which is detected by another inspection device by using a detection device equipped with an optical microscope, amending positional information of the defect, observing the defect by using an SEM, wherein the detecting the defect is carried out such that forming stationary waves on the specimen by irradiating the specimen with two illumination lights having the same wavelength from the opposite directions on the same incidence plane at the same incidence angle and cause the two illuminating light to interfere; removing scattered components generated by minute irregularities on the specimen surface by a spatial filter, detecting an image formed by the scattered light not removed by the spatial filter; and processing the detected image to detect the defect.
    Type: Grant
    Filed: October 22, 2012
    Date of Patent: September 6, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuko Otani, Toshifumi Honda, Shunichi Matsumoto
  • Patent number: 9436894
    Abstract: Provided are an image alignment apparatus and an image alignment method using the same. The image alignment apparatus includes a first conversion function estimation unit for estimating a first conversion function based on feature point information that is extracted from a first image, which is captured by using a first image sensor, and a second image, which is captured by using a second image; and a second conversion function estimation unit for estimating a second conversion function based on motion information that is extracted from the first image and the second image.
    Type: Grant
    Filed: February 11, 2014
    Date of Patent: September 6, 2016
    Assignee: Hanwha Techwin Co., Ltd.
    Inventors: Joon Sung Lee, Jae Yoon Oh, Gon Soo Kim
  • Patent number: 9430691
    Abstract: A fingerprint reading system includes a camera module, a control module, and a signal processing module. The camera module has a detection unit, an image capture unit, a liquid lens unit, and an illumination unit. Control module is electrically connected to camera module for controlling the internal components of camera module. When the detection unit detects a start signal, the control module activates the image capture unit, liquid lens unit, and illumination unit. The liquid lens unit adjusts the focus distance across an entire scanning region and scans fingerprint. The image capture unit adjusts the focus distance across the entire scanning region through the liquid lens unit and scans fingerprint to capture multiple photos. The signal processing module selects the sharpest photo from the multiple photos to convert to a fingerprint image.
    Type: Grant
    Filed: December 17, 2014
    Date of Patent: August 30, 2016
    Assignee: LUSTROUS ELECTRO-OPTIC CO., LTD.
    Inventor: Chih-Wei Tsai
  • Patent number: 9424470
    Abstract: An example method includes receiving a plurality of templates of a plurality of objects, where a template comprises feature values sampled at corresponding points of a two-dimensional grid of points positioned over a particular view of an object and scaled based on a depth of the object at the particular view. The method may further include receiving an image of an environment and determining a matrix representative of the image, where a row of the matrix comprises feature values sampled at a particular point of the two-dimensional grid positioned over one or more locations within the image and scaled based on depths of the one or more locations. The method may additionally include determining at least one similarity vector corresponding to at least one template and using the at least one similarity vector to identify at least one matching template for at least one object located within the image.
    Type: Grant
    Filed: August 22, 2014
    Date of Patent: August 23, 2016
    Assignee: Google Inc.
    Inventor: Stefan Hinterstoisser
  • Patent number: 9424489
    Abstract: Novel methods and systems for automated data analysis are disclosed. Data can be automatically analyzed to determine features in different applications, such as visual field analysis and comparisons. Anomalies between groups of objects may be detected through clustering of objects.
    Type: Grant
    Filed: July 28, 2015
    Date of Patent: August 23, 2016
    Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGY
    Inventor: Wolfgang Fink
  • Patent number: 9412001
    Abstract: A system recognizes an object employed by an electronic device, by capturing an image using a camera module and transmitting information recognized from the captured image to an external electronic device connected with the electronic device via a communication network. The system receives information associated with the recognized information from the external electronic device and displays the received information on a display.
    Type: Grant
    Filed: June 17, 2014
    Date of Patent: August 9, 2016
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Ki-Huk Lee, Kyung-Hee Lee, Chang-Ryong Heo
  • Patent number: 9406115
    Abstract: A method of identifying discontinuities in the surface of a substrate is herein disclosed. An object plane of an imaging system is positioned at a focal position associated with a discontinuity and an image is captured, the discontinuity having a relatively higher contrast with respect to the remainder of the surface of the substrate. The discontinuity is thereby more readily discernable than when the focal plane is positioned at the surface of the substrate. Analysis of discontinuities may include the extraction of discontinuity characteristics.
    Type: Grant
    Filed: June 30, 2011
    Date of Patent: August 2, 2016
    Assignee: Rudolph Technologies, Inc.
    Inventors: Wei Zhou, Michael Grant
  • Patent number: 9405997
    Abstract: Systems and methods for analyzing letters in an image of text are described. For each letter, a number of properties are determined and the letters are classified into letterform classes. The properties may include independent letter properties based on only the letter itself, such as a slanted bounding box encompassing the letter. The properties may also include dependent letter properties that are based, in part, on other letters, such as adjacent letters or letters in the same word or line.
    Type: Grant
    Filed: June 17, 2014
    Date of Patent: August 2, 2016
    Assignee: Amazon Technologies, Inc.
    Inventor: Vasanth Elancheralathan
  • Patent number: 9400940
    Abstract: The general field of the invention is that of the methods of processing an initial digital image IIN(p) made up of pixels (p). The method according to the invention comprises the following successive steps: Step 1: calculating the logarithm of the initial image in order to obtain a first intermediate image Log(IIN(p)); Step 2: filtering said first intermediate image using a low-frequency filter in order to obtain a second intermediate image BF(p); Step 3: determining the value of the minimum intensity and the value of the maximum intensity in the low-frequency image; Step 4: calculating a third intermediate image Log(IOUT(p)) using the following linear combination: Log(IOUT(p))=[Log(IIN(p)?BF(p)]·[K1·BF(p)+K2]+K3·BF(p)+K4 K1, K2, K3 and K4 being constants; Step 5: calculating the final image IOUT(p) by applying the exponential function to the third intermediate image.
    Type: Grant
    Filed: December 18, 2014
    Date of Patent: July 26, 2016
    Assignee: Thales
    Inventor: Matthieu Grossetete
  • Patent number: 9390327
    Abstract: In a feature extraction and pattern matching system, image sharpening can enable vascular point detection (VPD) for detecting points of interest from visible vasculature of the eye. Pattern Histograms of Extended Multi-Radii Local Binary Patterns and/or Pattern Histograms of Extended Multi-Radii Center Symmetric Local Binary Patterns can provide description of portions of images surrounding a point of interest, and enrollment and verification templates can be generated using points detected via VPD and the corresponding descriptors. Inlier point pairs can be selected from the enrollment and verification templates, and a first match score indicating similarity of the two templates can be computed based on the number of inlier point pairs and one or more parameters of a transform selected by the inlier detection. A second match score can be computed by applying the selected transform, and either or both scores can be used to authenticate the user.
    Type: Grant
    Filed: May 9, 2014
    Date of Patent: July 12, 2016
    Assignee: EyeVerify, LLC
    Inventors: Vikas Gottemukkula, Reza R. Derakhshani, Sashi K. Saripalle
  • Patent number: 9386186
    Abstract: An image processing apparatus accurately determines the inclination of an original even in the case where an original of a white sheet is read with a white sheet as a background. For this, the image processing apparatus extracts a fiber section having a feature of paper fiber from image data, analyzes a direction of fiber in the fiber section, and calculates the inclination of an original at the time of reading the original based on the direction.
    Type: Grant
    Filed: August 21, 2014
    Date of Patent: July 5, 2016
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yugo Mochizuki, Takashi Nakamura, Tetsuya Suwa
  • Patent number: 9384411
    Abstract: An image processing system comprises an image processor configured to identify edges in an image, to apply a first type of filtering operation to portions of the image associated with the edges, and to apply a second type of filtering operation to one or more other portions of the image. By way of example only, in a given embodiment a clustering operation is applied to the image to identify a plurality of clusters, a first set of edges comprising edges of the clusters is identified, an edge detection operation is applied to the image to identify a second set of edges, a third set of edges is identified based on the first and second sets of edges, and the first type of filtering operation is applied to portions of the image associated with one or more edges of the third set of edges.
    Type: Grant
    Filed: August 28, 2013
    Date of Patent: July 5, 2016
    Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: Denis V. Parkhomenko, Denis V. Parfenov, Denis V. Zaytsev, Aleksey A. Letunovskiy, Dmitry N. Babin
  • Patent number: 9378419
    Abstract: Methods, and apparatus for performing methods, for classifying an image. Methods include determining a corresponding set of metrics for each region of two or more regions of a pattern of regions of an image, and classifying the image in response to at least the corresponding set of metrics for each of the two or more regions of the pattern of regions.
    Type: Grant
    Filed: March 16, 2012
    Date of Patent: June 28, 2016
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Steven J Simske, Malgorzata M Sturgill, Matthew D Gaubatz, Masoud Zavarehi, Paul S Everest
  • Patent number: 9373160
    Abstract: Systems, methods and computer-accessible mediums for modifying an image(s) can be provided. For example, first image information for the image(s) can be received. Second image information can be generated by separating the first image information into at least two overlapping images. The image(s) can be modified using a prediction procedure based on the second image information.
    Type: Grant
    Filed: December 18, 2014
    Date of Patent: June 21, 2016
    Assignee: New York University
    Inventors: Rob Fergus, David Eigen, Dilip Krishnan
  • Patent number: 9366637
    Abstract: A method for establishing distortion properties of an optical system in a microlithographic measurement system is provided. The optical system has at least one pupil plane, in which the distortion properties of the optical system are established on the basis of measuring at least one distortion pattern, which the optical system generates when imaging a predetermined structure in an image field. The distortion properties of the optical system are established on the basis of a plurality of measurements of distortion patterns, in which these measurements differ from one another in respect of the intensity distribution present in each case in the pupil plane.
    Type: Grant
    Filed: June 17, 2014
    Date of Patent: June 14, 2016
    Assignee: Carl Zeiss SMS GmbH
    Inventor: Mario Laengle
  • Patent number: 9361545
    Abstract: Certain aspects of the present disclosure relate to methods and apparatus for neuro-simulation with a single two-dimensional device to track objects. The neuro-simulation may report a point of interest in an image that is provided by the device. The device may center on the point of interest using one or more actuators. The simulation mechanism may input pixels and output a plurality of angles to the actuators to adjust their direction.
    Type: Grant
    Filed: June 4, 2014
    Date of Patent: June 7, 2016
    Assignee: QUALCOMM INCORPORATED
    Inventors: Adrienne Milner, Kiet Chau, Victor Hokkiu Chan, Michael-David Nakayoshi Canoy