Patents Examined by Cindy D. Khuu
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Patent number: 7349825Abstract: Methods and systems for health operations analysis models to compare a first and second fleet of vehicles are disclosed. In one embodiment, a method for providing a system health operations analysis model including determining a first system health operations analysis of a first fleet of vehicles, determining a second system health operations analysis of a second fleet of vehicles, comparing the first and second system health operations analyses, and generating a system health operations output of the first and second system health operations analyses.Type: GrantFiled: November 28, 2006Date of Patent: March 25, 2008Assignee: The Boeing CompanyInventors: Zachary C. Williams, James L. Poblete
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Patent number: 7346456Abstract: To perform diagnosis of a completion system, at least one parameter of the completion system in a wellbore is monitored using a sensor. A profile is generated based on the monitored parameter, and a real-time diagnosis is performed of an operation of the completion system based on a comparison of the generated profile and an expected profile to identify an anomaly.Type: GrantFiled: July 21, 2006Date of Patent: March 18, 2008Assignee: Schlumberger Technology CorporationInventor: Djerassem Le Bemadjiel
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Patent number: 7340352Abstract: An inspecting method is capable of efficiently inspecting a wafer. According to the inspecting method, the chip area of a wafer is inspected for defects, and based on the results, a defect density D0p of each of peripheral-zone chips in the chip area which are located closely to the peripheral area of the wafer is calculated. A peripheral-zone chip with a high defect density D0p is selected, and an area in the peripheral area which is outward of the selected peripheral-zone chip is inspected for defects. Since only the area in the peripheral area which is located outward of the peripheral-zone chip selected based on the defect density D0p is inspected for defects, the wafer is inspected efficiently.Type: GrantFiled: October 27, 2006Date of Patent: March 4, 2008Assignee: Fujitsu LimitedInventors: Naohiro Takahashi, Kiyoshi Irino
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Patent number: 7337076Abstract: A method and system for identifying a defect or contamination on a surface of a sample. The system operates by detecting changes in work function across a surface via both vCPD and nvCPD. It utilizes a non-vibrating contact potential difference (nvCPD) sensor for imaging work function variations over an entire sample. The data is differential in that it represents changes in the work function (or geometry or surface voltage) across the surface of a sample. A vCPD probe is used to determine absolute CPD data for specific points on the surface of the sample. The combination of vibrating and non-vibrating CPD measurement modes allows the rapid imaging of whole-sample uniformity, and the ability to detect the absolute work function at one or more points.Type: GrantFiled: September 12, 2006Date of Patent: February 26, 2008Assignee: Qcept Technologies, Inc.Inventors: M. Brandon Steele, Jeffrey Alan Hawthorne
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Patent number: 7328121Abstract: The present invention relates to a vibration data collection method and apparatus. The invention includes processes of receiving electrical vibration signals from at least one vibration sensor, digitizing the electrical vibration signals to obtain digitized vibration signals, calculating the average of the digitized vibration signals over a predetermined period, and storing the average in a storage device. The processes above are repeated to provide a history of averages. When vibration data recording is requested, the invention proceeds to check the history of averages to determine if the averages within a time period are substantially equal to one another within a tolerance. If the averages are within the tolerance, the digitized vibration signals are recorded.Type: GrantFiled: October 20, 2006Date of Patent: February 5, 2008Assignee: Commtest Instruments Ltd.Inventor: Nigel Leigh
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Patent number: 7328113Abstract: A method and apparatus are provided for calibrating a flow meter having an array of sensors arranged in relation to a pipe that measures a flow rate of a fluid flowing in the pipe. The method features the step of calibrating the flow rate using a calibration correction function based on one or more parameters that characterize either the array of sensors, the pipe, the fluid flowing in the pipe, or some combination thereof. The calibration correction function depends on either a ratio t/D of the pipe wall thickness (t) and the pipe inner diameter (D); a ratio t/? of the pipe wall thickness (t) and the eddie wavelength (?) of the fluid; a Reynolds number (?UD/?) that characterizes the fluid flow in the pipe; a ratio ?x/D of the sensor spacing (?x) and the pipe inner diameter (D); a ratio f?x/Umeas of usable frequencies in relation to the sensor spacing (?x) and the raw flow rate (Umeas); or some combination thereof.Type: GrantFiled: November 21, 2006Date of Patent: February 5, 2008Assignee: CiDRA CorporationInventors: Paul Rothman, Daniel L. Gysling, Douglas H. Loose, Alex Kravets
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Patent number: 7321836Abstract: A method is disclosed wherewith a person skilled in the art of statistical quality control may determine whether a process, goods, or service is statistically equivalent to another of known quality, or to a desired target quality. The method may also be used to determine whether multiplicities of goods, processes, or services are statistically equivalent to one another and of a desired quality. The method makes the determination based on an equivalency index that is derived from integration of the probability distribution of data of measurement taken from products associated with the process, goods or services.Type: GrantFiled: July 9, 2004Date of Patent: January 22, 2008Assignee: Texas Instruments IncorporatedInventor: Eugene Y. Wang
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Patent number: 7321840Abstract: A tire monitor and a tire pressure gauge for reading the data from the tire monitor are disclosed. The tire monitor includes an in-tire controller that stores a target inflation pressure representing the pressure to which the tire should be inflated when the tire is at a standard temperature. The tire monitor transmits the target inflation pressure to the external processor when the external processor is connected to the in-tire monitor over a communication link. A sensor array in the tire monitor can provide pressure and temperature readings that are stored in the monitor and used to provide a temperature-compensated fill pressure for the tire. The tire pressure gauge provides the user with a fill pressure to be used in inflating the tire. The tire pressure gauge communicates with the tire monitor and obtains pressure and temperature readings stored in the tire monitor. These reading are used to provide the temperature-compensated fill pressure.Type: GrantFiled: June 6, 2005Date of Patent: January 22, 2008Assignee: Avago Technologies General IP Pte. Ltd.Inventor: Daniel Yves Abramovitch
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Patent number: 7321839Abstract: A first mirror and a second mirror are disposed in such a manner that their reflective surfaces are parallel and face toward each other. A mark is drawn between the first mirror and the second mirror. An image of the reflections of the mark in the first mirror and the second mirror is captured with a camera. Calibration of the camera system is performed based on the image.Type: GrantFiled: August 28, 2006Date of Patent: January 22, 2008Assignee: Kabushiki Kaisha ToshibaInventors: Kenichi Maeda, Yasuhiro Taniguchi, Susumu Kubota, Hiroaki Nakai
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Patent number: 7318006Abstract: An alarm analysis method capable of multi-purpose function. A plurality of efficiency indices are defined, including statistical-data-configuration, data-set, background-alarm-rate, peak-alarm-rate, active-alarm-distribution, bad-actors-identification, and alarm-report indices. A data warehouse is created according to the efficiency indices and using an online analytical processing method. A plurality of user interfaces are created according to the data warehouse and analysis results. The data warehouse is accessed using the user interfaces to retrieve the analysis results.Type: GrantFiled: December 28, 2005Date of Patent: January 8, 2008Assignee: Industrial Technology Research InstituteInventors: Huei-Shyang You, Yi-Chun Chang
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Patent number: 7318005Abstract: A method decomposes input data acquired of a signal. An input signal is sampled to acquire input data. The input data is represented as a probability distribution. An expectation-maximization procedure is applied iteratively to the probability distribution to determine components of the probability distributions.Type: GrantFiled: July 7, 2006Date of Patent: January 8, 2008Assignee: Mitsubishi Electric Research Laboratories, Inc.Inventors: Paris Smaragdis, Bhiksha Ramakrishnan
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Patent number: 7313491Abstract: A method and apparatus for measuring the frequency of a cyclically-repeating electrical signal by: passing the electrical signal through a network of sequentially-activated gates, in which the first gate detects the leading edge of each cycle of the electrical signal, and each of the remaining gates, when activated, applies a predetermine propagation delay to the detected leading edges; determining the gates which were activated at the beginning, and at the end, of a predetermined time window; determining the difference in the total propagation delays at the outputs of the activated gates; and utilizing the differences in the total propagation delays in determining the frequency of the electrical signal.Type: GrantFiled: January 11, 2006Date of Patent: December 25, 2007Assignee: Nexense Ltd.Inventors: Arie Ariav, Vladimir Ravitch
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Patent number: 7305307Abstract: A phase based system and method for determining signal consistency (e.g., in a video signal processing system). Various aspects of the present invention may, for example, comprise receiving a first and second signal, each of which comprises a respective first sub-signal. A receiving module may, for example, effect such receiving. The first and second signals may be synchronized according to, at least in part, aspects of their respective first sub-signals. A signal synchronization module may, for example, effect such synchronization. Phase difference between respective sub-signals of the first and second synchronized signals may be determined (e.g., using sample-wise multiplication). Multiplication and accumulator modules may, for example, effect such a determination. A signal may be generated that is indicative of signal consistency based, at least in part, on the determination of phase difference between the respective sub-signals. An output module may, for example, effect such a signal generation.Type: GrantFiled: May 5, 2006Date of Patent: December 4, 2007Assignee: Broadcom CorporationInventor: Alexander G. MacInnis
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Patent number: 7305313Abstract: A quality variation display device that can surely identify periodic information about quality on a product number basis such as the occurrence of a failure for every prescribed number of products is provided. The device includes a quality data storing database that stores the measurement result of each product measured by a measuring unit in association with the manufacturing order, an interval statistic calculation portion that shifts an interval corresponding to a prescribed number of products by a prescribed shift number of products, obtains a statistic for each of the intervals, and produces a graph representing the statistics in the manufacturing order at equal intervals, and a display portion that displays the graph.Type: GrantFiled: December 20, 2005Date of Patent: December 4, 2007Assignee: Omron CorporationInventors: Toru Fujii, Shiro Sugihara
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Patent number: 7305325Abstract: A computer-implemented method of optimizing at least one production or testing processes in a mass manufacturing industry, includes steps of: collecting error data relating to a product at a plurality of points along its production and distribution chain; classifying the error data into categories of errors to provide classified error data; analyzing relationships among the classified error data; and suggesting modifications to at least one of the production or testing processes based on the analysis.Type: GrantFiled: January 12, 2006Date of Patent: December 4, 2007Assignee: International Business Machines CorporationInventors: Tim J. Kostyk, Theresa C. Kratschmer, Jeff R. Layton, Peter K. Malkin, Stephen G. Perun, Kenneth L. Pyra, Padmanabhan Santhanam, John C. Thomas, Scott W. Weller
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Patent number: 7305312Abstract: A system, method, and apparatus for obtaining a record of logic level transitions within a signal, and for accurately determining a voltage-time pair exhibited by the signal. To achieve these ends, a front-end device may be mated to a real-time sampling system, such as an oscilloscope. The front-end device effectively permits the oscilloscope to observe signals exhibiting greater data rates than otherwise possible without the front-end device.Type: GrantFiled: January 10, 2006Date of Patent: December 4, 2007Assignee: Wavecrest CorporationInventors: John David Hamre, Peng Li, Steven J. Fraasch
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Patent number: 7302353Abstract: A method, and apparatus for carrying it out, for processing pulses derived from a radiation detector, those pulses having already been resolved by a pulse-height analyzer into channels having respective addresses indicative of their respective heights. The method includes steps of receiving a plurality of channel-address values from the pulse-height analyzer, averaging over a window selected ones of the channel-address values to obtain an average channel address for the selected channel-address values, and using the average channel address to increment the content of a spectrum channel. Speed and accuracy of execution of the method may be optimized if a criterion for selecting channel-address values for averaging is made variable so as to permit recycling of the channel addresses and so as to avoid counting losses.Type: GrantFiled: November 14, 2006Date of Patent: November 27, 2007Inventor: Valentin T. Jordanov
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Patent number: 7299135Abstract: Systems and methods for identifying populations of events in a multi-dimensional data set are described. The populations may, for example, be sets or clusters of data representing different white blood cell components in sample processed by a flow cytometer. The methods use a library consisting of one or more one finite mixture models, each model representing multi-dimensional Gaussian probability distributions with a density function for each population of events expected in the data set. The methods further use an expert knowledge set including one or more data transformations and one or more logical statements. The transformations and logical statements encode a priori expectations as to the populations of events in the data set. The methods further use program code by which a computer may operate on the data, a finite mixture model selected from the library, and the expert knowledge set to thereby identify populations of events in the data set.Type: GrantFiled: November 10, 2005Date of Patent: November 20, 2007Assignee: IDEXX Laboratories, Inc.Inventor: Edward Thayer
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Patent number: 7295951Abstract: A method of evaluating the quality of a deformation field includes providing a deformation field from a first domain to a second domain, where a deformation field ?=(?x,?y,?z) that transforms a point (x,y,z) in the first domain to a point (X,Y,Z) in the second domain is defined by { X = ? x ? ( x , y , z ) = x + u x ? ( x , y , z ) Y = ? y ? ( x , y , z ) = y + u y ? ( x , y , z ) Z = ? z ? ( x , y , z ) = z + u z ? ( x , y , z ) , where ux, uy, uz are displacement fields, and calculating a quality factor as a function of the of the displacement fields and the Jacobian matrix D?(x,y,z) of the deformation fields. The quality factor is a measure of the quality of said deformation field.Type: GrantFiled: January 10, 2006Date of Patent: November 13, 2007Assignee: Siemens Medical Solutions USA, Inc.Inventor: Gerardo Hermosillo Valadez
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Patent number: 7286958Abstract: A method and system for yield similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor devices, obtaining a first plurality of yields associated with a first yield, and obtaining a second plurality of yields associated with a second yield. Additionally, the method includes performing a first statistical analysis for the first plurality of yields, determining a first statistical distribution, performing a second statistical analysis for the second plurality of yields, and determining a second statistical distribution. Moreover, the method includes processing information associated with the first statistical distribution and the second statistical distribution, and determining an indicator.Type: GrantFiled: January 4, 2006Date of Patent: October 23, 2007Assignee: Semiconductor Manufacturing International (Shanghai) CorporationInventor: Eugene Wang