Patents Examined by Daniel A Miller
-
Patent number: 9188623Abstract: A method is provided for determining at least one operating parameter of a thermoelectric system in a vehicle, wherein the thermoelectric system comprises an energy conversion device having at least one photovoltaic element for converting thermal radiation, which is emitted by a heat source of the vehicle, into electrical energy. The method includes measuring an electrical power of the photovoltaic device, and determining an operating parameter of the thermoelectric system based on the measured electrical power of the photovoltaic device.Type: GrantFiled: July 29, 2011Date of Patent: November 17, 2015Assignee: CONTINENTAL AUTOMOTIVE GMBHInventors: Joris Fokkelman, Karsten Hofmann, Martin Böld, Christoph Weigand
-
Patent number: 9172562Abstract: A calibration circuit for calibrating a device to be calibrated includes a variable current generator, a device under test and a control unit. The variable current generator is coupled to a first node of a reference voltage and configured to generate a variable current responsive to variations of the reference voltage. The device under test is a copy of at least one portion of the device to be calibrated, and coupled to the variable current generator to derive, at a second node, a voltage dependent on the variable current. The control unit is coupled to the second node to receive the derived voltage and configured to compare the derived voltage with the reference voltage and to generate, based on a comparison result, at least one calibration signal for adjusting an adjustable electrical parameter of the device under test and the device to be calibrated.Type: GrantFiled: June 18, 2012Date of Patent: October 27, 2015Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventor: Wei Chih Chen
-
Patent number: 9170086Abstract: An inductive position sensor uses three parallel inductors, each of which has an axial core that is an independent magnetic structure. A first support couples first and second inductors and separate them by a fixed distance. A second support coupled to a third inductor disposed between the first and second inductors. The first support and second support are configured for relative movement as distance changes from the third inductor to each of the first and second inductors. An oscillating current is supplied to the first and second inductors. A device measures a phase component of a source voltage generating the oscillating current and a phase component of voltage induced in the third inductor when the oscillating current is supplied to the first and second inductors such that the phase component of the voltage induced overlaps the phase component of the source voltage.Type: GrantFiled: January 8, 2014Date of Patent: October 27, 2015Assignee: The United States of America as Represented by the Administrator of the National Aeronautics and Space AdministrationInventors: Robert C. Youngquist, Stephen M. Simmons
-
Patent number: 9164141Abstract: Apparatus and methods of use thereof for the measurement of photocurrents are provided. More specifically, methods for measuring the external quantum efficiency of a sample are provided wherein the method comprises contacting a sample with an electrolyte gel; contacting the electrolyte gel with a probe; directing light on the sample through the probe; measuring the resultant photocurrent; and determining the external quantum efficiency based on the light input power and the measured photocurrent.Type: GrantFiled: March 14, 2012Date of Patent: October 20, 2015Assignee: RUTGERS, THE STATE UNIVERSITY OF NEW JERSEYInventor: Aurelien L. Du Pasquier
-
Patent number: 9157972Abstract: An electrically-controlled failsafe switch is included in an MRI transmit-and-receive RF coil assembly so as to protect it from induced RF currents in the event it is disconnected from an MRI system, but inadvertently left linked to strong MRI RF fields during imaging procedures using other RF coils.Type: GrantFiled: August 15, 2012Date of Patent: October 13, 2015Assignees: QUALITY ELECTRODYNAMICS, LLC, TOSHIBA MEDICAL SYSTEMS CORPORATIONInventors: Yoshinori Hamamura, Xiaoyu Yang, Nicholas Castrilla, Christopher J. Allen, Shinji Mitsui
-
Patent number: 9146294Abstract: A current sense system includes a current transformer having a primary coil and a secondary coil, wherein the secondary coil has a first and second terminal; a burden resistor connected between the first terminal of the secondary coil and ground; a monitor circuit that measures current in the primary coil by monitoring voltage across the burden resistor; and a built-in test (BIT) circuit connected to the second terminal of the secondary coil. The BIT circuit provides a virtual ground during normal operation, and either a positive voltage or a negative voltage during test operations.Type: GrantFiled: July 19, 2012Date of Patent: September 29, 2015Assignee: Hamilton Sundstrand CorporationInventors: Robert D. Klapatch, William E. Villano
-
Patent number: 9146410Abstract: An embodiment of the present invention discloses a method for detecting crosstalk of a liquid crystal display panel, involving detection on a liquid crystal display panel for defect of special crosstalk of the liquid crystal display panel. The method comprises: inputting signals into the liquid crystal display panel to be detected so that a detection pattern is displayed on the liquid crystal display panel to be detected; a gray-scale value for all the pixels in an intermediate region is 0; in other regions a gray-scale value for all the pixels in first pixel groups is the same, a color and gray-scale value for all the pixels in second pixel groups are the same, and the gray-scale value for all the pixels in the second pixel groups differs from that for all the pixels in the first pixel groups; the first pixel groups and the second pixel groups are same in shape, and both are distributed alternatively in both transverse and longitudinal directions in the other regions.Type: GrantFiled: December 23, 2012Date of Patent: September 29, 2015Assignees: BOE TECHNOLOGY GROUP CO., LTD., HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.Inventors: Mu Gu Lee, Yan Wei
-
Patent number: 9140578Abstract: A measurement device is provided. The measurement device comprises a ring-shaped base and multiple sensing elements. The sensing elements are symmetrically disposed on the ring-shaped base. Each sensing element comprises a circumferential groove, an axial groove and a coil. The axial groove is connected to the circumferential groove. The coil is surrounded within the circumferential groove and extended along the axial groove.Type: GrantFiled: April 24, 2013Date of Patent: September 22, 2015Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Deng-Mao Wang, Chong-Xian Su, Chung-Hsien Lin
-
Patent number: 9140579Abstract: A low power inductive proximity sensing system in which a DC voltage to the inductors is only applied for a short time period needed to detect the presence or absence of an appropriate object. After the detection time period is over, DC voltage is no longer applied to the inductors.Type: GrantFiled: September 24, 2013Date of Patent: September 22, 2015Inventor: Fred Mirow
-
Patent number: 9134368Abstract: Some embodiments relate to an integrated circuit. The integrated circuit includes an inductive or capacitive wireless communication structure located on a die region of the integrated circuit. This wireless communication structure is configured to wirelessly receive a test stimulus vector to test circuitry on the die region. The integrated circuit also includes a landing region having a size and location suitable to allow a conductive needle or conductive probe to come into direct physical and electrical contact with the landing region. The landing region provides a DC power supply to the circuitry on the die region while the test stimulus vector is wirelessly received.Type: GrantFiled: May 7, 2012Date of Patent: September 15, 2015Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Yung-Hsin Kuo, Po-Yi Huang
-
Patent number: 9134449Abstract: The present disclosure relates to a method to determine a formation property of a subsurface formation. A downhole logging tool having two or more antennas, at least two of the antennas having a transversely-sensitive element and an axially-sensitive element is provided. Azimuthally-sensitive measurements are obtained using the antennas of the downhole logging tool. The measurements are fitted to a Fourier series having Fourier coefficients that include channel gains, if any. A DC component, a first harmonic component, and a second harmonic component are determined from the Fourier series, a measurement type is determined using the DC component, the first harmonic component, and/or the second harmonic component, and the formation property of the subsurface formation is determined using the determined measurement type.Type: GrantFiled: February 18, 2011Date of Patent: September 15, 2015Assignee: Schlumberger Technology CorporationInventors: Jean Seydoux, Dzevat Omeragic, Dean M. Homan
-
Patent number: 9134871Abstract: In one embodiment, a method includes applying a first current to a capacitance of a touch sensor. The application of the first current to the capacitance for a first amount of time modifies the voltage at the capacitance from the reference voltage level to a first pre-determined voltage level. The method also includes applying a second current to an integration capacitor. The second current is proportional to the first current. The application of the second current to the integration capacitor for the first amount of time modifies the voltage at the integration capacitor from the reference voltage level to a first charging voltage level. The method also includes determining whether a touch input to the touch sensor has occurred based on the first charging voltage level.Type: GrantFiled: June 16, 2014Date of Patent: September 15, 2015Assignee: Atmel CorporationInventors: Samuel Brunet, Luben Hristov Hristov, Trond Jarle Pedersen, Iqbal Sharif
-
Patent number: 9134141Abstract: A measurement device is provided. The measurement device comprises a ring-shaped base and multiple sensing units and a plurality of coils. The sensing units are disposed on and protruded from the inner circumferential surface of the ring-shaped base. Each sensing unit comprises a circumferential groove and an axial groove. The axial groove is connected to the circumferential groove. Each coil is surrounded within the circumferential groove and extended along the axial groove.Type: GrantFiled: December 6, 2013Date of Patent: September 15, 2015Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTEInventors: Chung-Hsien Lin, Deng-Mao Wang, Chong-Xian Su, Shou-Long Yu, Chao-Yun Chen
-
Patent number: 9129940Abstract: An integrated circuit includes a first chip and a second chip coupled to the first chip in a vertical stack. The first chip includes a radio frequency circuit and a first coil electrically coupled to the radio frequency circuit. The second chip includes a calibration circuit and a second coil electrically coupled to the calibration circuit. The calibration circuit is configured to calibrate the radio frequency circuit disposed on the first chip through inductive coupling between the first and second coils.Type: GrantFiled: March 14, 2012Date of Patent: September 8, 2015Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Hsieh-Hung Hsieh, Yi-Hsuan Liu, Tzu-Jin Yeh, Chewn-Pu Jou, Fu-Lung Hsueh
-
Patent number: 9116191Abstract: A voltage-drop testing system, including a voltage-drop control apparatus, and a voltage-drop testing method adapted for the voltage-drop testing system based on LABVIEW department platform. When the LABVIEW department platform 12 is running, different groups of test data may be transferred to the PLD tester 20, when the PLD tester 20 finishes the testing based on all groups of test data, the PLD tester 20 feeds back the test results to the LABVIEW department platform 12, and the LABVIEW department platform 12 creates the voltage-drop testing graphic frame displaying the test results for the electronic device under test 2 for the convenience of a user.Type: GrantFiled: March 15, 2012Date of Patent: August 25, 2015Assignee: HON HAI PRECISION INDUSTRY CO., LTD.Inventors: Tsung-Yuan Chen, Kuei-Chih Hou, Wen-Kai Chiang
-
Patent number: 9116581Abstract: A capacitive sense array configured to improve edge accuracy in detecting a presence of a conductive object is described. In one embodiment, a capacitive sense array includes at least a first set of sense elements having non-homogenous pitches disposes in a first longitudinal axis of the capacitive sense array. The pitch includes width of the sense elements and spacing between the sense elements.Type: GrantFiled: September 1, 2011Date of Patent: August 25, 2015Assignee: Cypress Semiconductor CorporationInventors: Tao Peng, Min Chin Chai
-
Patent number: 9116212Abstract: In order to increase the signal to noise ratio, and thus increase the quality of images produced during pediatric MRI, a pediatric RF coil assembly includes a head coil and a flexible body coil in a single dedicated device shaped and sized for a child. The flexible body coil may be operable to at least partially surround and abut the body of the child located on the pediatric RF coil assembly, while the head coil may at least partially surround and abut the head of the child located on the pediatric RF coil assembly. In order to optimize workflow, the child may be positioned on the pediatric RF coil assembly in a first room and moved to a second room including an MRI system after the child is brought to sleep or sedated in the first room. The pediatric RF coil assembly and the child may be moved to the second room using a handle rotatably attached to the pediatric RF coil assembly, and may be positioned on a patient table of the MRI system when the imaging process is to begin.Type: GrantFiled: November 19, 2010Date of Patent: August 25, 2015Assignees: Siemens Aktiengesellschaft, Quality ElectrodynamicsInventors: Hubertus Fischer, Hiroyuki Fujita, Joseph Herczak, Lars Lauer
-
Patent number: 9110005Abstract: A stud detector has a voltage source, a first device, and a second device. The first device serves to generate a voltage that is galvanically decoupled from the voltage source. The second device serves for the potential-free transmission of a control signal.Type: GrantFiled: May 6, 2013Date of Patent: August 18, 2015Assignee: Robert Bosch GmbHInventors: Tobias Zibold, Andrej Albrecht
-
Patent number: 9110099Abstract: A downhole logging tool includes a tool body having a co-located set of antennas located on the tool body and first and second antennas formed from respective first and second pairs of coil windings having a closed-loop pattern. Both the first and second pair of coil windings are arranged on diametrically opposed antenna sections. A cylindrical shield is disposed over the co-located set of antennas and has a first set of vertical slots arranged interposed between each of the underlying antenna sections, a second set of vertical slots arranged over each of the underlying antenna sections, with each of the second set of vertical slots being perpendicular to a portion of the coil winding in the underlying antenna section, and a set of non-vertical slots arranged over each the underlying antenna sections. Each of non-vertical slots is perpendicular to a portion of the coil winding in the underlying antenna section.Type: GrantFiled: November 10, 2014Date of Patent: August 18, 2015Assignee: Schlumberger Technology CorporationInventors: Dean M. Homan, Gerald N. Minerbo, Robert C. Smith
-
Patent number: 9097758Abstract: An integrated circuit device comprising a semiconductor die contained in a package. The integrated circuit device includes one or more internal connection verification modules for asserting a poor connection signal for the test apparatus in response to a voltage difference between a voltage at a corresponding internal power supply node and a reference voltage, the voltage difference being indicative of a poor connection of power supply to one of power supply terminals on the package. The test apparatus can include an indicator or a sorting element for rejecting or accepting the integrated circuit device in response to logic signals indicative of the presence or absence of a defect accompanied by non-assertion of the poor connection signal, and for processing the integrated circuit device distinctively in response to assertion of the poor connection signal.Type: GrantFiled: March 31, 2009Date of Patent: August 4, 2015Assignee: Freescale Semiconductor, Inc.Inventors: Yefim-Haim Fefer, Sergey Sofer, Boris Zapesochini