Patents Examined by Daniel A Miller
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Probing method, probe card for performing the method, and probing apparatus including the probe card
Patent number: 9599663Abstract: A probe method includes setting an allowable temperature range, the allowable temperature range including a test temperature and ensuring contact between a pad of a circuit substrate and a needle of a probe card, providing the probe card with a temperature within the allowable temperature range, contacting the needle of the probe card to the pad of the circuit substrate, and supplying a test current to the pad through the needle to test the circuit substrate.Type: GrantFiled: November 21, 2013Date of Patent: March 21, 2017Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Sang-Boo Kang, Ki-Sub Lim -
Patent number: 9599657Abstract: Approaches for performing in line wafer testing are provided. An approach includes a method that includes generating a radio frequency (RF) test signal, and applying the RF test signal to a device under test (DUT) in a wafer using a buckling beam probe set with a predefined pitch. The method also includes detecting an output RF signal from the DUT in response to the applying the RF test signal to the DUT, and sensing at least one frequency component of the detected output RF signal.Type: GrantFiled: January 3, 2013Date of Patent: March 21, 2017Assignee: GLOBALFOUNDRIES INC.Inventors: Hanyi Ding, John Ferrario, Barton E. Green, Stephen Moss, Mustapha Slamani
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Patent number: 9581580Abstract: This invention relates to a measurement tool and method of use, and in particular to a measurement tool for use in determining a parameter of a stationary or moving fluid. The measurement tool has been designed primarily for use in borehole formation testing. The measurement tool can measure the dielectric constant of a fluid within a pipe or surrounding the tool. The pipe or wall between the tool and the fluid is electrically insulating. The tool has pair of capacitor plates mounted adjacent to the pipe or wall, a signal generator which can deliver an alternating electrical signal to at least one of the capacitor plates, and a detector for measuring a signal dependent upon the electrical capacitance between the capacitor plates. The measurement tool can additionally measure the electrical resistivity of the fluid.Type: GrantFiled: October 26, 2012Date of Patent: February 28, 2017Assignee: Precision Energy Services, Inc.Inventors: Margaret Cowsar Waid, Bryan W. Kasperski, Michael Andrew Yuratich
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Patent number: 9575104Abstract: In an electrical machine which has unidirectional excitation applied to its windings, the mean values of voltage and current can be computed from the instantaneous phase voltage and current by the use of, for example, low-pass filters (in either the analogue or digital domain). The value of winding resistance can then be calculated by dividing the mean voltage by the mean current. This avoids the cost, fragility and potential inaccuracy of conventional temperature sensors, and provides the controller with an ongoing estimate of winding temperature.Type: GrantFiled: December 3, 2013Date of Patent: February 21, 2017Assignee: NIDEC SR DRIVES LTD.Inventor: Michael James Turner
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Patent number: 9575117Abstract: Testing stacked devices. In accordance with a first method embodiment, a primary circuit assembly is accessed from a first circuit assembly carrier. The primary circuit assembly is placed into a test fixture. A secondary circuit assembly is accessed from a second circuit assembly carrier. The secondary circuit assembly is placed into the test fixture on top of the primary circuit assembly. The primary circuit assembly is tested in conjunction with said secondary circuit assembly while coupled together.Type: GrantFiled: April 18, 2013Date of Patent: February 21, 2017Assignee: ADVANTEST CORPORATIONInventors: Ling Qi, Tung Sheng Hsieh
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Patent number: 9562621Abstract: An electrically controlled valve (10) includes a shaft (36), a piezoelectric motor (34) affixed to an end of the shaft (36), a controller (54), a follower (42), a valve member (40), and a valve seat (28). The piezoelectric motor (34) drives the shaft with a first direction and a second opposite direction. The controller (54) provides power to the piezoelectric motor (34) to move the shaft with a first speed and a second speed, the first speed being faster that the second speed. The follower (42) receives the shaft (36), and slides relative to the shaft in response to the shaft moving with the first speed, and grips and moves with the shaft in response to the moving with the second speed and includes a valve member (40). The valve member (40) moves with the follower (42). The valve member (40) is configured to be moved by the follower (42) against the valve seat (28) to restrict fluid flow and to be moved by the follower (42) away from the valve seat to increase the fluid flow.Type: GrantFiled: April 23, 2014Date of Patent: February 7, 2017Assignee: KONINKLIJKE PHILIPS N.V.Inventors: Francis Patrick O'Neill, Ronald Paul Consiglio
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Patent number: 9553215Abstract: The invention relates to a method and a device for recognizing faults in a photovoltaic system (1). A first output voltage (U0, UMPP) of the system (1) and/or a first parameter derived from the output voltage (U0, UMPP) is determined at a first point in time in a first operating state of the photovoltaic system (1). At a second point in time in a second operating state comparable to the first operating state, a second output voltage (U0, UMPP) and/or a second parameter of the system (1) derived from the output voltage (U0, UMPP) is determined. Finally, a deviation between the first and the second output voltage (U0, UMPP) and/or between the first and the second parameter is identified and a fault notification is output if the deviation exceeds a predeterminable threshold.Type: GrantFiled: October 11, 2010Date of Patent: January 24, 2017Assignee: Fronius International GmbHInventors: Michael Ammer, Thomas Muehlberger, Roland Proetsch, Yvonne Zwirchmayr
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Patent number: 9547023Abstract: A method of fabricating a test probe includes a first conductive providing operation in which a first conductive member formed of a conductive metal material is provided, the first conductive member including a probe portion that has a probe shape and is formed in an upper portion of the first conductive member by a micro-electromechanical systems (MEMS) process, a second conductive member providing operation in which a second conductive member formed of a conductive metal material is provided, the second conductive member having an insertion portion formed in an upper portion of the second conductive member for inserting the first conductive member to be coupled to the insertion portion, an insertion operation in which the first conductive member is inserted into the insertion portion of the second conductive member, and a fixing and coupling operation in which the first conducive member is fixedly coupled to the second conductive member by deforming a part of the second conductive member.Type: GrantFiled: July 1, 2011Date of Patent: January 17, 2017Assignee: ISC CO., LTD.Inventor: Jae Hak Lee
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Patent number: 9543948Abstract: A physical force capacitive touch sensor comprises a capacitive sensor element on a substrate, a physically deformable electrically insulating spacer over the capacitive sensor element and a conductive deformable plane over the physically deformable electrically insulating spacer. A protective deformable fascia may be placed over the conductive deformable plane to provide an environmental seal for physical and weather protection, but is not essential to operation of the capacitive touch sensor. Back lighting is accomplished through a light transmissive layer(s) in the capacitive touch sensor. When the conductive deformable plane is displaced toward the capacitive touch sensor element, the capacitance value of the capacitive touch sensor element changes and that change may be detected and used as an actuation signal.Type: GrantFiled: January 17, 2013Date of Patent: January 10, 2017Assignee: MICROCHIP TECHNOLOGY INCORPORATEDInventors: Keith Curtis, Fanie Duvenhage
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Patent number: 9541514Abstract: Apparatus and methods for diagnosing status of a consumable part of a plasma reaction chamber, the consumable part including at least one conductive element embedded therein. The method includes the steps of: coupling the conductive element to a power supply so that a bias potential relative to the ground is applied to the conductive element; exposing the consumable part to plasma erosion until the conductive element draws a current from the plasma upon exposure of the conductive element to the plasma; measuring the current; and evaluating a degree of erosion of the consumable part due to the plasma based on the measured current.Type: GrantFiled: December 15, 2015Date of Patent: January 10, 2017Assignee: I AM RESEARCH CORPORATIONInventor: Roger Patrick
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Patent number: 9535089Abstract: The inspection of semiconductors or like substrates by the present mechanism minimizes deflection in the checkplate and probe card. An inspection device including a housing, a toggle assembly within the housing, an objective lens assembly attached within the toggle assembly including an objective coupled within an objective focus, wherein the objective focus is deflectable along an optics axis, and a cam assembly including a rotary cam and a window carrier, wherein the window carrier is moveable along the optics axis with rotation of the rotary cam, wherein the cam assembly is coupled to the toggle assembly with the objective and window are aligned along the optics axis.Type: GrantFiled: May 20, 2014Date of Patent: January 3, 2017Assignee: Rudolph Technologies, Inc.Inventors: Gary Mark Gunderson, Greg Olmstead
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Patent number: 9535092Abstract: A spring probe includes a needle, a spring sleeve sleeved onto the needle, and a protrusion. The spring sleeve has upper and lower non-spring sections, and at least a spring section therebetween. The needle has a bottom end portion protruding out from the lower non-spring section, and a top end portion located in the upper non-spring section. The protrusion is located at one of the top end portion and the upper non-spring section. The needle is movable relative to the upper non-spring section from an initial position to a connected position where the upper non-spring section is electrically connected with the needle through the protrusion when receiving an external force. As a result, the spring probe effectively prevents signals from being transmitted through the spring section, thereby improving stability of signal transmission and preventing the spring section from fracture.Type: GrantFiled: January 26, 2015Date of Patent: January 3, 2017Assignee: MPI CORPORATIONInventors: Ting-Hsin Kuo, Tsung-Yi Chen, Tien-Chia Li, Yi-Lung Lee, Chien-Chou Wu
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Patent number: 9531380Abstract: A multi-channel capacitive sensor comprises a sample capacitor having first and second terminals, a first diode having a first terminal coupled to the second terminal of the sample capacitor and a second terminal coupled to a first sense electrode, and a second diode having a first terminal coupled to the second terminal of the sample capacitor and a second terminal coupled to a second sense electrode. The sample capacitor and diodes are coupled to a control circuit. The control circuit is operable to apply a drive signal to the first terminal of the sample capacitor while simultaneously applying a bias signal to the second terminal of one or other of the diodes to prevent the diode from conducting the drive signal.Type: GrantFiled: June 29, 2012Date of Patent: December 27, 2016Assignee: Atmel CorporationInventor: John Stanley Dubery
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Patent number: 9523713Abstract: Embodiments of the present disclosure are directed to interconnects that include liquid metal, and associated techniques and configurations. The individual interconnects may electrically couple a contact of a printed circuit board (PCB) to a contact of a device under test (DUT). The interconnect may be disposed in or on the PCB. In various embodiments, the interconnect may include a carrier that defines a well (e.g., an opening in the carrier), and the liquid metal may be disposed in the well. In some embodiments, the contact of the DUT, or a contact of an intermediary device, may extend into the well and directly contact the liquid metal. In other embodiments, a flex circuit may be disposed over the well to seal the well. The flex circuit may include a conductive pad to electrically couple the liquid metal to the contact of the DUT. Other embodiments may be described and claimed.Type: GrantFiled: May 28, 2013Date of Patent: December 20, 2016Assignee: INTEL CORPORATIONInventors: Youngseok Oh, Joe F. Walczyk, Jin Yang, Pooya Tadayon, Ting Zhong
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Patent number: 9506949Abstract: A spring probe includes a spring sleeve and a needle having a body located inside the spring sleeve and a head protruded out of a lower non-spring section of the spring sleeve and having a stopping block. The lower non-spring section is abutted against and fixed to the stopping block, facilitating assembly of the spring probe. A method for manufacturing the spring probe is disclosed including the steps of forming a spring sleeve having a lower non-spring section with a slot and a guiding sheet adjacent to the slot by photolithography technique, manufacturing a needle having a stopping block with a bonding pad and an engagement rib by MEMS manufacturing process, sleeving the spring sleeve onto the needle to engage the engagement rib into the slot, and fixing the guiding sheet and the needle together by reflow soldering the bonding pad.Type: GrantFiled: January 26, 2015Date of Patent: November 29, 2016Assignee: MPI CORPORATIONInventors: Yi-Lung Lee, Horng-Kuang Fan
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Patent number: 9506888Abstract: A vapor sensor includes a capacitance-related property sensor element (110), a heater circuit element (170), a capacitance-related property measurement circuit element (180), and at least one switch member (190). The capacitance-related property sensor element includes a dielectric substrate (120), a first conductive electrode (130), a second conductive electrode (140), and a layer of dielectric microporous material (150) disposed between and contacting the first conductive electrode and the second conductive electrode. The at least one switch member is capable of interrupting electrical communication between the first conductive electrode and the heater circuit element, and between the capacitance-related property measurement circuit element and the first conductive electrode.Type: GrantFiled: April 4, 2012Date of Patent: November 29, 2016Assignee: 3M INNOVATIVE PROPERTIES COMPANYInventors: Michael C. Palazzotto, Justin Tungjunyatham, Stefan H. Gryska, Michael S. Wendland
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Patent number: 9500608Abstract: Properties of a porous solid sample 19, which may be a core of rock taken from below ground are carried out using apparatus which performs both nuclear magnetic resonance (NMR) and porosimetry measurements. The apparatus has a magnet 11,12 providing a magnetic field and a radio frequency coil 20 for transmitting and/or receiving electromagnetic radiation so as to bring about NMR in the magnetic field, a pressure vessel 14, 15 to hold a sample 19 within the magnetic field, a supply of a non-wetting liquid connected to the vessel, means to apply pressure to the non-wetting liquid to force liquid into pores of the sample 19 means to measure applied pressure of the non-wetting liquid and means to measure volume thereof taken up by the sample. The pressure of non-wetting liquid may be increased in steps, using intruded liquid volume at each step to give a measurement of pore throat size using NMR at each step to give a measure of pore size such as diameter of equivalent sphere.Type: GrantFiled: March 12, 2012Date of Patent: November 22, 2016Assignee: SCHLUMBERGER TECHNOLOGY CORPORATIONInventors: Jonathan Mitchell, Edmund Fordham
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Patent number: 9495038Abstract: A method and system for detecting a presence of a conductive object proximate to a capacitive sense element during an initialization process of a touch-sensing device. A capacitance sensing circuit measures a reference capacitance of a reference sense element. A sensing parameter of the capacitance sensing circuit is iteratively adjusted to obtain a target measurement output value for the reference sense element. With the sensing parameter set to the sensing parameter value, the capacitance measurement circuit measures a first capacitance of a first sense element. A first capacitance difference value is determined between the first capacitance and a first baseline capacitance value for the first sense element. A presence of a conductive object is detected proximate to the first sense element when the first capacitance difference value exceeds a threshold value.Type: GrantFiled: October 22, 2014Date of Patent: November 15, 2016Assignee: MONTEREY RESEARCH, LLCInventor: Kristopher L Young
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Patent number: 9494408Abstract: A hardware-only contactless position sensor system is provided that includes a contactless position sensor and hardware-only sensor system electronics. The sensor includes excitation, sine, and cosine coils. The electronics are coupled to the sensor and detect a position of a target relative to the sensor. The electronics include a phase shift and summation circuit that applies a phase shift at a frequency of the excitation coil to one of a sine signal from the sine coil or a cosine signal from the cosine coil as a phase shifted signal and add the phase shifted signal with an unshifted instance of the cosine or sine signal to produce a phase shifted output. The electronics also include a phase detector circuit that detects a phase of the phase shifted output and generate an output voltage corresponding to the phase and proportional to the position of the target.Type: GrantFiled: February 11, 2014Date of Patent: November 15, 2016Assignee: ROSEMOUNT AEROSPACE, INC.Inventors: Donald R. Singh, James Joseph McTighe
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Patent number: 9494631Abstract: A new method of extracting information from a current waveform for the purpose of controlling a resonant converter is presented. The method comprises the step of sampling the converter waveform exactly three times in half a period of the converter waveform or sampling the converter waveform exactly at three different positions in a sequence on different periods of the converter waveform and the step of extracting waveform information to produce a fundamental component and a triangular component of the converter waveform. The information could also be used for the purpose of predicting the inductance and load of a circuit to indicate alignment in a inductive charging system.Type: GrantFiled: May 5, 2013Date of Patent: November 15, 2016Assignee: DET International Holding LimitedInventor: Marco Antonio Davila