Abstract: An on-chip millimeter wave power detection circuit comprises a high resistive probe for voltage sensing of millimeter wave signals, the probe comprises a metal line perpendicularly connected to a transmission line, at one end, and further connected to a power root mean square (RMS) detector at the other end; and the RMS detector for measuring a RMS voltage value of the sensed millimeter wave signals, wherein the RMS detector is characterized by a known impedance.

Abstract: A capacitive fingerprint sensor includes an array of capacitive sensing elements, readout circuitry electrically coupled to the array of capacitive sensing elements, a block first digital to analog converter (DAC), at least one second DAC, and at least one summing junction electrically coupled to the readout circuitry, the first DAC, and the at least one second DAC. The readout circuitry is adapted to read out pixel voltages from a group of each block of capacitive sensing elements. The first DAC is adapted to provide a block baseline voltage for each block of capacitive sensing elements. The second DAC is adapted to provide a pixel baseline voltage difference for one capacitive sensing element of each group of each block. The summing junction is adapted to subtract the received block baseline voltage and the received pixel baseline voltage difference from the corresponding pixel voltage of each row of each block.

Abstract: In a method and apparatus for recording magnetic resonance (MR) signals from an examination object, raw data space is filled with MR signals in raw data lines. Movement information of the examination object is detected during recording of the MR signals and the movement information is grouped into different movement phases of the examination object. A temporally randomly distributed sequence of the recording of the raw data lines is determined, with which at least one predetermined portion of the raw data space is filled MR signals. The MR signals are acquired in the determined temporally randomly distributed sequence of the raw data lines in the predetermined portion. Each recorded raw data line is allocated to one of the movement phases of the examination object.

Abstract: A device for testing integrated circuits utilizing a compression spring that has one longitudinal centerline that is concentric to the housing of the test probe and terminates in a number of reduced diameter coil windings that are non-concentric to the housing so as to provide a side load to the probe.

Abstract: A calibration circuit for calibrating a device to be calibrated includes a variable current generator, a circuit component, and a control unit. The variable current generator generates a variable current responsive to variations of a supply voltage relative to a predetermined voltage level. The circuit component is a copy of at least one portion of the device to be calibrated and is coupled between the variable current generator and the supply voltage. The control unit is coupled to the variable current generator and the circuit component, and generates, based on a voltage dependent on the variable current and the circuit component, at least one calibration signal for adjusting an adjustable electrical parameter of the circuit component and the device to be calibrated.

Abstract: Tamper-proof electronic packages and fabrication methods are provided which include a glass substrate. The glass substrate is stressed glass with a compressively-stressed surface layer. Further, one or more electronic components are secured to the glass substrate within a secure volume of the tamper-proof electronic package. In operation, the glass substrate is configured to fragment with an attempted intrusion event into the electronic package, and the fragmenting of the glass substrate also fragments the electronic component(s) secured to the glass substrate, thereby destroying the electronic component(s). In certain implementations, the glass substrate has undergone ion-exchange processing to provide the stressed glass.

Abstract: An inspection method for a blanking device for multi-beams, for inspecting whether a separate blanking system of the blanking device is defective, includes, using the blanking device, measuring a value of current flowing from a power source for supplying voltage based on a difference between a first potential and a second potential to each of a plurality of separate blanking systems, in a state where the first potential is applied to a first electrode from a first potential applying unit and the second potential is applied to a second electrode from a corresponding second potential applying unit in at least one second potential applying unit in each of a plurality of separate blanking systems of the blanking device, and determining, when a measured current value is a finite value and equal to or below a preset threshold, that a separate blanking system where a short circuit has occurred exists.

Abstract: A method of evaluating damper operation for a heating, ventilation and air conditioning (HVAC) system includes moving a plurality of dampers of the HVAC system collectively to a baseline damper position. The plurality of dampers is positioned at a flowpath including a fan driven by a motor. The fan is operating by switching the motor on and a baseline output level at the motor is measured. A first damper of the plurality of dampers is commanded to move from the baseline damper position to a first damper position and a first output level at the motor is measured. The first output level is compared to the baseline output level. A difference is indicative of successful movement of the first damper from the baseline damper position to the first damper position.

Abstract: Systems and methods for estimating electrical component degradation caused by an operating parameter that stresses the component in a series of stress cycles, in which cycle count values are maintained which individually correspond to a range of values of the operating parameter, and a plurality of maximum cycle values are stored, which individually correspond to one of the ranges and represent the number of stress cycles in the corresponding range at which the component is expected to have a user defined failure probability value. For a given stress cycle, one of the count values is incremented that corresponds to the range that includes a measured or sensed value, and a cumulative degradation value for the electrical system component is computed as a sum of ratios of the individual count values to the corresponding maximum cycle values.

Abstract: An interconnection evaluation system according to the present disclosure includes a switchboard including at least one endpoint, at least one endpoint contact tester configured to transmit a digital input signal obtained from each endpoint, an automation tester configured to output a preset digital output signal to the switchboard, and to generate interconnection information at each endpoint by reflecting the digital output signal and digital input signal, and an interface unit configured to generate a switchboard status information of switchboard by reflecting the interconnection information.

Abstract: A battery pack can include a temperature sensor that can provide an output that is indicative of a temperature associated with the battery pack. A battery management unit can directly measure the temperature sensor when the battery pack is by itself or engaged with a tool. A charger can directly read the temperature sensor when the battery pack is engaged with the charger. Thus, the temperature sensor can be shared by the battery pack and the charger. The battery pack can utilize a same terminal that provides access to the temperature sensor to indicate a stop-charge signal. The charger can read the stop-charge signal on the same terminal used to directly access the temperature sensor.

Abstract: A detection circuit for detecting an external device with a specific resistance is provided. The detection circuit includes a first resistor, a second resistor, a first converter, a second converter, a device converter, a first current comparator, and a second current comparator. The first resistor has a first resistance. The second resistor has a second resistance. The first converter is configured to convert the first resistance into a first current. The second converter is configured to convert the second resistance into a second current. The device converter is configured to convert the specific resistance into a specific current. The first current comparator is configured to compare the specific current with the first current, and generate a first output signal. The second current comparator is configured to compare the specific current with the second current, and generate a second output signal.

Abstract: A capacitance measurement system precharges first terminals (21-0 . . . 21-k . . . 21-n) of a plurality of capacitors (25-0 . . . 25-k . . . 25), respectively, of a CDAC (capacitor digital-to-analog converter) (23) included in a SAR (successive approximation register) converter (17) to a first voltage (VDD) and pre-charges a first terminal (3-j) of a capacitor (CSENj) to a second voltage (GND). The first terminals are coupled to the first terminal of the capacitor to redistribute charges therebetween so as to generate a first voltage on the first terminals and the first terminal of the capacitor, the first voltage being representative of a capacitance of the first capacitor (CSENj). A SAR converter converts the first voltage to a digital representation (DATA) of the capacitor. The capacitance can be a touch screen capacitance.

Abstract: A magnetic resonance imaging apparatus includes an imaging unit configured to carry out magnetic resonance imaging of a patient using a transmitting QD coil that allows at least one of phase and amplitude of a radio-frequency transmit pulse on at least one input channel of the transmitting QD coil to be adjusted independently of each other, and an adjustment unit arranged to adjust at least one of the phase and the amplitude of the radio-frequency transmit pulse according to imaging conditions.

Abstract: A nuclear magnetic flowmeter (1) for determining the flow of a medium flowing through a measuring tube (2), having a magnetic field generator (3) having permanent magnets for generating a magnetic field interfusing the medium over a magnetic field section LM, having a pre-magnetization section LVM located within the magnetic field section LM and having a measuring device also located in the magnetic field section LM including a coil-shaped antenna (4) with the length L1 serving as a measuring antenna. At least one coil-shaped antenna (5) is provided in the pre-magnetization section LVM for generating a pulse or pulse sequence spoiling the magnetization of the medium in the direction of the magnetic field.

Abstract: A method for diagnosing an electrical circuit including at least one electrical device, an actuator for the device controlled by a high side actuating switch and a low side actuating switch, and at least one additional switch not in series with any of the HS or LS switch, the method including: to each of the possible statuses of the circuit, giving a code; sequentially putting the circuit in at least some of these statuses for a given time period; during each of these periods, measuring voltage and/or current in different parts of the circuit and giving a code to the measurement; and establishing a diagnosis of correct functioning or of a malfunctioning of at least some elements of the circuit according to a pre-established correlation between the status codes and the measurement codes.

Abstract: A magnetic sensor may comprise a first linear output sensing element configured to sense a first component of an external magnetic field associated with a first axis. The first linear output sensing element may provide a first output voltage corresponding to the first component of the external magnetic field. The magnetic sensor may also comprise a second linear output sending component configured to sense a second component of the external magnetic field associated with a second axis. The second axis may be substantially orthogonal to the first axis. The second linear output sensing element may provide a second output voltage corresponding to the second component of the external magnetic field. The first output voltage and the second output voltage may be provided to determine an angle, associated with the external magnetic field, corresponding to a plane including the first axis and the second axis.

Abstract: A current sensor comprises a current carrying trace located within a substrate; and a sensing trace located within the substrate proximate to the current carrying trace; wherein the sensing trace detects an electromagnetic force (emf) generated by magnetic flux inductively coupled from the current carrying trace for transmitting to a current sensing device.

Abstract: Methods and apparatus relating to electrical margining of multi-parameter high-speed interconnect links with multi-sample probing are described. In one embodiment, logic is provided to generate one or more parameter values, corresponding to an electrical operating margin of an interconnect. The one or more parameter values are generated based on a plurality of eye observation sets to be detected in response to operation of the interconnect in accordance with a plurality of parameter sets (e.g., by using quantitative optimization techniques). In turn, the interconnect is to be operated at the one or more parameter values if it is determined that the one or more parameter values cause the interconnect to operate at an optimum level relative to an operation of the interconnect in accordance with one or more less optimum parameter levels. Other embodiments are also disclosed and claimed.

Abstract: Disclosed is an improved system and method to treat an edge of a material for determining a property of such material through measurements of electromagnetic waves. The system and method are operative to mitigate the adverse effects caused by the interaction between an electromagnetic wave and an edge of a sample of a material under test. The system and method define a configuration to block and significantly attenuate the propagation of electromagnetic waves that may reach an edge of the sample being evaluated. This configuration reduces the undesired effects caused by edge-diffraction that may interfere with the measurement of desired electromagnetic waves for material evaluation. As a result, a property of a material under test can be measured more accurately, especially near the edges of such material. In addition, the system and method enable the evaluation of a small-size sample of a material.