Abstract: Current sensing devices that are capable of surviving harsh ambient environment of ocean worlds, such as Jupiter and Saturn moons are disclosed. The described devices can meet 300 Krad radiation requirements and can survive at cold temperatures down to ?184° C. Exemplary implementations of the constituent circuits of the devices are presented. A scheduling algorithm to perform various measurement by the disclosed current sensing devices is also described.

Abstract: A method of measuring a rotational position of an assembly with circumferential ferromagnetic teeth includes applying an excitation signal for a cycle to an actuator, the cycle causing a first rotational displacement of a first ferromagnetic tooth from a first rotational position to a second rotational position and a second rotational displacement of a second ferromagnetic tooth from the second rotational position to a third rotational position. The method further includes measuring a plurality of first signal outputs from a magnetoresistive sensor during the cycle; determining one or more signal offset values based on the plurality of first signal outputs; applying the signal excitation for a portion of a second cycle to the actuator; measuring second signal outputs from the magnetoresistive sensor; generating corrected signals by modifying the second signal outputs with the signal offset values; and, based on the corrected signals, determining a rotational position of the assembly.

Abstract: A power meter includes a plurality of first terminals for receiving a measure of current and a plurality of second terminals for receiving a measure of voltage of each of one or more phases of power that is delivered to the load. A controller is configured to determine a number of power monitor parameters based on the measure of current of each of one or more phases of power that is delivered to the load and/or the measure of voltage of each of one or more phases of power that is delivered to the load. The power meter includes an I/O interface for communicating one or more of the power monitor parameters over a network using a configurable mapping that maps the power monitor parameters with corresponding addressable locations.

Abstract: The present invention relates to a Hall effect sensor which is integrated in a semiconductor substrate and enables measurement of a magnetic field component. perpendicularly to the surface of the semiconductor substrate. The Hall effect sensor comprises several Hall elements having an electrically conductive semiconductor region which has a straight-line row of electrical measuring and control contacts on an end face on the substrate surface. The Hall elements are designed or can be operated in such manner that they have a sensitivity both to a magnetic field component parallel to and the magnetic field component perpendicular to the substrate surface of the semiconductor substrate (1). Several of the Hall elements are arranged such that their sensitivity to a magnetic field component parallel to the substrate surface of the semiconductor substrate can be compensated mutually by circuitry or in a signal evaluation.

Abstract: The present disclosure provides a microwave system, including a chamber and a microwave process circuit. The microwave process circuit is coupled to the chamber, and configured to radiate a polarized source microwave, receive a first reflected microwave, and radiate a polarized first reflected microwave into the chamber so as to heat a device under test in the chamber. The microwave process circuit includes a power generator, a first energy feeder, and a second energy feeder. The power generator is configured to generate a source microwave according to a reference signal and a control signal. The first energy feeder is configured to polarized the source microwave to the polarized source microwave, and radiate the polarized microwave into the chamber. The second energy feeder is configured to polarized the first reflected microwave to the polarized first reflected microwave, and radiate the polarized first reflected microwave into the chamber.

Abstract: A method of determining a high voltage value without measuring the high voltage value directly, in varying possible temperatures. An apparatus includes two voltage divider circuits (108, 110; 109, 111), wherein the second circuit (i.e. a reference circuit 109, 111) is provided with a smaller reference input voltage (102). The transfer ratio can be obtained from the reference circuit (109, 111) through voltage measurements, and deduced into a transfer ratio of another circuit (108, 110), no matter the ambient temperature value. When measuring a divided voltage value (103) of one circuit (108, 110), the desired high voltage value (101) can be calculated, no matter what the ambient temperature is.

Abstract: A method and system for detecting tampering of an energy meter can involve, in a first phase: gathering magnetic field sample data, an average magnetic field strength, a minimum magnetic field strength, and a maximum magnetic field strength from a magnetic field condition applied to an energy meter by a magnetic sensor that measures a magnetic field in one or more directions, and using learning coefficients calculated from the magnetic field sample data and the average magnetic field strength, the minimum magnetic field strength, and the maximum magnetic field strength to classify with a classifier, magnet tampering conditions with respect to the energy meter. In a second phase, a magnet tamper event can be identified with respect to the energy meter when the magnet tampering condition classified by the classifier is greater than a magnetic detection threshold.

Abstract: The present disclosure relates to a pre-5th-Generation (5G) or 5G communication system to be provided for supporting higher data rates Beyond 4th-Generation (4G) communication system such as Long Term Evolution (LTE).

Abstract: A wireless power receiver including a transmitter configured to transmit to a wireless power transmitter, a foreign object detection status packet including a mode bit field indicating whether a foreign object detection status packet includes a reference peak frequency of the wireless power receiver, in which the reference peak frequency is pre-assigned to the wireless power receiver; and a receiver configured to receive from the wireless power transmitter, a response indicating the foreign object is present or not present in a charging area of the wireless power transmitter, wherein the response is determined based on a comparison of a measured peak frequency of a power signal transmitted by the wireless power transmitter and an adaptable threshold frequency adapted based on the reference peak frequency included in the foreign object detection status packet from the wireless power receiver.

Abstract: The present disclosure provides a magnetic sensor system for monitoring the position of the rotor relative to the stator for use in electronic motor commutation. The system uses two magnetic sensors with a back bias magnet, the magnetic sensors being configured to detect changes in the magnetic field direction caused by the magnetic field interacting with two moveable targets that are being rotated by the motor shaft. The unique phase shift between the signals measured at each sensor can thus be used to determine the relative position between the stator and the rotor. In this respect, the system makes use of the Nonius or Vernier principle to measure rotational displacement, however, the scale of the encoder is defined by the number of motor pole pairs.

Abstract: A system for managing grid interaction with an energy storage device includes an energy exchange server, a plurality of energy storage devices, a plurality of interconnect socket adapters, and a plurality of energy exchange controllers, each energy exchange controller coupling to one of the plurality of interconnect socket adapters and dictating energy consumption based on energy pricing data received from the energy exchange server.

Abstract: A position detection unit includes a magnetic sensor and a first magnetic field generator. The first magnetic field generator is spaced from and opposed to the magnetic sensor in a first-axis direction, includes a first multipolar magnet, and generates a first magnetic field to be exerted on the magnetic sensor. The first multipolar magnet includes N and S poles adjacent to each other along a plane orthogonal to the first-axis direction. The magnetic sensor and the first magnetic field generator are relatively movable with respect to each other along a second-axis direction orthogonal to the first-axis direction. A center position of the magnetic sensor in a third-axis direction orthogonal to both of the first-axis direction and the second-axis direction is different from a position in the third-axis direction of an interface between the N and S poles adjacent to each other in the third-axis direction.

Abstract: The present disclosure discloses a test apparatus for testing a package-on-package (POP) type semiconductor package includes a lower socket mounted to a tester board providing a test signal, and provided with a plurality of socket pins connected to a lower terminal of a lower package to electrically connect the lower package and the tester board to each other; a pusher to which an upper package is coupled, the pusher having a pusher body which may be moved to approach the lower socket or to be moved away from the lower socket; and an upper socket coupled to the pusher body, and provided with an insulating pad formed of a nonelastic insulating material and a plurality of electrically-conductive parts supported on the insulating pad, the electrically-conductive part being formed of an elastic insulating material containing a plurality of electrically-conductive particles.

Abstract: The present disclosure generally relates to a Wheatstone bridge array that has four resistors. Each resistor includes a plurality of TMR structures. Two resistors have identical TMR structures. The remaining two resistors also have identical TMR structures, though the TMR structures are different from the other two resistors. Additionally, the two resistors that have identical TMR structures have a different resistance area as compared to the remaining two resistors that have identical TMR structures. Therefore, the working bias field for the Wheatstone bridge array is non-zero.

Abstract: A method of packaging a semiconductor device having a bond pad on a surface thereof includes forming a redistribution material electrically coupled to the bond pad, forming a dielectric material over the redistribution material, and removing a first portion of the dielectric material to expose a first portion of the redistribution material. Semiconductor packages may include a redistribution layer having a first portion adjacent and coupled to a first contact of the package, a second portion exposed by a first opening in a dielectric material, and a redistribution line electrically coupled to a first bond pad, the first portion, and the second portion. Such a package may be tested placing at least one probe needle in contact with at least one terminal of the package, providing a test signal from the probe needle to the package through the terminal, and detecting signals using the needle.

Abstract: Sensing methods and systems for transformers, and the construction thereof, are described herein. Example transformer systems and example methods for constructing a core for the system are disclosed. The example system includes a core with a bottom plate, two or more limbs mounted to the bottom plate and a top plate enclosing the core. At least one of the bottom plate, the limbs and the top plate is formed with a sensing component therein. The sensing component can be mounted to a spacer layer assembled within a stack of laminated layers. The sensing component can be mounted within a path defined within the spacer layer, for example. Methods for detecting operating conditions within the transformer are also disclosed.

Abstract: A magnetic sensor includes a first resistor having a first resistance and a first correction resistor having a second resistance. The first resistor and the first correction resistor are connected in series. The first resistor is configured so that the first resistance changes periodically as strength of a magnetic field component changes periodically. The first correction resistor is configured so that a change in a sum of the first resistance and the second resistance due to a noise magnetic field is smaller than a change in the first resistance due to the noise magnetic field.

Abstract: A system having a host unit and a plurality of stacked modules which are electrically connected to the host unit. The host unit communicates with the plurality of stacked modules through a RS-485 interface. Upon power up, each module of the plurality of stacked modules is powered and enumerated in sequence, allowing the host unit to know the sequence the plurality of stable modules are connected.

Abstract: A system for magnetic field testing comprising a magnetic field generation device configured to generate a magnetic field in a rotor, a plurality of magnetic field measurement devices configured to measure a magnetic field at a predetermined position on the rotor, a drive mechanism configured to rotate the rotor and a test system configured to record the plurality of magnetic field measurements as a function of an angular position of the rotor.

Abstract: Magnetic sensor assembly 1 has first member 10 having first to third magnetic sensors 13A to 13C, and second member 20 having first to third magnets 22A to 22C. Second member 20 can be moved in X and Y directions and can be rotated about a Z axis relative to first member 10. Output of first to third magnetic sensors 13A to 13C monotonously changes. A change of the output of first magnetic sensor and a change of the output of second magnetic sensor are different from each other. First to third magnets are positioned on first to third straight lines L1 to L3. A first angle that is formed between first straight line L1 and X axis, a second angle that is formed between second straight line L2 and X axis, and a third angle that is formed between third straight line L3 and Y axis are same.