Abstract: The disclosure relates to a linear guide having a guide rail which extends in a longitudinal direction, wherein a guide carriage is mounted on the guide rail in a linearly movable manner in the longitudinal direction, wherein at least one sensor is fitted to the guide carriage and can be used to measure an elastic position change of the guide carriage with respect to the guide rail, wherein the at least one sensor comprises at least one emitter turn arrangement which is connected to an alternating current source. According to the disclosure, at least one receiver turn arrangement which is different from the emitter turn arrangement and is inductively coupled to the at least one emitter turn arrangement is provided.

Abstract: An attenuator includes: a first circuit including a common collector or common drain amplifier formed of a first transistor having its control node connected to an input of the attenuator and its emitter or source connected to an intermediate node of the attenuator; and a second circuit including a common collector or common drain amplifier formed of a second transistor having its emitter or source connected to the intermediate node and its control node connected to an output of the attenuator.

Abstract: A system for non-destructive inspection of a structure includes a magnetostrictive pulser coil and a ferromagnetic strip. The ferromagnetic strip is coupled to the structure adjacent to the pulser coil. A scanner receiver probe is located adjacent to the ferromagnetic strip. The probe includes a probe body, a position encoder, and a magnetostrictive partial loading receiver coil. A magnet applies a biasing magnetic field to the ferromagnetic strip. A pulser system generates a time-varying current in the pulser coil to induce a time-varying magnetization in the ferromagnetic strip to generate guided wave energy in the structure. The probe detects reflected guided wave energy as the probe is moved around the circumference of the structure. A processor controls the pulser system, records guided wave reflections, and process the guided wave and probe position data to generate a one-dimensional image or a two-dimensional image of anomalies in said structure.

Abstract: A measurement device has a sensor that generates current by electromagnetic coupling to a power line, a measurement circuit that measures one of voltage and power, the voltage and the power being obtained by the current generated in the sensor according to voltage at the power line, a conductive member electrically connected to a signal ground line of the measurement circuit, and an insulating member that brings the conductive member close to an external conductor and insulates the conductive member from the external conductor.

Abstract: The invention provides a target object detection system, comprising a plurality of sensing nodes (10) for positioning at respective detection locations with respect to a detection area (12) that is situated within a field generated by an ambient AC source of excitation. Each sensing node has at least one electric potential sensor (22, 42) designed to detect perturbations in said field caused by a target object (14), said one sensor including an electrode (20, 40) responsive to the AC excitation field for generating detection signals, an amplifier (28) connected to the electrode for receiving and amplifying the detection signals to produce AC measurement signals as output, and at least one feedback circuit (30, 36) from an output of the amplifier to an input thereof for enhancing the input impedance of the amplifier.

Abstract: A lighting-on apparatus comprises at least one gate line pin and further comprises a gate line pin moving unit. The at least one gate line pin is moved by the gate line pin moving unit so that the at least one gate line pin corresponds with a gate line interface of a liquid crystal display panel under test. The lighting-on apparatus according to the embodiments of the present disclosure is configured to perform a test on the liquid crystal display panel, and is capable of simplifying test work of liquid crystal display panels, saving test time and cost, and improving work efficiency.

Abstract: A sensor apparatus for detecting leakage current in a post-type insulator of an electrical power system includes: a sensor unit having a housing, the sensor unit including: a sensor assembly operable to generate an analog signal proportional to a received leakage current; an electronics module operable to covert the analog signal to a digital value; and a communications system operable to wirelessly transmit the digital value to an external receiver; a collection band adapted to be connected to an exterior surface of the insulator; and a transfer lead interconnecting the sensor assembly and the collection band, the transfer lead operable to transfer leakage current from the insulator from the collection band to the sensor assembly.

Abstract: Techniques are described to provide a universal direct docking tester to prober interface between the test head and a prober of semiconductor wafer prober for testing die within semiconductor wafers. In an implementation, a universal direct docking tester to prober interface includes a tray assembly configured to be mounted within an opening of the prober housing and a stiffener assembly configured to be mounted to a test head to support a load board PCB that includes a probe head. The stiffener assembly includes a skirt that is received in the tray assembly when the test head is interfaced with the prober to position the load board PCB within the prober to facilitate engagement of the probe head with the wafer.

Abstract: Current detection circuit of a semiconductor device provided with a shunt resistor, a voltage division ratio adjustment resistor and a selection circuit which selects a voltage division ratio of the latter and has enhancement type MOSFETs and Zener Zaps as trimming elements. One of the Zener Zaps is trimmed and a divided voltage of the voltage division ratio adjustment resistor connected in parallel with the shunt resistor is outputted. The detected voltage in which variation of the resistance of the shunt resistor has been cancelled is therefore outputted. As the shunt resistor and the voltage division ratio adjustment resistor are laminated together, it is possible to obtain a current detection circuit with a small area, which can detect a current flowing into a shunt resistor with high accuracy.

Abstract: According to one aspect, embodiments herein provide a system for monitoring circuit branches coupled to an input line of a load center, the system comprising a plurality of first current sensors, each configured to be coupled to a circuit branch, at least one second current sensor configured to be coupled to the input line, a controller, a plurality of first sensor circuits, each configured, in a first mode of operation, to sample a signal from an associated current sensor, and in a second mode of operation, to be powered off, and at least one second sensor circuit configured to sample a signal from the at least one second current sensor and provide an input line current measurement signal to the controller, wherein the controller is configured to operate each first sensor circuit in one of the first and second modes of operation based on the input line current measurement signal.

Abstract: Embodiments of the invention are directed to using a DC multimeter configured for checking device amperage. A DC voltmeter is electrically-connected in series with the DC multimeter. A linear circuit is electrically connected in series between the DC multimeter and the DC voltmeter. A device under test is electrically-connected between positive and negative terminals of the DC voltmeter.

Abstract: Embodiments relate to systems and methods for self-diagnostics and/or error detection using multiple signal paths in sensor and other systems. In an embodiment, a sensor system comprises at least two sensors, such as magnetic field sensors, and separate signal paths associated with each of the sensors. A first signal path can be coupled to a first sensor and a first digital signal processor (DSP), and a second signal path can be coupled to a second sensor and a second DSP. A signal from the first DSP can be compared with a signal from the second DSP, either on-chip or off, to detect faults, errors, or other information related to the operation of the sensor system. Embodiments of these systems and/or methods can be configured to meet or exceed relevant safety or other industry standards, such as safety integrity level (SIL) standards.

Abstract: A passive intermodulation (“PIM”) distortion test apparatus includes a housing, hammering elements disposed within the housing, each hammering element including a moveable striking member, a strike plate positioned above the hammering elements, where a bottom surface of the strike plate is positioned at a distance above the hammering elements such that the moveable striking members of the hammering elements impact the strike plate when moved into their activated positions, and a retaining member that is configured to hold a device under test on a top surface of the strike plate while a PIM distortion test is performed on the device under test.

Abstract: A system includes a bottle, a first wire, a second wire, a current probe and an output line. The bottle holds a dielectric liquid therein. The first wire is disposed longitudinally on the bottle and generates a first oscillating electrical current in response to an electromagnetic wave, wherein the first oscillating electrical current thereby generates a corresponding first oscillating magnetic field. The second wire is disposed in parallel with the first wire on the bottle and generates a second oscillating electrical current in response to the electromagnetic wave, wherein the second oscillating electrical current thereby generating a corresponding second oscillating magnetic field. The current probe is arranged to surround the bottle such that the bottle is rotatable within the current probe or such that the current probe is rotatable around the bottle.

Abstract: The disclosure relates to a device and method for testing a concentrated photovoltaic module comprising a plurality of sub-modules, which comprises: light sources; and parabolic mirrors coupled with the light sources so as to reflect the light from each source in quasi-collimated light beams toward the module to be tested, perpendicular to the module. Each light source comprises: an optical system comprising two parallel lenses on either side of a diaphragm; a lamp on an optical axis of the optical system; a reflector arranged on the axis, on the side opposite the optical system relative to the lamp, and translatably movable along the axis; and a housing containing the optical system, the lamp and the reflector and including an outlet opening for the light beam on the axis.

Abstract: An electronic device and a method for determining a shield state in an electronic device are provided. The method includes at a detecting pad, detecting an electrical signal corresponding to a contact state of a shielding that contacts a ground or the detecting pad, and determining a shield state by the shielding based on the detected electrical signal.

Abstract: Various embodiments include methods and apparatus structured to balance electrode pairs (112, 312) of a tool (105, 305) providing voltage equivalence between the electrode pairs. An electrically conductive wire (113, 313) coupling the electrodes of an electrode pair can be arranged such that resistance of the electrically conductive wire does not adversely affect the voltage equivalence. The electrically conductive wire can also be structured to provide temperature independent balancing by arranging the electrically conductive wire with respect to a measuring node (116, 316). Additional apparatus, systems, and methods are disclosed.

Abstract: The invention relates to a method for monitoring an on-load tap changer that is used to switch between winding taps of a tapped transformer without interrupting the load current and is actuated using a motor drive. According to the invention, prior to the actual load switching process, the on-load tap changer is initially moved a short distance, preferably against the direction in which the load is subsequently switched. In said initial process, it is verified whether the on-load tap changer has moved, i.e. has left its previous stationary position, and/or whether the torque on the motor drive has exceeded a predefined threshold value. The actual load switching process takes place only once the test has yielded a positive result.

Abstract: An interposer for inspecting reliability of a semiconductor chip is disclosed. The interposer for inspection includes: at least one active pad disposed in an active region of a first surface, and including: pads through which data and a control signal for testing an inspection target chip are received (input) and sent (output) during an active mode; and pads for receiving a power-supply voltage needed to operate the inspection target chip and the interposer during the active mode; at least one passive pad disposed in a passive region of the first surface, and including: pads receiving data for testing the inspection target chip during a passive mode, and a power-supply voltage needed to operate the inspection target chip and the interposer during the passive mode; and at least one bump pad disposed over a second surface facing the first surface, and to be coupled to the inspection target chip.

Abstract: Embodiments of the invention are directed to using a DC multimeter configured for checking device amperage. A DC voltmeter is electrically-connected in series with the DC multimeter. A linear circuit is electrically connected in series between the DC multimeter and the DC voltmeter. A device under test is electrically-connected between positive and negative terminals of the DC voltmeter.