Abstract: Inductive clamps for use in utility locate operations are disclosed. In one embodiment, an inductive clamp includes a head assembly including a base element and a plurality of arm elements coupled to the base element, a handle assembly including a utility selector element coupled to the head assembly, and a magnetic core subassembly for generating a magnetic field for coupling to a targeted utility, the magnetic core subassembly including a plurality of ferrite elements and wire winding wrapped about one or more of the ferrite elements.
Type:
Grant
Filed:
July 29, 2014
Date of Patent:
April 25, 2017
Assignee:
SEESCAN, INC.
Inventors:
Mark S. Olsson, Hunter Brown, Stephanie M. Bench, Justin W. Taylor, Jan Soukup
Abstract: Example embodiments provide systems and methods for a vehicle component structural integrity assessment system, comprising a first connection and a second connection coupled to a conduction path, which is associated with a vehicle component. The conduction path has an initial resistance. A controller is configured to transmit a signal upon the detection of a change in the resistance of the conduction path from the initial resistance.
Abstract: A distance measuring apparatus and method for calculating a distance in a conducting structure are provided. One distance measuring apparatus provides for calculating a distance between a reflection body in a conducting structure and an injection point provided on an end section of the conducting structure for electromagnetic waves is provided. The distance measuring apparatus includes a transmitting and receiving device with a conduction cross-over provided at the injection point for the coaxially-inductive coupling of the transmitting and receiving device to the conducting structure in order to inject an electromagnetic wave into the conducting structure and to decouple the electromagnetic wave reflected on the reflection body from the conducting structure. The distance measuring apparatus also includes an analysis device for calculating a distance between the injection point and the reflection body from the phase difference between the injected electromagnetic wave and the decoupled electromagnetic wave.
Abstract: A duplex system measuring and outputting at least one of a voltage and current is provided. A first measurement device measures at least one of the voltage and current. A second measurement device measures at least one of the voltage and current. A control device is disconnected from the first measurement device and performs a changeover to the second measurement device when the first measurement device abnormally operates. A filter filters a second measurement value of the second measurement device based on a first measurement value of the first measurement device to output a filtered value.
Abstract: A positioning apparatus includes a support structure, a positioning structure, and a fixture for retaining MEMS devices. A shaft spans between the support structure and the positioning structure, and is configured to rotate about a first axis relative to the support structure in order to rotate the positioning structure and the fixture about the first axis. The positioning structure includes a pair of beams spaced apart by a third beam. Another shaft spans between the pair of beams and is configured to rotate about a second axis relative to the positioning structure in order to rotate the fixture about the second axis. Methodology entails installing the positioning apparatus into a chamber, orienting the fixture into various positions, and obtaining output signals from the MEMS devices to determine functionality of the MEMS devices.
Abstract: A test instrument probe that encompasses the dual alternate action of a point or a clamp-grip within the same probe. This probe has approximately the same dimensions as a conventional probe, and allows either the point or clamp action to be used without the necessity of removing the probe from the hand. This alternate action requires only using a thumb and finger pressure to change from a point to a clamp or the clamp to a point. One embodiment allows a clamp jaw opening of up to a nominal ¼ inch that is usually sufficient to grip onto the leads of an electronic component such as resistor, capacitor or integrated circuit pin. The probes are also designed so that when not in use, the two probes can be connected together by a snap-in action that minimizes the potential loss of a probe and importantly allows the points to become safely enclosed to minimize a sharp point hazard.
Abstract: An adjusting device of an output voltage of a switch power supply and an adjusting method are provided. The adjusting device includes a potential setting module generating a high level signal and an adjustor being connected to the potential setting module to receive the high level signal. The adjustor includes a signal emitting module and a comparison module. The signal emitting module emits a pulse drive signal to the switch power supply when receiving the high level signal. The switch power supply automatically adjusts the output voltage when receiving the pulse drive signal. The comparison module reads the output voltage, compares with a preset voltage, and adjusts the output voltage according to a comparison result. The switch power supply can stop the automatic adjustment when an output level of a switch port of the switch power supply is inverted. An integrated chip is also provided.
Type:
Grant
Filed:
April 24, 2014
Date of Patent:
April 11, 2017
Assignee:
DELTA ELECTRONICS POWER (DONG GUAN) CO., LTD.
Abstract: For decades, a mainstay of electrical and electronic testing has been the conventional use of the multi-meter that used a pair of probes to connect the Device Under Test to the meter. This often proves inadequate for present-day testing because more than one simultaneous or alternate reading or the connection of another testing tool and the reading of its effect on the DUT is often required. The Dual-Function Switch and Lead set (DFSL) of the present invention provides a switch and lead set interfacing two multi-meters, or one multi-meter and one test device or instrument with the DUT, while using the traditional and convenient pair of probes and a simple finger movement on the DFSL. The DFSL facilitates these tests, their safety and integrity, and reduces the time of many test procedures.
Abstract: Disclosed are several examples of a system and method for detecting if an article is being tampered with. Included is a covering made of a substrate that is coated with a layer of an electrically conductive material that forms an electrically conductive surface having an electrical resistance. The covering is configured to at least partially encapsulate the article such that the article cannot be tampered with, without modifying the electrical resistance of the electrically conductive surface of the covering. A sensing device is affixed to the electrically conductive surface of the covering and the sensing device monitors the condition of the covering by producing a signal that is indicative of the electrical resistance of the electrically conductive surface of the covering. A measured electrical resistance that differs from a nominal electrical resistance is indicative of a covering that is being tampered with and an alert is communicated to an observer.
Type:
Grant
Filed:
August 11, 2015
Date of Patent:
April 4, 2017
Assignee:
UT-Battelle, LLC
Inventors:
Ronald Jason Livesay, Brandon William Mason, Michael Joseph Kuhn, Nathan Carl Rowe
Abstract: A method is disclosed for determining fault states in a half-bridge circuit having at least a first semiconductor switch and a second semiconductor switch are connected in series with one another and each controllable by a control signal to switch between an open and a closed switching state. For each of the first and second semiconductor switches, an actual switching state and a setpoint switching state are determined. A bridge short circuit in the half-bridge circuit is identified if both (a) the actual switching state of the first semiconductor switch is different than the setpoint switching state of the first semiconductor switch and (b) the actual switching state of the second semiconductor switch is different than the setpoint switching state of the second semiconductor switch.
Type:
Grant
Filed:
October 15, 2013
Date of Patent:
March 28, 2017
Assignee:
CONTI TEMIC MICROELECTRONIC GMBH
Inventors:
Christoph Hornstein, Ulrich Bley, Kai Kuehnen
Abstract: A method for predicting the usability of a relay or a contactor is described herein. A current flowing through the relay or the contactor and/or a voltage applied to the relay or the contactor is measured repeatedly, and the measured values are transmitted to an observation unit. The observation unit makes a prediction relating to the usability of the relay or of the contactor on the basis of the measured values and a model. Furthermore described are an observation unit and a battery which are configured to carry out the method according to the disclosure.
Type:
Grant
Filed:
September 1, 2011
Date of Patent:
March 14, 2017
Assignees:
Robert Bosch GmbH, Samsung SDI Co., Ltd.
Abstract: The invention relates to an electrical system comprising a plurality of modules that can be powered independently withy current, characterized in that it further comprises: a module configured to apply to each of the modules a current which is modulated by a signal specific to the module, an acoustic sensor enabling the measurement of an acoustic signal that accompanies an electrical arc generated by a defective module, a treatment unit configured to identify a signature of one of the specific signals in the acoustic signal measured by the acoustic sensor in order to identify the defective module. The invention also relates to a method for locating faults in such an electrical system.
Type:
Grant
Filed:
December 29, 2014
Date of Patent:
March 14, 2017
Assignee:
Commissariat à l'énergie atomique et aux énergies alternatives
Inventors:
Vincent Heiries, Jean-Louis Lacoume, Pierre Perichon
Abstract: A method and apparatus eliminate magnetic domain walls in a flux guide by applying, either simultaneously or sequentially, a current pulse along serially positioned reset lines to create a magnetic field along the flux guide, thereby removing the magnetic domain walls. By applying the current pulses in parallel and stepping through pairs of shorter reset lines segments via switches, less voltage is required.
Abstract: Devices and methods for monitoring a high-voltage arrangement wherein a current loop runs through elements of the high-voltage arrangement that are monitored. Voltages are sensed on at least three points of the current loop. On the basis of the sensed voltages, an interruption of the current loop is detected and, in response, a high-voltage supply is interrupted. The interruption is localized on the basis of the sensed voltages.
Abstract: In one example, a method includes determining that an insulated-gate bipolar transistor (IGBT) is saturated, and while the IGBT is saturated, determining a collector-emitter saturation voltage (VCESat) of the IGBT.
Abstract: An integrated circuit includes an output circuit having a first terminal adapted to couple to an external power supply, a second terminal adapted to couple to a reference potential, and a third, control terminal. The first and second terminals of the output circuit provide output terminals of the integrated circuit. The integrated circuit further includes an impedance measurement circuit responsive to the external power supply to generate a control signal for coupling to the control terminal of the output circuit. The control signal controls a current level associated with the output circuit. A corresponding method is also described.
Abstract: A controller area network (CAN) includes a CAN bus with a CAN-H wire, a CAN-L wire, a pair of CAN bus terminators located at opposite ends of the CAN bus, each terminator having a corresponding known terminator resistance value, a plurality of nodes including controllers wherein at least one of said controllers is a monitoring controller. The monitoring controller includes a detection control routine for detecting the presence of a wire-open fault on the CAN bus, including determining a CAN bus resistance, and determining a wire-open fault on the CAN bus based upon the determined CAN bus resistance and the terminator resistance values.
Type:
Grant
Filed:
May 22, 2015
Date of Patent:
February 14, 2017
Assignee:
GM GLOBAL TECHNOLOGY OPERATIONS LLC
Inventors:
Shengbing Jiang, Xinyu Du, Natalie Ann Wienckowski
Abstract: The present invention is directed to methods and systems for oil field downhole sensing and communication during drilling and/or production, wherein such methods and systems utilize coaxial cable to transmit electromagnetic (EM) energy, continuously or as a pulse, to passive downhole sensors.
Type:
Grant
Filed:
September 4, 2008
Date of Patent:
January 17, 2017
Assignee:
CHEVRON U.S.A. INC.
Inventors:
Don M. Coates, M. Clark Thompson, David W. Beck, Manuel E. Gonzalez, Michael A. Kendrick, Daniel L. Neagley
Abstract: A capacitive sensor sheet producing method for producing a capacitive sensor sheet uses a base having an insulative base layer on which a binder resin layer including conductive nanowires is formed. The conductive nanowires partially projecting from a surface of the binder resin layer. The method includes removing a binder resin from projections of conductive nanowires partially projected from a plurality of detection electrodes by implementing a surface etching and shaping treatment on a surface of the binder resin layer, or surface ends of at least partial detection electrodes of the plurality of detection electrodes, forming wiring lines of the conductive pattern layer, and connecting the wiring lines to the surface ends of at least partial detection electrodes in the pattern layer. The projections of the conductive nanowires removed the binder resin are put into contact with the connecting portions.
Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The power supply may be connected to an external power source. The conductive probe element may be connected to the power supply and may be configured to be energized by the power supply. The probe element may be configured to be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may be configured to receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may be configured to analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold.