Patents Examined by Demetrius Pretlow
  • Patent number: 9350162
    Abstract: For the purpose of determining a fault current component of a differential current which is measured as a current sum over a plurality of lines carrying a current of an AC current generator, an electric signal which depends on generator voltages present at the AC current generator with respect to earth potential and which is in phase with a leakage current component of the differential current is generated. The electric signal is scaled by multiplying it by a scaling factor; and the scaled electric signal is subtracted from the differential current to obtain a remainder. The scaling factor is repeatedly updated such that the effective value of the remainder reaches a minimum at the present value of the scaling factor.
    Type: Grant
    Filed: September 27, 2012
    Date of Patent: May 24, 2016
    Assignee: SMA SOLAR TECHNOLOGY AG
    Inventors: Gerd Bettenwort, Sebastian Bieniek, Lutz Eidenmueller, Olaf Proeve
  • Patent number: 9348000
    Abstract: A resistive electromagnet assembly comprises a pair of coils with a gap defined between the coils. The resistive electromagnet assembly is configured to generate a field having a magnetic flux density of at least about 4 Tesla and at a sweep rate to complete a hysteresis loop in less than about 1 minute. A support assembly is configured to support a sample of magnetic material within the gap. An optics module is configured to expose a test region of the magnetic material sample to an optical beam probe while the test region is subjected to the field and to receive a reflected beam from the test region. A processor is coupled to the optics module and configured to measure one or more properties of the magnetic material using the received reflected beam.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: May 24, 2016
    Assignee: SEAGATE TECHNOLOGY LLC
    Inventors: Jason L. Pressesky, Ganping Ju
  • Patent number: 9341651
    Abstract: A probe card for an electric test of a device under test on a working table incorporating a heat source includes a circuit base plate including conductive paths connected to a tester, a probe base plate including conductive paths corresponding to the conductive paths and provided with probes connected to the conductive paths, and a heat expansion adjusting member bonded to the probe base plate, having a different linear expansion coefficient from that of the probe base plate to restrain heat expansion of the probe base plate, and constituting a composite body with the probe base plate. In a case where, when the device under test is at two measuring temperatures, the composite body is at corresponding achieving temperatures, expansion changing amounts of the device under test and the composite body under temperature differences between the respective measuring temperatures and the corresponding achieving temperatures are set to be approximately equal.
    Type: Grant
    Filed: May 22, 2014
    Date of Patent: May 17, 2016
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Osamu Arai, Yuki Saito, Tatsuo Inoue, Hidehiro Kiyofuji
  • Patent number: 9341663
    Abstract: A positioning apparatus includes a support structure, a positioning structure, and a fixture for retaining MEMS devices. A shaft spans between the support structure and the positioning structure, and is configured to rotate about a first axis relative to the support structure in order to rotate the positioning structure and the fixture about the first axis. The positioning structure includes a pair of beams spaced apart by a third beam. Another shaft spans between the pair of beams and is configured to rotate about a second axis relative to the positioning structure in order to rotate the fixture about the second axis. Methodology entails installing the positioning apparatus into a chamber, orienting the fixture into various positions, and obtaining output signals from the MEMS devices to determine functionality of the MEMS devices.
    Type: Grant
    Filed: November 26, 2013
    Date of Patent: May 17, 2016
    Assignee: Freescale Semiconductor, Inc.
    Inventor: Thomas J. Birk
  • Patent number: 9335296
    Abstract: The systems and methods of the invention pertain to analyzing steam generator tube data for the detection of wear. Further, the invention is capable of performing a comparison of current tube signal data to baseline or historic tube signal data, e.g., from previous and/or the first, in-service inspection of the steam generator. The systems and methods are automated and can generate results to show potential tube-to-tube contact wear areas as well as the progression of tube-to-tube gap reduction within a steam generator tube bundle. In certain embodiments, the invention is capable of comparing current and historical eddy current data to determine the difference that may be related to degradation or other interested phenomena, and of processing and trending historical comparison results to establish normal variance and detect abnormal variances.
    Type: Grant
    Filed: July 26, 2013
    Date of Patent: May 10, 2016
    Assignee: Westinghouse Electric Company LLC
    Inventors: Qui V. Le, William K. Cullen, Craig Bowser
  • Patent number: 9335288
    Abstract: A storage vessel for a liquid has an arrangement for measuring the electric conductivity of the liquid situated in the vessel. The arrangement has a first contact and a second contact, which are wetted by the liquid and between which the conductivity is measured. The storage vessel has a first conductor loop with a first open end coupled electrically to the first contact and a second open end coupled electrically to the second contact.
    Type: Grant
    Filed: May 15, 2012
    Date of Patent: May 10, 2016
    Assignee: Continental Automotive GmbH
    Inventors: Philippe Grass, Manfred Weigl
  • Patent number: 9316619
    Abstract: A scanning probe for an industrial nondestructive evaluation (NDE) ultrasound or eddy current scanning system. The scanning probe gathers reflected waveform data indicative of internal characteristics of the test object. The scanning probe also includes a self-contained multi-axis position encoder that correlates both multi-dimensional probe underside translation and rotation motion across the test sample surface with the multi-dimensional spatial location on the test object surface. The position encoder compensates for probe rotation that would otherwise negatively impact probe position determination accuracy. A data acquisition system combines sets of positional and waveform data for processing by an NDE analyzer.
    Type: Grant
    Filed: August 1, 2013
    Date of Patent: April 19, 2016
    Assignee: Siemens Energy, Inc.
    Inventors: Erik A. Lombardo, David S. Segletes, Timor Abu-Jaber
  • Patent number: 9316682
    Abstract: A fault diagnosis method for freewheeling diodes of power converter of switched reluctance motor with two main switches per phase, in which two current sensors are arranged on a power converter with two main switches per phase, wherein, one current sensor LEM1 detects the total current of the main switches connected to the DC bus, and the other current sensor LEM2 detects the total feedback current of the freewheeling diodes connected to the DC bus. By controlling ON/OFF of the upper and lower main switch tubes, short circuit fault of the upper freewheeling diode, short circuit fault of the lower freewheeling diode, short circuit fault of both the upper freewheeling diode and the lower freewheeling diode, open circuit fault of the upper freewheeling diode, open circuit fault of the lower freewheeling diode, or open circuit fault of both the upper freewheeling diode and the lower freewheeling diode can be determined.
    Type: Grant
    Filed: April 19, 2013
    Date of Patent: April 19, 2016
    Assignee: CHINA UNIVERSITY OF MINING AND TECHNOLOGY
    Inventors: Hao Chen, Xing Wang
  • Patent number: 9310394
    Abstract: A current sensor includes: a housing that holds a busbar to which a current is applied and a core arranged around the busbar; a circuit board fixed to the housing in the state of being arranged to face the housing; and a detection element for detecting the current; wherein the detection element has an element main body held in the housing and plural connection terminals fixed in through-holes in the circuit board, and a plate-like member provided with guide holes in which the connection terminals are inserted and which have a diameter reduced from the side of the housing toward the side of the circuit board is provided on a surface facing the housing, of two surfaces of the circuit board.
    Type: Grant
    Filed: December 6, 2013
    Date of Patent: April 12, 2016
    Assignee: AISIN SEIKI KABUSHIKI KAISHA
    Inventors: Ken Okumura, Shigeki Niimi, Kenichi Taguchi, Akira Kamiya, Takashi Kurozumi, Kimihiro Tamura, Katsuki Kataoka
  • Patent number: 9310437
    Abstract: A method includes testing a first device and a second device identical to each other and comprising integrated circuits. The testing of the first device is performed according to a first test sequence of the first device, wherein the first test sequence includes a plurality of ordered test items, and wherein the first test sequence includes a test item. A test priority of the test item is calculated based on a frequency of fails of the test item in the testing of a plurality of devices having an identical structure as the first device. The first test sequence is then adjusted to generate a second test sequence in response to the test priority of the test item, wherein the second test sequence is different from the first test sequence. The second device is tested according to the second test sequence.
    Type: Grant
    Filed: March 25, 2011
    Date of Patent: April 12, 2016
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chun-Cheng Chen, Hung-Chih Lin, Mill-Jer Wang, Hao Chen, Ching-Nen Peng
  • Patent number: 9310414
    Abstract: According to one embodiment, in an electronic apparatus, a first pair of electrodes has a first electrode and a second electrode. A second pair of electrodes is disposed in parallel with the first pair, and has a third electrode and a fourth electrode. A third pair of electrodes is disposed between the first pair and the second pair in parallel with the first pair and the second pair, and has a fifth electrode and a sixth electrode. A first wire electrically connects the first electrode and the second electrode. A second wire electrically connects the third electrode and the fourth electrode. A third wire electrically connects the fifth electrode and the sixth electrode. A gel covers the first wire, the second wire, and the third wire. A first detection unit detects a break status of the first wire or the second wire.
    Type: Grant
    Filed: September 14, 2012
    Date of Patent: April 12, 2016
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Takahiro Omori, Kenji Hirohata, Tomoko Monda, Kazuyo Narita, Toshikatsu Akiba, Akihiro Koga, Katsumi Hisano
  • Patent number: 9310329
    Abstract: A system for measuring crop moisture content in a harvester elevator includes a receiver and processing node and one or more moisture sensing instruments coupled to one or more paddles of the harvested elevator, respectively. The moisture sensing instruments each include a moisture sensor and a transmitter in communication with a receiver and processing node. The moisture sensor is configured to dynamically measure the moisture content of a static harvested crop, relative to the sensor and corresponding paddle, at ascends in the harvester elevator.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: April 12, 2016
    Assignee: Raven Industries, Inc.
    Inventors: John Earl Acheson, Stephen Filip Fjelstad, Douglas Samuel Prairie
  • Patent number: 9301721
    Abstract: A non-resistive contact sensor assembly includes an electric field sensor device, including a dielectric component for receiving an electrical signal from an object of interest and a signal processing component for processing the electrical signal, a voltage regulator for controlling voltage to the dielectric component and the signal processing component, and a common ground reference for the dielectric component and the signal processing component.
    Type: Grant
    Filed: March 18, 2013
    Date of Patent: April 5, 2016
    Assignee: RESCON LTD
    Inventors: Thomas Andrew Dawson, Robert Basil
  • Patent number: 9291661
    Abstract: A monitoring circuit and a monitoring system for electrostatic discharge (ESD) protective device are disclosed herein. The monitoring circuit includes an oscillating unit, a signal processing unit and a comparator. The oscillating unit includes a first monitoring end and a second monitoring end. The first monitoring end is configured to be electrically connected to an ESD protective device. The second monitoring end is configured to be electrically connected to ground. When the first monitoring end is not electrically contacted to a user's body or the second monitoring end is not connected to ground, the oscillating unit is configured to output an oscillating signal. The signal processing unit is electrically connected to the oscillating unit, and is configured to output a first voltage according to the oscillating signal. The comparator is configured to compare the first voltage and a reference voltage, and correspondingly output an alarm signal.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: March 22, 2016
    Assignee: WISTRON CORP.
    Inventor: Chris Liu
  • Patent number: 9291636
    Abstract: Disclosed herein are example methods, systems, and devices involving electrically-conductive wires, such as standard IC bonding wires, that are configured so as to operate as inertial sensors. One embodiment of the disclosed methods, systems, and devices may take the form of a system that includes a first electrically-conductive wire and a second electrically-conductive wire, where the first wire and the second wire are electromagnetically coupled; and a sensor oscillator, where the sensor oscillator is coupled to the first wire and the second wire, and where the sensor oscillator is configured to output a sensor-oscillator signal that is frequency modulated based on a change in complex impedance between the first wire and the second wire, where the change in complex impedance is due to a displacement of the first wire relative to the second wire.
    Type: Grant
    Filed: March 23, 2011
    Date of Patent: March 22, 2016
    Assignee: University of Washington Through its Center for Commercialization
    Inventors: Brian Patrick Otis, Yu-Te Liao, William James Biederman
  • Patent number: 9291647
    Abstract: In various embodiments, a low-cost Rogowski coil sensor including a coil wound around a flexible carrier is provided with a reliable parallel-entry closure mechanism.
    Type: Grant
    Filed: March 28, 2012
    Date of Patent: March 22, 2016
    Assignee: ANALOG DEVICES, INC.
    Inventor: John Wynne
  • Patent number: 9285435
    Abstract: A two-core optical fiber magnetic field sensor is configured from at least a light incidence/emission unit; a lens; a magnetic garnet; and a reflector, wherein the lens and the magnetic garnet are disposed between the light incidence/emission end of the light incidence/emission unit and the reflector; a light beam is emitted from one optical fiber; the light beam is reflected by the reflector after being transmitted through the lens and the magnetic garnet; the light beam is transmitted again through the magnetic garnet and the lens after the reflection; and incident on the other optical fiber, the light beam is emitted again from the other optical fiber, and reflected by the reflector after being transmitted through the lens and the magnetic garnet; and the light beam is transmitted again through the magnetic garnet and the lens after the reflection and incident again on the one optical fiber.
    Type: Grant
    Filed: June 23, 2011
    Date of Patent: March 15, 2016
    Assignee: ADAMANT KOGYO, LTD.
    Inventors: Yoshihiro Konno, Masaru Sasaki
  • Patent number: 9285412
    Abstract: The present document relates to voltage regulators (101). In particular, the present document relates to the testing of voltage regulators subject to load transients. A test device (110) configured to generate a load current to be drawn at an output of a voltage regulator (101) is described. The test device (110) comprises a load connector (116) for coupling the test device (110) to the output of the voltage regulator (101); a transistor (113) configured to modulate the current through the load connector (116) subject to a control signal (123); wherein the current through the load connector (116) corresponds to the load current; a current sense resistor (112) arranged in series with the transistor (113) and configured to provide a feedback voltage (121) which is substantially proportional to the load current; and an operational amplifier (111) configured to generate the control signal (123) based on the feedback voltage (121) and based on a target voltage (122).
    Type: Grant
    Filed: September 20, 2012
    Date of Patent: March 15, 2016
    Assignee: Dialog Semiconductor GmbH
    Inventor: Mladen Veselic
  • Patent number: 9277887
    Abstract: A non-resistive contact sensor assembly includes an electric field sensor device, including a dielectric component for receiving an electrical signal from an object of interest and a signal processing component for processing the electrical signal, a voltage regulator for controlling voltage to the dielectric component and the signal processing component, and a common ground reference for the dielectric component and the signal processing component.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: March 8, 2016
    Assignee: RESCON LTD
    Inventors: Thomas Andrew Dawson, Robert Basil
  • Patent number: 9267975
    Abstract: The high speed, high accuracy capacitive gauging system employs an oscillator fed through steep slope filter that is discriminates between very small changes in capacitance even in the presence of electrical noise. During intervals when the probe tip is retracted, the oscillator frequency is calibrated to match the sweet spot in the center of the linear operative region of the steep slope filter. This calibrates the system to overcome the effects of varying temperature and humidity in the manufacturing environment.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: February 23, 2016
    Assignee: LASER MECHANISMS, INC.
    Inventors: Gerald F. Hermann, Daniel R. Buckley, Scott D. Swartzinski