Abstract: A circuit debug apparatus for debugging an integrated circuit that causes a functional fault may include a processor configured to extract a scan pattern of a scan chain of the integrated circuit while the integrated circuit is in a scan mode. The scan pattern includes a plurality of logic states for a corresponding plurality of logic circuits of the integrated circuit. The processor may also be configured to apply a modified scan pattern to the integrated circuit while the integrated circuit is in the scan mode, where the modified scan pattern includes a test pattern configured to eliminate the functional fault. The processor may be further configured to determine whether the integrated circuit with the modified scan pattern produces the functional fault while the integrated circuit is in a functional mode.

Abstract: A quantum computing system and associated methods. An exemplary method includes generating a specification from a binary matrix and at least one quantum check operator. The binary matrix is based at least in part on a classical error correcting code and the quantum check operator(s) is/are based on at least one multiple-qubit Pauli operator. The specification indicates which ancilla qubits are to be coupled to which data qubits. The data qubits are prepared as a plurality of multiple-qubit entangled states. The exemplary method also includes directing quantum hardware components of the quantum computing system to couple each of selected ones of the data qubits to one or more of the ancilla qubits in accordance with the couplings indicated in the specification. Each of the plurality of multiple-qubit entangled states is coupled to a plurality of the ancilla qubits.

Abstract: A transmitter and receiver are provided for communication over a noisy channel in a wireless communications system. The transmitter and receiver use polar coding to provide reliability of data transmission over the noisy wireless channel. In addition, signature bits are inserted in some unreliable bit positions of the polar code. For a given codeword, the receiver with knowledge of the signature can more effectively decode the codeword. Cyclic redundancy check (CRC) bits may also included in the input vector to assist in decoding.

Abstract: An embodiment may involve a network interface configured to capture data packets into a binary format and a non-volatile memory configured to temporarily store the data packets received by way of the network interface. The embodiment may also involve a first array of processing elements each configured to independently and asynchronously: (i) read a chunk of data packets from the non-volatile memory, (ii) identify flows of data packets within the chunk, and (iii) generate flow representations for the flows. The embodiment may also involve a second array of processing elements configured to: (i) receive the flow representations from the first array of processing elements, (ii) identify and aggregate common flows across the flow representations into an aggregated flow representation, (iii) based on a filter specification, remove one or more of the flows from the aggregated flow representation, and (iv) write information from the aggregated flow representation to the database.

Abstract: There are provided a memory device, a memory system including the memory device, and an operating method of the memory system. The memory device includes a memory cell array including a plurality of memory blocks, a peripheral circuit for performing a read operation by applying a read voltage to a selected memory block among the plurality of memory blocks, and control logic for controlling the peripheral circuit to perform a normal read operation using initially set voltages and a read retry operation using new read voltages. The peripheral circuit performs the read retry operation by using the new read voltage corresponding to program states other than at least one program state included in a specific threshold voltage region among a plurality of program states of the selected memory block.

Abstract: Embodiments of the application provides a method for encoding. The method includes: receiving a to-be-encoded data block; encoding the data block at an aggregation level of 2L, where a formula used during the encoding is as follows: [ u . 2 ? ? L u . L ] ? [ G LN 0 G LN G LN ] = ? C . 2 ? ? L C . L ? ( I ) u . L = { u L u L - 1 … u 1 } , u . 2 ? ? L = ? { u 2 ? L u 2 ? L - 1 … u L + 1 } , ? c . L = { c L c L - 1 … c 1 } , c . 2 ? ? L = { c 2 ? L c 2 ? L - 1 … c L + 1 } , G LN = G N ? log 2 ( L ) ( II ) L=2n, and n is a natural number greater than or equal to 0; and outputting an encoded data block.

Abstract: An error protection key generation method and system are provided, the method being used to generate a key for use in computing an error protection code for an input data value according to a chosen error protection scheme. The method comprises inputting a plurality of desired data value sizes, and then applying a key generation algorithm to generate a key for use in computing the error protection code for a maximum data value size amongst the plurality of data value sizes. The key generation algorithm is arranged so that it generates the key so as to comprise a plurality of sub-keys, where each sub-key is associated with one of the input data value sizes, and where each sub-key conforms to a key requirement of the error protection scheme. As a result, a generic key is produced containing a plurality of sub-keys, where each sub-key is associated with a particular desired data value size, and can be extracted and used independently given that each sub-key conforms to the error protection scheme requirements.

Abstract: A sensor system is configured to communicate at least partially protected sensor data over a communication interface. The sensor system includes a sensor element and a communication interface communicatively coupled to the sensor element. The sensor element is configured to provide sensor data in the digital domain. The communication interface is configured to generate a data package for transmission over the communication interface from the sensor data. The data package includes a data grouping comprising one or more nibbles related to the sensor data. The data package further includes a nibble indicia based on at least a portion of selected nibbles within the data grouping.

Abstract: A bit interleaver, a bit-interleaved coded modulation (BICM) device and a bit interleaving method are disclosed herein. The bit interleaver includes a first memory, a processor, and a second memory. The first memory stores a low-density parity check (LDPC) codeword having a length of 64800 and a code rate of 5/15. The processor generates an interleaved codeword by interleaving the LDPC codeword on a bit group basis. The size of the bit group corresponds to a parallel factor of the LDPC codeword. The second memory provides the interleaved codeword to a modulator for 4096-symbol mapping.

Abstract: A cyclic redundancy check (CRC) system includes an input unit, a plurality of CRC engines for 1 byte to n/2 byte, and an output unit. The input unit has a data de-multiplexer for receiving n byte data. The plurality of CRC engines for 1 byte to n/2 byte are connected to the data de-multiplexer for processing demultiplexed n byte data. The output unit has a data multiplexer for providing processed CRC output data. The plurality of CRC engines for 1 byte to n/2 byte are arranged in two columns. A first column includes one or more CRC engines for 1 byte to n/2 byte and a second column includes a CRC engine for n/2 byte.

Abstract: Methods, systems, and devices for targeted test fail injection are described. A memory device may include self-test circuitry configured to test one or more memory cells of a memory array. The self-test circuitry may be configured to store one or more addresses to fail during a test of the memory array based on an indication from a mode register of the memory device. The self-test circuitry may be configured to fail the stored one or more addresses regardless of the outcome of the test at the one or more memory addresses. For example, when an accessed address matches a stored address during test, the self-test circuitry may generate an indication that the accessed address has failed one or more tests of the self-test procedure. Based on the self-test circuitry failing the stored addresses, a test of the memory array may be validated.

Abstract: A data storage device and a method for sharing memory of controller thereof are provided. The data storage device comprises a non-volatile memory and a controller, which is electrically coupled to the non-volatile memory and comprises an access interface, a redundant array of independent disks (RAID) error correcting code (ECC) engine and a central processing unit (CPU). The CPU has a first memory for storing temporary data, the RAID ECC engine has a second memory, and the controller maps the unused memory space of the second memory to the first memory to be virtualized as part of the first memory when the second memory is not fully used so that the CPU can also use the unused memory space of the second memory to store the temporary data.

Abstract: The fully-automatic closed-loop detection method includes: comparing a SCD file of a to-be-tested substation with a device-type data template file, so as to determine whether configuration information about the to-be-tested substation is correct; when the configuration information about the to-be-tested substation is correct, parsing the SCD file of the to-be-tested substation and generating a SSD topological diagram of the to-be-tested substation; and acquiring a testing item from a predetermined testing item library in accordance with the SSD topological diagram of the to-be-tested substation, generating a testing scheme for the to-be-tested substation, performing a testing operation and outputting a testing result.

Abstract: Provided is a test apparatus for testing a device under test (DUT), the apparatus operating at an operating frequency that is lower than an operating frequency of the DUT. The test apparatus includes a clock source which generates a clock according to the operating frequency of the test apparatus, a clock multiplier configured to multiply the generated clock source by a multiplication number which is set according to the operating frequency of the DUT and output a first clock for the DUT, a phase converter configured to shift a phase of the generated clock according to the multiplication number and output a plurality of second clocks having different phases, and a test pattern comparator configured to sequentially collect pieces of data from the DUT by sequentially applying the plurality of second clocks having different phases.

Abstract: An integrated circuit having a secure domain is disclosed. Circuitry within the integrated circuit is used to select one of a plurality of scan modes. The sequence used to select one of the scan modes also serves to reset all of the flip-flops in the secure domain. In this way, it is impossible for a hacker to use the test modes to shift data from the secure domain out of the integrated circuit. The reset is generated asynchronously upon assertion of a first signal and is terminated upon the assertion of a second signal. The assertion of the second signal also serves to select one of the scan modes. This system cannot be hacked by any method that enters scan mode since it is a hardware based solution.

Abstract: In an aspect of the disclosure an apparatus, e.g., a base station, maybe configured to receive, from a UE, ACK/NACK feedback indicating that a subset of CBGs of a set of transmitted CBGs failed to be properly decoded. The apparatus maybe further configured to retransmit the subset of CBGs based on the ACK/NACK feedback and transmit information indicating the CBGs being retransmitted. In one configuration, a TB of new data maybe transmitted with the retransmitted subset of CBGs in a subframe/slot. In an aspect, a UE may be configured to determine that one or more CBGs of a received set of CBGs failed to be properly decoded at the UE, and send ACK/NACK feedback indicating the one or more CBGs that failed to be decoded. The UE maybe further configured to receive a retransmission of CBGs in the set of CBGs, and information indicating the retransmitted CBGs.

Abstract: A bit interleaver, a bit-interleaved coded modulation (BICM) device and a bit interleaving method are disclosed herein. The bit interleaver includes a first memory, a processor, and a second memory. The first memory stores a low-density parity check (LDPC) codeword having a length of 64800 and a code rate of 3/15. The processor generates an interleaved codeword by interleaving the LDPC codeword on a bit group basis. The size of the bit group corresponds to a parallel factor of the LDPC codeword. The second memory provides the interleaved codeword to a modulator for 1024-symbol mapping.

Abstract: The present application discloses an apparatus for testing defects of a memory module comprises a central buffer for generating a test write command and a test read command to indicate testing to a target address in a memory module; and a data buffer coupled to the central buffer to receive the test write command and the test read command; the data buffer is configured to, in response to the test write command, use target data as repair data corresponding to the target address, and write the target data into the memory module; and, in response to the test read command, to read target data from the target address and compare the target data with the repair data, and to send to the central buffer a comparison result of the target data and the repair data; the central buffer is further configured to record the target address as a tested address when generating the test write command, and determine whether to add the tested address to defective address information based on the comparison result associated with th

Abstract: An embodiment may involve receiving a chunk and a chunk index, where the chunk contains packets captured by a network interface unit and the chunk index contains timestamps of first and last packets within the chunk. The chunk may be stored in a first ring buffer of a first memory and the chunk index may be stored in an index buffer of the first memory. A processor may allocate an entry in an I/O queue of a second memory and an entry in a chunk processing queue of the first memory. The processor may read the chunk processing queue to identify and copy the chunk from the first ring buffer to a location in a second ring buffer of the second memory, the location associated with the entry in the I/O queue. The same or a different processor may instruct a controller to write the chunk to a non-volatile memory unit.

Abstract: A method and apparatus of wear leveling control for storage class memory are disclosed. According to the present invention, where current data to be written to a nonvolatile memory corresponds to an address cache hit is determined. If the current data to be written corresponds to an address cache hit, the current data are written to a designated location in the nonvolatile memory different from a destined location in the nonvolatile memory. If the current data to be written corresponds to an address cache miss, the current data are written to the destined location in the nonvolatile memory. In another embodiment, the wear leveling control technique also includes address rotation process to achieve long-term wear leveling as well.