Abstract: Systems and methods for calibrating an image projection system, using image capture devices are disclosed. In particular, Wide-Angle (WA) and Ultra Wide-Angle (UWA) lenses can be utilized to eliminate need for traditional test patterns and tedious alignment settings. That is particularly useful for automatic calibration of projection sources that may require frequent adjustments on the field. Geometric mapping techniques combined with image analytics allow identifying parallel lines in an image captured from a scene. Coordinates of vanishing points corresponding to pairs of parallel lines provide sufficient information to determine orientation of the image projection system in space.

Abstract: A method for increasing a detection distance of a surface of an object illuminated by near-IR electromagnetic radiation, including: (a) directing near-IR electromagnetic radiation from a near-IR electromagnetic radiation source towards an object at least partially coated with a near-IR reflective coating that increases a near-IR electromagnetic radiation detection distance by at least 15% as measured at a wavelength in a near-IR range as compared to the same object coated with a color matched coating which absorbs more of the same near-IR radiation, where the color matched coating has a ?E color matched value of 1.5 or less when compared to the near-IR reflective coating; and (b) detecting reflected near-IR electromagnetic radiation reflected from the near-IR reflective coating. A system for detecting proximity of vehicles is also disclosed.

Abstract: A process for detecting oil or lubricant contamination in a manufactured product, the process comprising adding a fluorescent taggant to oils or lubricants contained in processing machinery for the product, irradiating the product with radiation, such as infrared or ultraviolet radiation, and detecting radiation emitted from the irradiated product.

Abstract: Provided is a device for spectrometry of a radiation of photons, including a detector configured to receive the radiation and to deliver, at an output, an electrical signal that is a function of the radiation (X) received, a reference database that can be parameterised by means of a first parameter, a comparator configured to establish a comparison between the electrical signal and the reference signal, the comparator delivering a signal (E(t)) representative of the energy of each photon of the radiation and a quality factor (B(t)) of the comparison, and a feedback loop enabling the first parameter of the reference database to be adapted so as to optimise the quality factor (B(t)).

Abstract: In an example implementation, a method includes illuminating a wafer with excitation light having a wavelength and intensity sufficient to induce photoluminescence in the wafer. The method also includes detecting photoluminescence emitted from a portion of the wafer in response to the illumination, and detecting excitation light reflected from the portion of the wafer. The method also includes comparing the photoluminescence emitted from the portion of the wafer and the excitation light reflected from the portion of the wafer, and identifying one or more defects in the wafer based on the comparison.

Abstract: A scan head design uses 1:1 (one-to-one) imaging micro-lens arrays to transfer the object plane X-ray image from a CR-plate onto a linear photosensor. The scan-head includes a housing having therein, an array of red light emitting diodes (LEDs), a red-absorbing filter, a microlens array, an infrared-filter, and a sensor. The housing faces the CR-plate and the scan-head is translated across the CR-plate to read out the X-ray image therein. The scan head is compact and provides for improved spatial resolution and reduced power requirements.

Abstract: The present disclosure provides an X-ray imaging apparatus and control method thereof, by which the user's hand is photographed and information about a thickness of a subject, information about a photographed spot or information about a photographing angle may be easily obtained from the photographed image. According to an aspect of an example embodiment, there is an X-ray imaging apparatus comprising an X-ray source configured to generate and irradiate an X-ray; a photographing device equipped in the X-ray source for capturing a camera image; and a controller configured to detect a plurality of indicators from the camera image, calculate a thickness of an X-raying portion of a subject based on a distance between the plurality of indicators, and controlling an X-ray irradiation condition based on the thickness of the X-raying portion.

Abstract: The present disclosure describes a downhole tool including an electrically operated radiation generator that selectively output radiation to a surrounding environment based at least in part on supply of electrical power; and a control system that determines likelihood of exposing living beings in the surrounding environment to output radiation by determining whether one or more check conditions is met; determine that each of the one or more check conditions is met before instructing the electrically operated radiation generator to output radiation; and instruct the electrically operated radiation generator to cease output of radiation when at least one of the one or more check conditions is no longer met.

Abstract: Systems, methods, and devices for inelastic gamma-ray logging are provided. In one embodiment, such a method includes emitting neutrons into a subterranean formation from a downhole tool to produce inelastic gamma-rays, detecting a portion of the inelastic gamma-rays that scatter back to the downhole tool to obtain an inelastic gamma-ray signal, and determining a property of the subterranean formation based at least in part on the inelastic gamma-ray signal. The inelastic gamma-ray signal may be substantially free of epithermal and thermal neutron capture background.

Abstract: The mammography apparatus includes an imaging stand that includes a recess that cuts out at least a part of a contact face that comes in contact with a chest wall of a subject, in which the recess has a shape in which among a first ridge portion where the contact face and an upper face are connected to each other, a second ridge portion where the contact face and a lower face are connected to each other, a third ridge portion where the contact face and a first side face are connected to each other, and a fourth ridge portion where the contact face and a second side face are connected to each other, at least a part of the second ridge portion is cut out, and the first ridge portion, the third ridge portion, and the fourth ridge portion are not cut out.

Abstract: Detection can be performed even for a thick inspection target object through time delay integration without degradation of spatial resolution. There is provided an X-ray inspection device configured to include: an X-ray source that generates X-rays; a transport unit that performs transporting a sample; a detecting unit that has a time delay integration type detector which detects X-rays generated by the X-ray source and transmitted through the sample transported by the transport unit; and a defect determining unit that processes a signal obtained by detecting the X-rays transmitted through the sample by the time delay integration type detector of the detecting unit and determines a defect in the sample. The transport unit performs transporting the sample while causing the sample to rotate in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit.

Abstract: A digital quantum dot radiographic detection system described herein includes: a scintillation subsystem 202 and a semiconductor light detection subsystem 200, 200? (including a plurality of quantum dot image sensors 200a, 200b). In a first preferred digital quantum dot radiographic detection system, the plurality of quantum dot image sensors 200 is in substantially direct contact with the scintillation subsystem 202. In a second preferred digital quantum dot radiographic detection system, the scintillation subsystem has a plurality of discrete scintillation packets 212a, 212b, at least one of the discrete scintillation packets communicating with at least one of the quantum dot image sensors. The quantum dot image sensors 200 may be associated with semiconductor substrate 210 made from materials such as silicon (and variations thereof) or graphene.

Abstract: A fissile neutron detection system includes a neutron moderator and a neutron detector disposed proximate such that a majority of the surface area of the neutron moderator is disposed proximate the neutron detector. Fissile neutrons impinge upon and enter the neutron moderator where the energy level of the fissile neutron is reduced to that of a thermal neutron. The thermal neutron may exit the moderator in any direction. Maximizing the surface area of the neutron moderator that is proximate the neutron detector beneficially improves the reliability and accuracy of the fissile neutron detection system by increasing the percentage of thermal neutrons that exit the neutron moderator and enter the neutron detector.

Abstract: The present disclosure provides a ray calibration device and a working method thereof, and a radiation imaging system and a working method thereof, and belongs to the field of radiation imaging technology. The present disclosure can solve the problems that the existing calibration devices have low calibration efficiency and require relatively large spaces. The ray calibration device of the present disclosure includes a driving part, a cam part and a calibration part, wherein the calibration part is located below the cam part; the driving part is adapted to drive the cam part to rotate; and the cam part is adapted to exert a force on the calibration part to enable the calibration part to move into a ray area downwards.

Abstract: A method for displaying measurement results from X-ray diffraction measurement, in which a sample is irradiated with X-rays and the X-rays diffracted by the sample are detected by an X-ray detector, comprises: (1) forming a one-dimensional diffraction profile by displaying, on the basis of output data from an X-ray detector, a profile in which one orthogonal coordinate axis shows 2? angle values and another orthogonal coordinate axis shows X-ray intensity values; (2) forming a two-dimensional diffraction pattern by linearly displaying X-ray intensity data, for each 2? angle value and on the basis of output data from the X-ray detector; the X-ray intensity data being present in the circumferential direction of a plurality of Debye rings formed at each 2? angle by diffracted X-rays; and (3) displaying the two-dimensional diffraction pattern and the one-dimensional diffraction profile so as to be aligned such that the 2? angle values of both coincide with each other.

Abstract: The present invention relates to an X-ray imaging system. The invention further relates to an X-ray sensor to be used in such system and to a method for manufacturing such sensors. According to the invention, the combination of a lower saturation dose and obtaining a plurality of image frames during a single exposure, can be used to form a final X-ray image having an improved dynamic range.

Abstract: The invention relates to an X-ray imaging apparatus (2), comprising: a source (4) for generating X-ray radiation, an object receiving space (6) for arranging an object of interest for X-ray imaging, an X-ray collimator arrangement (8) arranged between the source (4) and the collimator arrangement (8), and an X-ray mirror arrangement (10). The mirror arrangement (10) comprises for example two tapered mirrors (22) facing each other and adapted for guiding X-ray radiation of the source (4) to the collimator arrangement (8). Consequently, the X-ray intensity at the object receiving space (6) is increased. In order to limit the X-ray radiation to an area, where the X-ray radiation can be utilized form imaging, an angle of spread ?m between the mirrors (22) and a length LM of each mirror (22) is adapted, such that a number of total reflections of X-ray radiation, provided by the source (4), at the mirrors (22) is limited.

Abstract: A wavelength dispersive X-ray fluorescence spectrometer of the present invention includes: a position sensitive detector (10) configured to detect intensities of secondary X-rays (41) at different spectral angles, by using detection elements (7) corresponding to the secondary X-rays (41) at different spectral angles; a measured spectrum display unit (14) configured to display a relationship between a position, in an arrangement direction, of each detection element (7), and a detected intensity by the detection element (7), as a measured spectrum, on a display (15); a detection area setting unit (16) configured to be set a peak area and a background area; and a quantification unit (17) configured to calculate, as a net intensity, an intensity of the fluorescent X-rays to be measured, based on a peak intensity in the peak area, a background intensity in the background area, and a background correction coefficient, and to perform quantitative analysis.

Abstract: According to one embodiment, an X-ray tube, including a cathode including a filament including a leg portion extending from a coil to a distal portion and including a corner portion at the distal portion, a support terminal including a gap, and including an opening portion in which the gap is opened and a bottom portion located on a side opposite to the opening portion, and a cathode cup being connected to the support terminal, the distal portion being located in the gap, the support terminal including a protruding portion protruding in the gap, being located more closely to the bottom portion side than the distal portion, and being joined to the corner portion of the leg portion.

Abstract: There is disclosed an X-ray detector that includes a detection section, an addition rate determination section, an addition section, and a position information storage section in order to enhance the accuracy of interpolation of an output signal from a defective element and suppress artifacts with ease without increasing, for example, the length of processing time, the number of processing circuits, and the amount of interpolation data. The detection section includes a plurality of arrays of detection element groups that are each formed of a plurality of detection elements in correspondence with one pixel. The addition rate determination section determines addition rates for output signals of the detection elements. The addition section calculates the signal value of each pixel of a projection image by adding the output signals of the detection elements belonging to the detection element groups in accordance with the addition rates.