Patents Examined by Djura Malevic
  • Patent number: 10900897
    Abstract: A process for detecting oil or lubricant contamination in a manufactured product, the process comprising adding a fluorescent taggant to oils or lubricants contained in processing machinery for the product, irradiating the product with radiation, such as infrared or ultraviolet radiation, and detecting radiation emitted from the irradiated product.
    Type: Grant
    Filed: May 29, 2013
    Date of Patent: January 26, 2021
    Assignee: Altria Client Services LLC
    Inventors: Edmond J. Cadieux, Robert E. Wood
  • Patent number: 10890676
    Abstract: Provided is a device for spectrometry of a radiation of photons, including a detector configured to receive the radiation and to deliver, at an output, an electrical signal that is a function of the radiation (X) received, a reference database that can be parameterised by means of a first parameter, a comparator configured to establish a comparison between the electrical signal and the reference signal, the comparator delivering a signal (E(t)) representative of the energy of each photon of the radiation and a quality factor (B(t)) of the comparison, and a feedback loop enabling the first parameter of the reference database to be adapted so as to optimise the quality factor (B(t)).
    Type: Grant
    Filed: October 25, 2017
    Date of Patent: January 12, 2021
    Assignee: DETECTION TECHNOLOGY SAS
    Inventors: Eric Marche, Silvère Lux
  • Patent number: 10883941
    Abstract: In an example implementation, a method includes illuminating a wafer with excitation light having a wavelength and intensity sufficient to induce photoluminescence in the wafer. The method also includes detecting photoluminescence emitted from a portion of the wafer in response to the illumination, and detecting excitation light reflected from the portion of the wafer. The method also includes comparing the photoluminescence emitted from the portion of the wafer and the excitation light reflected from the portion of the wafer, and identifying one or more defects in the wafer based on the comparison.
    Type: Grant
    Filed: June 20, 2018
    Date of Patent: January 5, 2021
    Assignee: SEMILAB Semiconductor Physics Laboratory Co., Ltd.
    Inventors: Zoltan Tamas Kiss, Laszlo Dudas, Zsolt Kovacs, Imre Lajtos, Gyorgy Nadudvari, Nicolas Laurent, Lubomir L. Jastrzebski
  • Patent number: 10876981
    Abstract: A scan head design uses 1:1 (one-to-one) imaging micro-lens arrays to transfer the object plane X-ray image from a CR-plate onto a linear photosensor. The scan-head includes a housing having therein, an array of red light emitting diodes (LEDs), a red-absorbing filter, a microlens array, an infrared-filter, and a sensor. The housing faces the CR-plate and the scan-head is translated across the CR-plate to read out the X-ray image therein. The scan head is compact and provides for improved spatial resolution and reduced power requirements.
    Type: Grant
    Filed: October 29, 2019
    Date of Patent: December 29, 2020
    Assignee: Leidos, Inc.
    Inventors: Rex David Richardson, William L. Hicks, Mark Alan Peressini
  • Patent number: 10849589
    Abstract: The present disclosure provides an X-ray imaging apparatus and control method thereof, by which the user's hand is photographed and information about a thickness of a subject, information about a photographed spot or information about a photographing angle may be easily obtained from the photographed image. According to an aspect of an example embodiment, there is an X-ray imaging apparatus comprising an X-ray source configured to generate and irradiate an X-ray; a photographing device equipped in the X-ray source for capturing a camera image; and a controller configured to detect a plurality of indicators from the camera image, calculate a thickness of an X-raying portion of a subject based on a distance between the plurality of indicators, and controlling an X-ray irradiation condition based on the thickness of the X-raying portion.
    Type: Grant
    Filed: January 12, 2018
    Date of Patent: December 1, 2020
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Sang Ha Song
  • Patent number: 10845501
    Abstract: The present disclosure describes a downhole tool including an electrically operated radiation generator that selectively output radiation to a surrounding environment based at least in part on supply of electrical power; and a control system that determines likelihood of exposing living beings in the surrounding environment to output radiation by determining whether one or more check conditions is met; determine that each of the one or more check conditions is met before instructing the electrically operated radiation generator to output radiation; and instruct the electrically operated radiation generator to cease output of radiation when at least one of the one or more check conditions is no longer met.
    Type: Grant
    Filed: November 8, 2016
    Date of Patent: November 24, 2020
    Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
    Inventors: Christian Stoller, Matthieu Simon, David Alan Rose, Libo Yang, Onur Ozen, Sicco Beekman
  • Patent number: 10845502
    Abstract: Systems, methods, and devices for inelastic gamma-ray logging are provided. In one embodiment, such a method includes emitting neutrons into a subterranean formation from a downhole tool to produce inelastic gamma-rays, detecting a portion of the inelastic gamma-rays that scatter back to the downhole tool to obtain an inelastic gamma-ray signal, and determining a property of the subterranean formation based at least in part on the inelastic gamma-ray signal. The inelastic gamma-ray signal may be substantially free of epithermal and thermal neutron capture background.
    Type: Grant
    Filed: February 12, 2018
    Date of Patent: November 24, 2020
    Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
    Inventors: Kenneth E. Stephenson, David Rose, Avtandil Tkabladze, Christian Stoller, John J. Simonetti
  • Patent number: 10827997
    Abstract: The mammography apparatus includes an imaging stand that includes a recess that cuts out at least a part of a contact face that comes in contact with a chest wall of a subject, in which the recess has a shape in which among a first ridge portion where the contact face and an upper face are connected to each other, a second ridge portion where the contact face and a lower face are connected to each other, a third ridge portion where the contact face and a first side face are connected to each other, and a fourth ridge portion where the contact face and a second side face are connected to each other, at least a part of the second ridge portion is cut out, and the first ridge portion, the third ridge portion, and the fourth ridge portion are not cut out.
    Type: Grant
    Filed: April 26, 2019
    Date of Patent: November 10, 2020
    Assignee: FUJIFILM Corporation
    Inventors: Hisatsugu Horiuchi, Yoshie Fujimoto
  • Patent number: 10823686
    Abstract: Detection can be performed even for a thick inspection target object through time delay integration without degradation of spatial resolution. There is provided an X-ray inspection device configured to include: an X-ray source that generates X-rays; a transport unit that performs transporting a sample; a detecting unit that has a time delay integration type detector which detects X-rays generated by the X-ray source and transmitted through the sample transported by the transport unit; and a defect determining unit that processes a signal obtained by detecting the X-rays transmitted through the sample by the time delay integration type detector of the detecting unit and determines a defect in the sample. The transport unit performs transporting the sample while causing the sample to rotate in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit.
    Type: Grant
    Filed: May 13, 2016
    Date of Patent: November 3, 2020
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Yuta Urano, Kaifeng Zhang, Yoshiki Matoba, Akihiro Takeda
  • Patent number: 10825856
    Abstract: A digital quantum dot radiographic detection system described herein includes: a scintillation subsystem 202 and a semiconductor light detection subsystem 200, 200? (including a plurality of quantum dot image sensors 200a, 200b). In a first preferred digital quantum dot radiographic detection system, the plurality of quantum dot image sensors 200 is in substantially direct contact with the scintillation subsystem 202. In a second preferred digital quantum dot radiographic detection system, the scintillation subsystem has a plurality of discrete scintillation packets 212a, 212b, at least one of the discrete scintillation packets communicating with at least one of the quantum dot image sensors. The quantum dot image sensors 200 may be associated with semiconductor substrate 210 made from materials such as silicon (and variations thereof) or graphene.
    Type: Grant
    Filed: March 16, 2020
    Date of Patent: November 3, 2020
    Assignee: Oregon Dental, Inc.
    Inventor: Leigh E. Colby
  • Patent number: 10809397
    Abstract: A fissile neutron detection system includes a neutron moderator and a neutron detector disposed proximate such that a majority of the surface area of the neutron moderator is disposed proximate the neutron detector. Fissile neutrons impinge upon and enter the neutron moderator where the energy level of the fissile neutron is reduced to that of a thermal neutron. The thermal neutron may exit the moderator in any direction. Maximizing the surface area of the neutron moderator that is proximate the neutron detector beneficially improves the reliability and accuracy of the fissile neutron detection system by increasing the percentage of thermal neutrons that exit the neutron moderator and enter the neutron detector.
    Type: Grant
    Filed: April 9, 2019
    Date of Patent: October 20, 2020
    Assignee: Silverside Detectors Inc.
    Inventors: Andrew Inglis, Zachary S. Hartwig, Philip C. Taber, Timothy Teal
  • Patent number: 10809207
    Abstract: The present disclosure provides a ray calibration device and a working method thereof, and a radiation imaging system and a working method thereof, and belongs to the field of radiation imaging technology. The present disclosure can solve the problems that the existing calibration devices have low calibration efficiency and require relatively large spaces. The ray calibration device of the present disclosure includes a driving part, a cam part and a calibration part, wherein the calibration part is located below the cam part; the driving part is adapted to drive the cam part to rotate; and the cam part is adapted to exert a force on the calibration part to enable the calibration part to move into a ray area downwards.
    Type: Grant
    Filed: September 29, 2016
    Date of Patent: October 20, 2020
    Inventors: Zhiqiang Chen, Yumei Chen, Yaohong Liu, Xinshui Yan, Weiqiang Guan, Wei Yin
  • Patent number: 10801976
    Abstract: A method for displaying measurement results from X-ray diffraction measurement, in which a sample is irradiated with X-rays and the X-rays diffracted by the sample are detected by an X-ray detector, comprises: (1) forming a one-dimensional diffraction profile by displaying, on the basis of output data from an X-ray detector, a profile in which one orthogonal coordinate axis shows 2? angle values and another orthogonal coordinate axis shows X-ray intensity values; (2) forming a two-dimensional diffraction pattern by linearly displaying X-ray intensity data, for each 2? angle value and on the basis of output data from the X-ray detector; the X-ray intensity data being present in the circumferential direction of a plurality of Debye rings formed at each 2? angle by diffracted X-rays; and (3) displaying the two-dimensional diffraction pattern and the one-dimensional diffraction profile so as to be aligned such that the 2? angle values of both coincide with each other.
    Type: Grant
    Filed: August 17, 2018
    Date of Patent: October 13, 2020
    Assignee: RIGAKU CORPORATION
    Inventors: Akito Sasaki, Akihiro Himeda, Yukiko Ikeda, Keigo Nagao
  • Patent number: 10775519
    Abstract: The present invention relates to an X-ray imaging system. The invention further relates to an X-ray sensor to be used in such system and to a method for manufacturing such sensors. According to the invention, the combination of a lower saturation dose and obtaining a plurality of image frames during a single exposure, can be used to form a final X-ray image having an improved dynamic range.
    Type: Grant
    Filed: August 17, 2015
    Date of Patent: September 15, 2020
    Assignee: TELEDYNE DALSA B.V.
    Inventors: Bartholomeus Goverdina Maria Henricus Dillen, Chiel Smit, Willem Hendrik Maes, Alouisius Wilhelmus Marinus Korthout, Andrey Lomako, James Miller
  • Patent number: 10765383
    Abstract: The invention relates to an X-ray imaging apparatus (2), comprising: a source (4) for generating X-ray radiation, an object receiving space (6) for arranging an object of interest for X-ray imaging, an X-ray collimator arrangement (8) arranged between the source (4) and the collimator arrangement (8), and an X-ray mirror arrangement (10). The mirror arrangement (10) comprises for example two tapered mirrors (22) facing each other and adapted for guiding X-ray radiation of the source (4) to the collimator arrangement (8). Consequently, the X-ray intensity at the object receiving space (6) is increased. In order to limit the X-ray radiation to an area, where the X-ray radiation can be utilized form imaging, an angle of spread ?m between the mirrors (22) and a length LM of each mirror (22) is adapted, such that a number of total reflections of X-ray radiation, provided by the source (4), at the mirrors (22) is limited.
    Type: Grant
    Filed: July 12, 2016
    Date of Patent: September 8, 2020
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Gerhard Martens, Ewald Roessl
  • Patent number: 10768125
    Abstract: A wavelength dispersive X-ray fluorescence spectrometer of the present invention includes: a position sensitive detector (10) configured to detect intensities of secondary X-rays (41) at different spectral angles, by using detection elements (7) corresponding to the secondary X-rays (41) at different spectral angles; a measured spectrum display unit (14) configured to display a relationship between a position, in an arrangement direction, of each detection element (7), and a detected intensity by the detection element (7), as a measured spectrum, on a display (15); a detection area setting unit (16) configured to be set a peak area and a background area; and a quantification unit (17) configured to calculate, as a net intensity, an intensity of the fluorescent X-rays to be measured, based on a peak intensity in the peak area, a background intensity in the background area, and a background correction coefficient, and to perform quantitative analysis.
    Type: Grant
    Filed: November 6, 2018
    Date of Patent: September 8, 2020
    Assignee: Rigaku Corporation
    Inventors: Shuichi Kato, Yoshiyuki Kataoka, Hajime Fujimura, Takashi Yamada
  • Patent number: 10763069
    Abstract: According to one embodiment, an X-ray tube, including a cathode including a filament including a leg portion extending from a coil to a distal portion and including a corner portion at the distal portion, a support terminal including a gap, and including an opening portion in which the gap is opened and a bottom portion located on a side opposite to the opening portion, and a cathode cup being connected to the support terminal, the distal portion being located in the gap, the support terminal including a protruding portion protruding in the gap, being located more closely to the bottom portion side than the distal portion, and being joined to the corner portion of the leg portion.
    Type: Grant
    Filed: January 11, 2018
    Date of Patent: September 1, 2020
    Assignee: Canon Electron Tubes & Devices Co., Ltd.
    Inventors: Hiroyuki Kumadaki, Tomonobu Saito, Hidero Anno
  • Patent number: 10751020
    Abstract: There is disclosed an X-ray detector that includes a detection section, an addition rate determination section, an addition section, and a position information storage section in order to enhance the accuracy of interpolation of an output signal from a defective element and suppress artifacts with ease without increasing, for example, the length of processing time, the number of processing circuits, and the amount of interpolation data. The detection section includes a plurality of arrays of detection element groups that are each formed of a plurality of detection elements in correspondence with one pixel. The addition rate determination section determines addition rates for output signals of the detection elements. The addition section calculates the signal value of each pixel of a projection image by adding the output signals of the detection elements belonging to the detection element groups in accordance with the addition rates.
    Type: Grant
    Filed: February 3, 2017
    Date of Patent: August 25, 2020
    Assignee: Hitachi, Ltd.
    Inventor: Yasutaka Konno
  • Patent number: 10751010
    Abstract: The disclosure relates to a mobile X-ray device having an equipment cart that is movable on wheels and has a lifting device on which a support assembly is arranged. A C-arm is mounted to the support assembly so as to be displaceable along the circumference of the support assembly, wherein the C-arm has an X-ray source and an X-ray receiver arranged opposite the X-ray source. In order to simplify the handling of a mechanical zoom on mobile X-ray devices, a motion controller is provided by which, in any given pose of the C-arm, a movement of the C-arm is controlled in such a way that the central axis extending between X-ray source and X-ray receiver is fixed in space.
    Type: Grant
    Filed: June 27, 2017
    Date of Patent: August 25, 2020
    Assignee: Siemens Healthcare GmbH
    Inventors: Alexander Gemmel, Gerhard Kleinszig, Wei Wei, Markus Weiten
  • Patent number: 10746656
    Abstract: The present disclosure discloses a CO2 quantitative fluorescent sensing material, a preparation method and an application thereof. The preparation method for the CO2 quantitative fluorescent sensing material includes dissolving 9,10-diacrylic anthracene in a solvent to prepare 5-10 mg/mL of a first solution; dissolving MnCl2 or Mn(ClO4)2 in water to prepare 50-100 mg/mL of a second solution; mixing the first solution and the second solution; adding a diluted acid into the mixed solution; sealing and heating the mixed solution. This preparation method is simple. During application, an ionic liquid produced by a reaction of CO2 gas and an amine compound improves an aggregation-induced emission of the CO2 quantitative fluorescent sensing material and a fluorescence thereof is significantly improved. So that a fluorescent CO2 quantification is performed rapidly and accurately.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: August 18, 2020
    Assignee: Yancheng Institute of Technology
    Inventors: Minghua Xie, Xiuli Yang, Rong Shao, Guihua Hou, Rongfeng Guan