Patents Examined by Giovanni Astacio-Oquendo
  • Patent number: 11320489
    Abstract: According to the embodiment, a field winding interlayer short-circuit detection apparatus comprises: a field winding resistance calculator to calculate, for a field winding of a rotating electrical machine, a field winding resistance calculated value from a detected value of a field winding current and a detected value of a field winding voltage; a determiner to determine presence or absence of an interlayer short-circuit in the field winding by using a comparison result between the field winding resistance calculated value and the reference resistance value.
    Type: Grant
    Filed: July 27, 2020
    Date of Patent: May 3, 2022
    Assignees: KABUSHIKI KAISHA TOSHIBA, TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATION
    Inventors: Toshio Hirano, Yoshihiro Taniyama, Masafumi Fujita, Koji Ando, Yoshinori Torii
  • Patent number: 11313989
    Abstract: The present disclosure is related to a detecting device which includes a fixing component, a sensing component, and a terminal. The fixing component is fixed to an object under test and generates a first magnetic field. The sensing component includes a driving module and a reference module. The driving module generates a second magnetic field, and the driving module further generates a sensing signal according to an electromagnetic induction produced by the first magnetic field and the second magnetic field. The reference module is spaced from the driving module by a distance, such that the reference module is outside of the second magnetic field and generates a reference signal. The terminal produces detection information according to the sensing signal and the reference signal.
    Type: Grant
    Filed: July 28, 2020
    Date of Patent: April 26, 2022
    Assignee: National Central University
    Inventors: Min-Chun Pan, Wei-Hao Lee, Po-Chin Chang, Tsung-Hsuan Su
  • Patent number: 11313900
    Abstract: An on chip leakage-current detection device including a first inverter where the magnitude of delay of the output signal of the first inverter is determined by a leakage current of a target device. The leakage-current detection device further includes: a capacitor that is charged by the output signal of the first inverter; a second inverter coupled to capacitor that switches states when the capacitor is charged to a switching level; an odd number of additional inverters coupled in a sequence with a second-inverter output. The output of the leakage-current detection device has a frequency proportional to the leakage of the target device.
    Type: Grant
    Filed: August 24, 2020
    Date of Patent: April 26, 2022
    Assignee: STMICROELECTRONICS INTERNATIONAL N.V.
    Inventors: Pravesh Kumar Saini, Shashwat
  • Patent number: 11315453
    Abstract: An electronic device includes a substrate having a top surface, a bottom surface and a side surface between the top surface and the bottom surface, and a test circuit disposed on the substrate. The test circuit extends from the top surface to the bottom surface through the side surface of the substrate and has a current terminal for an ammeter and a voltage terminal for a voltmeter, both of which are disposed on the bottom surface.
    Type: Grant
    Filed: November 8, 2020
    Date of Patent: April 26, 2022
    Assignee: InnoLux Corporation
    Inventor: Shuhei Hosaka
  • Patent number: 11307224
    Abstract: A measuring rod for an electric meter and an electric meter assembly using the same are disclosed, wherein the device to be detected disposed around the front end of at least one of the test probes allows the electric meter to determine the type of currently inserted test probes and whether the test probes are suitable for use under a current operation mode of the electric meter in a situation when the device to be detected is inserted into the electric meter; and the measuring socket corresponding to the device to be detected is disposed with a determination mechanism for allowing the electric meter to determine whether the abovementioned test probes or test probes of different types are suitable for use under a current operation mode of the electric meter.
    Type: Grant
    Filed: April 3, 2019
    Date of Patent: April 19, 2022
    Assignee: APPA TECHNOLOGY CORP.
    Inventors: Shan-Wen Chang, Shou-Hua Lin
  • Patent number: 11300613
    Abstract: A method of assessing the ability of one or more multi-die circuit elements to tolerate the presence of jitter in intra-package. The method includes: providing a first die having a set of transmitters for digital communications, the set of transmitters comprising a first transmitter and a second transmitter; providing a second die having a set of receivers for digital communications; providing a performance monitor; coupling, using an intra-package trace, a first transmit signal from the first transmitter to a receiver of the set of receivers; coupling a second transmit signal from the second transmitter to an external pin; supplying an input signal that induces jitter in the first and second transmit signals; measuring jitter in the second transmit signal via the external pin; and determining, using the performance monitor, a performance characteristic of the second die.
    Type: Grant
    Filed: September 16, 2020
    Date of Patent: April 12, 2022
    Assignee: Credo Technology Group Limited
    Inventors: Arshan Aga, Haoli Qian, Junqing Sun, James Bartenslager
  • Patent number: 11300463
    Abstract: A rotary angle sensor for an electric power assisted steering system of a motor vehicle, wherein the rotary angle sensor comprises an optical sensor unit with a light source, optical components and a photodetector and a disc with an optical pattern, wherein the optical sensor unit and the disc are configured to rotate relative to each other around a rotary axis, and wherein the optical sensor unit is configured such that light reflected from the optical pattern is measured by the photodetector, wherein the optical pattern comprises steps and spaces separating the steps, such that light reflected by steps and spaces destructively interferes leading to an intensity modulation of the reflected light according to an optical pattern which encodes a binary type code for the rotary angle of the disc.
    Type: Grant
    Filed: April 29, 2016
    Date of Patent: April 12, 2022
    Assignees: THYSSENKRUPP PRESTA AG, THYSSENKRUPP AG
    Inventor: Gergely Racz
  • Patent number: 11293992
    Abstract: There are disclosed fault detection circuits and methods for an N-to-1 Dickson topology hybrid DC-DC power converter. A short circuit fault detection circuit comprises: first and second measuring circuits configured to measure first and second voltages, Vsw1, Vsw2, at the switching node in the first and second state; first and second calculation circuits configured to calculate first and second absolute error voltage as an absolute difference of the respective first and second voltages in one operating cycle (Vsw1[n?1], Vsw2[n?1]) and in a next subsequent operating cycle (Vsw1[n], Vsw2[n]); and first and second fault circuits configured to provide first and second fault outputs indicative of a fault in response to the respective first or second absolute error voltage exceeding a short-circuit-trip level. Open circuit fault detection circuits and methods are also disclosed.
    Type: Grant
    Filed: March 10, 2020
    Date of Patent: April 5, 2022
    Assignee: NXP B.V.
    Inventors: Mojtaba Ashourloo, Venkata Raghuram Namburi, Gerard Villar Piqué, John Pigott, Olivier Trescases, Hendrik Bergveld, Alaa Eldin Y El Sherif
  • Patent number: 11293956
    Abstract: A real-time power monitoring method executable by an electronic device, comprising: performing an ADC calibration operation to a voltage of a first battery of the electronic device; calculating and forming a diagonal line for the first battery; determining whether the comparison result between a gain and an offset and an optimum gain and an optimum offset is located with a preset error range; if the comparison result is located with the preset error range, determining that the voltage calibration for the first battery is successful; and, if the comparison result is located outside the preset error range, determining that the voltage calibration for the first battery is unsuccessful, analyzing and fixing the first battery and for re-performing the ADC calibration to the first battery.
    Type: Grant
    Filed: May 28, 2020
    Date of Patent: April 5, 2022
    Assignee: NANNING FUGUI PRECISION INDUSTRIAL CO., LTD.
    Inventor: Yung-Chieh Lin
  • Patent number: 11293955
    Abstract: A system for energy metering for a building, such as a data center.
    Type: Grant
    Filed: December 10, 2018
    Date of Patent: April 5, 2022
    Assignee: Veris Industries, LLC
    Inventor: Martin Cook
  • Patent number: 11293941
    Abstract: An interface element (20) for a testing apparatus of electronic devices comprises at least one support (21) provided with a plurality of through-openings (22) that house respective interconnections elements (23), which extend between a first end (23a) and a second end (23b). Suitably, the interconnections elements (23) are made of a conductive elastomer that fills the openings (22) of the support (21), each of the interconnection elements (23) forming a conductive channel between different and opposing faces (Fa, Fb) of the support (21).
    Type: Grant
    Filed: March 3, 2020
    Date of Patent: April 5, 2022
    Assignee: Technoprobe S.p.A.
    Inventors: Roberto Crippa, Riccardo Vettori
  • Patent number: 11287457
    Abstract: This invention disclosed a system and method for characteristics measurement of electromagnetic signals. The measurement system comprises a multi-repetition-rate pulsed light source, a frequency mixer for electrical signal and optical signal, and a data acquisition and processing device. The measurement system accurately determines the characteristic information of the signal to be measured, such as frequency, phase, intensity, and their variations, by measuring the low frequency mixed signal generated by the multi-repetition-rate pulsed light source and the signal to be measured in the frequency mixer. This system has the advantages of simple structure, high measurement accuracy, low cost and large measurable frequency range. The system can be applied to the measurement of various electromagnetic signals, covering the spectral range from microwave, millimeter wave, to terahertz and even light wave.
    Type: Grant
    Filed: May 11, 2018
    Date of Patent: March 29, 2022
    Assignee: BEIHANG UNIVERSITY
    Inventors: Zheng Zheng, Xin Zhao, Cui Li
  • Patent number: 11287469
    Abstract: Embodiments of the present disclosure relate to a monitoring circuit and a semiconductor device, and particularly, to a monitoring circuit including an oscillation circuit configured to generate an oscillation signal having a rising characteristic or a falling characteristic according to a threshold voltage level and a counter configured to count the number of rises or the number of falls of the oscillation signal, and a semiconductor device including the monitoring circuit.
    Type: Grant
    Filed: January 7, 2020
    Date of Patent: March 29, 2022
    Assignee: SK hynix Inc.
    Inventor: Tae-Pyeong Kim
  • Patent number: 11287484
    Abstract: An electronic circuit triage device diagnoses functionality of various electronic circuits of an electronic device. The electronic circuit triage device detects whether an electronic circuit is functioning properly by measuring a magnetic field pattern associated with the electronic circuit and comparing the magnetic field pattern to an expected magnetic field pattern. A magnetic sensor array includes non-packaged magnetic sensors disposed on a substrate. The non-packaged magnetic sensors can include bare dice, in one embodiment. In another embodiment, the magnetic sensors are formed directly on the substrate, such as by printing conductive traces on the substrate. In another embodiment, a magnetic sensor array includes a magnetic field converter configured to launch received magnetic fields along an axis corresponding to a magnetic sensor maximum sensitivity.
    Type: Grant
    Filed: March 19, 2021
    Date of Patent: March 29, 2022
    Assignee: Innovaura Corporation
    Inventors: C. MacGill Lynde, Derek Platt, Christopher A. Wiklof, Alan Corwin, Ronald Schoenberg
  • Patent number: 11287466
    Abstract: A chip testing circuit and a testing method thereof are provided. The chip testing circuit includes a parameter measurement circuit, a plurality of power supply circuits, a plurality of switch circuits, and a control circuit. The plurality of power supply circuits respectively provide power supply to a plurality of chips carried by a plurality of sockets. Each switch circuit is electrically connected between one socket and one power supply circuit. The control circuit is connected in parallel to a plurality of signal pins of the plurality of chips carried by the plurality of sockets, so that when the control circuit outputs test data, all the chips can simultaneously receive the test data. When executing a parametric test mode, the control circuit controls one of the switch circuits to be turned on and controls the parameter measurement circuit to perform an electrical performance test on the chips.
    Type: Grant
    Filed: September 1, 2020
    Date of Patent: March 29, 2022
    Assignee: ONE TEST SYSTEMS
    Inventors: Chen-Lung Tsai, Gene Rosenthal
  • Patent number: 11280824
    Abstract: A method can be used for phase selection using multi-terminal measurements of a transmission line of a power system. The method includes obtaining, using measurements from a plurality of terminals of the transmission line, delta differential current values ?IdiffA(t), ?IdiffB(t), ?IdiffC(t), at time t, between pre-fault differential current measurements and post-fault differential current measurements from all three phases (A, B, C) of the transmission line. The method also includes determining at least one of the phases to be faulty when the absolute value of the corresponding delta differential current value is larger than k times the minimum of all the absolute values I?IdiffA(t)|, |?IdiffB(t)|, |?IdiffC(t)| of the delta differential current values, where k>1 is a scale factor.
    Type: Grant
    Filed: December 20, 2017
    Date of Patent: March 22, 2022
    Assignee: Hitachi Energy Switzerland AG
    Inventors: YouYi Li, Kai Liu, Jianping Wang
  • Patent number: 11282373
    Abstract: A magnetometer sensor that detects tampering is described. The sensor samples magnetometer data and computes a set of vectors based on the magnetometer data. The sensor detects a tampering of the magnetic sensor based on determining that the set of vectors is outside the reference plane for the magnetometer sensor. The sensor generates a notification to a security system coupled to the magnetometer sensor. The notification indicating the tampering of the magnetometer sensor.
    Type: Grant
    Filed: July 16, 2020
    Date of Patent: March 22, 2022
    Assignee: Nortek Security & Control LLC
    Inventors: Frank Raymond Nichols, Sr., Sivakumar Kathan
  • Patent number: 11280811
    Abstract: Systems, methods, and an apparatus for current monitoring are disclosed. A current monitor comprises a high-voltage side configured to obtain a signal indicative of current through a conductor and apply different levels of gain to different frequency bands of the signal to produce an adjusted signal. A low-voltage side of the current monitor is electrically isolated from the high-voltage side and is configured to split the adjusted signal to produce a plurality of output signals that are each indicative of a level of current at one of the different frequency bands. An isolation amplifier is configured to communicate the adjusted signal from the high-voltage side to the low-voltage side while electrically isolating the high-voltage side from the low-voltage side.
    Type: Grant
    Filed: June 15, 2020
    Date of Patent: March 22, 2022
    Assignee: Advanced Energy Industries, Inc.
    Inventor: Donald Enzinna
  • Patent number: 11280847
    Abstract: A circuit for parameter PSRR measurement includes a filter, a first regulator and a second regulator. The filter may be configured for receiving an AC input signal and a DC input signal, and for outputting a combined output signal according to the AC input signal and the DC input signal. The first regulator may be configured for receiving the combined output signal, and for outputting a first output signal having a first AC component signal and a first DC component signal. The second regulator may be configured for receiving the first output signal, and for outputting a second output signal having a second AC component signal and a second DC component signal. A parameter PSRR of the second regulator may be obtained according to the first AC component signal and the second AC component signal.
    Type: Grant
    Filed: October 30, 2020
    Date of Patent: March 22, 2022
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Amit Kundu, Jaw-Juinn Horng, Yi-Hsiang Wang
  • Patent number: 11282420
    Abstract: An electronic panel includes a base substrate having a first area, a second area adjacent to the first area, and a third area adjacent to the second area, a plurality of pixels in the second area, a plurality of pixel signal lines in the third area and connected to the pixels, a crack detecting pattern spaced apart from the pixels and in the first area, a first line spaced apart from the pixel signal lines, in the third area, and connected to a portion of the crack detecting pattern, and a second line spaced apart from the pixel signal lines, in the third area, connected to another portion of the crack detecting pattern, and spaced apart from the first line. The crack detecting pattern has a line-symmetrical shape with respect to a symmetry axis passing through a center of the first area.
    Type: Grant
    Filed: November 26, 2019
    Date of Patent: March 22, 2022
    Assignee: Samsung Display Co., Ltd.
    Inventors: Jeongyun Han, Jong-Hwa Kim, Kyungsu Lee