Patents Examined by Gregory J. Toatley, Jr.
  • Patent number: 7777896
    Abstract: A signal processing apparatus comprising: an optical sensor for outputting a detection signal by detecting a surface of a recording medium on which a correction image is to be formed; and a control section configured to obtain a detection signal of the surface of the recording medium with the correction image from which a dominant frequency component has been deleted by making reverse frequency analysis of an analysis signal that has been obtained by making a frequency analysis of a detection signal outputted by the optical sensor detecting the surface of the recording medium on which the correction image it formed.
    Type: Grant
    Filed: October 26, 2006
    Date of Patent: August 17, 2010
    Assignee: Konica Minolta Business Technologies, Inc.
    Inventors: Tadayuki Ueda, Hiroyuki Watanabe, Akifumi Isobe, Yoshihito Sasamoto, Takashi Nara
  • Patent number: 7773212
    Abstract: In one embodiment, a surface analyzer system comprises a first radiation source to generate radiation at a first wavelength, a surface inspection assembly, and an edge detection assembly. In operation, the system enables contemporaneous surface inspection and edge detection.
    Type: Grant
    Filed: May 21, 2008
    Date of Patent: August 10, 2010
    Assignee: KLA-Tencor Corporation
    Inventors: Christian Wolters, Anatoly Romanovsky
  • Patent number: 7773220
    Abstract: A process and system for determining alignment data for partially obscured features on wafers or chips when a wafer or chip is substantially coated by an over bump applied material, e.g. a resin or film, and using that data to align the wafers or chips for subsequent operations such as dicing or joining. Position data for alignment is produced by identifying a location of an at least partially obscured feature by varying the depth of focus upon a work piece to determine an SNR approximating a maximum value from an image captured by optical scanning. An SNR above a threshold value can be employed.
    Type: Grant
    Filed: April 2, 2008
    Date of Patent: August 10, 2010
    Assignee: International Business Machines Corporation
    Inventors: Claudius Feger, Nancy C. LaBianca, Steven E. Steen
  • Patent number: 7773209
    Abstract: Improved method and apparatus for machine vision. One embodiment provides automated imaging and analysis, optionally including Scheimpflug's condition on the pattern projector, telecentric imaging and projecting, an IR filter, a mask to constrain observed illumination, and/or a sine-wave projection pattern for more accurate results. Another embodiment provides circuitry for a machine-vision system. Another embodiment provides a machine-vision system, optionally including accommodation of random orientation of parts in trays, irregular location of features being inspected, crossed pattern projectors and detectors for shadow reduction, detection of substrate warpage as well as ball-top coplanarity, two discrete shutters (or flash brightnesses) interleaved (long shutter for dark features, short shutter for bright features).
    Type: Grant
    Filed: March 3, 2009
    Date of Patent: August 10, 2010
    Inventors: Joshua J. Hackney, Arye Malek, Franz W. Ulrich, John B. Estridge
  • Patent number: 7773218
    Abstract: Embodiments of the present invention relate to systems and methods for spectral imaging. Electromagnetic energy emanating from an object is passed through a first dispersive element, a coded aperture, and a second dispersive element to a detector plane. A wavelength-dependent shift is created by the first dispersive element. The coded aperture modulates the image emanating from the first dispersive element. The wavelength-dependent shift is removed from the modulated image by the second dispersive element producing a wavelength-independent image measured by the detector. A spectral image of the object is calculated from the measured image, a wavelength-dependent shift of the first dispersive element, the code of the coded aperture, and a wavelength dependent shift of the second dispersive element. A spectral image can be calculated from measurements obtained in a single time step and from a number of measurements that is less than the number of elements in the spectral image.
    Type: Grant
    Filed: April 16, 2007
    Date of Patent: August 10, 2010
    Assignee: Duke University
    Inventors: David J. Brady, Michael E. Gehm
  • Patent number: 7773208
    Abstract: Embodiments relate to a device for measuring characterisation by reflectometry including a source that emits a light beam, a detector, optics for processing and controlling this light beam so as to focus it on a reflective surface to be measured in the form of a spot and to receive it on the detector, command and acquisition modules, a camera and modules for imaging the spot on the detector and on the camera, wherein the camera is connected to the command and acquisition means so as to automatically focus the spot on the reflective surface to be measured and to automatically conjugate the reflective surface to be measured with the surface of the detector.
    Type: Grant
    Filed: May 29, 2007
    Date of Patent: August 10, 2010
    Assignee: Commissariat a l'Energie Atomique
    Inventors: Herve Piombini, Philippe Voarino
  • Patent number: 7768660
    Abstract: Disclosed is the use of a focused electromagnetic beam which is caused to impinge on the top surface of a tube shaped sample, to investigate a film coating on its inner surface during fabrication thereof and/or thereafter.
    Type: Grant
    Filed: August 30, 2007
    Date of Patent: August 3, 2010
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Gregory K. Pribil, John A. Woollam, Martin M. Liphardt, James D. Welch
  • Patent number: 7768630
    Abstract: A method of evaluating the Polarization Mode Dispersion (PMD) of an optical fiber by arranging the optical fiber at substantially zero tension on a surface, propagating prescribed evaluation optical signals along the optical fiber, measuring fiber Differential Group Delay (DGD) values in response to the evaluation optical signals, repeating at least once the acts of propagating and measuring, each time preliminarily inducing a change in a mode coupling of the fiber, and determining the fiber PMD on the basis of a calculated DGD average value. Changes in the polarization mode coupling of the fiber are induced by, moving at least a section of the fiber substantially orthogonally to the surface.
    Type: Grant
    Filed: September 14, 2004
    Date of Patent: August 3, 2010
    Assignee: Prysmian Cavi E Sistemi Energia S.R.L.
    Inventors: Davide Sarchi, Martino Travagnin, Alexis Debut
  • Patent number: 7768648
    Abstract: Aberrations in an optical system can be detected and measured using a method comprised of a test target in the object plane of a projection system and imaging onto the image plane with the system. The test target comprises at least one open figure which comprises a multiple component array of phase zones, where the multiple zones are arranged within the open figure so that their response to lens aberration is interrelated and the zones respond uniquely to specific aberrations depending on their location within the figure. This is a unique and new method of detecting a variety of aberration types including coma, spherical, astigmatism, and three-point through the imaging onto photosensitive material or image detector placed in the image plane of the system and the evaluation of these images.
    Type: Grant
    Filed: November 14, 2006
    Date of Patent: August 3, 2010
    Inventor: Bruce W. Smith
  • Patent number: 7768647
    Abstract: A multi-color cavity ringdown based spectrometer is housed in a light tight enclosure to detect the presence of trace quantities of gas phase molecules emanating from explosives, drugs, or hazardous materials being transported through the enclosure or compounds contained in a patient's breath. A method is also disclosed for detecting gas phase molecules emanating from explosives, drugs, hazardous materials, or a patient's breath.
    Type: Grant
    Filed: June 1, 2007
    Date of Patent: August 3, 2010
    Assignee: Arkansas State University - Jonesboro
    Inventors: Scott Reeve, Susan Allen
  • Patent number: 7768646
    Abstract: Methods and systems detect the presence of a fluid, such as water, based on a reflection of optical energy from the fluid. Methods and systems also determine the concentration of a constituent element in a mixture based on a reflection of optical energy from the mixture.
    Type: Grant
    Filed: February 1, 2007
    Date of Patent: August 3, 2010
    Assignee: Advanced Precision Inc.
    Inventors: Mark A. Mentzer, Nicholas P. Petrillo, Wayne A. Webb
  • Patent number: 7768657
    Abstract: An optical fly height measurement system includes a planar waveguide, a first diffraction grating for coupling an electromagnetic wave into the planar waveguide wherein the first diffraction grating is positioned for directing the electromagnetic wave towards an air bearing surface of a slider. A second diffraction grating is provided for receiving the electromagnetic wave reflected from the air bearing surface. A detector module and processor are provided to determine the fly height.
    Type: Grant
    Filed: August 7, 2007
    Date of Patent: August 3, 2010
    Assignee: Seagate Technology LLC
    Inventors: Xuhui Jin, Amit Itagi, William Albert Challener
  • Patent number: 7768636
    Abstract: A belt inspecting apparatus applies illuminating light beams (R, G, B) through light guides to a flat inner portion, a flat outer portion, flat side portions, and curved portions of a metal belt. The illuminating light beams, which are reflected by the metal belt, are guided through the light guides to color cameras, which detect the illuminating light beams as image information. A surface state decision unit compares the detected image information with normal image information in order to determine whether the metal belt contains flaws therein or not.
    Type: Grant
    Filed: December 3, 2008
    Date of Patent: August 3, 2010
    Assignee: Honda Motor Co., Ltd.
    Inventors: Ryo Obara, Hiroki Tahira
  • Patent number: 7768633
    Abstract: A system for inspecting components is provided. The system includes a prism having a first end, a second end, a first reflecting surface, and a second reflecting surface. The first end of the prism is located in a plane that is parallel to and axially separated from a plane of one or more of a plurality of inspection pieces. An image data system is disposed beyond the second end of the prism and generates image data of one or more of the inspection piece that includes a top surface of at least one of the inspection pieces and at least one side of at least one of the inspection pieces. An inspection piece transportation system, such as a pick and place tool or conveyor, moves a plurality of inspection pieces past the first end of the prism through an inspection area.
    Type: Grant
    Filed: April 5, 2007
    Date of Patent: August 3, 2010
    Assignee: ASTI Holdings Limited
    Inventors: Ajharali Amanullah, Han Cheng Ge, Huek Choy Tan, Hing Tim Lai
  • Patent number: 7768655
    Abstract: A method of measuring an object includes positioning the object on a moveable stage, performing a rotary scan of the object with a range sensor, and determining geometric parameters of the object based on the rotary scan.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: August 3, 2010
    Assignee: General Electric Company
    Inventors: Steven Robert Hayashi, Zhongguo Li, Kevin George Harding, Jianming Zheng, Howard Paul Weaver, Xiaoming Du, Tian Chen
  • Patent number: 7764362
    Abstract: The inner surface shape of a hole, in particular, the inner surface shape of a hole the entry of which is narrow and which becomes wider further in from the entry, can be measured at a high level of accuracy.
    Type: Grant
    Filed: December 2, 2008
    Date of Patent: July 27, 2010
    Assignee: Olympus Corporation
    Inventor: Susumu Takahashi
  • Patent number: 7764360
    Abstract: A fuel property sensor is provided with three bypass passages and a measure passage. The measure passage is located inside of a closed loop which is comprised of common tangential lines of adjacent bypass passages and a part of profile line of each bypass passage in a cross section perpendicular to the measure passage. Even if the fuel property sensor is rotated around the axis of a fuel pipe in assembling the fuel property sensor to the fuel pipe, at least one of two bypass passages is always located above the measure passage in a vertical direction. Hence, bubbles included in the fuel are restricted from flowing into the measure passage. The fuel property sensor can detect the concentration of ethanol contained in the fuel with high accuracy.
    Type: Grant
    Filed: May 16, 2008
    Date of Patent: July 27, 2010
    Assignees: Denso Corporation, Nippon Soken, Inc., Toyota Jidosha Kabushiki Kaisha
    Inventors: Hitoshi Noguchi, Rie Osaki, Hiroshi Nakamura, Hitoshi Uda, Yukihiro Tsukasaki, Hiroki Ichinose
  • Patent number: 7764386
    Abstract: A method and system are provided which can easily determine relative positions and postures of a three-dimensional measurement device and an object when the measurement device is used to measure the object using a manipulator. The method includes fixing one of the measurement device and the object, supporting the other at a support point with the manipulator so that a position and support posture of the other can be changed, conducting first measurement with the support point being set to first position and posture, changing the support point to second position and posture so that the second position is a position where the posture is changed, about a reference position within a measurable area of the measurement device in the first measurement, to an opposite side by a degree equal to a portion corresponding to a change from the first posture to the second posture, and conducting second measurement.
    Type: Grant
    Filed: September 26, 2006
    Date of Patent: July 27, 2010
    Assignee: Konica Minolta Sensing, Inc.
    Inventors: Shinichi Horita, Yoshihisa Abe
  • Patent number: 7764371
    Abstract: The disclosure relates generally to methods and apparatus for obtaining a super resolution image of a sample using a fiber array spectral translator system. In one embodiment includes collecting photons from a sample at a first end of a fiber array spectral translator; delivering the photons from a second end of the fiber array spectral translator into a multiple detector rows of a photon detector; interpolating between the multiple detector rows to thereby form interpolated rows; and arranging an output of the multiple detector rows and the interpolated rows so as to obtain a super resolution image of the sample.
    Type: Grant
    Filed: February 15, 2007
    Date of Patent: July 27, 2010
    Assignee: ChemImage Corporation
    Inventors: Matthew P. Nelson, Jason H. Neiss, Patrick J. Treado
  • Patent number: 7764366
    Abstract: A robotic die sorter having pick and place arm assemblies and a multi-camera optical inspection system is disclosed. A pick arm of the pick arm assembly picks a die from a semiconductor wafer, and a place arm of the place arm assembly receives the die from the pick arm and places same in a reel of pocketed tape. After picking, the pick arm and the place arm are rotated into facing arrangement, whereupon the die is transferred to the place head of the place arm and a camera of the optical inspection system to detect defects in the die. After inspection, the place arm rotates toward the pocketed tape and places the die into the pocketed tape. Additional cameras of the optical inspection system allow for calibration of the pick and place arms, as well as monitoring of the die transfer process.
    Type: Grant
    Filed: July 11, 2006
    Date of Patent: July 27, 2010
    Assignee: BESI North America, Inc.
    Inventors: John D. Moore, Lawrence F. Roberts, Miroslaw Sokol