Abstract: Gain independent reference channel measurement system and method. A method of making robust, stable measurements, in a variety of different applications is disclosed. More specifically, this disclosure describes systems and methods relating to performing gain independent reference channel measurements by making two phase measurements of a device under test. Mathematically, the measurements are combined and many common mode parameters drop out. The result yields an analysis of a device under test analysis which mitigated errors, predominately arising from environmental variations and changes in circuit behavior stemming from swings in signal input.

Abstract: According to the present invention, an optical differential interrogation method for surface plasmon resonance imaging including: letting first incident light of a first wavelength and second incident light of a second wavelength to be incident on a sample while varying an incident angle; detecting intensity of first reflection light of the first incident light and intensity of second reflection light of the second incident light; and identifying the sample by using a difference between the intensity of the first reflection light and the intensity of the second reflection light, can be provided, and thus it is possible to obtain much better angular resolution while using a detector or a camera, which has a relative low receiving sensitivity and a sensor chip where samples having various characteristics are two-dimensionally arrayed and integrated can be effectively measured.

Abstract: The present invention teaches a punch and die measurement device which includes a linear array LED micrometer arranged so that the light beams and shadows pass vertically from transmitters to receivers, and further teaches a 1:1 ratio pantograph for transferring measurements from inside of a necker die to outside the die where it may then be measured by the linear array LED micrometers. The invention may include a precision alignment block, captive adjustment screws to adjust tilt plates angle of the linear array measurement carriage and lever arms to reduce motion of the adjustment screws as applied to the tilt plates.

Abstract: A flow cytometer, laser optics assembly thereof, and methods of assembling the same are provided. The flow cytometer is capable of yielding consistent and accurate results despite exposure to adverse environmental conditions such as, for example, temperature changes within a relatively wide temperature range and/or a relatively large amount of random-axis mechanical vibration. The flow cytometer of the present disclosure is additionally or alternatively relatively insensitive to real or apparent core stream shifts, employs a slowly converging beam along the axis perpendicular to core stream flow, and provides the ability to precisely measure time-of-flight.

Abstract: Flow cytometers having an enclosed particle sorting module are provided. Aspects of the flow cytometers include, in addition to the enclosed particle sorting modules, a sample input module fluidically coupled to an inlet of the enclosed particle sorting module, a waste reservoir fluidically coupled to first outlet of the enclosed particle sorting module and a first sorted particle collection system fluidically coupled to a second outlet of the enclosed particle sorting module. Flow cytometers as described herein are configured to control aerosol content in the enclosed particle sorting modules, including the sort chambers of such modules. Also provided are methods of using the flow cytometers, as well as kits that include one or more components of the flow cytometers are consumables for use therewith.

Abstract: According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.

Abstract: An airborne microorganism measurement device includes a housing including a first body and a second body, an air passage formed between the first body and the second body such that air containing airborne microorganisms pass therethrough, a charging part and a collecting part disposed in the air passage to charge and collect the airborne microorganisms, a high voltage generating device provided in the first body to supply a high voltage to the charging part and the collecting part, and a light emitting unit and a light receiving part provided in the second body to detect a fluorescent signal generated by irradiating the airborne microorganisms collected in the collecting unit with light.

Abstract: Embodiments relate generally to systems and methods for detecting particulate matter in the air. A particulate matter sensor may comprise an airflow channel; a light source configured to pass light through the airflow channel; an airflow generator configured to generate airflow into the airflow channel; a waveguide configured to direct light from the light source after it passes through the airflow channel and scatters off of particulate matter within the airflow channel; a photodiode configured to receive light scattered by the waveguide; and a computing device coupled to the photodiode having a processor and a memory storing instructions which, when executed by the processor, determines a mass concentration of particles in the airflow channel based on an output of the photodiode.

Abstract: A method of performing metrology analysis of a thin film includes coupling a radiation into an optical element disposed adjacent to a surface of the thin film. The radiation is coupled such that the radiation is totally internally reflected at an interface between the optical element and the thin film. An evanescent radiation generated at the interface penetrates the thin film. The method furthers include analyzing the evanescent radiation scattered by the thin film to obtain properties of the thin film.

Abstract: An apparatus for additively manufacturing three-dimensional objects includes a scanning unit configured to scan an energy beam over a build plane, and a focusing unit that includes an optical lens or lens system. The focusing unit may be configured to control a focal position of the energy beam based on calibration information. The focal position may be controlled by moving the focusing unit in the z-direction relative to the build plane without changing the focal length of the energy beam. Methods of calibrating such an apparatus may include moving a focusing unit in the z-direction relative to a build plane based on calibration information and scanning an energy beam over at least a portion of the build plane using a scanning unit, with the focusing unit being configured to control a focal position of the energy beam without changing the focal length of the energy beam.

Abstract: A method of determining dimensional information of a target surface includes generating a first point cloud corresponding to a first plurality of reconstructed surface points of the target surface generated by a first imaging system-illumination source pair of a phase profilometry system; generating a second point cloud corresponding to a second plurality of reconstructed surface points of the target surface generated by a second imaging system-illumination source pair of the phase profilometry system; generating an initial estimate of the target surface based on the first and second point clouds; and refining the initial surface estimate using positions of the first and second point clouds and geometry of the first and second imaging system-illumination source pairs to generate a final point cloud.

Abstract: A particle sensing device according to one embodiment comprises: a light-emitting unit for emitting light; a first flow path unit arranged under the light-emitting unit so as to be vertical to an optical shaft of the light-emitting unit, and through which air including particles flows; a light-receiving unit arranged at the optical shaft under the first flow path unit, and on which light that has passed through the first flow path is incident; and a light-absorbing unit arranged at the optical shaft under the light-receiving unit and absorbing light that has passed through the light-receiving unit.

Abstract: This disclosure relates generally to a sampling device, and more particularly, a sampling device that facilitates spectroscopic measurements with a variable path length and the necessary software controlled algorithms and methods for such a device.

Abstract: Apparatus include an illumination source configured to produce and direct a multi-wavelength illumination beam to a microfluidic target that can include nanotags, a detector configured to receive a multi-wavelength detection beam from the microfluidic target and to produce a detection signal, wherein the multi-wavelength detection beam comprises light that is elastically side-scattered by an interaction between the multi-wavelength illumination beam and the nanotags in the microfluidic target, and a processor configured to receive the detection signal and to determine the presence of the nanotags in the microfluidic target by comparing multiple wavelength side-scatter intensity characteristics of the detection signal with predetermined multi-wavelength elastic side-scatter intensity profiles of one or more nanotag types.

Abstract: Some demonstrative embodiments include apparatuses, systems and/or methods of determining one or more optical parameters of a lens of eyeglasses. For example, a product may include one or more tangible computer-readable non-transitory storage media including computer-executable instructions operable to, when executed by at least one computer processor, enable the at least one computer processor to process at least one captured image of at least one reflection of a flash on a lens of eyeglasses; and determine one or more optical parameters of the lens based at least on the at least one captured image.

Abstract: A particle diameter acquisition device includes an intensity distribution acquisition unit configured to acquire an intensity distribution of scattered light scattered from a multi-phase flow including dispersed phase at the time of irradiating the multi-phase flow with irradiation light, an attenuation gradient acquisition unit configured to acquire an attenuation gradient in the intensity distribution on the basis of the intensity distribution of the scattered light, a concentration acquisition unit configured to acquire a concentration of the dispersed phase in the multi-phase flow, a database configured to store intensity distribution data which is an intensity distribution of scattered light for each particle diameter and concentration of a dispersed phase, and a particle diameter acquisition unit configured to acquire a particle diameter of the dispersed phase on the basis of the acquired attenuation gradient, concentration, and intensity distribution data with reference to the intensity distribution da

Abstract: A measurement system is provided for predicting a future status of a refractory lining that is lined over an inner surface of an outer wall of a metallurgical vessel and exposed to a heat during which the refractory lining is exposed to molten metal. The system includes one or more laser scanners and a processor. The laser scanners are configured to conduct a plurality of laser scans of the refractory lining when the metallurgical vessel is empty. At least one of the laser scanners is configured to laser scan the refractory lining prior to the heat to collect data related to pre-heat structural conditions of the refractory lining. At least one of the laser scanners is configured to laser scan the refractory lining after the heat to collect data related to post-heat structural conditions of the refractory lining. The processor is configured to predict the future status of the lining.

Abstract: Performing critical-dimension localization microscopy includes: subjecting a first dimensional member and a second dimensional member of a reference artifact to critical-dimension metrology, the first and second dimensional members, in combination, including a critical dimension and each independently providing optical contrast; determining a primary length of the critical dimension to be traceable to International System of Units meter; imaging in a calibrant optical field, by optical microscopy, the first dimensional member and the second dimensional member, the calibrant optical field disposed in an ocular optical field; determining, from the optical microscopy of the first dimensional member and the second dimensional member, a secondary length and a secondary length uncertainty of the critical dimension subjected to the critical-dimension metrology; and calibrating the calibrant optical field and the secondary length, to the primary length to establish traceability of the secondary length to the Internat

Abstract: A three dimensional scan system includes a projection device, an image capturing module and an image formation device. The projection device includes a lighting module for providing a light beam, and a pattern generator for receiving the light beam and project a predetermined pattern. The image capturing module is used to capture images. The image formation device is used to form a projected pattern by projecting the predetermined pattern onto an object, and to project an image of the object and the projected pattern to the image capturing module. An optimal image formation focal plane of the image formation device for forming the predetermined pattern is different from an optimal image capturing focal plane of the image formation device for projecting the projected pattern.

Abstract: To provide a three-dimensional coordinate measuring device capable of performing highly reliable shape measurement at high accuracy without complicated calibration work. A motorized rotation stage is rotatably supported with respect to a reference base. A reference camera is fixed to the reference base, the reference camera captures an image of a plurality of reference markers provided on the motorized rotation stage. At the time of calibration, a plurality of markers of the reference member are captured at respective different postures of the motorized rotation stage. New camera parameters are calculated based on a plurality of reference images and reference marker information indicating the arrangement of the plurality of markers and then the camera parameters in the main body memory are updated to the new camera parameters.