Abstract: An optical turbulence measurement system may include a camera assembly, a first optics assembly, a second optics assembly, and processing circuitry. The first optics assembly and the second optics assembly may be configured to magnify and direct a portion of a source beam received by a respective aperture to the camera assembly to be received as a two portions of a received beam. The processing circuitry may be configured to receive, from the camera assembly, a data representation of a first received beam from the first optics assembly and a second received beam from the second optics assembly, determine a focal spot displacement variance based on motion of a first focal spot corresponding to the first received beam relative to a second focal spot corresponding to the second received beam, and measure optical turbulence along a path of the source beam based on the focal spot displacement variance.

Abstract: A micro camera is placed in an appropriate image capturing position therefor on the basis of a center-to-center distance depending on a rotational angle of a holding table. Even in the case where the center C0 of a holding surface and the center C1 of a wafer are displaced out of alignment with each other, allowing a position in X-axis directions of an outer circumference of the wafer to vary as the holding table rotates, a control unit can make an image capturing range of the micro camera follow the varying position of the outer circumference of the wafer. Therefore, the image capturing range of the micro camera can be determined with ease. Both a surface of the wafer and the outer circumference of the wafer can be inspected simply when two cameras are moved along the X-axis directions by a single X-axis moving mechanism.

Abstract: The application discloses a light scattering parameter measurement system and its measurement method. Dual-frequency scattering interference technology is adopted to obtain distributed measurement of Rayleigh scattering parameters in an optical fiber. The Rayleigh scattering coefficient r and phase retardance ? are modulated on different components of the interference signal respectively by using the dual-frequency interference technology. The Rayleigh scattering coefficient r and phase retardance ? can be decoupled by simple filtering, to obtain separate measurements. A linear stretch is applied to the optical fiber under test, to add uniform phase change signals at all positions of the optical fiber under test. As a result, the term containing only Rayleigh scattering coefficient r can be extracted by low-pass filtering. The direct measurement of Rayleigh scattering parameters is of great significance to fundamental and application researches related to Rayleigh scattering of optical fiber.

Abstract: The invention generally provides systems and methods for particle detection for minimizing microbial growth and cross-contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. In some embodiments, systems of the invention incorporate a housing having an outer surface being a first antimicrobial surface and a touchscreen being a second antimicrobial surface. In some embodiments, substantially all of the outer surfaces of the system are antimicrobial surfaces. In some embodiments, the first antimicrobial surface may comprise an Active Screen Plasma alloyed layer. In some embodiments, the housing may comprise a molded polymer substrate and a metal coating layer bonded to the molded polymer substrate such that at least some exterior surfaces of the housing are metal coated surfaces.

Abstract: A nanostructure array including a base body and a nanostructure formed on the base body, in which a plurality of the nanostructures are arranged on the nanostructure array, the nanostructure is made of a metal having a surface plasmon and a property of absorbing and releasing hydrogen, the base body is made of a hydrogen-responsive material that reacts with hydrogen to reversibly change from a conductor to a dielectric substance, and a surface plasmon resonance occurs by light incident on the nanostructure.

Abstract: A diffraction measurement target that has at least a first sub-target and at least a second sub-target, and wherein (1) the first and second sub-targets each include a pair of periodic structures and the first sub-target has a different design than the second sub-target, the different design including the first sub-target periodic structures having a different pitch, feature width, space width, and/or segmentation than the second sub-target periodic structure or (2) the first and second sub-targets respectively include a first and second periodic structure in a first layer, and a third periodic structure is located at least partly underneath the first periodic structure in a second layer under the first layer and there being no periodic structure underneath the second periodic structure in the second layer, and a fourth periodic structure is located at least partly underneath the second periodic structure in a third layer under the second layer.

Abstract: A transmissometer and method for determining a transmissivity of an atmosphere within a chamber. A chamber contains the atmosphere. A light source generates a test beam and a light detector detects the test beam. A periscope is movable between a first position which allows the test beam to pass through the atmosphere in the chamber and into the light detector and a second position in which the test beam is deflected to pass into the light detector without passing through the atmosphere in the chamber. A processor determines the transmissivity of the atmosphere from a transmissivity measurement for the test beam obtained by the light detector when the periscope is in the first position and a transfer standard obtained at the light detector when the periscope is in the second position.

Abstract: An inspection apparatus for inspecting a workpiece having an outer peripheral portion rotationally symmetric about a symmetry axis with projections and recesses provided periodically and repeatedly, the apparatus comprises: an edge imaging mechanism that captures an image of an edge portion of a projection of a rotated workpiece; an upstream imaging mechanism that captures an image of an upstream wall surface of the rotated workpiece; and a downstream imaging mechanism that captures an image of a downstream wall surface of the rotated workpiece. The inspection apparatus inspects the workpiece on the basis of the images captured by the edge imaging mechanism, the upstream imaging mechanism, and the downstream imaging mechanism.

Abstract: An electronics housing assembly is disclosed. In some embodiments, the electronics housing is attached to a vehicle to house a sensor of the vehicle (e.g., a LIDAR). The electronics housing includes a fixed body structure, a movable body structure, a motor operatively coupled to the movable body structure, a positioner sensor coupled to the fixed body structure, and a sensor bracket attached to the movable body structure and configured to attach to a sensor. In some embodiments, the positioner sensor is used to detect the position of the movable body structure and the sensor.

Abstract: An optical detector device includes a housing with a projecting neck that is closed off towards the outside by a light-transmissive pane, under which at least one optical waveguide that tapers in the direction of an optical sensor is disposed. An optical waveguide arrangement has a plurality of optical waveguides which are retained in the neck by a holding mechanism.

Abstract: A mount assembly includes a stage including a base and one or more sidewalls extending upward from the base to define an elongated channel, and a holder including an elongated body having a first end portion and a second end portion opposite the first end portion, a bracket extending upward from the elongated body at the first end portion, and a foot extending upward from the elongated body at the second end portion. The elongated body is positionable within the elongated channel. An inspection device is extendable between the bracket and the foot.

Abstract: A diagnostic kit includes: a diagnostic chip formed with a flow channel through which a diagnostic sample moves; a diagnostic sample movement regulation unit opening/closing one end of the flow channel to regulate movement of the diagnostic sample; an optical information detection unit detecting optical information on the diagnostic sample; and a controller controlling operation of the diagnostic sample movement regulation unit and the optical information detection unit, wherein the optical information detection unit includes: a light source illuminating the diagnostic sample; and a sensor sensing the optical information from the diagnostic sample, the diagnostic sample movement regulation unit is operatively associated with the optical information detection unit, and the diagnostic chip and the optical information detection unit are moved relative to each other upon operation of the diagnostic sample movement regulation unit.

Abstract: Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer. The method includes the steps of providing an optical particle analyzer and modulating a power applied to a source of EMR. The method includes the steps of, in response to the modulating step, inducing a detector signal waveform and analyzing the detector signal waveform to determine a value of at least one diagnostic parameter associated with one or more of the source of EMR, an optical assembly, a chamber, a detector, and an optical collection system of the optical particle analyzer. The method includes the step of determining a calibration status of the optical particle analyzer based on the one or more determined values of the at least one diagnostic parameter.

Abstract: The present invention relates to an optical energy meter. Illustrative embodiments of the present disclosure include a system controller, temperature sensing system, vibration sensing system, torque sensing system, graphical display system, climate control system, and vibration control system. The invention measures the radiation pressure of incident high power electromagnetic radiation. The measurement of radiation pressure can be used to determine the power of the radiation; that is, the purposes of the invention are to measure, with high precision and accuracy, and survive the power of an incident high power electromagnetic beam while minimizing size, weight, and power requirements.

Abstract: A spectroscopic detection system includes a sensor configured to reflect light of a first wavelength associated with a presence of a reference substance on the sensor and configured to reflect light of a second wavelength associated with a presence of a monitored substance on the sensor, wherein the monitored substance flows to the sensor from a circulating fluid. The spectroscopic detection system further includes a detector that has first and second channels for respectively receiving the light of the first and second wavelengths reflected from the sensor and one or more processors in electrical communication with the detector and configured to identify an excess condition of the monitored substance with respect to the circulating fluid based on a ratio of a second amount of the light of the second wavelength received at the detector to a first amount of the light of the first wavelength received at the detector.

Abstract: The present invention is to provide a diffracted light removal slit and an optical sample detection system including the same, in which diffracted light of excitation light can be reliably removed without affecting reflected light of the excitation light in a sample detection device utilizing the reflected light of the excitation light. A diffracted light removal slit is provided between a light source unit and an excitation light reflector in an optical sample detection system that emits excitation light from the light source unit and also performs predetermined measurement using reflected light of the excitation light reflected at the excitation light reflector. The diffracted light removal slit includes: a main portion provided in a direction substantially perpendicular to an optical path of the excitation light; and a sidewall portion extending from an end portion of the main portion and inclined toward an upstream side in an optical path direction of the excitation light.

Abstract: The apparatus comprises a target structure (101) having a reflective surface (102) and a crossbar structure oriented parallel to an axel of the vehicle; a first reference structure (107) having a pass-through channel (108) and an aiming surface (109); a second reference structure (111) having a laser emitter (102). In the method the first reference structure is aligned with a midpoint of a side of the vehicle nearest to the target structure and the second reference structure with the laser emitter is aligned with a midpoint of a side of the vehicle furthest from the target structure with the laser emitter oriented toward the target structure. The emitted laser beam passes through the channel of the first reference structure and is reflected by the reflective surface. The relative angle and alignment of the target structure at the reflection position is adjusted such that the reflected beam is reflected onto a designated region of the aiming surface on the first structure.

Abstract: System and method for profile measurement are provided. The profile measurement system includes a light projector, an imaging device, a control system, and a processing unit. The light projector includes a light source, a mask, and an optical system. An aperture of the mask allows a portion of light to pass through and generates a pattern. The optical system includes a variable focal length lens element configured to project the pattern at different projection distances. The imaging device is configured to capture images of the pattern projected at the different projection distances. The control system is configured to control a projection distance of the light projector and a focus distance of the imaging device. The processing unit is configured to obtain in-focus pixels in the captured images, generate mask images, reconstruct a large depth of field pattern image based on the captured images and reconstruct the object profile.

Abstract: A workpiece inspection and defect detection system includes a light source, a lens that inputs image light arising from a surface of a workpiece, and a camera that receives imaging light transmitted along an imaging optical path. The system utilizes images of workpieces acquired with the camera as training images to train a defect detection portion to detect defect images that include workpieces with defects, and determines a performance of the defect detection portion as trained with the training images. Based on the performance of the defect detection portion, an indication is provided as to whether additional defect images should be provided for training. After training is complete, the camera is utilized to acquire new images of workpieces which are analyzed to determine defect images that include workpieces with defects, and for which additional operations may be performed (e.g., metrology operations for measuring dimensions of the defects, etc.

Abstract: The present application discloses a sensor system that includes a sensor having a sensor surface, a sample cartridge including one or more flexible membranes and a membrane frame, the membrane frame including one or more openings covered by the one or more flexible membranes defining one or more wells for holding one or more samples, the flexible membrane having a sample side supporting the sample and an opposite sensor side, the sample cartridge being removably insertable in the sensor system such that the sensor side of the flexible membrane is positioned above and faces the sensor surface, a displacement mechanism that can be actuated to displace the flexible membrane toward the sensor surface such that the sample is moved to a position closer to the sensor surface, and an optical imaging system that detects light emitted from the sensor. Disclosed also are a cartridge cassette and a method of use.