Abstract: Exemplary embodiments of systems and methods can be provided which can generate data associated with at least one portion of a sample. For example, at least one first radiation can be forwarded to the portion through at least one optical arrangement. At least one second radiation can be received from the portion which is based on the first radiation. Based on an interaction between the optical arrangement and the first radiation and/or the second radiation, the optical arrangement can have a first transfer function. Further, it is possible to forward at least one third radiation to the portion through such optical arrangement (or through another optical arrangement), and receive at least one fourth radiation from the portion which is based on the third radiation. Based on an interaction between the optical arrangement (or the other optical arrangement) and the third radiation and/or the fourth radiation, the optical arrangement (or the other optical arrangement) can have a second transfer function.

Abstract: A multipass cell assembly for monitoring of fluid is described, as well as fluid processing systems utilizing same, and associated methods of use of such multipass cell assembly for fluid monitoring. The multipass cell assembly is usefully employed in fluid processing operations such as monitoring of vapor deposition process reactants, e.g., reactants used for vapor deposition metallization of tungsten from a tungsten carbonyl precursor.

Abstract: In a spherical shape measurement method for measuring a surface shape, a sphere to be measured is made freely rotatable. The partial spherical shape of each measurement area, which is established so as to have an area overlapping with another measurement area adjacent to each other, is measured at each rotation position, and the surface shape is measured by joining the partial spherical shapes of the measurement areas by a stitching operation based on the shape of the overlapping area. In the state of detaching the sphere from the sphere hold mechanism to which the sphere is freely attachable and detachable, the sphere support table holds the sphere. The sphere is re-held at a different position, so that the shape of the entire sphere can be measured with high accuracy.

Abstract: A physical parameter estimating method, a physical parameter estimating device, and electronic apparatus are disclosed. The method includes: reading a Newton's rings fringe pattern of a unit to be measured; calculating a magnitude spectrum of an intensity distribution signal of at least one first-direction pixel set in the Newton's rings fringe pattern under each fractional Fourier transform (FRFT) order in a searching range of FRFT orders; determining a matched order of the intensity distribution signal according to the calculated magnitude spectrums; and estimating a physical parameter involved in the interferometric measurement according to at least the matched order. Therefore, physical parameters of the unit to be measured can be estimated with high accuracy even in presence of noise and obstacles in the fringe pattern.

Abstract: Provided is an optical measurement device configured so that a high-accuracy three-dimensional image can be obtained. An emission angle of a ray of light is changed in such a manner that the rotation frequencies of two motors configured to rotatably drive a first optical path changing unit and a second optical path changing unit is controlled. The ray of light is emitted to a front three-dimensional region, and reflected light is obtained. Then, calculation is made by a computer, and in this manner, three-dimensional data on a measurement target object is obtained. The amount (vibration amount) of axial backlash or play of a rotary mechanism, such as a motor shaft, along which the ray of light is emitted is measured in real time, and such a backlash or play amount is subtracted from a three-dimensional image obtained by the computer. Consequently, a high-accuracy three-dimensional image is obtained.

Abstract: The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.

Abstract: A system that may include a radiation source to generate a beam of coherent radiation; traveling lens optics to focus the beam so as to generate multiple spots on a surface of a sample and to scan the spots together over the surface; collection optics to collect the radiation scattered from the multiple spots and to focus the collected radiation so as to generate a pattern of interference fringes; and a detection unit to detect changes in the pattern of interference fringes.

Abstract: A voltage is applied to a liquid-crystal variable retarder that monotonically changes a retardance and changes a first derivative with respect to time of the retardance of the liquid-crystal variable retarder over a time period. An interferogram of light passing through the liquid-crystal variable retarder is measured during the time period.

Abstract: When the optical system is illuminated with an illumination light flux emitted from one extant input image point, an interference image generated by superimposing an extant output light flux output from the optical system and a reference light flux coherent with the extant output light flux is imaged to acquire interference image data, and thus to acquire measured phase distribution, and this acquisition operation is applied to each extant input image point. Thus, each measured phase distribution is expanded by expanding functions ?n(u, v) having coordinates (u, v) on a phase defining plane as a variable to be represented as a sum with coefficients ?n{Ajn·?n(u, v)}. When the optical system is illuminated with a virtual illumination light flux, a phase ?(u, v) of a virtual output light flux is determined by performing interpolation calculation based on coordinates of a virtual light emitting point.

Abstract: Ultra-cold atom sensor for measuring a rotational velocity along a measurement axis comprises: means designed to generate a first and a second ultra-cold atom trap, one trap making it possible to immobilize a cloud of ultra-cold atoms in an internal state different from the other trap, at a predetermined distance from the measurement plane, the means comprising, at least one first and one second waveguide that are designed to propagate microwaves with angular frequencies ?a and ?b, the waveguides being non-secant and positioned symmetrically about an axis called the axis of symmetry, conductive wires integrated into the chip and designed to be flowed through by DC currents, the means being configured to modify the energy of the ultra-cold atoms in such a way as to create a potential minimum for the ultra-cold atoms in the internal state |a> and a potential minimum for the ultra-cold atoms in the internal state |b>, thus forming the first and second ultra-cold atom traps, and to move the traps along a cl

Abstract: When an optical system is illuminated with illumination light fluxes emitted from respective input image points, an interference image generated by superimposing output light fluxes output from the optical system and a reference light flux coherent with the output light fluxes is imaged to acquire interference image data collectively including information of an interference image about all input image points. Diffractive optical light propagation simulation is performed to acquire a phase distribution associated with only light emitted from a single input image point at a position where reconstructed light fluxes to the respective output light fluxes are separated into each light flux. In each input image point, this simulation is performed to acquire a phase distribution on an exit pupil plane.

Abstract: A miniaturized spectrometer capable of being held and carried in a person's hand and including all of the necessary elements for reliable quantification and characterization for laboratory purposes, of a variety of objects, including an analyte in solution, and that is also optionally adaptable for analysis of an analyte in gaseous phase, and/or on or imbedded in a solid surface.

Abstract: An optical measuring device for measuring a measurement region, the optical device comprising a photonic chip with an interferometer defined on said chip, said interferometer comprising first and second waveguides on said photonic chip and an interference region, wherein the first and second waveguides carry signals from the interference region to the sample region and back to the interference region, the device further comprising a phase adjusting unit configured to vary a phase difference between the signals in the first and second waveguides reflected by the measurement region.

Abstract: An optical spectral analyzer for measuring an optical multi-channel signal by separating the multi-channel signal and measuring a plurality of single-channel signals simultaneously. The spectral analyzer can include a demultiplexer configured to receive the multi-channel signal. The multi-channel signal can be a multi-channel wavelength range. The demultiplexer can separate the multi-channel signal into the plurality of single-channel signals including a first single-channel signal and a second single-channel signal. The spectral analyzer can include a plurality of optical paths. The plurality of optical paths can include a plurality of respective detectors for measuring an optical power of the respective single-channel signals. The detectors can convert the optical power of the respective single-channel signals to corresponding electrical signals.

Abstract: The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.

Abstract: A film thickness measurement device includes a light source, an imaging component, and a controller. The controller estimates unknown variables I1(j), I20(j), k(j), and t(i) based on the Formula (1), where i represents an observation point number of an interference image captured by the imaging component, j represents a number for a type of wavelength of monochromatic light, ?(j) represents wavelength of the monochromatic light, n represents a refractive index of a semi-transparent film, g(i,j) represents a brightness value observed at an observation point, I1(j) represents an intensity of reflected light from a front face of the semi-transparent film, I20(j) represents an intensity of reflected light from a rear face of the semi-transparent film when there is no absorption of light in the semi-transparent film, k(j) represents an absorption coefficient of the semi-transparent film, and t(i) represents a film thickness of the semi-transparent film.

Abstract: The invention relates to a device (1) and a method (20) for determining a spectrum (X) of scattered radiation (S). The invention further relates to a method (70) for calculating the spectrum (X) and a method for compressing unstructured data (60) of known distribution. To be able to determine the spectrum (X) as precisely as possible and to derive from this the characteristics of materials that scatter laser pulses (P), the invention proposes that at least one characteristic of the laser pulse (P) is determined and that a spectrum analyzer (5) is used for this. Frequencies (F) of laser pulses (P) and volumes (M) of backscattered radiation (S) are combined into frequency and volume values (F?, M?) to calculate the spectrum (X). The most frequent data values are deleted from the data to compress the data (60).

Abstract: An electronic wafer inspecting method includes: rotating the wavelength transparent wafer, emitting, from a light source coupled with an interferometric device, two light beams, to form, a measurement volume and having a variable inter-fringe distance within the volume, a time signature of a defect intersecting the measurement volume depending on an inter-fringe distance where the defect intersects the volume, the device and the wafer arranged so that the measurement volume extends into a wafer region, collecting the light scattered by the wafer region, emitting a signal representing the variation in the intensity of the collected light per time, detecting in the signal, a frequency of the intensity, the frequency being the time of the passage of a defect through the measurement volume, determining, based on the value of the inter-fringe distance at the location where the defect passes, the position of the defect.

Abstract: The invention relates to a method for observing a sample, in particular an anatomopathological slide formed from a thin thickness of a sampled biological tissue. It includes a step of illuminating the sample with a light source and acquiring, with an image sensor, an image representing the light transmitted by the sample. The image undergoes holographic reconstruction, so as to obtain a representation, in the plane of the sample, of the light wave transmitted by the latter. The method includes applying an impregnating fluid to the sample, such that the sample is impregnated with said impregnating liquid, said impregnating liquid having a refractive index strictly higher than 1.

Abstract: A serial weak FBG interrogator is disclosed. The serial weak FBG interrogator may include a CW tunable laser or pulsed laser utilized as a laser source and an EDFA. The serial weak FBG interrogator may also be an interrogation of a single sensor system by utilization of a DFB laser which utilizes a single sensor, which may be an interferometer sensor, an extrinsic Fabry-Perot interferometer or a wavelength-modulated sensor. The serial weak FBG interrogator may also include a computer system or CSPU.