Abstract: Some embodiments include an integrated assembly having a base supporting first circuitry and first conductive lines. The first conductive lines extend along a first direction and are associated with the first circuitry. A deck is over the base and supports an array of memory cells and second conductive lines which are associated with the array of memory cells. The second conductive lines extend along a second direction which is substantially orthogonal to the first direction. Vertical interconnects extend from the deck to the base and couple the first conductive lines to the second conductive lines. Each of the vertical interconnects couples one of the first conductive lines to one of the second conductive lines. Each of the second conductive lines is coupled with only one of the first conductive lines.

Abstract: Methods, apparatuses and systems related to maintaining stored data are described. The apparatus may be configured to refresh the stored data according to schedule that includes different delays between successive refresh operations.

Abstract: Concurrent access of multiple memory cells in a cross-point memory array is disclosed. In one aspect, a forced current approach is used in which, while a select voltage is applied to a selected bit line, an access current is driven separately through each selected word line to concurrently drive the access current separately through each selected memory cell. Hence, multiple memory cells are concurrently accessed. In some aspects, the memory cells are accessed using a self-referenced read (SRR), which improves read margin. Concurrently accessing more than one memory cell in a cross-point memory array improves bandwidth. Moreover, such concurrent accessing allows the memory system to be constructed with fewer, but larger cross-point arrays, which increases array efficiency. Moreover, concurrent access as disclosed herein is compatible with memory cells such as MRAM which require bipolar operation.

Abstract: Methods and apparatuses for a system error-correction code function are presented. The apparatus includes a memory configured to communicate with a host via at least one data connection and at least one non-data connection. The memory includes a memory array. The memory array includes a first portion and a second portion. The memory is further configured to, in a first mode, store and output data in the first portion and the second portion of the memory array. The first portion is addressable by a first address, and the second portion is addressable by a second address. The memory is further configured to, in a second mode, receive ECC of the data from the host via the at least one non-data connection, store the data in the first portion of the memory array, and store the ECC of the data in the second portion of the memory array based on the first address.

Abstract: A memory device includes a first word line and a second word line. A first portion of the first word line is formed in a first metal layer, a second portion of the first word line is formed in a second metal layer above the first metal layer, and a third portion of the first word line is formed in a third metal layer below the second metal layer. A first portion of the second word line is formed in the first metal layer. A second portion of the second word line is formed in the second metal layer. The first portion, the second portion, and the third portion of the first word line have sizes that are different from each other, and the first portion and the second portion of the second word line have sizes that are different from each other.

Abstract: According to one embodiment, a controller configured to manage second test information including status information indicating that a test related to a write operation and a read operation on a second storage area has not been executed. In response to receiving a command for acquiring information related to the second storage area from a host, the controller transmits the second test information to the host. When execution of the test on the second storage area is requested by the host, the controller executes the test related to the write operation and the read operation on the second storage area, and updates the status information of the second test information.

Abstract: Counters may be provided for individual word lines of a memory for tracking word line accesses. In some examples, multiple counters may be provided for individual word lines. In some examples, the counters may be included on the word lines. The counters may be incremented responsive to word line accesses in some examples. In some examples, the counters may be incremented responsive for a time period for which a word line is held open. In some examples, the counters may be incremented responsive to both word line accesses and time periods for which the word line is held open. In some examples, count values for the counters may be written back to the counters after incrementing. In some examples, the count values may be written back prior to receiving a precharge command.

Abstract: Embodiments of the disclosure provide a circuit structure and related method to compensate for sense amplifier leakage. A circuit structure according to the disclosure includes a reference voltage generator coupling a supply voltage and a reference line to a sense amplifier. A multiplexer within the reference voltage generator is coupled to the reference line. The multiplexer includes a plurality of transistors each having a gate terminal coupled to ground.

Abstract: Concurrent access of multiple memory cells in a cross-point memory array is disclosed. In one aspect, a forced current approach is used in which, while a select voltage is applied to a selected bit line, an access current is driven separately through each selected word line to concurrently drive the access current separately through each selected memory cell. Hence, multiple memory cells are concurrently accessed. In some aspects, the memory cells are accessed using a self-referenced read (SRR), which improves read margin. Concurrently accessing more than one memory cell in a cross-point memory array improves bandwidth. Moreover, such concurrent accessing allows the memory system to be constructed with fewer, but larger cross-point arrays, which increases array efficiency. Moreover, concurrent access as disclosed herein is compatible with memory cells such as MRAM which require bipolar operation.

Abstract: Structures herein include an array of non-volatile memory cells. The non-volatile memory cells include memory bit cells and at least one reference bit cell that is adjacent the memory bit cells. These structures also include at least one reference voltage regulator connected to the reference bit cell, and at least one sense amplifier connected to the memory bit cells and the reference voltage regulator.

Abstract: A memory device may include sideband circuitry to provide additional functionality without interfering with normal operations of the memory device. The memory device may also include sideband pins to provide sideband information to an external device. The sideband information may include various digital or analog signals. In some cases, a sideband circuit of the memory device may use a data protocol for communicating the sideband information with the external device. Furthermore, systems and methods for receiving sideband information from multiple memory devices of a memory system are described to reduce latency and increase functionality of a memory system including such memory devices.

Abstract: A semiconductor device according to an embodiment of the present invention which can rapidly output data while being relatively low cost includes: a plurality of memory each including: a strobe signal transmission path having, in this order, a strobe input terminal, a strobe delay circuit, and a strobe output terminal; a plurality of data output circuits connected to a downstream side of the strobe delay circuit of the strobe signal transmission path; and a data output bus connected to the plurality of data output circuits; and a controller including: a strobe circuit which inputs the strobe signal to the strobe input terminal; a data buffer circuit which temporarily stores the data outputted from the data output terminal; and a delay adjustment circuit which adjusts a delay amount of the strobe delay circuit so as to decrease a difference between the memory in delay of the strobe signal outputted from the strobe output terminal relative to the strobe signal outputted from the strobe circuit.

Abstract: A power supply circuit and a memory are provided. The power supply circuit includes: a voltage generation module, configured to provide an initial voltage signal; a first power supply module, configured to provide a power reference voltage based on the initial voltage signal; an amplification module, configured to generate and output a first power voltage based on the power reference voltage; a first power network, configured to supply power to at least one function module connected to the first power network; a second power supply module, a second power network and a voltage control module. The second power supply module is configured to provide a second power voltage for the second power network based on the initial voltage signal.

Abstract: An integrated circuitry (IC) device for a memory device includes driver circuitry, selection circuitry, clock generation circuitry, and self-time path circuitry. The driver circuitry generates a plurality of driver circuitry outputs. The selection circuitry selects one of the plurality of driver circuitry outputs based on a plurality of enable signals. The clock generation circuitry receives the selected one of the plurality of driver circuitry outputs from the selection circuitry, and generates a clock signal based on at least the selected one of the plurality of driver circuitry outputs from the selection circuitry. The self-time path circuitry of a memory receives the clock signal and generates a reset signal based on the clock signal. The plurality of driver circuitry outputs and the clock signal are based on the reset signal, and the self-time path circuitry corresponds to one or more columns of a memory bank.

Abstract: A method to control a memory cell in a memory device, where the memory cell includes a switch, a memory element, and a negative resistance device coupled in series, the method includes: determine whether the memory cell is in a read operation or not; during the read operation in the memory cell, apply a read voltage greater than a predetermined threshold voltage of the negative resistance device for making the negative resistance device entering into a negative resistance state. A memory device that includes a memory cell array is also provided.

Abstract: The present disclosure is drawn to a magnetoresistive device including an array of memory cells arranged in rows and columns, each memory cell comprising a magnetic tunnel junction, each row comprising a word line, and each column comprising a bit line; a column select device that selects a bit line. The magnetoresistive device also includes a sense amplifier comprising a first input corresponding to a selected bit line, a second input corresponding to a reference bit line, and a data output. The plurality of columns comprise a reference column, the reference column comprising a conductive element coupled to the magnetic tunnel junctions in the reference column.

Abstract: A memory device may include a plurality of memory cells, a peripheral circuit configured to perform a plurality of program loops on selected memory cells among the plurality of memory cells, each of the plurality of program loops including a program pulse application operation and a program verify operation, and control logic configured to control the peripheral circuit to suspend an nth program loop (n is a natural number equal to or greater than 1) among the plurality of program loops in response to a suspend command received during the nth program loop, and to resume the nth program loop with a negative verify operation in response to a resume command. The negative verify operation applies a negative voltage having a voltage less than a state voltage at the time of application of the resume command.

Abstract: In an embodiment a non-volatile memory cell includes a substrate, a first body in the substrate, a second body in the substrate, a first storage transistor having a first conduction region and a second conduction region in the first body, the first and second conduction regions delimiting a first channel region in the first body, a first control gate region in the second body, an insulating region overlying the substrate, a single floating gate region extending on the substrate and embedded in the insulating region, the single floating gate region having a first portion on the first body and a second portion on the second body, the first portion and second portion being connected and electrically coupled, a first selection via extending through the insulating region and electrically coupling the first conduction region with a first conduction node, a second selection via extending through the insulating region and electrically coupling the second conduction region with a second conduction node and a first con

Abstract: A semiconductor storage device includes a connection transistor that connects a first wiring to a word line, a block decoder that supplies a signal to a gate of the connection transistor, and a voltage generation circuit including a first node from which a first voltage for generating the signal is supplied to the block decoder, a second node from which a second voltage is supplied to the first wiring, and a voltage difference generation circuit connected between the first node and the second node, wherein the voltage difference generation circuit includes diode-connected first and second transistors and a third transistor, each of the diode-connected first and second transistors having a current path connected between the first and second nodes, the third transistor having a first terminal connected to the first node, a gate connected to a gate of the second transistor, and a second terminal connected to the second node.

Abstract: Systems and methods for multi-wordline direct refresh operations in response to a row hammer error in a memory bank. The approach includes detecting, by a row hammer mitigation component, a row hammer error in a memory bank; and then triggering, by the row hammer mitigation component, a response to the row hammer error. Further, a memory controller receives, from a mode register, data, based on an aliasing row counter policy, selecting a type of multi-wordline direct refresh operation to be performed on a plurality of victim memory rows within the memory bank, wherein the plurality of victim memory rows are dispersed across a plurality of memory sub-banks. The approach includes concurrently executing the selected multi-wordline direct refresh operation to the plurality of victim memory rows.