Patents Examined by J. Kerveros
-
Patent number: 6784671Abstract: A Moisture and Density Detector (MDD) that provides a method and apparatus to determine the moisture content and/or density of any dielectric material for various purposes. This device is very useful in detecting the moisture content (MC) of wood and wood-based materials, such as that of lumber in a dry kiln prior to, during and/or following drying. The MDD passes a radio frequency signal between opposed or adjacent capacitance electrodes and measures the signal strength and phase shift of the signal. The addition of phase shift and multiple frequencies improves the accuracy of the results.Type: GrantFiled: February 4, 2002Date of Patent: August 31, 2004Assignee: Mississippi State UniversityInventors: Philip H. Steele, Jerome E. Cooper
-
Patent number: 6570394Abstract: A system for determining a composite signal level at which a signal path begins to generate non-linear distortion. A reference test signal, which is preferably a short-duration burst of repeatable broadband energy, is passed through the signal path and received on a digital signal acquisition unit. An impaired received reference test signal is comprised of the transmitted reference test signal, linear distortion components, and non-linear distortion components. The impaired received reference test signal is digitally processed to reveal the non-linear distortion components. The impaired received reference test signal may be processed with a stored reference test signal to find a time-domain impulse response from which the uncorrelated distortion energy can be measured.Type: GrantFiled: January 16, 2001Date of Patent: May 27, 2003Inventor: Thomas H. Williams
-
Patent number: 6559651Abstract: A method includes locating an open in a conductive line of an insulated conductor surrounded by an insulative sheath. In accordance with one embodiment, the insulated conductor is beneath an earthen surface and a locator signal and carrier signal including synchronization are introduced into the conductive line. A ground current is capacitively transmitted from capacitive points along the conductive line across the insulative sheath to a ground reference in response to the locator and carrier signals. A ground locator signal and a ground carrier signal are received in response to the ground current flowing past a pickup positioned in electrical communication with earth at a downstream point proximal to one of the capacitive points. The ground locator signal has a real component and a quadrature component and the ground carrier signal has real and quadrature synchronization.Type: GrantFiled: October 25, 2000Date of Patent: May 6, 2003Inventor: Robert G. Crick
-
Patent number: 6525547Abstract: A two dimensional array of electrods for sensing the presence or absence of the ridges in a fingerprint through capacitive measurements. Exciting signals are supplied from outside the array which allows the array to be fabricated from metal and insulator layers on non-semiconductor substrates such as glass or plastic using normal deposition and patterning techniques. A top protective layer consisting of hard, rigid material may be provided. The required electronic circuits are preferably located around the periphery of the array.Type: GrantFiled: April 17, 2001Date of Patent: February 25, 2003Assignee: Sentronics CorporationInventor: Robert S. Hayes
-
Patent number: 6518772Abstract: By a test vessel, a test enclosure is created immediately surrounding the zone of the line or cable harness to be inspected by detection. This enclosure is sealed off before detection-inspection and an internal atmosphere is substituted by at least a partial gas substitution with a test gas or a test gas mixture with a lower disruptive discharge voltage than that of air. This test method permits detection of faulty lines with greater distances between the faulty line, the test electrode, and the corresponding counter-electrode. A corresponding pliers-type device for the sectional detection of a line or harness, or a stationary vacuum seal-tight testing chamber capable of performing the same detection may be used. The method is suitable also for a local detection when the test vessel is created and formed by the installation object itself (e.g., an aircraft fuselage).Type: GrantFiled: October 30, 2000Date of Patent: February 11, 2003Assignee: Wee-Electrotest Engineering GmbHInventors: Nikola Milkovic, Josef Hanson
-
Patent number: 6515485Abstract: A system and method for the automatic detection and matching of power line impedance which makes use of level detection and source impedance circuits in electronic communication with the existing circuitry of a power line communication devices are disclosed. This invention uses modified power line communication device circuitry to sense the impedance of the power line and to correct its impedance to match the impedance of the power line. By automatically sensing and adjusting the source impedance of the power line jack this invention maximizes power transfer to and from the power line, reduces radiated power as well as the power line reflection coefficient.Type: GrantFiled: April 19, 2000Date of Patent: February 4, 2003Assignee: Phonex Broadband CorporationInventors: Scott R. Bullock, Ryan Hoobler
-
Patent number: 6504381Abstract: The disclosure provides a two-output voltage test system, wherein the system includes a plurality of D/A converters, buffers, sinusoidal wave generators, power amplifiers, and a micro-processing controller. The two-output voltage test system provides for a number of processes including one group of the plurality of D/A converters, buffers, sinusoidal wave generators, and power amplifiers to perform the measurement of AC voltage durability (WAC), DC voltage durability (WDC), insulation resistance (IR), and leakage current (LK). The other group of the plurality of D/A converters, buffers, sinusoidal wave generators, and power amplifiers performs the measurement of ground resistance (GR). The micro-processing controller outputs the measurements simultaneously or with slight time delay in order to obtain the results measured at the same time.Type: GrantFiled: October 2, 2000Date of Patent: January 7, 2003Assignee: Chroma Ate Inc.Inventor: Simon Wang
-
Patent number: 6504377Abstract: An analyzing device for producing measurements using transient ionic drift technique and an analysis method using same. The device for the quantitative detection of copper in silicon by transient ionic drift essentially comprises a heater and a rapid cooler for the sample to be analyzed, an electrode for measuring the electrical capacity of the sample and a unit generating an energizing signal and processing the measuring electric signal. The heater (2) for the sample (4) to be analyzed consists in at least a halogen lamp, the rapid cooler (3) for the sample (4) to be analyzed is a water cooler, and the electrode for measuring the sample (4) to be analyzed is a mercury electrode.Type: GrantFiled: February 27, 2001Date of Patent: January 7, 2003Assignee: Centre National de la Recherche ScientifiqueInventor: Thomas Heiser
-
Patent number: 6492823Abstract: A reconfigurable and customizable nest for a device under test. The reconfigurable nest includes a non-metallic nest plate and nesting blocks. The nesting blocks are positioned around the device under test using removable fastening elements such as doublestick tape. Using the removable fastening elements, the nest may be reconfigured for different devices under test. The nest also provides for audio isolation through a configuration which separates a speaker and microphone that provide audio coupling to the device under test.Type: GrantFiled: February 23, 2000Date of Patent: December 10, 2002Assignee: Agilent Technologies, Inc.Inventor: Rick T. Euker
-
Patent number: 6489797Abstract: A test system for testing at least one electrical component includes a test head having a mounting assembly for removably attaching the electrical component, and a plurality of test ports for electrically coupling to the electrical component. The test system further includes a voltage and current source located within the test head. The voltage and current source is constructed and arranged so as to provide at least one electrical output, through an interface assembly, to the electrical component. The electrical output has a voltage magnitude within a predetermined voltage range and has a current magnitude within a predetermined current range. The voltage and current source further analyzes the electrical output so as to detect and measure one or more changes to the electrical output caused by the electrical component. The voltage and current source also receives and analyzes a plurality of response signals through the interface assembly from the signal ports of the electrical component.Type: GrantFiled: July 15, 1999Date of Patent: December 3, 2002Assignee: LTX CorporationInventors: Bruce MacDonald, Philip Perkins
-
Patent number: 6486674Abstract: A method for fault detection in the operation of sensors with at least two decoupled signal-transmitting elements with contacts and with a closed conductor loop includes delaying, a first test output by a defined switching delay with reespect to a second test output and evaluating the input channels in accordance with a defined expectation. Faults being inferred from deviations between actual and expected signal variations and time intervals.Type: GrantFiled: January 29, 2001Date of Patent: November 26, 2002Assignee: Siemens AktiengesellschaftInventors: Heiko Groenewold, Ronald Hauf
-
Patent number: 6486681Abstract: In a measuring circuit for a capacitive sensor for distance measurement and/or space monitoring comprising sensor wire and shielding electrode, a sine signal is applied to the shielding electrode. The sensor wire is connected, via a shielded cable, with one input of an input amplifier which serves as current-voltage converter and whose supply voltage is likewise influenced by the sine signal. The output of the input amplifier is connected with one input of a phase-dependent rectifier arrangement, the sine signal is applied to the other input of the phase-dependent rectifier arrangement, and its output is connected to an analog-to-digital converter.Type: GrantFiled: March 22, 2001Date of Patent: November 26, 2002Assignee: Robert Bosch GmbHInventors: Jens Weber, Juergen Hoetzel, Wolf-Henning Rech, Ega Tschiskale
-
Patent number: 6472897Abstract: A programmable after-package, on-chip reference voltage trim circuit for an integrated circuit having a plurality of programmable trim cells generating a programmed sequence. A converter is provided to convert the bit sequence into a trim current. The trim current is added to an initial value of a reference voltage to be trimmed, as generated by the integrated circuit. Once the correct value of the trim current is determined, isolation circuitry is programmed to isolate the trim circuitry from the remainder of the IC, thereby freeing the logic and package pins associated with the IC for use by users of the IC. The preferred trim circuitry includes fuses which are blown in accordance with a bit value supplied to the trim cell to permanently fix a trim current value, once a best fit value is determined.Type: GrantFiled: January 24, 2000Date of Patent: October 29, 2002Assignee: Micro International LimitedInventors: You-Yuh Shyr, Sorin Laurentiu Negru
-
Patent number: 6469488Abstract: A method of processing a high frequency signal containing at least two different fundamental frequencies F1 and F2 and their harmonic components in order to extract at least one harmonic component of each of the two fundamental frequencies comprises sampling the signal at two sampling frequencies CK1=F1(M1/N1) and CK2=F2(M2/N2), where M1 and N1 are a first pair of integers having no common factor and M2 and N2 are a second pair of integers having no common factor. The sample values resulting from sampling at CK1 are stored cyclically in a set of M1 memory locations such that the nth sample value is stored cumulatively in the remM1[n]th memory location, and the sampled values resulting from sampling at CK2 are stored cyclically in a set of M2 memory locations such that the nth sample value is stored cumulatively in the remM2[n]th memory location.Type: GrantFiled: August 29, 2000Date of Patent: October 22, 2002Assignee: Scientific Systems Research LimitedInventors: Michael B. Hopkins, Jean-Marc Overard
-
Patent number: 6469526Abstract: The present invention provides a system to detect conductive contaminants interspersed within unconsolidated materials. By using the system described herein, voluminous amounts of unconsolidated materials such as soils, waste streams, hay, and similar non-conductive materials may be processed such that conductive contaminants, namely metal objects, may be identified and removed from the processed material. In general, the present invention utilizes the conductive property of these contaminants to alert the system such that the contaminant may be removed. By passing the unconsolidated materials across an arrangement of different contacts placed in close proximity, metal or similar conductive contaminants will complete an electrical circuit that signals a sensor within the circuit and initiates a partial shut down procedure.Type: GrantFiled: April 12, 2000Date of Patent: October 22, 2002Assignee: Synagro Technologies, Inc.Inventor: Marshall R. Franklin
-
Patent number: 6462564Abstract: A method for determining a load in a tumble dryer. Initially, laundry is moved in a laundry drum and the electrical conductivity of the laundry is determined by electrodes residing in the laundry drum. The method is distinguished by the fact that a range of fluctuation of the electrical conductivity is determined and serves as a measure of the load. As a result, the determination of the load can be carried out without an additional outlay for components and circuitry in the case in which a conductivity measurement is already implemented in the tumble dryer. The method is particularly suitable to be carried out by a microcontroller.Type: GrantFiled: August 21, 1998Date of Patent: October 8, 2002Assignee: BSH Bosch und Siemens Hausgeraete GmbHInventors: Uwe-Jens Krausch, Dietmar Pech, Ulrich Nehring
-
Patent number: 6459292Abstract: A testing system for a semiconductor device having a tester carrying out a test for a semiconductor device, a host computer carrying out a repair analysis processing, a tester controller instructing the tester to operate the test and notifying the test result to the host computer. The host computer has a stay-and-resident program necessary for the analytical processing and sends those data to the tester controller in the point in which data showing “repairable or not” is detected.Type: GrantFiled: April 13, 2000Date of Patent: October 1, 2002Assignee: Advantest CorporationInventors: Hisashi Oikawa, Yasuo Watanabe
-
Patent number: 6456101Abstract: An auxiliary BIST circuit is constructed in a primary chip to which a secondary chip is attached, thereby allowing testing of the secondary chip using the auxiliary BIST circuit. This allows direct test access to the secondary chip without the need for a separate BIST circuit to be included in the secondary IC chip and without using a primary BIST circuit of the primary IC chip to test the secondary chip.Type: GrantFiled: April 7, 1999Date of Patent: September 24, 2002Assignee: Agere Systems Guardian Corp.Inventor: Austin C. Dumbri
-
Patent number: 6456093Abstract: The present invention relates to an apparatus for detection of foreign bodies in materials, comprising a first antenna device for transmitting electromagnetic signals, the transmitted electromagnetic signals are in the microwave range, the signals comprise at least two signals at different frequencies, a second antenna device for receiving signals originating from the first antenna, where the received signals, at least partially, passes through the materials, device for measuring at least one parameter of the received signals for each frequency, so as to obtain parameter values, device for comparing the parameter value with the corresponding output parameter value of the transmitted signals, so as to obtain a comparison value for each of the frequencies, device for analyzing each comparison value based on a reference value, which reference value is accessible to the apparatus, and device for emitting a signal when the comparison value differs a predetermined amount from the reference value.Type: GrantFiled: February 18, 2000Date of Patent: September 24, 2002Assignee: SIK - Institut för livsmedel och biotecknik ABInventors: Harald Merkel, Mikael Reimers, Christina Skjöldebrand
-
Patent number: 6456081Abstract: Testing apparatus for testing string lamps such as hose of Christmas lights. The apparatus includes a hand held housing having two sockets for testing lamps, an indicating lamp, and a buzzer. One socket connects power from a battery to the electrodes of the lamp. The other socket is associated with an inductive circuit which energizes the indicating lamp and buzzer when the inserted lamp is operable. Externally exposed electrodes connected to the indicating lamp and buzzer enable testing of fuses. Internal circuitry includes a 4069 chip containing a plurality of individual amplifiers.Type: GrantFiled: October 26, 2000Date of Patent: September 24, 2002Inventor: Michael Reeves