Abstract: Apparatus and method for providing a classification of inclusions in molten metal. The apparatus and method include the steps of and means for obtaining an analog signal stream from a data collection apparatus, passing the analog signal stream through an analog to digital converter to convert the analog signal stream to a digital signal stream, and partitioning the digital signal stream into a discrete time frame of 5 milliseconds. The digital signal stream is vector normalized to provide a normalized signal stream having a largest amplitude magnitude of 1. The normalized signal stream is compared to a control of a prototype shape for determining a classification for the digital signal stream over the discrete time frame by decision logic to determine hard inclusions versus soft inclusions in the liquid metal.

Abstract: A preferred embodiment of the present invention includes a system for detecting a presence of a macromolecule having one or more resonant frequencies. The system includes a pulse generator (a T-wave generator in the most preferred embodiment) for generating a detection profile having a detection set of T-waves and applying the detection profile to a sample including the macromolecule, at least one T-wave having a center frequency substantially centered on one of the resonant frequencies of the macromolecule, a detector for receiving the detection profile after the application of the detection profile to the sample, an analyzer, coupled to the detector, for determining a T-wave absorption profile by identifying which T-waves of the set of T-waves have been wholly or partially absorbed by the sample and to subsequently identify the macromolecule by use of the absorption profile.

Abstract: An induction machine asymmetry detection instrument includes an interconnector and a voltmeter. The interconnector is configured to connect an electric source across a first terminal and a second terminal of a stator of an induction machine. The induction machine includes a rotor disposed for magnetic coupling with the stator. The interconnector is further configured to cause a flow of direct current between the first terminal and the second terminal of the stator during a rotation of the rotor when the induction machine is substantially unloaded. The voltmeter is connectable across the second terminal and a third terminal of the stator. A detection by the voltmeter of a meaningful voltage across the second terminal and the third terminal of the stator concurrent with the flow of direct current between the first terminal and the second terminal and concurrent with the rotation of the rotor serves to indicate an asymmetry of a portion of the induction machine.

Abstract: The invention relates to a fault localizing and identifying device for electric systems. The device comprises a primary unit and a secondary unit. The primary unit comprises at least two connections which are connectible to conductors in the electric system. The secondary unit is connectible to corresponding conductors at a distance from the primary unit. The primary unit further comprises a coupling unit which has a high-impedance and a low-impedance state and which is connected between the connections, and a control unit having an output which is connected to the coupling unit and is adapted to control the coupling unit to shift between the two states. The secondary unit detects the resistance variations. This makes it possible to detect and localize different types of faults. It is also possible to identify or follow a certain conductor.

Abstract: After a flexible printed circuit is left under an atmosphere of a water vapor pressure of not lower than 30 mmHg so as to absorb moisture, a voltage is applied between two wiring portions to thereby measure an insulation resistance value between the wiring portions during the voltage application. The quantity &Dgr;log(R) of the change of the insulation resistance value at regular intervals is obtained. An examination is made as to whether the maximum of the quantity &Dgr;log(R) of the change of the insulation resistance value is not larger than a predetermined reference value or not. From this examination, a judgment is made as to whether the flexible printed circuit is good or not.

Abstract: A flying prober having at least one prober head for contacting test sites on a unit under test which is programed for measuring isolations and continuities of test sites through the prober head. The prober heads include a camera and a test probe wherein the camera views and verifies contact between the test probe and the test sites. A display screen illustrates at least a real time camera view of the unit under test and a computer generated detail view of the unit under test for comparison.

Abstract: A method and apparatus that provides in-situ monitoring of both the ion flux and the ion energy distribution of plasma processes to determine the endpoint of the etch process or the integrity and reproducibility of the deposition process where ion bombardment and energy distribution play critical roles in the process. A capacitance sensor is provided for measuring ion flux and ion distribution. At least one capacitance sensor is disposed within a plasma reactor at a first position for detecting ion flux emanating from a plasma within the plasma reactor. The capacitance sensor generates an ion flux measurement signal in response to the detection of the ion flux. Each of the at least one capacitance sensors is coupled to signal lines for routing an ion flux measurement signal outside the plasma reactor. A plurality of capacitance sensors may be formed as one of a plurality of rows of parts to be processed.

Abstract: An interface for connection between a printed circuit board and a device associated with a disk drive apparatus for extending the flexible connection between the printed circuit board and the disk drive device. The device includes a planar substrate relatively flexible to the board, and conductors are formed on the substrate. The conductors are in conductive communication with the circuit board and with a circular flexible wire having conductors associated with the head gimbal assembly of a disk drive device.

Abstract: An apparatus for measuring triboelectric charge applied by a material to a flexible member is provided. The apparatus includes a frame and a drum. The drum is used for mounting the member to an external periphery thereof. The drum is rotatably mounted to the frame. The apparatus also includes a mechanism including a motor for rotating the drum, the mechanism operably associated with the drum. The apparatus also includes a support for supporting the material in intimate contact with the flexible member. The material and the member form a triboelectric charge on the external surface of the member. The material includes a material portion thereof in intimate contact with the member at a first member position on an external periphery of the member. The apparatus also includes a charge measuring device operably associated with the drum for measuring an electrical field emanating from the member.

Abstract: A method and apparatus are provided for monitoring a corrosion current density to determine a corrosion rate of a corroding system 130 using Electrochemical Frequency Modulation (EFM). In the method two sinusoidal signals 100, 105, having different frequencies are applied to a portion of the system 130 to distort a response current 120 in the system. Analysis of this current 120 generated in response to the applied perturbation signal 110 provides the corrosion rate and Tafel parameters of the system 130 without prior knowledge of the Tafel parameters. In one embodiment, the method and apparatus also provide a mechanism for validating the quality of the measured data used in calculating the corrosion rate and Tafel parameters.

Abstract: A dielectric constant sensing device of the present invention comprises a transmission line consisting of a first electrode formed of a conductor being wound like a longitudinal cylinder, a second electrode provided to be separated from the cylindrical surface of the first electrode at a predetermined distance, and a chamber for introducing a measured fluid between the first electrode and the second electrode, whereby a dielectric constant of the measured fluid can be sensed based on a rate of a pulse voltage wave propagated over the transmission line. Accordingly, the fluid dielectric constant sensing device which is able to attain high precision by a simple structure can be provided.

Abstract: A test interface is used to connect an electronic device under test (“DUT”), such as a computer chip, to a tester. The interface utilizes a combination of spring forces and air pressure forces to extend and retract pogo pins, respectively. The pogo pins when extended contact conductive pads which are electrically connected to the DUT, perhaps via a DUT board. Springs are biased to extend the pins to contact the pads, and air pressure is used to retract the pins. Thus no air pressure or vacuum is required to maintain the pins in contact with the pads. When retracted, the pogo pins are shielded from damage by a shield, such as a board with holes in it for the pogo pins to pass through.

Abstract: A set battery which generates a high voltage comprises a number of battery modules connected to each other in series. A module voltage of each of the battery modules is detected by a corresponding differential voltage detecting circuit and is transmitted to an A/D convertor. Each of Several voltage detecting blocks is constituted by a plurality of the differential voltage detecting circuits for detecting module voltages of a plurality of the battery modules contiguous to each other. Each of the differential voltage detecting circuits belonging to the same voltage detecting block is applied with a common reference potential which is used to detect the module voltage. The reference potential is set to values which differ from each other for the respective voltage detecting blocks.

Abstract: The invention provides a semiconductor integrated circuit wherein a PMOS 111 having a high threshold voltage is installed between a VDD line 101 and a VDDV line 103, and a NMOS 121 having a high threshold voltage is installed between a VSS line 102 and a VSSV line 104. The semiconductor integrated circuit comprises a logic gate circuit supplied with a power source voltage via the VDDV line 103 and the VSSV line 104, respectively, and made up of PMOSes 131 to 133, and NMOSes 141 to 143. A substrate terminal of the PMOSes 131 to 133, respectively, is connected to a pad 163 to which a suitable voltage can be supplied from outside while a substrate terminal of the NMOSes 141 to 143, respectively, is connected to a pad 164 to which a suitable voltage can be supplied from outside. The semiconductor integrated circuit with such a configuration is capable of improving a failure detection ratio at testing.

Abstract: The most commonly used type of voltage probe for high-bandwidth applications is the high-impedance passive probe. It is reliable, rugged, simple to use, and inexpensive. However, because it has a relatively high input capacitance, it is not truly “high impedance” to the higher frequency components of a test signal. Consequently, connecting the probe can distort the signal under test (e.g., by increasing the rise and fall times of a fast pulse). Also, the probe input capacitance forms a resonant circuit with any parasitic inductance in the probe ground lead. In response to a short-duration step in voltage, this can cause spurious oscillations in the input signal to the instrument. Active probes generally have a much lower input capacitance, thereby minimizing these problems. Also, active probes have been able to achieve much higher bandwidths than those of high-impedance passive probes. But active probes are very expensive, and they are not as rugged or as reliable as passive probes.

Abstract: An aligner according to the present invention is constituted by integrating a wafer chuck, a wafer and a contactor, which are aligned with one another, into one piece by vacuum adsorptivity. A vacuum exhaust apparatus for generating the vacuum adsorptivity, includes first and second valve mechanisms, a valve operation mechanism for opening/closing these valve mechanisms, first and second solenoid valves connected to the valve operation mechanism through a vacuum exhaust line, and a vacuum leak detecting pressure gauge interposed between the first solenoid valve and the valve operation mechanism.

Abstract: A phase detector determines a phase error value dependent on the relative phase between a local oscillator signal, used for the system clock, and an input signal received over a PR (a, b, b, a) channel. The error value is used to lock the phase and frequency of an input signal to the phase and frequency of the clock in a phase-lock loop (FIG. 1, not shown). The input signal is sampled at regular intervals in accordance with the local oscillator signal, and the sampled values provided on a line 10. A threshold slicer 22 selects an ideal sample value for a sampling point by comparing the sampled values with thresholds received on threshold inputs 23 to 26. A subtracter 32 determines a difference value which corresponds to a difference between the ideal sample value and the actual sample value for that sampling point. A subtracter 28 and a delay register 29 operate to determine the sense of change to the ideal sample value from a ideal sample value for a preceding sampling point.

Abstract: An automated test system for testing a device having a circuit connection and a ground connection includes a processor, a test apparatus, and a discharge circuit. The processor is operable to generate a control signal that includes a set of test parameters, and is further operable to generate a discharge control signal upon completion of a test. The test apparatus includes a first connection operable to be connected to the circuit connection of the device and a second connection operable to be connected to the ground connection of the device. The test apparatus is also operably connected to receive the control signal including the set of test parameters from the processor. The test apparatus is operable to perform a first test based on the set of test parameters. The discharge circuit is external to the test apparatus and is coupled to the processor. The discharge circuit is operable to be coupled to the ground connection and the circuit connection of the device.

Abstract: For discrete-time reactance measurement the reactance is activated by a clocked generator device with an electric voltage, an electric current or an electric charge. A clocked analyzer device generates an output signal as a function of the reactance to be measured from discrete-time sampling values of the electric voltage, electric current or electric charge. The generator device and the analyzer device are clocked in synchronism, the clock controlling the generator device and the analyzer device being varied in the same way by a frequency or phase modulator for reducing the influence of narrowband disturbances coupled into the circuit caused by aliasing.

Abstract: An electric inspection device impresses between a pair of terminals a current pulse train having a constant pitch, a constant pulse width and a constant current, and measures the resistance appearing between the terminals based on the voltage appearing between the terminals. The variation of the resistance measured for the current pulses is compared against a threshold. If there is any latent defect in the circuit, such as latent open-circuit or short-circuit failure resides which is not in effect at present, a large variation of resistance is observed.