Patents Examined by J. Kerveros
  • Patent number: 6191592
    Abstract: An apparatus is provided to facilitate connection inspections for a high tension cord 1. The apparatus includes a contact element that can be brought into contact with a distributor terminal T2. The contact element includes elastic elements 31b to 34b that are constructed to be displaceable between an enclosed state where they enclose the distributor terminal T2 to establish an electrical connection therewith and an open state where a high tension cord 1 can be mounted and detached. Since the distributor terminal T2 can be connected electrically without precisely positioning it, connection inspections for the high tension cord 1 can be made easier and, consequently, automation and labor-saving can be made possible.
    Type: Grant
    Filed: January 25, 1999
    Date of Patent: February 20, 2001
    Assignee: Sumitomo Wiring Systems, Ltd.
    Inventors: Hiroyuki Ohsawa, Hitoshi Ohkubo
  • Patent number: 6191601
    Abstract: A test fixture for matched impedance testing of a printed circuit board having a top plate for supporting the printed circuit board having matched impedance circuit traces extending from test site locations on the printed circuit board requiring matched impedance testing. Spring probes extend through holes in the top plate for transmission of test signals from the test sites on the printed circuit board to the matched impedance circuit traces. A TDR meter is wired to the top plate by coaxial connectors attached to the circuit traces to read the test signals.
    Type: Grant
    Filed: February 22, 1999
    Date of Patent: February 20, 2001
    Assignee: Delaware Capital Formation, Inc.
    Inventor: Mark A. Swart