Abstract: A dynamic memory management method for layout verification tools that maximizes main memory usage and minimizes required disk storage capacity. Layout data generated during each given geometric operation is retained in main memory at the end of the given geometric operation. At the beginning of each new (current) geometric operation, an estimated amount of main memory required to perform the current geometric operation at peak processing speed is determined. When insufficient available main memory is available, a Central Balancer Module determines whether previously generated layout data can be moved from main memory to disk storage. Layout data file(s) are then selected based on minimizing the amount of transferred layout data needed to provide the required estimated amount. A Distributed File Manager then transfers the selected layout data file(s) from main memory to disk storage, thereby facilitating execution of the current geometric operation at peak operating speed.

Abstract: System design using accurate performance models may include generating, using a processor, a performance verification testbench from a hardware description language design and an automaton and determining, using the processor, a parameter of the design by analyzing the performance verification testbench using formal verification methods. The parameter is provably accurate. A performance model of a system under design including the design may be executed. The performance model uses the parameter. A determination may be made, using the processor, whether the system under design meets a system requirement according to a comparison of a result of executing the performance model with the system requirement.

Abstract: A method of generating electronic circuit layout data can include electronically providing data representing a first standard cell layout including a first scaling enhanced circuit layout in an electronic storage medium. The first scaling enhanced circuit layout included in the first standard cell layout can be electronically defined using a marker layer. The first scaling enhanced circuit layout can be electronically swapped for a second scaling enhanced circuit layout to electronically generate data representing a second standard cell layout in the electronic storage medium. The data representing the second standard cell layout can be electronically verified.

Abstract: In accordance with an embodiment of the present invention, a method of testing a plurality of semiconductor devices includes applying a stress voltage having a peak voltage on a shield line disposed over a substrate. The substrate has functional circuitry of a semiconductor device. A fixed voltage is applied to a first metal line disposed above the substrate adjacent the shield line. The first metal line is coupled to the functional circuitry and is configured to be coupled to a high voltage node during operation. The peak voltage is greater than a maximum fixed voltage. The shield line separates the first metal line from an adjacent second metal line configured to be coupled to a low voltage node during operation. The method further includes measuring a current through the shield line in response to the stress voltage, determining the current through the shield line of the semiconductor device, and based on the determination, identifying the semiconductor device as passing the test.

Abstract: Aspects of the disclosed technology relate to techniques of pattern-based resolution enhancement. Surrounding areas for a plurality of geometric layout elements in a layout design are partitioned into geometric space elements. The plurality of geometric layout elements and the geometric space elements are grouped, through pattern classification, into geometric layout element groups and geometric space element groups, respectively. Optical proximity correction is performed for each of the geometric layout element groups and sub-resolution assist feature insertion is performed for each of the geometric space element groups. The results are applied to the plurality of geometric layout elements and the geometric space elements in the layout design.

Abstract: Vacant areas of a layer of an integrated circuit design are filled with shapes connected to the appropriate nets.

Abstract: Methods and systems for checking a wafer-level design for compliance with a rule include determining a tile area, having a size that is based on the one or more layout design rules, that crosses a boundary between adjacent chip layouts and that leaves at least a portion of each chip layout uncovered. It is determined that a portion of a first chip layout inside the tile area fails to comply with one or more layout design rules. The first chip layout is modified, responsive to the determination that the first chip layout within the tile area fails to comply with the one or more layout design rules, to bring non-compliant periphery chip regions into compliance. It is determined that the portion of the first chip layout within the tile area complies with the one or more design rules after modifying the first chip layout. A multi-chip wafer is fabricated that includes the chip layouts.

Abstract: Methods and systems for providing overlay corrections are provided. A method may include: selecting an overlay model configured to perform overlay modeling for a wafer; obtaining a first set of modeled results from the overlay model, the first set of modeled results indicating adjustments applicable to a plurality of term coefficients of the overlay model; calculating a significance matrix indicating the significance of the plurality of term coefficients; identifying at least one less significant term coefficient among the plurality of term coefficients based on the calculated significance matrix; obtaining a second set of modeled results from the overlay model, the second set of modeled results indicating adjustments applicable to the plurality of term coefficients except for the identified at least one less significant term coefficient; and providing the second set of modeled results to facilitate overlay correction.

Abstract: Various embodiments provide for circuit design routing based on parallel run length (PRL) rules. In particular, a plurality of PRL rules is accessed and used to generate a set of additional routing blockages around an existing routing blockage of the circuit design. The additional routing blockages can be positioned relative to the existing routing blockage. During routing, the set of additional routing blockages can be modeled into a capacity map, which is then used by global to generate routing guide(s) between at least two nodes of the circuit design. In doing so, the various embodiments can assist in routing a wire while avoiding violation of the plurality of PRL rules with respect to the existing blockage, can speed up performance of global routing, can make it easier for detailed routing to honor routing guides produced by global routing, and can speed up performance of detailed routing in resolving DRC violations.

Abstract: A method for generating a design for a 3D integrated circuit (3DIC) comprises extracting at least one design characteristic from a first data representation of a design for a integrated circuit (2DIC) generated according to the design criteria required for the 3DIC. Components of the 3DIC are partitioned into groups (each representing one tier of the 3DIC) based on the extracted design characteristic. A second data representation of a 2DIC design is generated comprising multiple adjacent partitions each comprising the component groups for one tier of the 3DIC design together with inter-tier via ports representing locations of inter-tier vias. A placement for each partition is determined separately from a placement of corresponding components of the 2DIC represented by the original first data representation. This approach allows a 2DIC EDA tool to be used for designing a 3DIC.

Abstract: A system for designing an integrated circuit having pre-layout RC information is disclosed. The system includes: at least one processor; and at least one memory including computer program code for one or more programs, the at least one memory and the computer program code configured to, with the at least one processor, cause the system to: generate current and voltage information for a schematic having device array layout constraint included; create interconnection topology patterns and realizing route for the schematic; generate RC information according to the route; and determine if the schematic having the device array layout constraint and the RC information included violates one or more of the system design rule constraints. An associated method and a computer readable medium are also disclosed.

Abstract: For combination map based design, a method defines one or more logic elements including one or more binary output variables and one or more binary input variables. The method further assigns the one or more logic elements to a combination map. In addition, the method defines one or more logic element relationships between the logic elements on the combination map. The method encodes a plurality of fields of the combination map as a linear array that includes a plurality of logic states. Each logic state includes the one or more binary output variables, the one or more binary input variables, one or more minterms of the one or more binary input variables, one or more maxterms of the one or more minterms, one or more present state values, and one or more next state values.

Abstract: Simulating a hardware description language design including a core and a testbench can include performing, using a processor, a first compilation of the hardware description language design by generating a compiled core unit for the core, a compiled testbench for the testbench, and synchronization data describing signals crossing a compile checkpoint boundary. A subsequent compilation of the hardware description language design can be performed by reusing the compiled core unit from the first compilation and generating a new compiled testbench for the testbench using the synchronization data.

Abstract: Zero wire load based assertions are generated. A zero wire load report is generated for a set of logic in a hardware description language corresponding to a circuit design. A set of assertions is identified for the circuit design by parsing the zero wire load report based in part on real data values corresponding to best case delays for one or more input pins and one or more output pins in a plurality of macros of the circuit design. A circuit may be fabricated based on the set of assertions.

Abstract: Swap insertion in mapping logical qubits on a quantum circuit is performed by obtaining an operation sequence including a plurality of operations to be executed on a quantum circuit. The quantum circuit including a plurality of physical qubits and a plurality of couplings. Finding a blocking set of operations including leading unresolved operation in the operation sequence. Calculating a first coupling score for each coupling of the plurality of couplings based on total reduction of shortest path lengths of a plurality of unresolved operations of the plurality of operations Selecting a coupling based on the first coupling score of each coupling. Updating the blocking set by removing any leading unresolved operations from the blocking set that can be performed after swapping a pair of logical qubits stored in a pair of physical qubits connected by the selected coupling.

Abstract: Embodiments included herein are directed towards a system and method for implementing an IC package design with an IC package design estimator. Embodiments may include estimating a number of layers for an integrated circuit (IC) package design that includes a plurality of IC die designs. Embodiments may further include determining whether the estimated number of layers can accommodate routing demands for interconnections between the IC package design and each of the plurality of IC die designs. Embodiments may also include identifying a number of layers required to perform routing between each of the plurality of IC die designs. Embodiments may further include determining a power layer or ground layer based upon, at least in part, one or more factors and generating an output for the IC package design based upon, at least in part, the estimated number of layers and the power layer or ground layer.

Abstract: A computer-method is provided for designing a router network to connect components of an integrated circuit, where the router network comprises a plurality of connected data routing elements. The method comprises generating an undirected graph to represent a mesh of candidate router elements, where the candidate data routing elements are positioned dependent on at least one characteristic of the integrated circuit. The undirected graph comprises a node to represent each candidate data routing element and an edge to represent each connection between the candidate data routing elements.

Abstract: Event tracing for a system-on-chip (SOC) may be implemented by instrumenting, using a computer, a design for the SOC with instrumentation program code that, responsive to execution by a processor of the SOC, generates software trace events. The design may be specified in a high level programming language. A circuit design specifying an accelerator circuit for a function of the design may be generated using the computer. The accelerator circuit is configured for implementation within programmable circuitry of the SOC. The circuit design may be instrumented to include trace circuitry using the computer. The trace circuitry may be configured to detect hardware trace events for operation of the accelerator circuit, receive the software trace events, and combine the hardware and software trace events into time synchronized trace data.

Abstract: A system for verifying networking system-on-chip designs comprises a reconfigurable hardware modeling device programmed to implement circuitry hardware models and a traffic generation device communicating with the reconfigurable hardware modeling device. The circuitry hardware models comprise a hardware model of a circuit design and a hardware model of interface circuitry. The system employs a backpressure flow control independent of the communication protocol, which can cause the traffic generation device to suspend sending messages when one or more message buffers in the traffic generation device, the reconfigurable hardware modeling device, or both cannot accept more messages based on predetermined conditions.

Abstract: An apparatus, including: a deterministic monitored device; an interconnect to communicatively couple the monitored device to a support circuit; a super queue to queue transactions between the monitored device and the support circuit, the super queue including an operational segment and a shadow segment; a debug data structure; and a system management agent to monitor transactions in the operational segment, log corresponding transaction identifiers in the shadow segment, and write debug data to the debug data structure, wherein the debug data are at least partly based on the corresponding transaction identifiers.