Patents Examined by Jack I. Berman
  • Patent number: 7851756
    Abstract: It is to prevent an image drift from occurring caused by a specimen being charged when observing the specimen including an insulating material. A first scan is performed in a predetermined direction on scanning line and in a predetermined sequential direction of scanning lines and a second scan is performed in a scanning direction different from the predetermined scanning direction and in a sequential direction different from the predetermined sequential direction. An image may be created by repeating the process of executing the second scan after executing the first scan and by requiring the arithmetic average of the frames obtained by the second scans. An image may be created by averaging arithmetically at least one frame obtained by the first scan and at least one frame obtained by the second scan.
    Type: Grant
    Filed: July 30, 2008
    Date of Patent: December 14, 2010
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Ritsuo Fukaya, Zhigang Wang
  • Patent number: 7851769
    Abstract: The invention relates to a motorized manipulator for positioning a TEM specimen holder with sub-micron resolution parallel to a y-z plane and rotating the specimen holder in the y-z plane, the manipulator comprising a base (2), and attachment means (30) for attaching the specimen holder to the manipulator, characterized in that the manipulator further comprises at least three nano-actuators (3a, 3b, 3c) mounted on the base, each nano-actuator showing a tip (4a, 4b, 4c), the at least three tips defining the y-z plane, each tip capable of moving with respect to the base in the y-z plane; a platform (5) in contact with the tips of the nano-actuators; and clamping means (6) for pressing the platform against the tips of the nano-actuators; as a result of which the nano-actuators can rotate the platform with respect to the base in the y-z plane and translate the platform parallel to the y-z plane.
    Type: Grant
    Filed: October 17, 2008
    Date of Patent: December 14, 2010
    Assignee: The Regents of the University of California
    Inventors: Andreas Karl Schmid, Nord Andresen
  • Patent number: 7851744
    Abstract: A Matrix Assisted Laser Desorption Ionization ion source or ion imaging device is disclosed comprising a laser (1) and a zoom lens (3, 4, 5). The zoom lens (3, 4, 5) is arranged to be able to vary the magnification of a laser beam which is directed onto a target region, sample surface or target plate (13) of the ion source or ion imaging device.
    Type: Grant
    Filed: December 23, 2005
    Date of Patent: December 14, 2010
    Assignee: Micromass UK LImited
    Inventors: Jeffery Mark Brown, Daniel James Kenny
  • Patent number: 7851748
    Abstract: A circuit synchronizes the actuation of multi-dimensional separating valves with a system clock also coupled to a data acquisition circuit such that signals from a detector are synchronized and no signal information is lost. The system comprises an acquisition clock coupled to a data acquisition logic system and to a modulator valve control. The modulator valve control is, in turn, coupled to a multi-dimensional separation technique valve unit for controlling the valves for introduction of the eluant from a first separation column to a second, faster column in synchronism with acquisition of data by a detector.
    Type: Grant
    Filed: March 23, 2007
    Date of Patent: December 14, 2010
    Assignee: Leco Corporation
    Inventor: Michael Mason
  • Patent number: 7845306
    Abstract: In a method of manufacturing an LCD device, an atomic beam is irradiated onto a thin film including a carbon-carbon double bond to form a polarized functional group by transforming the carbon-carbon double bond into a carbon-carbon single bond and a radical state. Then, a polarity preserving material is combined with the polarized functional group so as to preserve a polarity of the polarized functional group. According to the present invention, the alignment film is formed on the thin film transistor unit cell and on the color filter unit cell by a non-contact method. Therefore, time of forming the alignment film is reduced and alignment of the liquid crystal molecules is improved.
    Type: Grant
    Filed: April 28, 2008
    Date of Patent: December 7, 2010
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dae-Ho Choo, Hak-Jin Kim, Bong-Woo Lee
  • Patent number: 7849515
    Abstract: A nanotweezer (1) according to the present invention includes: a supporting member (25); an observation probe (10) that projects out from the supporting member (25), and is used when observing a surface of a specimen; a movable arm (20) that is arranged next to the observation probe (10) projecting out from the supporting member (25), and makes closed or opened between the observation probe (10) and the movable arm (20) to hold or release the specimen held between the observation probe (10) and the movable arm (20); and a drive mechanism that drives the movable arm (20) so as to make closed or opened between the observation probe (10) and the movable arm (20), and the supporting member (25), the observation probe (10) and the movable arm (20) are each formed by processing a semiconductor wafer (30) through a photolithography process.
    Type: Grant
    Filed: November 22, 2005
    Date of Patent: December 7, 2010
    Assignees: National University Corporation Kagawa University, AOI Electronics Co., Ltd.
    Inventors: Gen Hashiguchi, Maho Hosogi, Takashi Konno
  • Patent number: 7849516
    Abstract: A method of scanning over a substrate includes implementing a write mode of the substrate by scanning a probe across a substrate, the probe having a spring cantilever probe mechanically fixed to a probe holding structure, a tip with a nanoscale apex, and an actuator for lateral positioning of the tip; the actuator comprising a thermally switchable element and a heating element for heating the thermally switchable element; and heating the heating element to a given temperature so as to locally soften a portion of the substrate and applying a force to the softened portion of the substrate through the tip so as to create one or more indentation marks in the softened portion of the substrate.
    Type: Grant
    Filed: August 7, 2008
    Date of Patent: December 7, 2010
    Assignee: International Business Machines Corporation
    Inventors: Gerd Binnig, Evangelos Elefheriou, Mark Lantz
  • Patent number: 7847246
    Abstract: In an RF ion trap, analyte ions are fragmented by applying a moderately high RF storage voltage to the trap. The ions are then excited via dipolar excitation, and after a short time, the ions are forced into a resting state, again using dipolar excitation. The RF storage voltage is then rapidly reduced to a low value thereby making it possible to store small fragment ions produced by ergodic decompositions that occur subsequent to the reduction of the RF storage voltage.
    Type: Grant
    Filed: November 28, 2007
    Date of Patent: December 7, 2010
    Assignee: Bruker Daltonik, GmbH
    Inventor: Andreas Brekenfeld
  • Patent number: 7847238
    Abstract: A method and system for micromanipulation of objects of any shape. The method and system creates various forms of holographic optical traps for a variety of commercial purposes. Some alternate forms of traps include a dark form of optical traps, optical vortices with different helical winding numbers and optical traps with variable phase profiles imprinted thereon.
    Type: Grant
    Filed: November 6, 2007
    Date of Patent: December 7, 2010
    Assignee: New York University
    Inventor: David G. Grier
  • Patent number: 7847241
    Abstract: In various aspects, ion sources, mass spectrometer systems, and a power supply circuit coupled to a feedback circuit are provided. A power supply is provided that includes at least the power supply circuit and is operable to transfer charge to a load. The feedback circuit is responsive to a DC component of an output voltage supplied by the power supply in a first feedback loop and an AC component of the output voltage in a second feedback loop to produce a feedback signal representative of at least one of: a value of the output voltage before a charge transfer from a capacitor of the power supply to a load; the value of the output voltage during the charge transfer from the capacitor of the power supply to the load; or the value of the output voltage after the charge transfer from the capacitor of the power supply to the load.
    Type: Grant
    Filed: January 8, 2009
    Date of Patent: December 7, 2010
    Assignee: DH Technololgies Development PTE. Ltd.
    Inventor: Stephen C. Gabeler
  • Patent number: 7847248
    Abstract: Ion trap apparatus and methods for efficiently addressing the effects of charge space caused by ion trap overfilling, useful in linear ion traps of mass spectrometers.
    Type: Grant
    Filed: November 18, 2008
    Date of Patent: December 7, 2010
    Assignees: MDS Analytical Technologies, a business unit of MDS Inc., Applied Biosystems, Inc.
    Inventor: Bruce A. Collings
  • Patent number: 7842917
    Abstract: A method an apparatus for analyzing biomolecules is described. The method includes injecting and storing one species of ionized molecule in a linear ion trap and injecting second species of oppositely polarity ionized molecule such that the second species is transmitted through the stored first species. The resultant reaction products may be analyzed by a mass analyzed taking account of the remaining charge values. In an aspect, a linear ion trap may be used as the reaction volume, and the ionized species injected along the axis of the trap in a substantially collinear manner. The mass analysis may be performed by mass selective axial ejection or by a mass spectrometer.
    Type: Grant
    Filed: November 29, 2007
    Date of Patent: November 30, 2010
    Assignee: Purdue Research Foundation
    Inventors: Scott A. McLuckey, Xiaorong Liang, Yu Xia
  • Patent number: 7842932
    Abstract: There is disclosed an ultraviolet radiation device. The device comprises a base portion, a plurality of semiconductor structures connected to the base portion and an ultraviolet radiation transparent element connected to the plurality of semiconductor structures. Preferably: (i) the at least one light emitting diode is in direct contact with the ultraviolet radiation transparent element, or (ii) there is a spacing between the at least one light emitting diode and the ultraviolet radiation transparent element, the spacing being substantially completely free of air. There is also disclosed a fluid treatment system incorporating the ultraviolet radiation device.
    Type: Grant
    Filed: June 2, 2008
    Date of Patent: November 30, 2010
    Assignee: Trojan Technologies
    Inventors: Douglas G. Knight, Jim Fraser, Michael Sasges
  • Patent number: 7842936
    Abstract: The present invention relates a probe forming lithography system for generating a pattern on to a target surface such as a wafer, using a black and white writing strategy, i.e. writing or not writing a grid cell, thereby dividing said pattern over a grid comprising grid cells, said pattern comprising features of a size larger than that of a grid cell, in each of which cells said probe is switched “on” or “off, wherein a probe on said target covers a significantly larger surface area than a grid cell, and wherein within a feature a position dependent distribution of black and white writings is effected within the range of the probe size as well as to a method upon which such system may be based.
    Type: Grant
    Filed: March 9, 2007
    Date of Patent: November 30, 2010
    Assignee: Mapper Lithography IP B.V.
    Inventors: Pieter Kruit, Remco Jager, Stijn Willem Karel Herman Steenbrink, Marco Jan-Jaco Wieland
  • Patent number: 7841015
    Abstract: A method is described for determining a dopant concentration on a surface and/or in layer region lying close to the surface of a semiconductor sample using an atomic force microscope, whose leaf-spring tip is brought into contact with the semiconductor sample, forming a Schottky barrier, wherein an electric alternating potential is applied between the spring-leaf tip and the semiconductor sample in the region of the Schottky barrier in such a way that a space charge region inside the semiconductor sample defining the three-dimensional extension of the Schottky barrier is excited and begins to oscillate within the confines of its spatial extension, said oscillations are transmitted to the leaf-spring, are detected and form the basis for determining the dopant concentration.
    Type: Grant
    Filed: February 28, 2007
    Date of Patent: November 23, 2010
    Assignee: Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung E.V.
    Inventors: Walter Arnold, Kerstin Schwarz, Ute Rabe
  • Patent number: 7838844
    Abstract: The invention, in one characterization, may be said to be directed to a radiopharmaceutical system. In some embodiments, the system may include a radioisotope elution component and a radio-frequency identification (RFID) tag coupled to the radioisotope elution component. Other embodiments may include a radiation shielded enclosure having an interior, an exterior, and a radio-frequency identification (RFID) communication transmission passage extending between the interior and the exterior.
    Type: Grant
    Filed: September 21, 2006
    Date of Patent: November 23, 2010
    Assignee: Mallinckrodt Inc.
    Inventors: Gary S. Wagner, Chad M. Gibson, Frank M. Fago
  • Patent number: 7838834
    Abstract: As an image forming method including comparison between images for three-dimensional image construction or the like and an apparatus for forming such images, there are provided an image forming method and an electron microscope capable of obtaining with high accuracy or efficiency information required for comparison. In the image forming method, an image is formed on the basis of comparison between a plurality of images obtained by applying an electron beam to a specimen at different tilt angles. The method includes obtaining a first transmission image with the electron beam applied in a first direction and a second transmission image with the electron beam applied in a second direction, the second transmission image being formed within a region different from a peripheral blurred region resulting from tilting, and making a search in the first transmission image by using the second transmission image.
    Type: Grant
    Filed: March 14, 2008
    Date of Patent: November 23, 2010
    Assignee: Hitachi-High Technologies Corporation
    Inventors: Isao Nagaoki, Yoshihiko Nakayama, Ryoichi Ishii
  • Patent number: 7838819
    Abstract: An apparatus of generating optical tweezers with momentum is provided for providing optical tweezers with a first momentum on a test piece. The apparatus comprises a laser source, a diffractive optical element (DOE) and a lens. The laser source is for outputting a laser beam. The DOE has a first phase-delay picture, and the laser beam forms a diffraction pattern after passing the first phase-delay picture. The lens is for receiving and focusing the diffraction pattern on the test piece to form the first optical tweezers with the first momentum. The lens has an optical axis intersecting the DOE at an optical intersection point, a geometric center of the phase-delay picture has a displacement vector relative to the optical intersection point and a direction of the first momentum is related to a direction of the displacement vector.
    Type: Grant
    Filed: January 24, 2008
    Date of Patent: November 23, 2010
    Assignee: Raydium Semiconductor Corporation
    Inventors: Long Hsu, Cheng-Hsien Liu, Sheng-Yang Tseng, Chung-Cheng Chou, Wai William Wang, Fung-Hsu Wu, Chen Peng, Ta-Yuan Lee
  • Patent number: 7838832
    Abstract: An apparatus for generating a dual-energy electron beam. The apparatus includes a first electron beam source configured to generate a lower-energy electron beam, and a second electron beam source configured to generate a higher-energy electron beam. The apparatus further includes a combining device for forming the dual-energy electron beam by combining the lower-energy and higher-energy electron beams. In addition, a first controllable electron-beam deflector is configured to provide a controllable offset of a first area illuminated by the lower-energy electron beam in relation to an image data collection area, and a second controllable electron-beam deflector configured to provide a controllable offset of a second area illuminated by the higher-energy electron beam in relation to the image data collection area. A moving stage and a time delay integration detection system are utilized. Other embodiments, aspects and features are also disclosed.
    Type: Grant
    Filed: June 6, 2008
    Date of Patent: November 23, 2010
    Assignee: KLA-Tencor Corporation
    Inventors: Marian Mankos, Vassil Spasov
  • Patent number: 7838853
    Abstract: A patterned beam of radiation is projected onto a substrate. A reflective optical element is used to help form the radiation beam from radiation emitted from a plasma region of a plasma source. In the plasma source, a plasma current is generated in the plasma region. To reduce damage to the reflective optical element, a magnetic field is applied in the plasma region with at least a component directed along a direction of the plasma current. This axial magnetic field helps limit the collapse of the Z-pinch region of the plasma. By limiting the collapse, the number of fast ions emitted may be reduced.
    Type: Grant
    Filed: December 14, 2006
    Date of Patent: November 23, 2010
    Assignee: ASML Netherlands B.V.
    Inventors: Vladimir Vitalevitch Ivanov, Vadim Yevgenyevich Banine, Konstantin Nikolaevitch Koshelev