Patents Examined by James Split
  • Patent number: 9176186
    Abstract: A wafer translator and a wafer, removably attached to each other, provides the electrical connection to electrical contacts on integrated circuits on a wafer in such a manner that the electrical contacts are substantially undamaged in the process of making such electrical connections. Various embodiments of the present invention provide a gasketless sealing means for facilitating the formation by vacuum attachment of the wafer/wafer translator pair. In this way, no gasket is required to be disposed between the wafer and the wafer translator. Air, or gas, is evacuated from between the wafer and wafer translator through one or more evacuation pathways in the gasketless sealing means.
    Type: Grant
    Filed: January 17, 2013
    Date of Patent: November 3, 2015
    Assignee: TRANSLARITY, INC.
    Inventors: Aaron Durbin, Morgan T. Johnson, Jose A. Santos
  • Patent number: 9151801
    Abstract: Provided is a measurement circuit that measures a signal under measurement input thereto, comprising a level comparing section that outputs a logic value according to a comparison result between a signal level of the signal under measurement and a set threshold level; a logic comparing section that acquires the logic value output by the level comparing section at a comparison timing input thereto; and a timing adjusting section that adjusts relative phases of a signal output by the level comparing section and the comparison timing, based on the expected value pattern of the signal under measurement and the threshold level.
    Type: Grant
    Filed: June 22, 2011
    Date of Patent: October 6, 2015
    Assignee: ADVANTEST CORPORATION
    Inventors: Masahiro Ishida, Kiyotaka Ichiyama
  • Patent number: 9151783
    Abstract: Methods and systems are described for monitoring and compensating an offset between a reference voltage used in a first device and a corresponding reference voltage used in a second device. The first device can include offset circuitry. The offset circuitry receives two voltage signals. The first voltage signal is equal to a first voltage value that is used as a reference voltage in the first device. The second voltage signal can be a time-varying voltage signal that has a known relationship with a second voltage value that is used as a reference voltage in the second device. The offset circuitry can then determine the second voltage value from the second voltage signal, and output an offset value based on a difference between the first voltage value and the second voltage value.
    Type: Grant
    Filed: April 26, 2012
    Date of Patent: October 6, 2015
    Assignee: SYNOPSYS, INC.
    Inventors: Edvard Mkrtchyan, Dino Anthony Toffolon, Adam Burns
  • Patent number: 9097746
    Abstract: An arrangement for use in a utility meter includes a switch, a processing circuit, and a magnetic element. The switch is supported on a first meter structure. The switch has at least a first and second state. The switch is configured to transition from a first state to a second state responsive to a detected magnetic field of a first polarity, and to transition from a second state to a first state responsive to a detected magnetic field of a second polarity. The processing circuit is operably coupled to determine whether the switch is in the first state or the second state. The magnetic element is supported on a second meter structure configured to be physically connected to the first meter structure, the magnetic element positioned such that removal of the second meter structure from the first meter structure causes the magnetic element to expose the switch to a magnetic field of the first polarity.
    Type: Grant
    Filed: September 2, 2011
    Date of Patent: August 4, 2015
    Assignee: Landis+Gyr, Inc.
    Inventor: Anibal Diego Ramirez
  • Patent number: 9092982
    Abstract: An apparatus for measuring speed of movement of an object deforming lines of Earth's magnetic field includes a first and second magnetometer disposed on either side of a traffic roadway for the object and substantially perpendicular to the object. The magnetometers are configured for measuring deformation of Earth's magnetic field by the object travelling over the roadway. The apparatus also includes a processing unit configured for extracting, from each of the magnetometers, a measurement value corresponding to a quotient defined by a distance of the object with respect to the magnetometer divided by a speed of movement of the object, and for calculating a speed of the object from the measurement values and a geometrical disposition of the magnetometers with respect to one another and with respect to the traffic roadway.
    Type: Grant
    Filed: January 7, 2011
    Date of Patent: July 28, 2015
    Assignee: Commissariat à l'énergie atomique et aux énergies alternatives
    Inventors: Antoine Robinet, Roland Blanpain
  • Patent number: 9052282
    Abstract: A water analysis measurement arrangement for determining a concentration of ions and/or ionic compounds in an aqueous medium includes a closed buffer solution housing comprising a pH buffer solution. The closed buffer solution housing is configured to communicate with the aqueous medium via an electrolyte bridge. A reference electrode is arranged in the closed buffer solution housing. An amplifier ground is disposed on a ground electrode and is configured to directly contact the aqueous medium. A high-impedance amplifier comprises a first capacitive element arranged between the reference electrode and the amplifier ground. An AC voltage generator is arranged between the amplifier ground and the ground electrode. A measurement electrode is configured to directly contact the aqueous medium.
    Type: Grant
    Filed: August 5, 2010
    Date of Patent: June 9, 2015
    Assignee: HACH LANGE GMBH
    Inventors: Michael Kussmann, Lothar Heidemanns, Andreas Jonak, Markus Hahn, Heinz Rudde, Claudia Rieger, Axel Leyer
  • Patent number: 9048782
    Abstract: Provided is a method for evaluating a solar cell incorporated into a solar module. A PL evaluation step is performed. The PL evaluation step is a step for evaluating the solar cell to be evaluated among a plurality of solar cells (10) by illuminating the solar cell (10) with light from a light source (20) and detecting the intensity of photoluminescent light (L2) emitted by the solar cell (10). The light is irradiated while a light-blocking member (21) is provided between the solar module (1) and the light source (20) so that light from the light source (20) is not incident on portions of the solar module other than the solar cell (10) to be evaluated.
    Type: Grant
    Filed: October 17, 2013
    Date of Patent: June 2, 2015
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventor: Toshiaki Baba
  • Patent number: 9013193
    Abstract: An object of the present invention is to accurately detect concentrations of mixtures in a fluid. An internal electrode 23 is disposed on the inner side of an external electrode 22 coaxially with the external electrode 22, and a plurality of points in the length direction of the internal electrode 23 are supported by a casing 21 via supporting members 28a and 28b. The state of a fluid S passing through a passage 26 between the external electrode 22 and the internal electrode 23 is detected based on electrostatic capacitance between the external electrode 22 and the internal electrode 23.
    Type: Grant
    Filed: May 8, 2012
    Date of Patent: April 21, 2015
    Assignee: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Takashi Tsuruta, Kazuhiro Nishikawa, Koichi Kubota, Takuto Shibayama
  • Patent number: 9007057
    Abstract: The device to measure the absolute rotation angle of a rotating shaft includes a rotating disc, fixed to the shaft. A group of permanent magnets of different sizes and polarities is disposed on a circular track. Further, a group of Hall sensors, fixed to a static part of the device, are disposed on a circular path, in proximity of the rotating disc magnets tracks, and generate electric signals proportional to the strength of the magnetic field produced by the magnets in proximity. The signs of these electric signals are used to calculate a code characteristic of a low resolution absolute angular position. Two analog signals are associated to the obtained code, according to a predefined table. The associated analog signal having the closest value to zero is used as an entry to a pre-recorded table containing the correspondent angular position of the shaft.
    Type: Grant
    Filed: April 30, 2012
    Date of Patent: April 14, 2015
    Assignee: Servosence (SMC) Ltd.
    Inventor: Yves Villaret
  • Patent number: 9000789
    Abstract: A method for testing a plurality of semiconductor apparatuses, the method including mounting a plurality of semiconductor apparatuses on a first test board, wherein the plurality of semiconductor apparatuses include test circuits, loading test software into the test circuits, performing, by using the test circuits, self-tests on the plurality of semiconductor apparatuses based on the test software, and removing the plurality of semiconductor apparatuses, which have completed the self-tests, from the first test board. Upon completion of the loading of the test software, the test software is loaded into test circuits of a plurality of semiconductor apparatuses on a second test board, while the self-tests are performed on the plurality of semiconductor apparatuses on the first test board.
    Type: Grant
    Filed: September 22, 2011
    Date of Patent: April 7, 2015
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Eun-sik Kim, Kil-yeon Kim, Yun-bo Yang, Kui-hyun Ro, Heon-gwon Lee, Young-jae Jung
  • Patent number: 8994390
    Abstract: A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through the probe wires from the probe card, for example, through a circuit board to other diagnostic equipment. The contact of the probe card with the circuit board allows signals to be transferred through the probe wires to the other diagnostic equipment. On another side of the probe card is a connector structure. The connector structure includes a retainer that can allow the probe card to be replaced from a test system, such as allowing it to be connected and disconnected from a holder.
    Type: Grant
    Filed: July 6, 2012
    Date of Patent: March 31, 2015
    Assignee: Celadon Systems, Inc.
    Inventors: Bryan J. Root, William A. Funk, John L. Dunklee
  • Patent number: 8988088
    Abstract: Disclosed is a liquid immersion sensor comprising a substrate (10) carrying a conductive sensing element (20) and a corrosive agent (30) for corroding the conductive sensing element, said corrosive agent being immobilized in the vicinity of the conductive sensing element and being soluble in said liquid.
    Type: Grant
    Filed: November 29, 2010
    Date of Patent: March 24, 2015
    Assignee: Quotainne Enterprises LLC
    Inventors: Aurelie Humbert, Matthias Merz, Roel Daamen, Youri Victorovitch Ponomarev
  • Patent number: 8957676
    Abstract: An integrated magnetic field sensor includes a magnetic field sensing element configured to generate a magnetic field sensing element output signal in response to a magnetic field. The integrated magnetic field sensor also includes a threshold control node configured to receive a control signal from outside of the integrated magnetic field sensor, wherein the integrated magnetic field sensor is configured to provide an adjustable threshold signal in response to the control signal. The integrated magnetic field sensor also includes a comparator having a first input node coupled to receive a first signal representative of the magnetic field sensing element output signal, a second input node coupled to receive a second signal representative of the adjustable threshold signal, and an output node at which is generated an output signal responsive to the first and second signals.
    Type: Grant
    Filed: May 6, 2011
    Date of Patent: February 17, 2015
    Assignee: Allegro Microsystems, LLC
    Inventors: Paul David, Andreas P. Friedrich, Gary T. Pepka, Nevenka Kozomora
  • Patent number: 8941387
    Abstract: An electrical waveform is received over an electrical power line. A plurality of nominal electrical parameters are determined for the electrical power network and the plurality of nominal electrical parameters are associated with a state of the electrical power network in the absence of at least one transitory electrical fault in the network. Subsequently, a plurality of electrical parameters of the electrical waveform are sampled when the at least one transitory electrical fault exists in the network. A plurality of inductances are determined based at least in part upon a comparison of the nominal electrical parameters and the plurality of sampled electrical parameters. The plurality of inductances are representative of inductances present in the network when the at least one transitory electrical fault exists in the network. The plurality of inductances are analyzed to determine a distance and/or direction to the at least one electrical fault.
    Type: Grant
    Filed: October 12, 2010
    Date of Patent: January 27, 2015
    Assignees: Howard University, San Diego Gas & Electric Company
    Inventor: Charles Kim
  • Patent number: 8937476
    Abstract: A sensor device includes first and second electrodes, a coating film and a functional element. The first electrode includes a first metallic material in which either a first passivation film forms on a surface thereof or the first passivation film present on the surface thereof is lost, in association with changes in the pH of a measurement site. The second electrode includes a second metallic material different from the first metallic material, and is spaced apart from the first electrode. The coating film includes a third metallic material different from the first and second metallic materials. The coating film covers at least the first or second electrode. The functional element is configured to measure a difference in electric potential between the first and second electrodes that changes depending on presence or absence of each of the first passivation film and the coating film in association with the changes in pH.
    Type: Grant
    Filed: March 22, 2012
    Date of Patent: January 20, 2015
    Assignee: Seiko Epson Corporation
    Inventors: Juri Kato, Takao Miyazawa
  • Patent number: 8912805
    Abstract: Device for processing and measuring properties of a moving rod of material of the tobacco processing industry includes a microwave resonator structured and arranged so that the rod of material is conveyable through the microwave resonator. Includes microwave generator with output frequency f0, and frequency stabilized oscillator to generate intermediate frequency fIM that is less than f0. Single sideband modulator supplies microwave resonator with a sideband signal having a sideband frequency shifted with respect to output frequency f0 by intermediate frequency fIM, and at least one analysis arrangement includes single sideband demodulator, low-pass filter, and analog to digital converter arranged in series. Single sideband demodulator receives a measurement signal of the sideband frequency transmitted or reflected from the microwave resonator, and receives output frequency f0.
    Type: Grant
    Filed: September 23, 2011
    Date of Patent: December 16, 2014
    Assignee: Hauni Maschinenbau AG
    Inventor: Dierk Schroeder
  • Patent number: 8907696
    Abstract: There is provided a test apparatus for testing a device under test, including a test signal generator that generates a test signal to test the device under test, an electric-photo converter that converts the test signal into an optical test signal, an optical interface that (i) transmits the optical test signal generated by the electric-photo converter to an optical receiver of the device under test and (ii) receives and outputs an optical response signal output from the device under test, a photo-electric converter that converts the optical response signal output from the optical interface into an electrical response signal and transmits the electrical response signal, and a signal receiver that receives the response signal transmitted from the photo-electric converter and a test method.
    Type: Grant
    Filed: March 1, 2011
    Date of Patent: December 9, 2014
    Assignee: Advantest Corporation
    Inventor: Shin Masuda
  • Patent number: 8884629
    Abstract: A digital sensing device includes a sensor diagnostic system for detecting sensor fault conditions. The sensor diagnostic system including an input multiplexer applying a first burnout current or a second burnout current to a selected input channel and a near-rail detector configured to detect when an input voltage of the digital sensing device is near a positive power supply or near a negative power supply. The burnout current injection is applied without interfering with the sensor data. In other embodiments, the sensor diagnostic system may further include an overload detector configured to detect an overflow or underflow condition at the analog-to-digital converter. The sensor diagnostic system may further include a window comparator to detect when the ADC digital output is near a zero digital value. Finally, the sensor diagnostic system may further include a sensor flag generator to generate data flags indicative of sensor fault conditions.
    Type: Grant
    Filed: May 9, 2011
    Date of Patent: November 11, 2014
    Assignee: National Semiconductor Corporation
    Inventors: D V J Ravi Kumar, Theertham Srinivas, Gururaj Ghorpade
  • Patent number: 8860399
    Abstract: A monitoring device is for monitoring physical characteristics of a building material. The monitoring device is buried inside a block of the building material, and has a sensor to sense physical characteristics thereof. The sensor transmits a signal representative of the physical characteristics.
    Type: Grant
    Filed: September 23, 2011
    Date of Patent: October 14, 2014
    Assignee: STMicroelectronics S.R.L.
    Inventors: Giovanni Girlando, Alessandro Finocchiaro
  • Patent number: 8854035
    Abstract: A magnetic type rotation detection device may include a magnet body formed with a magnetic pole pair comprised of an “S”-pole and an “N”-pole and provided on a rotation body, a magnetic sensing element facing the magnet body in a rotation center axial line direction of the rotation body, a partition member disposed between the magnet body and the magnetic sensing element, and a ring fixed to a face of the partition member on a side where the magnet body is located. A center of the magnetic sensing element may be located on a center axial line of the ring. The magnet body may be disposed on an inner side of the ring in a non-contact state with the ring. A center of the magnet body may be located on the center axial line of the ring.
    Type: Grant
    Filed: September 2, 2009
    Date of Patent: October 7, 2014
    Assignee: Nidec Sankyo Corporation
    Inventors: Haruhiro Tsuneta, Keiji Osada, Syungo Yasaki, Tomomi Akahane