Abstract: A method for characterizing gas emissions includes sampling each of a plurality of sectors having a common geographic center. For each sector, a first laser beam is transmitted from the geographic center to a first retroreflection location, where it is retroreflected into a first retroreflected beam. Near the geographic center, the first retroreflected beam is measured to obtain a first absorption. A second laser beam is then transmitted from the geographic center to a second retroreflection location, where it is retroreflected into a second retroreflected beam. Near the geographic center, the second retroreflected beam is measured to obtain a second absorption. The first and second retroreflection locations are both located within the same sector. First and second concentrations are determined from the first and second absorptions and processed to determine emission information about a known or potential gas source whose source lies within the sector.

Abstract: A method, system, and device evaluate a gemstone using a gemstone imaging and evaluation device. The method includes capturing a plurality of training images of a plurality of gemstones using an image capturing device having a plurality of different focal settings, training a machine learning module using the plurality of training images, capturing a query image of a gemstone, analyzing the query image using the trained machine learning module, identifying a selected feature of the gemstone within the query image, and outputting a notification of the identified selected feature. The system and the gemstone imaging and evaluation device implement the method.

Abstract: The present disclosure provides a gas sensor, including a shell with a receiving cavity, an infrared transmitter, an acoustic sensor and a partition plate accommodated in the receiving cavity. The partition plate is connected with the substrate and the side wall, the partition plate divides the receiving cavity into a first receiving cavity and a second receiving cavity, the acoustic sensor is located in the first receiving cavity, the infrared transmitter is located in the second receiving cavity. Compared with the related art, the gas sensor disclosed by the present disclosure could improve the sensitivity of the product.

Abstract: An online detection device underwater elements includes an LIBS system in a sealing pressure chamber and an external airflow control system. The airflow control system has a gas probe bin and a gas source. An opening is formed at one end of the gas probe bin while the other end and the sealing pressure chamber are hermetically partitioned through a glass window. A laser in the LIES system outputs laser to an underwater object surface to be detected for generating plasma spectra. A spectrometer collects plasma spectra returned along an original optical path. When the device operates in water, the balance gas storage tank produces gas with the same pressure as underwater. A flow model is invoked according to the current water pressure to accurately control the air flow rate to form a stable gas environment in the gas probe, which improves the plasma excitation and collection efficiency.

Abstract: A method includes controlling a gloss channel of a color measurement apparatus to measure a surface gloss of a color sample to generate a gloss value for the color sample. A color channel of the color measurement apparatus is controlled to measure a reflectance spectrum of the color sample to generate a first plurality of reflectance values for the color sample under a first measurement geometry. The first plurality of reflectance values are converted to a second plurality of reflectance values representing the reflectance spectrum of the color sample under a second measurement geometry, different from the first measurement geometry. The converting utilizes an adjustment that is a function of the gloss value.

Abstract: It is known for a product to be mass produced by way of a manufacturing process. Typically, a quality control step is used in a manufacturing process to monitor the quality of manufactured products. However, quality control procedures in manufacturing are typically labour intensive. A technician or other person must inspect the product and carry out any necessary tests. The present disclosure provides a surface roughness measurement system and method for determining a surface roughness of a product with an imaging system, a coherent light source, a light sensor and several trained machine learning algorithms.

Abstract: A method for inspecting a joint portion between fluororesin members, including: a step (A1) of inspecting an internal condition of a joint portion between a fluororesin member (A1) and a fluororesin member (A2) based on image data obtained by imaging the joint portion by optical coherence tomography. Also disclosed is a method for inspecting a fluororesin member, including: a step (B1) of inspecting a defect inside a fluororesin member (B1) based on image data obtained by imaging the fluororesin member (B1) by optical coherence tomography.

Abstract: Described is a metrology system for determining a characteristic of interest relating to at least one structure on a substrate, and associated method. The metrology system comprises a processor being configured to computationally determine phase and amplitude information from a detected characteristic of scattered radiation having been reflected or scattered by the at least one structure as a result of illumination of said at least one structure with illumination radiation in a measurement acquisition, and use the determined phase and amplitude to determine the characteristic of interest.

Abstract: An image processing apparatus includes one or more computer-readable storage media, and one or more processors, wherein the one or more processors and the one or more computer-readable storage media are configured to: acquire image data acquired by capturing an image of an object, acquire distance information about a distance from an imaging apparatus, by which the captured image of the object is captured, to the object, acquire an optical profile representing an attribute of an image reflected on a surface of the object based on the image data and the distance information, and evaluate a state of the surface of the object based on the optical profile.

Abstract: A multi-purpose in-situ contamination sampler includes an inner frame surrounded by a plurality of removable or attachable pieces, each of which include of a single witness surface configured to collect both particulate and molecular contamination within an environment on a payload or a spacecraft.

Abstract: System and apparatus for robust, portable gas detection. Specifically, this disclosure describes apparatuses and systems for optical gas detection in a compact package using two optical pathways. There is a need for a very compact, low-power, gas detection system for gases such as CO2, NOx, water vapor, methane, etc. This disclosure provides an ultra-compact and highly stable and efficient optical measurement system based on principals of optical absorption spectroscopy using substantially collinear pathways.

Abstract: Aspects of the disclosure provide for automated self-inspection by an OCT imaging engine or device, to identify and resolve failures or inefficiencies in the hardware and/or software of the system or device during imaging. An OCT imaging engine can include a catheter connection check system for checking the quality of a physical connection point between a catheter and other components of an OCT imaging device or system. In some examples, the OCT imaging engine includes a self-inspection engine implemented to perform routine self-inspection by using a reference reflector internal to the OCT imaging engine to generate system performance data. The OCT imaging engine can use the system performance data to periodically search for and resolve failures or inefficiencies in the system. The OCT imaging engine can perform a self-calibration process to perform k-linearization and/or correct for chromatic dispersion using mirror measurements collected from an internal reference reflector.

Abstract: A method and system for the suppression and/or modulation of absorption spectrum artifacts for the purpose of gas detection and concentration measurements using at least one magnetic, electric or electromagnetic field. A field applied selectively to at least one section of the system modulates absorption by influencing quantum energy state transitions of gas species.

Abstract: Embodiments of the present disclosure generally relate to systems and methods for in-line measurement of alkali metal-containing structures or alkali ion-containing structures of, e.g., electrodes. In an embodiment, a system for processing an electrode is provided. The system includes a first processing chamber for forming an electrode comprising an alkali metal-containing structure. The system further includes a metrology station coupled to and in-line with the first processing chamber, the metrology station comprising: a source of radiation for delivering radiation to the alkali metal-containing structure, and an optical detector for receiving an emission of radiation emitted from the alkali metal-containing structure, and a processor configured to determine a characteristic of the alkali metal-containing structure of the electrode based on the emission of radiation.

Abstract: A system and method indicate capability for detecting methane leaks inside buildings. This approach provides the ability to detect methane behind high efficiency coated windows and can extract methane concentration (rather than concentration-path length product CL). Lock-in imaging technologies can facilitate lower laser transmitter power. A field deployable, hand held prototype sensor for use in remote sensing a appropriate standoff distances can support operational testing. Distance infrared imaging of methane is feasible. Fully characterized real time image of a methane cloud offers operational advantages in accuracy and safety as compared to current sensors.

Abstract: A particle detection system may include a light source, a first beam splitter, a particle interrogation zone, a reflecting surface, a second beam splitter, a first photodetector, and a second photodetector. The first beam splitter may be configured to split the source beam into an interrogation beam and a reference beam. The particle interrogation zone may be disposed in the path of the interrogation beam. The reflecting surface may be configured to reflect the interrogation beam back on itself. The second beam splitter may be configured to: (i) receive the reference beam and side scattered light from one or more particles interacting with the interrogation beam in the particle interrogation zone; and (ii) produce a first component beam and second component beam. The first photodetector may be configured to detect the first component beam. The second photodetector may be configured to detect the second component beam.

Abstract: A device may receive a master data set for a first spectroscopic model; receive a target data set for a target population associated with the first spectroscopic model to update the first spectroscopic model; generate a training data set that includes the master data set and first data from the target data set; generate a validation data set that includes second data from the target data set and not the master data set; generate, using cross-validation and using the training data set and the validation data set, a second spectroscopic model that is an update of the first spectroscopic model; and provide the second spectroscopic model.

Abstract: Aspects of the present disclosure include methods for spectrally resolving light from fluorophores having overlapping fluorescence spectra in a sample. Methods according to certain embodiments include detecting light with a light detection system from a sample having a plurality of fluorophores having overlapping fluorescence spectra and spectrally resolving light from each fluorophore in the sample. In some embodiments, methods include estimating the abundance of one or more of the fluorophores in the sample, such as on a particle. In certain instances, methods include identifying the particle in the sample based on the abundance of each fluorophore and sorting the particle. Methods according to some embodiments includes spectrally resolving the light from each fluorophore by calculating a spectral unmixing matrix for the fluorescence spectra of each fluorophore. Systems and integrated circuit devices (e.g., a field programmable gate array) for practicing the subject methods are also provided.

Abstract: A method of correcting a misalignment of a wafer on a wafer holder and an apparatus for performing the same are disclosed. In an embodiment, a semiconductor alignment apparatus includes a wafer stage; a wafer holder over the wafer stage; a first position detector configured to detect an alignment of a wafer over the wafer holder in a first direction; a second position detector configured to detect an alignment of the wafer over the wafer holder in a second direction; and a rotational detector configured to detect a rotational alignment of the wafer over the wafer holder.

Abstract: Devices are provided for indicating a moisture content of a substance such as soil. In an example, a device for indicating a moisture content of soil includes a stem configured to be inserted into the soil and an indicator coupled to the stem and configured to visually indicate the moisture content of the soil, the stem and the indicator each comprised of an absorbent material and at least the indicator including hydrochromic ink on the absorbent material.