Patents Examined by Jamil Ahmed
  • Patent number: 11181470
    Abstract: The present technology relates to a sensing system, a sensing method, and a sensing device which are capable of performing measurement with higher accuracy. A sensing system is configured such that a plurality of reference reflection regions having a reflectance corresponding to an inspection target are prepared for each wavelength band which is a target for sensing of the inspection target as reference reflection regions, and is configured to sense the reference reflection region having a reflectance corresponding to the inspection target for each wavelength band which is a target for sensing of the inspection target at the time of sensing a region including the inspection target and the reference reflection region. The present technology can be applied to a system for measuring a vegetation index such as a normalized difference vegetation index (NDVI).
    Type: Grant
    Filed: June 12, 2017
    Date of Patent: November 23, 2021
    Assignee: Sony Group Corporation
    Inventor: Masatoshi Takashima
  • Patent number: 11181472
    Abstract: A device and a process detects alcohol in a gas sample, especially in an exhaled breath sample. A measuring chamber (2) receives the gas sample to be tested. Two IR radiation sources (7, 11) are configured to transmit an IR beam each into the measuring chamber (2). Two IR detectors (9, 13) generate a measured value each depending on an incident IR beam. An analysis unit (10) automatically makes a decision on whether or not the gas sample contains alcohol, doing so depending on the two measured values from the two IR detectors (9, 13).
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: November 23, 2021
    Assignee: Dräger Safety AG & Co. KGaA
    Inventors: Burkhard Stock, Malte Baesler
  • Patent number: 11183374
    Abstract: There is provision of a plasma processing apparatus including a chamber; a gas inlet for supplying a first gas containing fluorine and supplying a second gas into the chamber; a plasma generator configured to generate a plasma from the first gas and the second gas supplied into the chamber; an optical emission spectrometer (OES) configured to measure light emission intensities of first radicals and second radicals in the plasma, the first radicals originating from the first gas, the second radicals originating from the second gas; an expendable part disposed in the chamber; and a processor configured to determine a wastage rate of the expendable part based on the measured light emission intensities of the first radicals and the second radicals.
    Type: Grant
    Filed: July 22, 2020
    Date of Patent: November 23, 2021
    Assignee: Tokyo Electron Limited
    Inventors: Shu Kusano, Yusuke Hirayama
  • Patent number: 11175182
    Abstract: Provided is a spectral imaging apparatus. The spectral imaging apparatus includes: an optical filter including a plurality of band filter units having different center wavelengths; a sensing device configured to receive light passing through the optical filter; an imaging lens array including a plurality of lens units which respectively correspond to the plurality of band filter units and each implement imaging on the sensing device; and a transparent substrate which is apart from the sensing device. At least one of the optical filter and the imaging lens array is provided on the transparent substrate.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: November 16, 2021
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hyochul Kim, Younggeun Roh, Yeonsang Park, Suyeon Lee
  • Patent number: 11162777
    Abstract: A wafer alignment apparatus includes a light source, a light detection device, and a rotation device configured to rotate a wafer. The light source is configured to provide a light directed to the wafer. The light detection device is configured to detect reflected light intensity from the wafer to locate at least one wafer alignment mark of wafer alignment marks separated by a plurality of angles. At least two of those angles are equal.
    Type: Grant
    Filed: December 23, 2019
    Date of Patent: November 2, 2021
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Wei-Hsiang Tseng, Chin-Hsiang Lin, Heng-Hsin Liu, Jui-Chun Peng, Ho-Ping Chen
  • Patent number: 11156563
    Abstract: An electronic device for optically checking an appearance of products for defects includes a camera device, at least one white light source, and at least one red light source. The camera device is perpendicular to a side surface of a product to be checked, when the white light source is activated, the camera device captures images of the side surface and corners of the side surface of the product. When the red light source is activated, the camera device captures images of the side surface of the product. The electronic device checks for defects in appearance of the side surface of the product according to the images captured by the camera device, such defects including abnormal colors, stair slope errors, scratches, and sanding marks.
    Type: Grant
    Filed: April 29, 2020
    Date of Patent: October 26, 2021
    Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.
    Inventors: Liu-Bin Hu, Bin Zou, Zhi-Cheng Huang
  • Patent number: 11156549
    Abstract: Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving location 2 for receiving a sample 3 for analysis; an illumination arrangement 4 for directing light towards a received sample; a detector 6 for detecting light reflected by a received sample; and collection optics 5 for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer 42 and a half beam block 45a, 45b which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer.
    Type: Grant
    Filed: October 9, 2019
    Date of Patent: October 26, 2021
    Assignee: PerkinElmer Singapore PTE Limited
    Inventors: Ralph Lance Carter, Robert Alan Hoult
  • Patent number: 11156565
    Abstract: Provided is a method for inspecting a semiconductor device which performs an inspection of a semiconductor device as an object to be inspected, including attaching an adhesive tape to a surface to be inspected of the semiconductor device, acquiring a first pattern image based on a light detected from a region including a surface of the surface to be inspected to which the adhesive tape is attached, inputting an electrical signal to the semiconductor device to which the adhesive tape is attached, acquiring a first heat generation image by detecting light according to heat radiation from the region including the surface to which the adhesive tape is attached in a state in which the electrical signal is input, and superimposing the first pattern image and the first heat generation image.
    Type: Grant
    Filed: May 14, 2018
    Date of Patent: October 26, 2021
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toru Matsumoto, Kazushige Koshikawa
  • Patent number: 11156555
    Abstract: The present application discloses a spectroscopy probe for a Raman spectroscopy system, and methods for preparing filters for the probe. A method for forming an SERS substrate which can optionally be used with the probe is also described. The spectroscopy probe is formed using a double-clad optical fibre probe tip, the double-clad optical fibre (DCF) having a single mode core, multimode inner cladding, and outer cladding, and a micro-filter fixed to the distal end of the optical fibre probe tip. The micro-filter has a short pass or band pass filter configured to align with the DCF core to filter silica Raman background generated by laser excitation in the single mode core, and a long pass filter configured to suppress Rayleigh scattering from the sample while allowing Raman scattered wavelengths to be transmitted through the inner cladding.
    Type: Grant
    Filed: January 25, 2019
    Date of Patent: October 26, 2021
    Assignees: Swinburne University of Technology, Vanderbilt University
    Inventors: Md Abdullah Al Mamun, Paul Randall Stoddart, Anita Mahadevan-Jansen, Nerida Anne Cole
  • Patent number: 11150191
    Abstract: An apparatus comprises: a photonic cavity; a substrate comprising a waveguide layer, wherein the waveguide layer comprises waveguides configured to direct light towards the photonic cavity; and a wafer comprising: a top side, and a nanowire array affixed to the top side. A method of performing a surface-enhanced Raman scattering (SERS) analysis, the method comprises: directing, using a waveguide layer of a SERS device, an incident light towards a photonic cavity of the SERS device; permitting, using the photonic cavity, a fluid to flow freely into and out of the SERS device; causing, within the photonic cavity, an interaction among the incident light, the fluid, and a nanowire array of the SERS device to create scattered light; converting the scattered light into an electrical signal; and analyzing the electrical signal to determine whether a contaminant exists in the fluid.
    Type: Grant
    Filed: February 28, 2020
    Date of Patent: October 19, 2021
    Assignee: The Board of Regents of the University of Oklahoma
    Inventors: Binbin Weng, Mark A. Nanny, Joseph M. Suflita, Rouzbeh Ghanbarnezhad Moghanloo
  • Patent number: 11143759
    Abstract: An investigative system, comprising: an emitter, said emitter being adapted to output a plurality of pulses, said plurality of pulses being arranged in a first temporal pattern; a receiver adapted to receive said plurality of pulses; and a correlator adapted to correlate the first pattern with the received plurality of pulses to output a correlated pattern.
    Type: Grant
    Filed: November 8, 2019
    Date of Patent: October 12, 2021
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Richard Mark Stevenson, Jan Huwer, Andrew James Shields
  • Patent number: 11135588
    Abstract: A device for manipulating microdroplets using optically-mediated electrowetting comprising: a first composite wall comprising: a first transparent substrate; a first transparent conductor layer on the substrate having a thickness of 70 to 250 nm; a photoactive layer activated by electromagnetic radiation in the wavelength range 400-1000 nm on the conductor layer having a thickness of 300-1000 nm; and a first dielectric layer on the conductor layer having a thickness of 120-160 nm; a second composite wall comprised of: a second substrate; a second conductor layer on the substrate having a thickness of 70 to 250 nm; and an A/C source to provide a voltage across the first and second composite walls connecting the first and second conductor layers; at least one source of electromagnetic radiation having an energy higher than the bandgap of the photoexcitable layer; and means for manipulating the points of impingement of the electromagnetic radiation on the photoactive layer.
    Type: Grant
    Filed: June 21, 2018
    Date of Patent: October 5, 2021
    Assignee: LIGHTCAST DISCOVERY LTD
    Inventors: Thomas Henry Isaac, Pedro Cunha, Eoin Sheridan, David Love, Rebecca Palmer, Douglas J. Kelly, Gareth Podd
  • Patent number: 11125698
    Abstract: Provided is a method for inspecting a semiconductor device which performs an inspection of a semiconductor device as an object to be inspected, including attaching an adhesive tape to a surface to be inspected of the semiconductor device, acquiring a first pattern image based on a light detected from a region including a surface of the surface to be inspected to which the adhesive tape is attached, inputting an electrical signal to the semiconductor device to which the adhesive tape is attached, acquiring a first heat generation image by detecting light according to heat radiation from the region including the surface to which the adhesive tape is attached in a state in which the electrical signal is input, and superimposing the first pattern image and the first heat generation image.
    Type: Grant
    Filed: May 14, 2018
    Date of Patent: September 21, 2021
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Toru Matsumoto, Kazushige Koshikawa
  • Patent number: 11125647
    Abstract: In some examples, fiber optic virtual sensing may include generating, by a virtual sensor generator that is operatively connected to a device under test (DUT), at least one virtual sensor along the DUT. A DUT interrogator may be operatively connected to the DUT to transmit a stimulus optical signal into the DUT. The DUT interrogator may analyze reflected light resulting from the transmitted stimulus optical signal. The DUT interrogator may determine, based on the analysis of the reflected light, an attribute of the DUT sensed by the at least one virtual sensor.
    Type: Grant
    Filed: June 24, 2019
    Date of Patent: September 21, 2021
    Assignee: VIAVI SOLUTIONS FRANCE SAS
    Inventor: Andre Champavere
  • Patent number: 11125697
    Abstract: A transfer state inspection system including a camera configured to capture a transfer state of a transfer material of any of solder, flux, conductive paste, or adhesive transferred to multiple terminals on a lower surface of an electronic component; an image processing section configured to process an image captured by the camera to recognize the transfer state of the transfer material such that the transfer state inspection system inspects the transfer state of the transfer material based on a recognition result of the image processing section; an inspection target specifying section configured to specify whether inspection is necessary for at least a portion of the terminals among the multiple terminals on the lower surface of the electronic component via an operation from an operator or a production program; and an inspection executing section configured to not inspect the transfer state of the transfer material for terminals specified as unnecessary.
    Type: Grant
    Filed: May 12, 2017
    Date of Patent: September 21, 2021
    Assignee: FUJI CORPORATION
    Inventors: Takahiro Kobayashi, Hiroshi Oike, Kazuya Kotani
  • Patent number: 11125693
    Abstract: A surface enhanced infrared absorption stage may include a substrate, a static island extending from the substrate and a movable nano finger extending from the substrate. The static island may have a plasmonically active island cap and a dimension parallel to the substrate of at least one micrometer. The movable nano finger may be aligned with the dimension. The movable nano finger may have a plasmonically active finger cap closable to less than or equal to 5 nm of the island cap.
    Type: Grant
    Filed: January 31, 2017
    Date of Patent: September 21, 2021
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Fausto D'Apuzzo, Aleksandr Polyakov, Anita Rogacs
  • Patent number: 11119022
    Abstract: An optical analysis device includes a light source, a beam shaping unit, a relative movement unit, a photodetector, and a position detector. The light source unit generates a light beam. The beam shaping unit forms a flat beam portion. The relative movement unit is configured to cause the flat beam portion and a test sample including marker particles to relatively move in a minor axis direction of the flat beam portion. The photodetector is configured to detect a light intensity and a light emitting position in a plane orthogonal to the minor axis direction. The position detector is capable of detecting spatial positions of the marker particles on the basis of information on a relative movement amount of the flat beam portion, information on the light intensity and the light emitting position, and a change of the light intensity generated according to a relative movement of the flat beam portion.
    Type: Grant
    Filed: September 26, 2019
    Date of Patent: September 14, 2021
    Assignee: OLYMPUS CORPORATION
    Inventors: Mitsushiro Yamaguchi, Tetsuya Tanabe
  • Patent number: 11119036
    Abstract: A sensor arrangement (50) encompasses a reaction subassembly (72) having a housing (52) and having a detector subassembly (54), there being provided in the housing (52) a layered component arrangement (60) that encompasses: a luminophore-containing reaction laminate (62) that is excitable, by irradiation with a first electromagnetic radiation of a first wavelength, to emit a second electromagnetic radiation of a second wavelength different from the first wavelength; and a temperature-detection laminate (64) emitting an infrared radiation; the housing (52) comprising an opening (78a, 78b) through which a fluid is introducible; the housing (52) comprising a reaction window (66a) and a temperature-sensing window (66b) arranged physically remotely therefrom; the one reaction window (66a) transmitting the first (E1) and the second electromagnetic radiation (E2); and the temperature-sensing window (66b) being penetrable by infrared radiation (I); the detector subassembly (54) encompassing: a radiation source (
    Type: Grant
    Filed: March 6, 2018
    Date of Patent: September 14, 2021
    Assignee: HAMILTON BONADUZ AG
    Inventors: Marco Giardina, Bernd Offenbeck, Christoph Schranz, Thomas Laubscher, Dominik Novotni, Dirk Schönfuss
  • Patent number: 11118898
    Abstract: A method for producing a preparation for fiber length measurement includes: a preliminary dispersion process of adding fibers and a dispersion medium with a viscosity of 500 Pa·s to 10,000 Pa·s to a sealable container so as to give a concentration of the fibers of 0.1% by mass or less and shaking the container to prepare a preliminary dispersion liquid; a dispensing process of dispensing part of the preliminary dispersion liquid to another sealable container; a dilution process of adding the dispersion medium to the dispensed preliminary dispersion liquid so as to give a concentration of the fibers of 0.005% by mass or less and shaking the container to prepare a dispersion liquid for measuring fiber length; and a casting process of spreading part of the dispersion liquid for measuring fiber length onto a base having light transparency.
    Type: Grant
    Filed: October 2, 2018
    Date of Patent: September 14, 2021
    Assignees: NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH SYSTEM, TORAY INDUSTRIES, INC., AISIN SEIKI KABUSHIKI KAISHA, KYOWA INDUSTRIAL CO., LTD
    Inventors: Mariko Terada, Atsuhiko Yamanaka, Yukitane Kimoto, Koji Shiraki, Yuji Hotta, Daisuke Shimamoto
  • Patent number: 11112353
    Abstract: A residual toxicant detection device for testing residual toxicant in an aqueous solution is disclosed, which includes a first space cavity, a second space cavity, a connecting frame and a sensing cavity. The first space cavity includes a light source and a lens. The second space cavity includes a photo sensor and a circuit module. The connecting frame is configured to connect the first space cavity and the second space cavity. The sensing cavity for receiving an aqueous solution is formed between the first space cavity and the second space cavity and at one side of the connecting frame. The light source emits a light with a wavelength range. The photo sensor receives the sensing signal of the light passing through the sensing cavity. The circuit module is configured to calculate the absorbance and the variation in absorbance of the residual toxicants in the aqueous solution.
    Type: Grant
    Filed: December 27, 2019
    Date of Patent: September 7, 2021
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Chih-Hao Hsu, Jui-Hung Tsai, Ying-Hao Wang, Chia-Jung Chang