Patents Examined by Jamil Ahmed
  • Patent number: 10529209
    Abstract: The present invention provides a dust sensor comprising an impactor assembly for passing only relatively small particles among particles contained in air; a light emitting unit for radiating light in a path through which the air introduced through the impact assembly passes; and a light receiving unit for receiving light scattered from particles included in the air passing through the path. The impact assembly may comprise an upper case, a first impactor, and a second impactor. The upper case may include an inlet and an outer downward protruding portion. The first impactor may include a central downward depression and a plurality of slots. The second impactor may include an outlet, a central upward protruding portion, a double-bent portion, an outer upward protruding portion and a guide portion.
    Type: Grant
    Filed: August 9, 2018
    Date of Patent: January 7, 2020
    Inventor: Inwoo Lee
  • Patent number: 10530992
    Abstract: The present invention provides a detection method, a detection system, and a detection device for flexible substrate; and the detection method comprises: obtaining the light intensity distribution by parallel light with the same intensity transmitted through the flexible substrate; finding a difference point of light intensity from the light intensity distribution; obtaining a position of the difference point of light intensity corresponding to the flexible substrate, and the position is treated as an abnormal position in the flexible substrate. Wherein the difference point of light intensity is a point where the light intensity is different from the light intensity of the surrounding area. The abnormal positions can be obtained by the detection method of the present invention.
    Type: Grant
    Filed: January 16, 2017
    Date of Patent: January 7, 2020
    Assignee: Wuhan China Star Optoelectronics Technology Co., Ltd
    Inventor: Chun Zhang
  • Patent number: 10527410
    Abstract: [Object] To provide a shape measurement apparatus that is capable of detecting minute roughness irregularity at high speed across the entire width on the entire surface of a measurement object. [Solution] Provided is a shape measurement apparatus including: a light source configured to irradiate a surface of a moving strip-shaped body with linear light diagonally from an upstream side in a movement direction of the strip-shaped body; a screen configured such that reflected light of the linear light on the surface of the strip-shaped body is projected on the screen; an imaging unit configured to image the reflected light of the linear light projected on the screen; and an arithmetic processing unit configured to acquire surface roughness distribution of the strip-shaped body on the basis of width distribution of a light strip of the reflected light of the linear light projected on the screen.
    Type: Grant
    Filed: January 19, 2017
    Date of Patent: January 7, 2020
    Inventors: Toshio Akagi, Yusuke Konno, Atsuhiro Hibi, Nobuhiro Furuya, Takayuki Sonoda, Akihito Nakazaki
  • Patent number: 10514247
    Abstract: A wafer alignment apparatus includes a light source, a light detection device, and a rotation device configured to rotate a wafer. The light source is configured to provide a light directed to the wafer. The light detection device is configured to detect reflected light intensity from the wafer to locate at least one wafer alignment mark of wafer alignment marks separated by a plurality of angles. At least two of those angles are equal.
    Type: Grant
    Filed: January 8, 2018
    Date of Patent: December 24, 2019
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Wei-Hsiang Tseng, Chin-Hsiang Lin, Heng-Hsin Liu, Jui-Chun Peng, Ho-Ping Chen
  • Patent number: 10495569
    Abstract: The invention relates to a method, system, and computer program product for determining a composition of a gas mix in a vehicle, said method comprising the steps of: exposing the gas mix with light; measuring data relating to a light absorption of the gas mix at at least two different pressures of the gas mix; and determining the composition of the gas mix based on said measured data. The invention relates also to a vehicle equipped with said system.
    Type: Grant
    Filed: June 1, 2016
    Date of Patent: December 3, 2019
    Assignee: Scania CV AB
    Inventors: Ola Stenlåås, Henrik Röjdegård
  • Patent number: 10495491
    Abstract: This application relates to methods and apparatus for distributed fibre optic sensing, especially distributed acoustic sensing (DAS). The sensor apparatus (300) has an optical generator (303, 305, 306) for repeatedly generating a first coded sequence of optical radiation to be launched into a sensing optical fibre (302). The first coded sequence is encoded according to a polylevel coding sequence (101) and has desired autocorrelation properties. A detector (311) detects optical radiation which has been Rayleigh backscattered from within the sensing optical fibre and a processor (301c) processes the output of the detector. The processor processes the detector output in range bins and for each range bin correlating a detection signal derived from the detector output with the polylevel coding sequence at a time delay corresponding to that particular range bin.
    Type: Grant
    Filed: August 31, 2016
    Date of Patent: December 3, 2019
    Inventors: Andrew Lewis, Stuart Russell
  • Patent number: 10495568
    Abstract: An apparatus for analysing a sample of granular material, such as soil, is described. An elongated housing has a channel extending therethrough to define an optical path. A cavity is defined within the top of the housing to receive the sample, and a transparent sample-receiving surface is disposed within the cavity at a first elevation from the bottom of the housing. A lens assembly is positioned within the optical path at a second, lower, elevation. The lens assembly magnifies an image formed by light beams reflected by or transmitted through the sample. An image capturing device is disposed across the optical path at a third elevation that is lower than the second elevation. The image capturing device is thus lower than both the lens assembly and the transparent sample-receiving surface. A light source is mounted within the housing to emit light toward the sample-receiving surface.
    Type: Grant
    Filed: April 27, 2018
    Date of Patent: December 3, 2019
    Inventors: Viacheslav Adamchuk, Asim Biswas, Long Qi, Maxime Leclerc, Bharath Sudarsan, Wenjun Ji
  • Patent number: 10488342
    Abstract: In methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers, the sample is subjected to a light intensity distribution including an intensity maximum of focused fluorescence excitation light to selectively scan partial areas of interest of the sample. Fluorescence light emitted out of the sample is registered and allocated to a respective location of the light intensity distribution in the sample. The subjection of the sample to at least one part of the light intensity distribution is terminated at each location of the light intensity distribution, if at least one criterion of the following criteria is met: (a) a predetermined maximum light amount of the fluorescence light emitted out of the sample has been registered, and (b) a predetermined minimum light amount of the fluorescence light emitted out of the sample has not been registered within a predetermined period of time.
    Type: Grant
    Filed: October 23, 2018
    Date of Patent: November 26, 2019
    Inventors: Andreas Schoenle, Christian Wurm, Benjamin Harke, Gerald Donnert
  • Patent number: 10481079
    Abstract: An embodiment of a path length calibration system is described that comprises a swing arm coupled to a first surface; a base coupled to a second surface configured to receive the sample; a position sensor system comprising a first component coupled to the swing arm and a second component coupled to the base, wherein the position sensor system is configured to provide an output voltage when the swing arm is in a down position; and a processor configured to calibrate a zero path length using the output voltage.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: November 19, 2019
    Assignee: Thermo Electron Scientific Instruments LLC
    Inventors: Damian W. Ashmead, James V. Howard, Kevin K. Kim, Andrew Martin Braasch
  • Patent number: 10473584
    Abstract: Diffuse reflectance spectroscopy apparatus for use in analyzing a sample comprising a sample receiving location 2 for receiving a sample 3 for analysis; an illumination arrangement 4 for directing light towards a received sample; a detector 6 for detecting light reflected by a received sample; and collection optics 5 for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer 42 and a half beam block 45a, 45b which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer.
    Type: Grant
    Filed: May 21, 2018
    Date of Patent: November 12, 2019
    Assignee: PerkinElmer Singapore PTE Limited
    Inventors: Ralph Lance Carter, Robert Alan Hoult
  • Patent number: 10473456
    Abstract: A driving control system includes: an imaging device that is installed on a moving body and that images a target object in a first frame period a plurality of times to generate a multiple-exposure image data including a first image data and a second image data; and a processor that detects a relative motion state of the moving body with respect to the target object, based on the first image data and the second image data. The imaging device images the target object with a first sensitivity in a first exposure period in the first frame period to generate the first image data and images the target object with a second sensitivity in a second exposure period in the first frame period to generate the second image data, the second exposure period being different from the first exposure period, the second sensitivity being different from the first sensitivity.
    Type: Grant
    Filed: December 12, 2018
    Date of Patent: November 12, 2019
    Inventors: Kazuko Nishimura, Yasuo Miyake, Yoshiaki Satou, Osamu Shibata, Hiroshi Iwai
  • Patent number: 10466178
    Abstract: Methods and devices for cytometric analysis are provided. A cytometry apparatus is provided which may be used with a stationary sample cuvette for analysis of a stationary sample or with a flow sample cuvette for analysis of a flowing sample. The methods and devices provided herein may be used to perform cytometric analysis of samples under a wide range of experimental and environmental conditions.
    Type: Grant
    Filed: May 18, 2018
    Date of Patent: November 5, 2019
    Assignee: Theranos IP Company, LLC
    Inventors: Chinmay Pangarkar, Karan Mohan
  • Patent number: 10466101
    Abstract: A method to adjust the energy transmitted from a multiplicity of light sources to provide an adequate reference for spectral measurement or control using a multichannel feedback adjustment algorithm that compensates for the interactions between adjacent spectral ranges and sets reference light sources for optimal system performance using a normalized energy value for each spectral range is disclosed.
    Type: Grant
    Filed: June 25, 2018
    Date of Patent: November 5, 2019
    Assignee: OCEAN OPTICS, INC.
    Inventors: Kirk Clendinning, Nelson Chandler
  • Patent number: 10466176
    Abstract: The present disclosure relates to a system and method utilizing a light source coupled with a viewing device to detect contaminant(s) on an electronic circuit board. This fluorescence microscopy apparatus can be easily integrated into a bench top stereoscope or microscope and does not require the use of expensive and destructive analytical techniques. Typically, blue light is used in conjunction with a filter to detect contamination from cured epoxy resins and many other contaminants on gold bond pads, wires, pads, or other electrically conductive elements on the electronic circuit.
    Type: Grant
    Filed: May 1, 2017
    Date of Patent: November 5, 2019
    Assignee: BAE Systems Information and Electronic Systems Integration Inc.
    Inventors: Richard Rochford, Tristan J. Baldwin, Edward L. Brabant, Jr., Charles H. Mazel, Michael J. Meade
  • Patent number: 10458925
    Abstract: An inspection apparatus and methods for inspecting a body having a structure of walls defining a plurality of channels, such as a honeycomb structure. An inspection apparatus may include a translucent conveyor belt and a light source oriented to direct light onto the backlight surface. The light source and the belt are arranged to convey the body while directing diffuse light into the body, whereby inspection of the inner walls of the structure may be facilitated.
    Type: Grant
    Filed: July 19, 2016
    Date of Patent: October 29, 2019
    Assignee: Corning Incorporated
    Inventors: Andrew Paul Courtney, Brian George Martinec
  • Patent number: 10458847
    Abstract: A luminance evaluation image 1 has a determination portion 3 configured such that luminance changes progressively between low and high luminance regions 3a and 3b defined to have luminance levels lower and higher than an upper limit of luminance displayable on the image display device 4, respectively. A chromaticity evaluation image has a determination portion configured such that chroma changes progressively between low and high chroma regions defined to have chroma levels lower and higher than an upper limit of chroma displayable on the image display device 4, respectively. At least either the luminance evaluation image or chromaticity evaluation image is displayed on the image display device 4 to evaluate characteristics of the image display device 4 from a position of a boundary B1 in the determination portion 3.
    Type: Grant
    Filed: January 26, 2017
    Date of Patent: October 29, 2019
    Assignee: IMAGICA Lab. Inc.
    Inventors: Ado Ishii, Wataru Matsumoto, Toshiki Yura, Tomohiro Hasegawa
  • Patent number: 10459354
    Abstract: A lithographic apparatus including a support to support a patterning device, a substrate table to hold a substrate, and a projection system to project a radiation beam patterned by the patterning device onto a target portion of the substrate. A transparent layer is provided to protect the pattering device. The apparatus further includes a transparent layer deformation-determining device to determine a deformation profile of the transparent layer, the deformation profile of the transparent layer expressing a deformation of the transparent layer during a scanning movement of the lithographic apparatus, and a compensator device which is configured to control the projection system, the substrate table and/or the support in response to the deformation profile of the transparent layer to compensate for the deformation of the transparent layer during the scanning movement of the apparatus.
    Type: Grant
    Filed: March 24, 2016
    Date of Patent: October 29, 2019
    Assignee: ASML Netherlands B.V.
    Inventors: Kevin Van De Ruit, Bart Dinand Paarhuis, Jean-Philippe Xavier Van Damme, Johannes Onvlee, Cornelis Melchior Brouwer
  • Patent number: 10451564
    Abstract: A method for qualitatively detecting aberration and determine aberration types in a photolithography system is disclosed. The method includes using a digital micromirror device (DMD) pattern to project an optical signal on a reflective substrate, acquiring a return optical signal reflected from the substrate at different focus heights (ranging from above to below best focus), forming a through focus curve based off of the return optical signal at various focus heights, comparing the through focus curve to a predetermined curve—the predetermined curve being a function of focus, and determining if a lens aberration is present. By using the existing hardware of the photolithography system to determine if a lens aberration exists, costs are maintained at a minimum and the DMD pattern creates a through focus curve (TFC) image in less than five minutes allowing for quick correction.
    Type: Grant
    Filed: April 25, 2018
    Date of Patent: October 22, 2019
    Inventors: Qin Zhong, Antoine P. Manens, Hwan J. Jeong
  • Patent number: 10451519
    Abstract: A non-contact strain and/or displacement measurement system for use with structural objects having an optical device, a data store and an image arrangement that is fixed relative to the structural object to be tested, the optical device including an image receiving device for receiving visual images and the data store being configured to record the received visual images, the image receiving device being spaced from the image arrangement by an optical spacing such that the image receiving device has a visual range that includes a portion of the structural object and the image arrangement being within the portion, the image arrangement having at least one image element wherein movement of the at least one image element during a measurement period provides image data to calculate structural object strain and/or structural object displacement.
    Type: Grant
    Filed: February 25, 2018
    Date of Patent: October 22, 2019
    Assignee: Pile Dynamics, Inc.
    Inventors: Garland E. Likins, Jr., George R. Piscsalko, Dean A. Cotton, Brent Robinson, Frank Rausche, Richard E. Berris, Jr.
  • Patent number: 10444083
    Abstract: A fiber optic sensing system includes a plurality of optical probes, a light source, and a light splitting unit connecting the light source to the plurality of optical probes. The light splitting unit splits a light emitted from the light source into a plurality of divided lights, the divided lights being transmitted to the plurality of optical probes.
    Type: Grant
    Filed: November 21, 2017
    Date of Patent: October 15, 2019
    Assignee: Watlow Electric Manufacturing Company
    Inventor: Mohammad Nosrati