Patents Examined by Jamil Ahmed
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Patent number: 11624656Abstract: An optical sensor device, includes an optical sensor that has a set of sensor elements, an optical filter that includes a plurality of regions, and one or more processors. A region, of the plurality of regions, includes a first set of optical channels comprising optical channels that are configured to pass light associated with respective subranges of a first wavelength range, a second set of optical channels comprising optical channels that are configured to pass light associated with respective subranges of a second wavelength range, and a third set of optical channels comprising optical channels that are configured to pass light associated with respective subranges of a third wavelength range. The one or more processors are configured to obtain, from the optical sensor, sensor data associated with a scene and determine image information associated with the scene based on the spectral information.Type: GrantFiled: April 12, 2021Date of Patent: April 11, 2023Assignee: VIAVI Solutions Inc.Inventor: William D. Houck
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Patent number: 11619591Abstract: An image inspection apparatus includes: an image capturing unit which captures images of an object; a transparent illumination unit which has a light-emitting surface which radiates light to the object and is configured to be able to control a light-emitting position on the light-emitting surface and a radiation direction of the light; and a control unit which is configured to control the image capturing unit and the illumination unit. The control unit causes the illumination unit to change the light-emitting position and the radiation direction, causes the image capturing unit to capture images of the object, identifies a light-emitting position and a radiation direction of the illumination unit when a measurement point of the surface of the object is illuminated from images of the object, and calculates a distance to the measurement point on the basis of the identified light-emitting position and the identified radiation direction.Type: GrantFiled: January 15, 2019Date of Patent: April 4, 2023Assignee: OMRON CorporationInventors: Yutaka Kato, Shingo Inazumi
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Patent number: 11619549Abstract: The present disclosure provides for an apparatus for measuring optical properties of liquid samples. The apparatus includes a sample chamber and a spectrometer optically coupled with the sample chamber. One or multiple sources of electromagnetic radiation are positioned relative to the sample chamber to direct electromagnetic radiation through the sample chamber to measure the color, haze, and/or clarity of the sample. Also provided is a method for measuring optical properties of liquid samples, including inserting a cuvette containing a liquid sample into the sample chamber of the apparatus, and directing electromagnetic radiation from the one or more sources and through the sample to measure the color, haze, and/or clarity of the sample. The apparatus and methods may be used to analyze various samples, such as petroleum-based fluids, including fuels and lubricants.Type: GrantFiled: March 1, 2021Date of Patent: April 4, 2023Inventor: Ranzy Morgan, III
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Patent number: 11604149Abstract: A metrology system configured to measure overlay errors on a sample is disclosed. The metrology system measures overlay error on the sample in a first direction and/or a second direction simultaneously or sequentially. The metrology system comprises an illumination sub-system configured to illuminate a hatched overlay target on the sample with one or more illumination lobes. The metrology system further comprises an objective lens and a detector at an image plane configured to image the hatched overlay target. A controller is configured to direct illumination source to generate the illumination lobes, receive images of the hatched overlay target, and calculate the overlay errors between a first layer of the sample and a second layer of the sample.Type: GrantFiled: January 6, 2021Date of Patent: March 14, 2023Assignee: KLA CorporationInventor: Yoel Feler
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Patent number: 11592390Abstract: In one illustrative configuration, an air quality monitoring system may enable wide-scale deployment of multiple air quality monitors with high-confidence and actionable data is provided. Further, the air quality monitoring system may enable identifying a target emission from a plurality of potential sources at a site based on simulating plume models. The simulation of plume models may take into consideration various simulation parameters including wind speed and direction. Further, methods of determining a plume flux of a plume of emissions at a site, and methods of transmitting data from an air quality monitor are disclosed.Type: GrantFiled: June 17, 2022Date of Patent: February 28, 2023Assignee: PROJECT CANARY, PBCInventors: Anna Ailene Scott, Nasr E. Alkadi, Yan Azdoud, Nathan C. Eichenlaub, William J. Foiles, Christopher Daniel Kelley, Shyla Kupis
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Patent number: 11592540Abstract: A light detection and ranging (LIDAR) sensor system includes a dual-polarization optical antenna, a single-polarization optical antenna, a first receiver, and a second receiver. The dual-polarization optical antenna is configured to (i) emit a transmit beam with a first polarization orientation and (ii) and detect a return beam having a second polarization orientation. The single-polarization optical antenna is configured to detect the return beam having the second polarization orientation.Type: GrantFiled: June 23, 2022Date of Patent: February 28, 2023Assignee: OURS Technology, LLCInventors: Sen Lin, Andrew Steil Michaels
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Patent number: 11594434Abstract: Collection device for collecting elements on at least one bevel of a circular plate, comprising: a base comprising a collection groove intended to receive a collection liquid, a plate-carrier able to rotate the plate about itself and such that an outer periphery of the plate penetrates into the collection groove, wherein the collection device comprises means for visualising the interior of the collection groove, enabling at least one image to be acquired of the contact region between the collection liquid and a face of the plate.Type: GrantFiled: December 18, 2019Date of Patent: February 28, 2023Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESInventors: Delphine Autillo, Thomas Bordy, Delphine Boutry, Virginie Enyedi, Thierry Flahaut, Herve Fontaine, Roland Garcia-Santana
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Patent number: 11585751Abstract: This invention relates to a method of and system for facilitating detection of a particular predetermined gas in a scene under observation. The gas in the scene is typically associated with a gas leak in equipment. To this end, the system comprises an infrared camera arrangement; a strobing illuminator device having a strobing frequency matched to a frame rate of the camera; and a processing arrangement. The processing arrangement is configured to store a prior frame obtained via the infrared camera arrangement; and compare a current frame with the stored prior frame and generate an output signal in response to said comparison. The system also comprises a display device configured to display an output image based at least on the output signal generated by the processing arrangement so as to facilitate detection of the particular predetermined gas, in use.Type: GrantFiled: October 9, 2018Date of Patent: February 21, 2023Assignee: CSIRInventor: Ettienne Cox
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Patent number: 11585752Abstract: In one illustrative configuration, an air quality monitoring system may enable wide-scale deployment of multiple air quality monitors with high-confidence and actionable data is provided. Further, the air quality monitoring system may enable identifying a target emission from a plurality of potential sources at a site based on simulating plume models. The simulation of plume models may take into consideration various simulation parameters including wind speed and direction. Further, methods of determining a plume flux of a plume of emissions at a site, and methods of transmitting data from an air quality monitor are disclosed.Type: GrantFiled: June 17, 2022Date of Patent: February 21, 2023Assignee: PROJECT CANARY, PBCInventors: Anna Ailene Scott, Nasr E. Alkadi, Yan Azdoud, Nathan C. Eichenlaub, William J. Foiles, Christopher Daniel Kelley, Shyla Kupis
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Patent number: 11567000Abstract: The present invention discloses a method of infrared spectrometric measurement of tunnel gas employing a gas measurement system including a gas collection unit, a gas analysis unit and a positioning indication unit for measuring the gas in the tunnel. The method performs sequential steps of installing the gas measurement system, starting the positioning indication unit for positioning one of the detection regions in the tunnel space, sampling the gas in the detection region through the gas collection unit, analyzing the gas by the gas analysis unit, generating a gas analysis result, and determining whether all of the detection regions are completed.Type: GrantFiled: October 21, 2020Date of Patent: January 31, 2023Assignee: SINOTECH ENGINEERING CONSULTANTS, INC.Inventors: Cheng-Hsien Tsai, Fu-Yuan Hsiao, Shu-Yung Chi, Chih-Hao Yang, Shih-Hui Wang
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Patent number: 11566938Abstract: Methods and systems for controlling tintable windows based on cloud detection.Type: GrantFiled: September 21, 2020Date of Patent: January 31, 2023Assignee: View, Inc.Inventors: Stephen Clark Brown, Jason David Zedlitz, Jack Kendrick Rasmus-Vorrath, Nitin Khanna, Ruican Zhong, Vashisth Parekh, Nidhi Tiwari, Kriti Sharma
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Patent number: 11561167Abstract: Provided is a liquid sensor that can more accurately detect the state of a liquid. The liquid sensor includes a light emitting element, an optical waveguide, a light receiving element, and a detection circuit. The light receiving element is configured to receive light that was emitted by the light emitting element and passed through the optical waveguide. The detection circuit is configured to detect output of the light receiving element. The optical waveguide includes a first pillar portion that extends straight and a second pillar portion that extends straight. The second pillar portion is provided at a position opposing the first pillar portion. A space for liquid is formed between the first pillar portion and the second pillar portion. The first pillar portion includes a first end surface that faces the light emitting element, and a second end surface that is tilted relative to the first end surface and reflects light toward the second pillar portion.Type: GrantFiled: October 29, 2021Date of Patent: January 24, 2023Assignee: NIPPON PILLAR PACKING CO., LTD.Inventors: Akira Nakatsu, Kentaro Watanabe
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Patent number: 11561168Abstract: A radiation source for obliquely launching a narrowband electromagnetic radiation into a cavity, comprises an emitter structure having a main radiation emission region for emitting the narrowband electromagnetic radiation, wherein the emitter structure is optically coupled to the cavity, and a layer element coupled to the main radiation emission region of the emitter structure, wherein the layer element comprises a radiation deflection structure configured for deflecting the radiation emission characteristic of the emitter structure with respect to the surface normal of the main radiation emission region of the emitter structure.Type: GrantFiled: December 15, 2020Date of Patent: January 24, 2023Assignee: Infineon Technologies AGInventors: David Tumpold, Christoph Glacer, Steffen Kubacki
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Patent number: 11561084Abstract: Methods, devices and systems provide improved detection, sensing and identification of objects using modulated polarized beams. An example polarization sensitive device includes an illumination source, and a modulator coupled to the illumination source to produce output beams in which polarization states or polarization parameters of the output beams are modulated to produce a plurality of modulated polarized beams. The device further includes a polarization sensitive detector positioned to receive a reflected portion of modulated polarized beams after reflection from an object and to produce information that is indicative of modulation and polarization states of the received beams. The information can be used to enable a determination of a distance between the polarization sensitive device and the object, or a determination of a polarization-specific characteristic of the object.Type: GrantFiled: April 13, 2018Date of Patent: January 24, 2023Assignee: ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONAInventor: Stanley Pau
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Patent number: 11555786Abstract: Apparatus for laser induced ablation spectroscopy (LIBS) is disclosed. An apparatus can have a computer, a pulsed laser and a lightguide fiber bundle that is subdivided into branches. One branch can convey a first portion of the light to a first optical spectrometer and a different branch can convey a second portion of the light to another optical spectrometer. The first spectrometer can be relatively wideband to analyze a relative wide spectral segment and the other spectrometer can be high dispersion to measure minor concentrations. The apparatus can have a plurality of spectrometers with distinct and/or complementary capabilities, and can include an inductively coupled plasma mass spectrometer and data and instructions in tangible media operable to obtain a synergistic composition analysis based on optical spectra and ion mass to charge ratio peaks from the mass spectrometer.Type: GrantFiled: September 6, 2022Date of Patent: January 17, 2023Assignee: Applied Spectra, Inc.Inventors: Jong Hyun Yoo, Chunyi Liu, Richard E. Russo
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Patent number: 11555773Abstract: An inflammatory marker is calculated using a nonlinear function including, as variables, a parameter associated with an erythrocyte aggregation and another parameter associated with an erythrocyte density. The parameter associated with the erythrocyte aggregation is calculated based on a syllectogram measured from a blood specimen. The parameter associated with the erythrocyte density is measured from the blood specimen.Type: GrantFiled: January 25, 2018Date of Patent: January 17, 2023Assignee: NIHON KOHDEN CORPORATIONInventor: Makoto Higuchi
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Patent number: 11551980Abstract: A dynamic misregistration measurement amelioration method including taking at least one misregistration measurement at multiple sites on a first semiconductor device wafer, which is selected from a batch of semiconductor device wafers intended to be identical, analyzing each of the misregistration measurements, using data from the analysis of each of the misregistration measurements to determine ameliorated misregistration measurement parameters at each one of the multiple sites, thereafter ameliorating misregistration metrology tool setup for ameliorated misregistration measurement at the each one of the multiple sites, thereby generating an ameliorated misregistration metrology tool setup and thereafter measuring misregistration at multiple sites on a second semiconductor device wafer, which is selected from the batch of semiconductor device wafers intended to be identical, using the ameliorated misregistration metrology tool setup.Type: GrantFiled: May 19, 2019Date of Patent: January 10, 2023Assignee: KLA-TENCOR CORPORATIONInventors: Roie Volkovich, Anna Golotsvan, Eyal Abend
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Patent number: 11543357Abstract: Disclosed is an operating method of a metal sorting system using laser induced breakdown spectroscopy (LIBS), which may include: analyzing a metal component distribution for various metals using LIBS library information; setting multiple clusters according to the metal component distribution; performing first regression component analysis with respect to spectral data of a metal sample; calculating a probability that the spectral data will belong to each of the set multiple clusters using the first regress component analysis result; performing second regression component analysis with respect to the spectral data which belong to each cluster; and discriminating a type of metal sample by a weighted sum of the calculated probability and the second regression component analysis result.Type: GrantFiled: August 7, 2019Date of Patent: January 3, 2023Assignee: Gwangju Institute of Science and TechnologyInventors: Eui Seok Hwang, E Den Kim, Sung Ho Jeong, Sung Ho Shin
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Patent number: 11543557Abstract: Disclosed herein are methods and systems that determine the carbon content of a subterranean formation by analyzing samples of drill cuttings obtained from a subterranean formation with a laser-induced breakdown spectrometer and an autocalcimeter.Type: GrantFiled: July 31, 2019Date of Patent: January 3, 2023Assignee: Halliburton Energy Services, Inc.Inventor: Juliana Teotonio Da Silva
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Patent number: 11543295Abstract: Aspects of the present disclosure include methods for spectrally resolving light from fluorophores having overlapping fluorescence spectra in a sample. Methods according to certain embodiments include detecting light with a light detection system from a sample having a plurality of fluorophores having overlapping fluorescence spectra and spectrally resolving light from each fluorophore in the sample. In some embodiments, methods include estimating the abundance of one or more of the fluorophores in the sample, such as on a particle. In certain instances, methods include identifying the particle in the sample based on the abundance of each fluorophore and sorting the particle. Methods according to some embodiments includes spectrally resolving the light from each fluorophore by calculating a spectral unmixing matrix for the fluorescence spectra of each fluorophore. Systems and integrated circuit devices (e.g., a field programmable gate array) for practicing the subject methods are also provided.Type: GrantFiled: April 8, 2021Date of Patent: January 3, 2023Assignee: BECTON, DICKINSON AND COMPANInventors: Peter Mage, Keegan Owsley