Patents Examined by Janet L Suglo
  • Patent number: 7451053
    Abstract: An on die thermal sensor (ODTS) includes a thermal sensor for outputting a first comparing voltage by detecting a temperature of the semiconductor memory device; a comparing unit for outputting a trimming code by comparing the first comparing voltage with a second comparing voltage and increasing or decreasing a preset digital code in response to the comparing result; and a voltage level adjusting unit for adjusting a voltage level of the second comparing voltage by determining a maximum variation voltage and a minimum variation voltage based on the trimming code and a temperature control code.
    Type: Grant
    Filed: September 26, 2006
    Date of Patent: November 11, 2008
    Assignee: Hynix Semiconductor Inc.
    Inventor: Chun-Seok Jeong
  • Patent number: 7424390
    Abstract: A method for testing the time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimit with an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns time delays TD of the device are measured, thereby ne bad time delays of these ns time delays TD are detected. PDhigh and/or PDlow are obtained, whereby PDhigh is the worst possible likelihood distribution and PDlow is the best possible likelihood distribution containing the measured ne bad time delays with the probability D. The average numbers of erroneous bits NEhigh and NElow for PDhigh and PDlow are obtained. NEhigh and NElow are compared with NElimit=ERlimit ns. If NElimit is higher than NEhigh or NElimit is lower than NElow the test is stopped.
    Type: Grant
    Filed: October 1, 2003
    Date of Patent: September 9, 2008
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventor: Thomas Maucksch
  • Patent number: 7421357
    Abstract: An operation unit executes a process for calling to a main memory first data representative of a result of equipment QC applied to a production unit. A process for reading out to the main memory an amount of change in failure in accordance with particle numbers calculated for individual defect sizes from second inspection data representative of a result of equipment QC is applied to the production unit. Electrical test data of a product processed by the production unit during a period inclusive of the time that the second inspection is carried outis also read to the main memory. A process is also executed for using the amount of change in failure in accordance with the calculated particle numbers and the particle numbers for individual sizes determined from the first inspection data to determine an impact on the product by particles generated in the production equipment when the first inspection data is detected.
    Type: Grant
    Filed: July 12, 2004
    Date of Patent: September 2, 2008
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Makoto Ono, Yohei Asakawa
  • Patent number: 7400975
    Abstract: A probe for use in a computerized plant selection and health maintenance system comprises a controller having a processor adopted to process environmental data received from a plurality of sensors and a communications interface adapted to transmit environmental data; and a soil mount removably engaged with the controller having a receptacle adapted to snugly receive the communications interface and a stake adapted to removably engage with soil. The receptacle advantageously allows engagement and disengagement of the controller from the soil mount by hand without the need for tools or independent attachment mechanisms, which has heightened importance where portability of the controller is required, and protects sensitive electronic components of the controller, such as the communications interface, from environmental contaminants.
    Type: Grant
    Filed: February 28, 2007
    Date of Patent: July 15, 2008
    Assignee: PlantSense, LLC
    Inventors: Matthew K. Glenn, David L. Wilkins
  • Patent number: 7373275
    Abstract: A system and method of point matching measured positions to template, or reference, positions for various applications may generally comprise creating force field vectors and moments operative to perturb measured point locations into alignment with template point locations. Progressive reduction of the force radius may produce results that match very well for points that are highly correlated with the template pattern.
    Type: Grant
    Filed: March 12, 2004
    Date of Patent: May 13, 2008
    Assignee: Rudolph Technologies, Inc.
    Inventor: Raymond H. Kraft
  • Patent number: 7337091
    Abstract: A system includes a process tool for processing a workpiece, a process controller, and a fault monitor. The process controller is configured to determine a control action for updating an operating recipe of the process tool. The fault monitor is configured to determine at least one fault detection threshold based on the control action. A method includes determining a control action for updating an operating recipe of a process tool and determining at least one fault detection threshold based on the control action.
    Type: Grant
    Filed: October 31, 2002
    Date of Patent: February 26, 2008
    Assignee: Advanced Micro Devices, Inc.
    Inventor: Richard J. Markle
  • Patent number: 7317997
    Abstract: A system and method for assisting listening wherein an integrated circuit selects one or more audio sources from among a plurality audio sources to be presented to a signal processing circuit. Selection of the audio source can be automatically executed in response to detection of an external magnetic field, such as from a telephone handset, or manually controlled by a user input.
    Type: Grant
    Filed: August 15, 2006
    Date of Patent: January 8, 2008
    Assignee: Knowles Electronics, LLC.
    Inventors: Steven E. Boor, Paris Tsangaris
  • Patent number: 7308372
    Abstract: A method, an apparatus, and a system for phase jitter measurement circuits are described herein.
    Type: Grant
    Filed: January 26, 2006
    Date of Patent: December 11, 2007
    Assignee: Intel Corporation
    Inventors: Michael C. Rifani, Keng L. Wong, Christopher Pan
  • Patent number: 7263469
    Abstract: An RF multiple switching apparatus, such as one included in or coupled to a broadcast satellite signal receiver, having a plurality of multiple RF signal input ports for receiving respective ones of a plurality of RF signals, such as broadcast satellite television signals, utilizes a relative signal strength indicator, such as an automatic gain control signal, to determine the difference between the actual input signal that is present at one of the plurality of signal input ports and a false signal that appears to be present at another signal input port of the plurality of signal input ports due to the RF signal bleeding between the multiple signal input ports. During a setup configuration determination or routine, the switching apparatus steps through each RF signal input, extracts pertinent transmission network (such as a satellite transmission network) information, determines a relative signal strength indicator for the RF signal, and compares the obtained information.
    Type: Grant
    Filed: December 16, 2002
    Date of Patent: August 28, 2007
    Assignee: Thomson Licensing
    Inventors: Brian David Bajgrowicz, John Joseph Curtis, III
  • Patent number: 7260495
    Abstract: A system and method for test generation for system level verification using parallel algorithms are provided. The present invention generates test patterns for system level tests by exploiting the scalability of parallel algorithms while allowing for data set coloring and expected result checking. Based on the characteristics of the system being tested an iterative parallel algorithm is selected from a plurality of possible parallel algorithms. The selected parallel algorithm is then separated into separate program statements for execution by a plurality of processors. A serial version of the selected algorithm is executed to generate a set of expected results. The devised parallel version of the selected algorithm is then run to generate a set of test result data which is compared to the set of expected results. If the two sets of data match, it is determined that the system is operating correctly.
    Type: Grant
    Filed: June 6, 2005
    Date of Patent: August 21, 2007
    Assignee: International Business Machines Corporation
    Inventors: Sanjay Gupta, Steven L. Roberts, Christopher J. Spandikow
  • Patent number: 7254495
    Abstract: A system and technique for detecting a device that requires power is implemented with a power detection station. The power detection system includes a detector having an output and a return which are coupled together by the device when the device requires power. The detector includes a word generator for generating test pulses for transmission to the device via the detector output, and a comparator for comparing the detector output with the detector return. The power detection station has a wide variety of applications, including by way of example, a switch or hub.
    Type: Grant
    Filed: August 16, 2005
    Date of Patent: August 7, 2007
    Assignee: Broadcom Corporation
    Inventors: Vafa Rakshani, Nariman Yousefi
  • Patent number: 7246024
    Abstract: The sensor malfunction detection system for a gas-turbine engine is configured to determine or check once every first predetermined time period whether the outputted value from the sensor is within a permissible range and determines that the sensor is faulty when the result of the check is at least one result between the case of the number of times the outputted value is found not to be within the permissible range exceeding a first predetermined value and the case of the number of times the outputted value is consecutively found not to be within the permissible range exceeding a second predetermined value.
    Type: Grant
    Filed: March 28, 2005
    Date of Patent: July 17, 2007
    Assignee: Honda Motor Co., Ltd.
    Inventors: Hironori Muramatsu, Yukinobu Sugitani
  • Patent number: 7212941
    Abstract: A test apparatus implements a method for testing electronic devices that exhibit non-deterministic behavior. The test apparatus includes a high-speed buffer queue for storing data packets. The data packets arrive at one end of the queue and, as they exit at the other end, are compared against expect data packets stored in memory. If the data packet exiting the buffer queue corresponds to response signals generated by the device under test during a non-deterministic (e.g., idle) state, the expect data packet is not retrieved from memory and the comparison is not made.
    Type: Grant
    Filed: August 24, 2004
    Date of Patent: May 1, 2007
    Assignee: Credence Systems Corporation
    Inventors: Angarai T. Sivaram, Burnell G. West, Howard Maassen
  • Patent number: 7209864
    Abstract: A method for testing performance of a constrained resources computing device (CRCD) is provided which includes determining that a data sample was generated and generating a time stamp corresponding to when the data sample was generated. The method also includes determining a defined time interval corresponding to the time stamp and incrementing a counter associated with the defined time interval corresponding to the time stamp.
    Type: Grant
    Filed: September 9, 2004
    Date of Patent: April 24, 2007
    Assignee: Sun Microsystems, Inc.
    Inventors: Terrence Barr, David Proulx
  • Patent number: 7209863
    Abstract: A performance information monitoring method using computers includes the steps of accepting information on a group relating to a first computer in the first computer; storing the accepted group information in a storage in the first computer; accepting performance information from a second computer in the first computer; comparing performance information of the second computer previously stored in a storage with the performance information received from the second computer in the first computer; judging whether or not the second computer is included in the information of the group when finding a difference between the performance information in the comparison result; and transmitting an instruction to the computer included in the group information to change a performance information collection interval according to the judgment result.
    Type: Grant
    Filed: August 6, 2003
    Date of Patent: April 24, 2007
    Assignee: Hitachi, Ltd.
    Inventors: Yusuke Fukuda, Tadashi Numanoi, Tomohiro Kominami, Naoki Shimada
  • Patent number: 7200497
    Abstract: A test system for testing a portable electronic apparatus is described. The test system has at least a display, a platform, and a controller. The controller controls the display to display test images in sequence. The controller commands the portable electronic apparatus, via a test interface, to capture the test images on the display to generate image data. The controller determines whether the image data meet a predetermined test requirement. The test system can further include at least a light source and a reflector. The reflector reflects the light on the display, so that the display reaches a predetermined uniformity of light.
    Type: Grant
    Filed: March 29, 2005
    Date of Patent: April 3, 2007
    Assignee: Quanta Computer Inc.
    Inventors: Chih-Cheng Wang, Hung-Yang Wu, Chuan-Hung Chiang
  • Patent number: 7197410
    Abstract: Method arid apparatus for accelerating a multi-phase motor having a rotatable rotor are disclosed. The method incorporates use of a motor control circuit to predict a subsequent loss of frequency lock between the motor control circuit and a motor while the motor control circuit and the motor remain frequency locked, and based on the prediction, steps to avert a loss of frequency lock during acceleration.
    Type: Grant
    Filed: August 4, 2004
    Date of Patent: March 27, 2007
    Assignee: Seagate Technology LLC
    Inventors: Jeffrey Alan Heydt, David Ray Street
  • Patent number: 7197414
    Abstract: A system for identifying a manufacturing tool causing a failure, includes a data generating module generating factorial effect data, based on information on a failure lot group by using an orthogonal array, a chart generating module generating a factorial effect chart based on the factorial effect data, a selection module selecting failure lots caused by the same reason for a failure from among the failure lot group, based on the factorial effect chart, and an identification module identifying a manufacturing tool used as a common tool for the selected plurality of failure lots, based on history information of the manufacturing tool group.
    Type: Grant
    Filed: March 28, 2005
    Date of Patent: March 27, 2007
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Hiroshi Matsushita, Kenichi Kadota
  • Patent number: 7194382
    Abstract: The present invention comprises systems and methods for determining stability margin of a combustor. One embodiment of the present invention includes the steps of providing a measuring device in communication with the combustor, wherein the measuring device generates signals indicative of combustor quantities; performing an autocorrelation calculation on the signals to determine the correlation time of the signals in the combustor; and determining the damping coefficient from the autocorrelation calculation, wherein the damping coefficient signifies a proximity of the combustor to instability. The damping coefficient may be estimated from the oscillatory envelope of the autocorrelation calculation data.
    Type: Grant
    Filed: February 4, 2005
    Date of Patent: March 20, 2007
    Assignee: Georgia Tech Research Corporation
    Inventor: Tim C. Lieuwen
  • Patent number: 7181370
    Abstract: Certain exemplary embodiments can comprise obtaining and analyzing data from at least one discrete machine, automatically determining relationships related to the data, taking corrective action to improve machine operation and/or maintenance, automatically and heuristically predicting a failure associated with the machine and/or recommending preventative maintenance in advance of the failure, and/or automating and analyzing mining shovels, etc.
    Type: Grant
    Filed: August 17, 2004
    Date of Patent: February 20, 2007
    Assignee: Siemens Energy & Automation, Inc.
    Inventors: Ken Furem, Daniel W. Robertson, Gopal Madhavarao