Patents Examined by Janet L Suglo
  • Patent number: 7165014
    Abstract: A partial discharge monitoring apparatus for a rotating electric machine includes a partial discharge detecting circuit which measures each signal output from a partial discharge sensor located in the rotating electric machine simultaneously in a first frequency band and a second frequency band. Detection time for detecting each signal includes a peak hold time and a dead time, which comes after the peak hold time. A next-occurring signal is detected after the dead time has elapsed.
    Type: Grant
    Filed: August 16, 2004
    Date of Patent: January 16, 2007
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Yoshiharu Kaneda, Chiharu Kawase
  • Patent number: 7162381
    Abstract: A system and method for assisting listening wherein an integrated circuit selects one or more audio sources from among a plurality audio sources to be presented to a signal processing circuit. Selection of the audio source can be automatically executed in response to detection of an external magnetic field, such as from a telephone handset, or manually controlled by a user input.
    Type: Grant
    Filed: December 15, 2003
    Date of Patent: January 9, 2007
    Assignee: Knowles Electronics, LLC
    Inventors: Steven E. Boor, Paris N. Tsangaris
  • Patent number: 7158910
    Abstract: A method of calculating a quantity of light by measuring, by using an adhering force measuring unit (71), the adhering force of an ultraviolet light-curable tape (11 or 21) relying upon the quantity of ultraviolet light with which the ultraviolet light-curable tape is irradiated from an ultraviolet light irradiation unit (61), and calculating, by using a calculation unit, the quantity of ultraviolet light corresponding to a predetermined adhering force, from the measured adhering force of the ultraviolet light-curable tape, and a device therefor. The predetermined adhering force may have been stored in advance in the storage unit or the predetermined adhering force may be determined in advance relying upon at least either one of the kind of the ultraviolet light-curable tape or the elapsed time of the ultraviolet light-curable tape.
    Type: Grant
    Filed: July 12, 2004
    Date of Patent: January 2, 2007
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventor: Isamu Kawashima
  • Patent number: 7155362
    Abstract: A system for generating a signal for testing a relay is provided. The system includes a plurality of argument vector arrays, each defines a digital signal for testing the relay. Each of the argument vector arrays includes a plurality of argument vectors and each argument vector includes a plurality of arguments. The system includes a plurality of waveform generators to generate a plurality of signal components. Each waveform generator generates the signal component based on the argument vectors contained by a selected one of the plurality of argument vector arrays. The system also includes a merge component to combine the signal components to produce the digital signal for testing the relay.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: December 26, 2006
    Assignee: AVO Multi-Amp Corporation
    Inventors: Michael Edwards, Terry L. Elzy, Michael Maahs, Marvin G. Miller
  • Patent number: 7152019
    Abstract: Various embodiments of the invention provide devices, methods and systems, including without limitation data acquisition systems, that can provide flexible sensing and/or data acquisition solutions. An exemplary sensing device, which may be in communication with one or more computers, such as a server, etc., can include one or more sensor(s), a processor and/or a data store. The sensing device can, perhaps in response to instructions received from the computer, filter and/or otherwise process data acquired by the sensor before transmitting the desired data to the computer. The sensing device may store some or all of the acquired data locally and/or may transmit, replicate, etc. some or all of the stored data to the computer.
    Type: Grant
    Filed: April 4, 2005
    Date of Patent: December 19, 2006
    Assignee: Oracle International Corporation
    Inventors: Carlo Tarantola, Grzegorz Wojcik, Maciej Skolecki, Marcin Odrowaz-Sypniewski
  • Patent number: 7146292
    Abstract: A method for evaluating the aging level of a component includes measuring values of the elapsed time in operation of the component (tm,i), at least one entity (Im,i) indicative of the aging of the component, and the temperature (Tm,i) of the component, and processing the values measured as a function of a reference temperature (Tref) to produce corresponding normalized reference values (tref,i; Im,i) representative of virtual operation of the component at said reference temperature (Tref). An updated prediction model for the at least one entity over time is generated from the reference values (tref,i; Im,i). A predicted value (Ifit) for the at least one entity at a given time obtained by means of the prediction model is compared with an aging threshold. An aging warning signal is generated if the comparison indicates deviation of the predicted value (Ifit) beyond an acceptable range.
    Type: Grant
    Filed: August 13, 2004
    Date of Patent: December 5, 2006
    Assignee: Avago Technologies Fiber IP (Singapore) Pte. Ltd.
    Inventors: Giammarco Rossi, Luigi Gastaldi, Paolo Montangero, Ezio Riva
  • Patent number: 7139674
    Abstract: Methods and systems for generating a curve that represents raw data are provided. In one embodiment, the system includes memory for storing a curve generation application program, a user interface, a display device, and a processor. The processor executes the stored curve generation application program and is coupled to the memory, the user interface, and the display device. The executed curve generation application program includes a first component that receives raw data and a second component that allows for the manual or default setting of a base value for defining weight values for each data point of inputted raw data. A third component generates a curve for representing the raw data based on at least a portion of the data points and the set base value. A fourth component outputs the generated curve to the display device.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: November 21, 2006
    Assignee: The Boeing Company
    Inventors: John M. Switlik, Frederick Klein
  • Patent number: 7110895
    Abstract: A method for measuring the resistance component current included in the leakage current is provided. In a monitoring apparatus and system for measurement the signal waveform of at least one AC cycle is sampled. The resistance component leakage current is measured by dividing the average of integrated value of the instantaneous leakage current values and the instantaneous voltage values by the square root of average of squared instantaneous voltage values. In addition, a voltage signal of the target measurement circuit is obtained the waveform of the leakage current signal and the voltage signal for one cycle is sampled and stored; the leakage current signal and the voltage signal are expanded to N-th higher harmonic wave component respectively, and the resistance component that relates to the leakage current is calculated.
    Type: Grant
    Filed: October 4, 2002
    Date of Patent: September 19, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Naohiro Takakamo, Kuniyoshi Sakai, Yoshikazu Terakami
  • Patent number: 7110887
    Abstract: A residual chlorine meter detects a pre-calibration residual chlorine reaction amount of sample water in a detection section, inputs a calibration standard residual chlorine standard concentration of the sample water in an input section, determines calibration factors from data for computing the calibration factors based on the amount and the concentration stored in a calibration factor computation data storage section in a calibration factor computation section, and stores the calibration factors in a calibration factor storage section.
    Type: Grant
    Filed: October 20, 2004
    Date of Patent: September 19, 2006
    Assignee: Tanita Corporation
    Inventors: Shinichi Harima, Kiyoshi Sagawa
  • Patent number: 7099797
    Abstract: A method of testing a computer system in a testing environment formed of a network of routers, servers, and firewalls. Performance of the computer system is monitored. A log is made of the monitored performance of the computer system. The computer system is subjected to hostile conditions until it no longer functions. The state of the computer system at failure point is recorded. The performance monitoring is done with substantially no interference with the testing environment. The performance monitoring includes monitoring, over a sampling period, of packet flow, hardware resource utilization, memory utilization, data access time, or thread count. A business method entails providing a testing environment formed of a network of network devices including routers, servers, and firewalls, while selling test time to a customer on one or more of the network devices during purchased tests that test the security of the customer's computer system.
    Type: Grant
    Filed: July 8, 2004
    Date of Patent: August 29, 2006
    Assignee: Avanza Technologies, Inc.
    Inventor: Philippe Richard
  • Patent number: 7092830
    Abstract: The present invention is directed to a method for analyzing the tail-end behavior of a lithium cell having a solid cathode. The tail of a longer-term accelerated discharge data (ADD) test is estimated from the tail of two shorter-term ADD tests. This is accomplished by first comparing the discharge tails of shorter-term ADD tests and determining angles or rotation that correspond to Rdc growth, and then trending rotation angles versus time to reach a give DoD. For example, the 18-month and 36-month ADD test tails are used to estimate the ADD test tail of a similarly constructed cell subjected to a longer-term ADD test, for example a 48-month ADD test.
    Type: Grant
    Filed: March 23, 2005
    Date of Patent: August 15, 2006
    Assignee: Wilson Greatbatch Technologies, Inc.
    Inventors: Kenneth Syracuse, Noelle Waite, Hong Gan, Esther S. Takeuchi
  • Patent number: 7089126
    Abstract: A method for discovering a power level in a diode discovery circuit includes transmiting a pulse signal from a diode discovery device on a first line, receiving the pulse signal in the diode discovery device on a second line, measuring a time to charge a capacitor in response to applying power to determine the power level, and applying power in response to comparing the transmitted pulse signal to the received pulse signal and to measuring the time.
    Type: Grant
    Filed: November 6, 2001
    Date of Patent: August 8, 2006
    Assignee: Intel Corporation
    Inventor: Robert Muir